Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388194
G. Felic, A. Dolente
This paper presents a modelling technique for achieving accurate switching waveforms of typical power converter systems. The interconnection model of a power printed circuit board (PCB) is based on the high frequency equivalent circuit which relates the interconnection inductance to transient waveform of the power device. We propose a fast and efficient simulation technique to provide transient analysis for power PCB design.
{"title":"Modelling of transient waveforms for printed circuit board circuits in power electronics","authors":"G. Felic, A. Dolente","doi":"10.1109/EMCZUR.2007.4388194","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388194","url":null,"abstract":"This paper presents a modelling technique for achieving accurate switching waveforms of typical power converter systems. The interconnection model of a power printed circuit board (PCB) is based on the high frequency equivalent circuit which relates the interconnection inductance to transient waveform of the power device. We propose a fast and efficient simulation technique to provide transient analysis for power PCB design.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130833973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388268
D. Desideri, A. Maschio, E. Poli
A medium voltage three-phase power line supported by reinforced concrete poles and with a pole-top-pin construction has been analyzed. An analytical model has been developed for the evaluation of the electric field, with a range of validity extending from the ground up to one quarter of the height of the poles supporting the line. The model consists in assuming that the charges on the overhead conductors are not affected by the presence of the poles, and in replacing the pole with a suitable charge distribution. In this way, new simple formulas for the estimation of the electric field that include the effect of the line supporting poles have been obtained and the analytical results have been experimentally validated.
{"title":"Analytical formulas of the electric field near a reinforced concrete pole of a MV line","authors":"D. Desideri, A. Maschio, E. Poli","doi":"10.1109/EMCZUR.2007.4388268","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388268","url":null,"abstract":"A medium voltage three-phase power line supported by reinforced concrete poles and with a pole-top-pin construction has been analyzed. An analytical model has been developed for the evaluation of the electric field, with a range of validity extending from the ground up to one quarter of the height of the poles supporting the line. The model consists in assuming that the charges on the overhead conductors are not affected by the presence of the poles, and in replacing the pole with a suitable charge distribution. In this way, new simple formulas for the estimation of the electric field that include the effect of the line supporting poles have been obtained and the analytical results have been experimentally validated.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123732298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388288
G. Avril, F. Gauthier, F. Moulin, A. Zeddam, F. Nouvel
Powerline communication systems are used to transmit audio and video transmissions with delay, datarate and QoS requirements. Consequently the knowledge of the channel frequency response has to be as accurate as possible. However, the Powerline medium is shared with other devices connected to any socket. When switching, and even during normal operation, these devices can generate some noises (stationary, cyclostationary & impulsive), and may cause perceptible variation of channel frequency response. This study tries to establish a link between impulsive noise and a simultaneous variation of the channel frequency response. Indeed, an impulsive noise corresponds to a particular event which may be a sign of a change in the Powerline characteristics, and the channel frequency response may be affected by this change. Afterwards, a statistical analysis of the noises linked with a variation of the channel frequency response is performed, and consequently incurred results may help any receiver to anticipate this variation.
{"title":"Time variation of the powerline channel simultaneously with impulsive noise.","authors":"G. Avril, F. Gauthier, F. Moulin, A. Zeddam, F. Nouvel","doi":"10.1109/EMCZUR.2007.4388288","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388288","url":null,"abstract":"Powerline communication systems are used to transmit audio and video transmissions with delay, datarate and QoS requirements. Consequently the knowledge of the channel frequency response has to be as accurate as possible. However, the Powerline medium is shared with other devices connected to any socket. When switching, and even during normal operation, these devices can generate some noises (stationary, cyclostationary & impulsive), and may cause perceptible variation of channel frequency response. This study tries to establish a link between impulsive noise and a simultaneous variation of the channel frequency response. Indeed, an impulsive noise corresponds to a particular event which may be a sign of a change in the Powerline characteristics, and the channel frequency response may be affected by this change. Afterwards, a statistical analysis of the noises linked with a variation of the channel frequency response is performed, and consequently incurred results may help any receiver to anticipate this variation.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114245905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388296
E. Voges, T. Eisenburger, D. Peier
Electrical mode-stirring in reverberating chambers for EMC is accomplished by antennas which are loaded by variable reactances. The principle is derived from a network model of the chamber, which employs measurable coupling factors. The concept is experimentally confirmed in the GHzrange for a chamber with four conical antennas. One antenna is connected to a generator; the other three antennas are reactively loaded by variable short circuit plungers.
{"title":"Electrical mode stirring by reactively loaded antennas in reverberating chambers for EMC","authors":"E. Voges, T. Eisenburger, D. Peier","doi":"10.1109/EMCZUR.2007.4388296","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388296","url":null,"abstract":"Electrical mode-stirring in reverberating chambers for EMC is accomplished by antennas which are loaded by variable reactances. The principle is derived from a network model of the chamber, which employs measurable coupling factors. The concept is experimentally confirmed in the GHzrange for a chamber with four conical antennas. One antenna is connected to a generator; the other three antennas are reactively loaded by variable short circuit plungers.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"250 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114544362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388303
T. Williams
The standard conducted emissions test may use a transient limiter between the LISN and the measuring instrumentation. This component is non-linear and can introduce significant errors in the measurement, sufficient to completely change the outcome of the test but which are transparent to the test engineer. The different mechanisms by which this may happen are described and modelled, and some mitigation techniques are recommended.
{"title":"Measurement Errors Caused by the Transient Limiter","authors":"T. Williams","doi":"10.1109/EMCZUR.2007.4388303","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388303","url":null,"abstract":"The standard conducted emissions test may use a transient limiter between the LISN and the measuring instrumentation. This component is non-linear and can introduce significant errors in the measurement, sufficient to completely change the outcome of the test but which are transparent to the test engineer. The different mechanisms by which this may happen are described and modelled, and some mitigation techniques are recommended.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122110125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388266
K. Casey, W. Radasky
Fast-transient electromagnetic (EM) coupling to the interior of a shielded region through a shielded cable penetration is considered. A transient EM field couples through the shield of a coaxial cable into the cable interior and then propagates into the region beyond the shield termination. We calculate the total current and charge per unit length induced on the shield by the incident field, and the resulting current and voltage induced in the interior of the cable. We then evaluate the electromagnetic field and the current carried by the center conductor into the region beyond the shield termination. Representative numerical results are presented to illustrate the analysis.
{"title":"Fast-transient coupling through a shielded cable penetration","authors":"K. Casey, W. Radasky","doi":"10.1109/EMCZUR.2007.4388266","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388266","url":null,"abstract":"Fast-transient electromagnetic (EM) coupling to the interior of a shielded region through a shielded cable penetration is considered. A transient EM field couples through the shield of a coaxial cable into the cable interior and then propagates into the region beyond the shield termination. We calculate the total current and charge per unit length induced on the shield by the incident field, and the resulting current and voltage induced in the interior of the cable. We then evaluate the electromagnetic field and the current carried by the center conductor into the region beyond the shield termination. Representative numerical results are presented to illustrate the analysis.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"185 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116916608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388279
I. Junqua, L. Guibert, J. Parmantier
This paper deals with the application of the Power Balance approach to a generic object, the GENEC, to assess high frequency coupling mechanisms. This method has been validated by measurements performed in a reverberation chamber. Finally, it will be shown how this method, once included in a global strategy, can be complementary to “Maxwell Codes” to predict high frequency constraints in a complex system.
{"title":"Assessment of high frequency coupling in a generic object by the power balance method","authors":"I. Junqua, L. Guibert, J. Parmantier","doi":"10.1109/EMCZUR.2007.4388279","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388279","url":null,"abstract":"This paper deals with the application of the Power Balance approach to a generic object, the GENEC, to assess high frequency coupling mechanisms. This method has been validated by measurements performed in a reverberation chamber. Finally, it will be shown how this method, once included in a global strategy, can be complementary to “Maxwell Codes” to predict high frequency constraints in a complex system.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115005263","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388195
M. Taki, W. John, C. Hedayat, U. Hilleringmann
In this article an extended methodology to determine the dominant propagation paths of induced transient noise injected into a printed circuit board will be presented. Many noise sources and load conditions can now be considered. The physical signal paths carrying significant noise power from each source to a sensitive digital device port are determined by the use of efficient graph searching algorithms. The time domain waveform of these paths, including device drivers and receivers, is obtained by a hybrid analysis in HSpice environment. The methodology is applied to an interconnect system driven by two inverter gates. Some results are presented.
{"title":"Noise propagation for induced fast transient impulses on PCB-level","authors":"M. Taki, W. John, C. Hedayat, U. Hilleringmann","doi":"10.1109/EMCZUR.2007.4388195","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388195","url":null,"abstract":"In this article an extended methodology to determine the dominant propagation paths of induced transient noise injected into a printed circuit board will be presented. Many noise sources and load conditions can now be considered. The physical signal paths carrying significant noise power from each source to a sensitive digital device port are determined by the use of efficient graph searching algorithms. The time domain waveform of these paths, including device drivers and receivers, is obtained by a hybrid analysis in HSpice environment. The methodology is applied to an interconnect system driven by two inverter gates. Some results are presented.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130265237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388182
I. Stievano, E. Vialardi, F. Canavero
This paper addresses the generation of accurate macromodels of digital ICs accounting for both the functional and the out-of-band behaviour of devices. The proposed models that can be effectively used for immunity predictions are obtained from port transient responses only and can be implemented in any commercial tool based on SPICE or mixedsignal hardware description languages. The approach is demonstrated on a real test board by injecting a RF noise disturbance into a digital IC: a systematic study comparing actual measurements and simulation predictions is carried out.
{"title":"Behavioral macromodels of digital integrated circuits for RF immunity prediction","authors":"I. Stievano, E. Vialardi, F. Canavero","doi":"10.1109/EMCZUR.2007.4388182","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388182","url":null,"abstract":"This paper addresses the generation of accurate macromodels of digital ICs accounting for both the functional and the out-of-band behaviour of devices. The proposed models that can be effectively used for immunity predictions are obtained from port transient responses only and can be implemented in any commercial tool based on SPICE or mixedsignal hardware description languages. The approach is demonstrated on a real test board by injecting a RF noise disturbance into a digital IC: a systematic study comparing actual measurements and simulation predictions is carried out.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126615721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388215
B. Derat, A. Cozza, J. Bolomey
For many applications involving antenna systems in the vicinity of lossy scatterers, such as phantoms used for Specific Absorption Rate (SAR) assessment, it would be of great interest to know how local absorption can be related to the free-space radiated electromagnetic field. However, when the source closely approaches e. g. a phantom, complex interactions mechanisms begin to occur, leading to modifications of the nearfield effectively impinging on the phantom. Based on plane-wave expansion, this paper proposes an analysis of the contribution of the free-space field to the field transmitted in a phantom, as the antenna-phantom distance is varied. The particular cases of λ/2 dipoles at 900 and 1800 MHz close to a flat phantom are studied numerically. The results surprisingly show that the electric field topography inside the phantom is poorly distorted by multiple interactions, even for distances as short as 2.5 mm. It appears that this distortion is generally even weaker, for source-phantom distances where the modulus of the reflection coefficient at the antenna input port is high.
{"title":"Influence of source - phantom multiple interactions on the field transmitted in a flat phantom","authors":"B. Derat, A. Cozza, J. Bolomey","doi":"10.1109/EMCZUR.2007.4388215","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388215","url":null,"abstract":"For many applications involving antenna systems in the vicinity of lossy scatterers, such as phantoms used for Specific Absorption Rate (SAR) assessment, it would be of great interest to know how local absorption can be related to the free-space radiated electromagnetic field. However, when the source closely approaches e. g. a phantom, complex interactions mechanisms begin to occur, leading to modifications of the nearfield effectively impinging on the phantom. Based on plane-wave expansion, this paper proposes an analysis of the contribution of the free-space field to the field transmitted in a phantom, as the antenna-phantom distance is varied. The particular cases of λ/2 dipoles at 900 and 1800 MHz close to a flat phantom are studied numerically. The results surprisingly show that the electric field topography inside the phantom is poorly distorted by multiple interactions, even for distances as short as 2.5 mm. It appears that this distortion is generally even weaker, for source-phantom distances where the modulus of the reflection coefficient at the antenna input port is high.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127023661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：