Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388281
Tian Hong Loh, B. Loader, M. Alexander
The results are presented of an intercomparison of electric field strength generated by calculable dipoles and transverse electromagnetic (TEM) cells from 30 MHz to 100 MHz. An optical electric field sensor (OEFS) is used as the transfer device between an open-area test site (OATS) and two TEM cells. The corresponding calibration factors for the OEFS are measured and compared. The agreement of better than 0.4 dB between the calibration factors obtained in the different facilities gives confidence in the basis of two distinct methods that provide traceability for E-field strength, namely the calculable dipole and the TEM cell.
{"title":"Comparison of electric field strength at VHF frequencies generated by dipoles and TEM cells","authors":"Tian Hong Loh, B. Loader, M. Alexander","doi":"10.1109/EMCZUR.2007.4388281","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388281","url":null,"abstract":"The results are presented of an intercomparison of electric field strength generated by calculable dipoles and transverse electromagnetic (TEM) cells from 30 MHz to 100 MHz. An optical electric field sensor (OEFS) is used as the transfer device between an open-area test site (OATS) and two TEM cells. The corresponding calibration factors for the OEFS are measured and compared. The agreement of better than 0.4 dB between the calibration factors obtained in the different facilities gives confidence in the basis of two distinct methods that provide traceability for E-field strength, namely the calculable dipole and the TEM cell.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123202388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388282
D. Camell, R. Johnk
This paper demonstrates the usefulness of timedomain processing to determine free-space antenna factors (FSAF) for electromagnetic compatibility (EMC) antennas. Procedures are explained and data are provided from 30 MHz to 9 GHz. We investigate time gating of dense frequency packed insertion loss data obtained with an ultrawideband measurement system. These results show the advantage of time-domain signal processing to provide reliable results for the free-space antenna factors of EMC antennas.
{"title":"Time-domain processing to determine free-space antenna factor","authors":"D. Camell, R. Johnk","doi":"10.1109/EMCZUR.2007.4388282","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388282","url":null,"abstract":"This paper demonstrates the usefulness of timedomain processing to determine free-space antenna factors (FSAF) for electromagnetic compatibility (EMC) antennas. Procedures are explained and data are provided from 30 MHz to 9 GHz. We investigate time gating of dense frequency packed insertion loss data obtained with an ultrawideband measurement system. These results show the advantage of time-domain signal processing to provide reliable results for the free-space antenna factors of EMC antennas.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130323751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388199
F. Klotz
This paper presents a general EMC test specification for integrated circuits that is based on the internationally standardised test methods set out in IEC 61967 and IEC 62132 and specifies a generic procedure enabling a comparative characterisation of the EMC behaviour of different IC types. The specification contains general information about the test methods used, defines various IC function modules, pin types, and test and measurement networks, and provides a guide to selecting the pins to be tested, operating modes and limit values.
{"title":"EMC test specification for integrated circuits","authors":"F. Klotz","doi":"10.1109/EMCZUR.2007.4388199","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388199","url":null,"abstract":"This paper presents a general EMC test specification for integrated circuits that is based on the internationally standardised test methods set out in IEC 61967 and IEC 62132 and specifies a generic procedure enabling a comparative characterisation of the EMC behaviour of different IC types. The specification contains general information about the test methods used, defines various IC function modules, pin types, and test and measurement networks, and provides a guide to selecting the pins to be tested, operating modes and limit values.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132119010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388228
M. Baldauf, S. Knorzer, J. Pontes, W. Wiesbeck
Assessing the safety distances to base station antennas needs to be done in a quick but safe manner. The commonly performed far-field calculation leads typically to an overestimation of the safety distance in the main beam direction. However, for the vertical safety distance the straight forward application of the far-field formula might lead to an underestimation of the field strengths. Based on a computational investigation of halfwavelength dipoles, which are built in most base station antennas a new formula is presented that allows a safe assessment of the safety distance directly underneath the base station antenna.
{"title":"Safety distances underneath vertically polarized base station antennas","authors":"M. Baldauf, S. Knorzer, J. Pontes, W. Wiesbeck","doi":"10.1109/EMCZUR.2007.4388228","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388228","url":null,"abstract":"Assessing the safety distances to base station antennas needs to be done in a quick but safe manner. The commonly performed far-field calculation leads typically to an overestimation of the safety distance in the main beam direction. However, for the vertical safety distance the straight forward application of the far-field formula might lead to an underestimation of the field strengths. Based on a computational investigation of halfwavelength dipoles, which are built in most base station antennas a new formula is presented that allows a safe assessment of the safety distance directly underneath the base station antenna.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"168 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132147983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388202
F. Olyslager, J. Fostier, J. Peeters, D. De Zutter
In this contribution we extend our work on the application of boundary integral equations to accurately predict the shielding properties of complex enclosure geometries. The focus of this contribution is on the power of the splay tree algorithm to efficiently extract symmetry properties from a geometry. We will show that by using these splay trees in two as well as three dimensions significant savings in CPU time can be achieved allowing for the evaluation of ever more complex structures within a given computation time. We show different results for enclosures in two dimensions and also illustrate the time savings of splay trees in three dimensions. At the time of the conference we will also show three-dimensional shielding problems.
{"title":"Fast and accurate evaluation of enclosures with the method of moments by using splay trees","authors":"F. Olyslager, J. Fostier, J. Peeters, D. De Zutter","doi":"10.1109/EMCZUR.2007.4388202","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388202","url":null,"abstract":"In this contribution we extend our work on the application of boundary integral equations to accurately predict the shielding properties of complex enclosure geometries. The focus of this contribution is on the power of the splay tree algorithm to efficiently extract symmetry properties from a geometry. We will show that by using these splay trees in two as well as three dimensions significant savings in CPU time can be achieved allowing for the evaluation of ever more complex structures within a given computation time. We show different results for enclosures in two dimensions and also illustrate the time savings of splay trees in three dimensions. At the time of the conference we will also show three-dimensional shielding problems.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132544295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388223
J. Schoene, M. Uman, V. Rakov, J. Jerauld, J. Howard, Britt D. Hanley, K. Rambo, B. DeCarlo
Currents in (1) a 100 m by 30 m buried rectangular loop conductor (counterpoise) and (2) a grounded vertical conductor of 7 m height induced by natural and rocket-triggered lightning at distances ranging from 60 to 300 m were recorded in 2005 at the International Center for Lightning Research and Testing (ICLRT). The peak values of 12 triggered lightning channel-base currents and the peak values of the induced currents in the counterpoise are strongly correlated. The first few microseconds of the current induced in the vertical conductor by triggered lightning return strokes 100 m away resemble electric field time derivative waveforms simultaneously measured at the ICLRT. During a close natural lightning flash, five pre-first return stroke current pulses with peak currents up to 140 A were measured in the vertical conductor. These are apparently associated with multiple attempts of an upwarddirected unconnected leader in response to the charge lowered by downward-propagating leader steps.
{"title":"Lightning-induced currents in a buried loop conductor and a grounded vertical conductor","authors":"J. Schoene, M. Uman, V. Rakov, J. Jerauld, J. Howard, Britt D. Hanley, K. Rambo, B. DeCarlo","doi":"10.1109/EMCZUR.2007.4388223","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388223","url":null,"abstract":"Currents in (1) a 100 m by 30 m buried rectangular loop conductor (counterpoise) and (2) a grounded vertical conductor of 7 m height induced by natural and rocket-triggered lightning at distances ranging from 60 to 300 m were recorded in 2005 at the International Center for Lightning Research and Testing (ICLRT). The peak values of 12 triggered lightning channel-base currents and the peak values of the induced currents in the counterpoise are strongly correlated. The first few microseconds of the current induced in the vertical conductor by triggered lightning return strokes 100 m away resemble electric field time derivative waveforms simultaneously measured at the ICLRT. During a close natural lightning flash, five pre-first return stroke current pulses with peak currents up to 140 A were measured in the vertical conductor. These are apparently associated with multiple attempts of an upwarddirected unconnected leader in response to the charge lowered by downward-propagating leader steps.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131095072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388249
C. Faure, David Roux, Elisabeth Beaubois, S. Girard, P. Bonnet, F. Paladian, G. Ledoigt, A. Vian
Exposing tomato plant to low amplitude high frequency electromagnetic field results in an immediate (15-60 minutes) and strong (3-7 fold) accumulation of stress-related transcripts. These accumulations are systemic, observed in exposed organ (local response) as well as in protected tissue (distant response). Tomato mutants deficient for abscisic acid display only the local response but lack the distant one. We propose that EMF exposition evokes the genesis of an informative signal, dependant upon ABA metabolism, that is rapidly widespread through the plant.
{"title":"Systemic response after local exposition to low amplitude HF-EMF in tomato plants","authors":"C. Faure, David Roux, Elisabeth Beaubois, S. Girard, P. Bonnet, F. Paladian, G. Ledoigt, A. Vian","doi":"10.1109/EMCZUR.2007.4388249","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388249","url":null,"abstract":"Exposing tomato plant to low amplitude high frequency electromagnetic field results in an immediate (15-60 minutes) and strong (3-7 fold) accumulation of stress-related transcripts. These accumulations are systemic, observed in exposed organ (local response) as well as in protected tissue (distant response). Tomato mutants deficient for abscisic acid display only the local response but lack the distant one. We propose that EMF exposition evokes the genesis of an informative signal, dependant upon ABA metabolism, that is rapidly widespread through the plant.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125406285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-11-27DOI: 10.1109/EMCZUR.2007.4388229
J. J. Nelson, W. Goodwin, M. Steffka, William T. Ivan, M. Kopp
This paper investigates the adaptation of the standard 12V automotive conducted emissions component EMC measurement method, as defined in CISPR 25, to the ever increasing high voltage automotive components seen in hybrid electric, fuel cell, and the alike vehicles. Due to significantly higher voltages and currents and variations in shielding strategies, conventional automotive measurement methods do not always produce vehicle representative results. Experimental and simulation results are presented which show that artificial networks, as defined in CISPR 25, should not be used for validation of high voltage automotive components in either conducted voltage or current measurements.
{"title":"High voltage automotive EMC component measurements using an artificial network","authors":"J. J. Nelson, W. Goodwin, M. Steffka, William T. Ivan, M. Kopp","doi":"10.1109/EMCZUR.2007.4388229","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388229","url":null,"abstract":"This paper investigates the adaptation of the standard 12V automotive conducted emissions component EMC measurement method, as defined in CISPR 25, to the ever increasing high voltage automotive components seen in hybrid electric, fuel cell, and the alike vehicles. Due to significantly higher voltages and currents and variations in shielding strategies, conventional automotive measurement methods do not always produce vehicle representative results. Experimental and simulation results are presented which show that artificial networks, as defined in CISPR 25, should not be used for validation of high voltage automotive components in either conducted voltage or current measurements.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121899546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-01DOI: 10.1109/EMCZUR.2007.4388219
Ye Zhu, M. Klingler, F. Paladian
This communication proposes a new method to evaluate the differential mode scattering parameters of cable harnesses from the scattering parameters calculated or obtained conventionally in common mode. Considering a reference conductor instead of a ground plane, the characterization of coupling effects by means of differential mode S-parameters is of great practical interest in automotive applications. In order to show the efficiency of the method, an example of crosstalk prediction is provided.
{"title":"A method to convert scattering parameters from common mode to differential mode for automotive applications","authors":"Ye Zhu, M. Klingler, F. Paladian","doi":"10.1109/EMCZUR.2007.4388219","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388219","url":null,"abstract":"This communication proposes a new method to evaluate the differential mode scattering parameters of cable harnesses from the scattering parameters calculated or obtained conventionally in common mode. Considering a reference conductor instead of a ground plane, the characterization of coupling effects by means of differential mode S-parameters is of great practical interest in automotive applications. In order to show the efficiency of the method, an example of crosstalk prediction is provided.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122970326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-01DOI: 10.1109/EMCZUR.2007.4388276
H. Ryser
This contribution reports on experimental investigations on different uncertainty contributions to the result of the absorbing clamp calibration. The requirements in [1] are confirmed and some additional precautions are described which can further reduce the uncertainty of the calibration.
{"title":"Uncertainty contributions to the clamp factor CF of the absorbing clamp","authors":"H. Ryser","doi":"10.1109/EMCZUR.2007.4388276","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388276","url":null,"abstract":"This contribution reports on experimental investigations on different uncertainty contributions to the result of the absorbing clamp calibration. The requirements in [1] are confirmed and some additional precautions are described which can further reduce the uncertainty of the calibration.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132238890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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