Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.21
J. Fuehne
The Purdue Polytechnic Institute in Columbus utilizes metrology tools with specially designed 3-D printed and machined measurement artifacts to facilitate learning and provide opportunities to demonstrate competency in basic measurement tools. Analog and digital calipers, analog and digital micrometers, Pi tapes, bore micrometers, and dial indicators are all employed during special training sessions designed to educate about various measurement tools, allowing trainees to develop knowledge on how to choose a proper measurement tool. Trainees and students use different tools to measure identical features on a part, highlighting the different scales, resolutions, potential errors and uncertainties, as well as the obvious ease or challenge to utilize each tool. There is an obvious advantage of digital dimensional measurement tools due to the ease of reading the value, but they may not always represent the best tool for the specific task. Little prior experience in measurement may lead to the belief that the value displayed on the tool is correct without considering appropriate procedures, units, and mechanics of actually using the tool – pressure applied to the measurement surface, proper zero-setting of the tool etc. In the case of measuring diameters, is there consideration and evaluation of using a two-point instrument versus a three-point instrument? These issues are highlighted only if different tools are used to measure the same feature. Another issue addressed is using a dial indicator for several geometric dimensioning and tolerancing measurements, such as flatness, parallelism, and perpendicularity. These procedures are demonstrated and participants will perform several of these measurements, discussing afterwards the value and utility of coordinate measuring machines.
{"title":"Training with Various Tools to Facilitate Measurement Instrument Selection","authors":"J. Fuehne","doi":"10.51843/wsproceedings.2020.21","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.21","url":null,"abstract":"The Purdue Polytechnic Institute in Columbus utilizes metrology tools with specially designed 3-D printed and machined measurement artifacts to facilitate learning and provide opportunities to demonstrate competency in basic measurement tools. Analog and digital calipers, analog and digital micrometers, Pi tapes, bore micrometers, and dial indicators are all employed during special training sessions designed to educate about various measurement tools, allowing trainees to develop knowledge on how to choose a proper measurement tool. Trainees and students use different tools to measure identical features on a part, highlighting the different scales, resolutions, potential errors and uncertainties, as well as the obvious ease or challenge to utilize each tool. There is an obvious advantage of digital dimensional measurement tools due to the ease of reading the value, but they may not always represent the best tool for the specific task. Little prior experience in measurement may lead to the belief that the value displayed on the tool is correct without considering appropriate procedures, units, and mechanics of actually using the tool – pressure applied to the measurement surface, proper zero-setting of the tool etc. In the case of measuring diameters, is there consideration and evaluation of using a two-point instrument versus a three-point instrument? These issues are highlighted only if different tools are used to measure the same feature. Another issue addressed is using a dial indicator for several geometric dimensioning and tolerancing measurements, such as flatness, parallelism, and perpendicularity. These procedures are demonstrated and participants will perform several of these measurements, discussing afterwards the value and utility of coordinate measuring machines.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129905532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.18
Uğurcan Akyüz
In the past, like many companies, we tried to automate the data collection of handheld meters and other devices using Optical Character Recognition (OCR) technology, only to learn OCR technology has its limitations; we discovered any change in position, lighting, angle and even glare would throw off the OCR, resulting in bad numbers. So we changed direction and switched to Artificial Intelligence (AI) with Deep Learning algorithms. Our goal was to implement a “learn as you go,” AI-assisted solution that will learn to read a handheld meter as good, or better than, a human. The continual learning/training would train the AI to read measurements at any angle, in most lighting conditions. The trained AI would even be smart enough to understand scaled values based on the prefixes. Over time, with a much larger data set, the AI would be able to read just about any new display.
{"title":"Deep Learning & Artificial Intelligence can Solve Measurement Problems with Estimated Confidence ","authors":"Uğurcan Akyüz","doi":"10.51843/wsproceedings.2020.18","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.18","url":null,"abstract":"In the past, like many companies, we tried to automate the data collection of handheld meters and other devices using Optical Character Recognition (OCR) technology, only to learn OCR technology has its limitations; we discovered any change in position, lighting, angle and even glare would throw off the OCR, resulting in bad numbers. So we changed direction and switched to Artificial Intelligence (AI) with Deep Learning algorithms. Our goal was to implement a “learn as you go,” AI-assisted solution that will learn to read a handheld meter as good, or better than, a human. The continual learning/training would train the AI to read measurements at any angle, in most lighting conditions. The trained AI would even be smart enough to understand scaled values based on the prefixes. Over time, with a much larger data set, the AI would be able to read just about any new display.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115931927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.02
N. Fletcher, John D. Williams, A. Tzalenchuk, J. Janssen, Becky King, Connor D. Shelly, Kieran Edmonds
The redefinition of the SI base units ampere and kilogram in 2019 formalized the use of the quantum Hall effect (QHE) to provide resistance traceability (the SI ohm) from the fundamental constants h and e. Traditionally, realization of the ohm via the QHE has required large complex liquid helium cryostats (including a high field superconducting magnet), and been largely confined to National Measurement Institutes. In recent years, graphene has been demonstrated as an ideal material for QHE samples, offering access to the quantum resistance reference (RK=h/e2) at lower magnetic fields and higher temperatures than previously possible. We present a system that builds on this technological advance, combined with liquid helium-free (closed cycle) cryogenic cooling techniques. The system integrates both a graphene QHE reference and a Cryogenic Current Comparator (CCC) instrument into a single compact enclosure. Resistance bridges based around a CCC offer the ultimate accuracy and noise performance for comparisons of conventional room temperature standard resistors to the QHE reference, and for scaling between different decade values, but this technology has not previously been demonstrated without the use of liquid helium. Our CCC system also integrates a second cryogenic SQUID detector to operate as the critical nanovoltmeter in the bridge electronics. We use a latest generation polymer-encapsulated molecular doped epigraphene sample optimized for operation at the 5 T field of our compact magnet, which does not require any user tuning of device properties on repeated cool-down cycles. Combined with the cryogen-free cooling, this gives a truly ‘turn-key’ system, making the quantum resistance reference and CCC accuracy available 24/7 in the metrology laboratory with no regular user intervention. The system is designed for both the realisation of the ohm at 100 Ω and regular calibration of standard resistors in the range 1 Ω to 10 kΩ, with combined relative standard uncertainties down to 0.01 ppm in the best cases.
{"title":"A Compact Self-Contained Cryogen-Free Instrument for the Realization of the Ohm in the Revised SI","authors":"N. Fletcher, John D. Williams, A. Tzalenchuk, J. Janssen, Becky King, Connor D. Shelly, Kieran Edmonds","doi":"10.51843/wsproceedings.2020.02","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.02","url":null,"abstract":"The redefinition of the SI base units ampere and kilogram in 2019 formalized the use of the quantum Hall effect (QHE) to provide resistance traceability (the SI ohm) from the fundamental constants h and e. Traditionally, realization of the ohm via the QHE has required large complex liquid helium cryostats (including a high field superconducting magnet), and been largely confined to National Measurement Institutes. In recent years, graphene has been demonstrated as an ideal material for QHE samples, offering access to the quantum resistance reference (RK=h/e2) at lower magnetic fields and higher temperatures than previously possible. We present a system that builds on this technological advance, combined with liquid helium-free (closed cycle) cryogenic cooling techniques. The system integrates both a graphene QHE reference and a Cryogenic Current Comparator (CCC) instrument into a single compact enclosure. Resistance bridges based around a CCC offer the ultimate accuracy and noise performance for comparisons of conventional room temperature standard resistors to the QHE reference, and for scaling between different decade values, but this technology has not previously been demonstrated without the use of liquid helium. Our CCC system also integrates a second cryogenic SQUID detector to operate as the critical nanovoltmeter in the bridge electronics. We use a latest generation polymer-encapsulated molecular doped epigraphene sample optimized for operation at the 5 T field of our compact magnet, which does not require any user tuning of device properties on repeated cool-down cycles. Combined with the cryogen-free cooling, this gives a truly ‘turn-key’ system, making the quantum resistance reference and CCC accuracy available 24/7 in the metrology laboratory with no regular user intervention. The system is designed for both the realisation of the ohm at 100 Ω and regular calibration of standard resistors in the range 1 Ω to 10 kΩ, with combined relative standard uncertainties down to 0.01 ppm in the best cases.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131023504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.24
William B. Miller
This paper revisits the impacts of using or not using contract reviews and discusses terminology for the reviews. Are they just for ISO 17025i calibration accreditations or does everybody need them? What are the costs of just asking for a calibration from a calibration agency? Is it possible your calibration agency has provided you with an accredited calibration that is not traceable to the SI leaving you with a contractual violation? Questions that date back to around the 5th century BC will be discussed to see if we can break the pattern.
{"title":"Contract Reviews – Does Anybody Really Them?","authors":"William B. Miller","doi":"10.51843/wsproceedings.2020.24","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.24","url":null,"abstract":"This paper revisits the impacts of using or not using contract reviews and discusses terminology for the reviews. Are they just for ISO 17025i calibration accreditations or does everybody need them? What are the costs of just asking for a calibration from a calibration agency? Is it possible your calibration agency has provided you with an accredited calibration that is not traceable to the SI leaving you with a contractual violation? Questions that date back to around the 5th century BC will be discussed to see if we can break the pattern.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116651343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.08
Julian C.P
At the Standards and Calibration Laboratory (SCL), a method to measure the performance of temperature chamber was developed based on the international standard IEC 60068-3-5 – Environmental Testing – Part 3-5: (2018) Confirmation of the Performance of Temperature Chambers. A multi-channel temperature logger with platinum resistance thermometer sensors was used for the measurement. In this paper, details on the setup and procedure for the measurement of the achieved temperature, temperature fluctuation, temperature gradient, temperature variation in space and temperature rate of change of a chamber are provided. Examples of measurement results and the method for uncertainty evaluation are also presented.
{"title":"Measuring the Performance of Temperature Chambers in Accordance with IEC60068-3-5:2018","authors":"Julian C.P","doi":"10.51843/wsproceedings.2020.08","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.08","url":null,"abstract":"At the Standards and Calibration Laboratory (SCL), a method to measure the performance of temperature chamber was developed based on the international standard IEC 60068-3-5 – Environmental Testing – Part 3-5: (2018) Confirmation of the Performance of Temperature Chambers. A multi-channel temperature logger with platinum resistance thermometer sensors was used for the measurement. In this paper, details on the setup and procedure for the measurement of the achieved temperature, temperature fluctuation, temperature gradient, temperature variation in space and temperature rate of change of a chamber are provided. Examples of measurement results and the method for uncertainty evaluation are also presented.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132350519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.17
Harry C Spinks
Spreadsheets are one of the most versatile document formats in use today. They can be used for a multitude of purposes: instructional or informative document, financial analysis, data analysis, charts, numerical calculations, checklists, data entry forms, and information management, to name a few. The list is virtually endless. ISO/IEC 17025:2017 General Requirements for the Competence of Testing and Calibration Laboratories requires spreadsheets to be validated if they affect the quality of the laboratory results. This can occur in three distinct areas – measurement uncertainty budgets, information management, and methods. Failure to validate spreadsheets may result in an assessment/audit nonconformance and ss a calibration accreditation assessor, I have rarely seen spreadsheets validated. This is usually because spreadsheets aren’t looked at as part of the method (calibration procedure) or the information management system. Spreadsheets should be validated for any application and in any industry if they contain calculations that may affect the quality of the organizations product or service. Spreadsheets are required to be validated in organizations regulated by the FDA such as medical devices and pharmaceutical manufacturers. This paper will explain why spreadsheets need to be validated, the applicable sections of ISO/IEC 17025:2017, and the basics on how to validate a spreadsheet.
{"title":"ISO/IEC 17025:2017 Spreadsheet Validation – the details","authors":"Harry C Spinks","doi":"10.51843/wsproceedings.2020.17","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.17","url":null,"abstract":"Spreadsheets are one of the most versatile document formats in use today. They can be used for a multitude of purposes: instructional or informative document, financial analysis, data analysis, charts, numerical calculations, checklists, data entry forms, and information management, to name a few. The list is virtually endless. ISO/IEC 17025:2017 General Requirements for the Competence of Testing and Calibration Laboratories requires spreadsheets to be validated if they affect the quality of the laboratory results. This can occur in three distinct areas – measurement uncertainty budgets, information management, and methods. Failure to validate spreadsheets may result in an assessment/audit nonconformance and ss a calibration accreditation assessor, I have rarely seen spreadsheets validated. This is usually because spreadsheets aren’t looked at as part of the method (calibration procedure) or the information management system. Spreadsheets should be validated for any application and in any industry if they contain calculations that may affect the quality of the organizations product or service. Spreadsheets are required to be validated in organizations regulated by the FDA such as medical devices and pharmaceutical manufacturers. This paper will explain why spreadsheets need to be validated, the applicable sections of ISO/IEC 17025:2017, and the basics on how to validate a spreadsheet.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131613311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.14
L. Chao
After the recent redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated mass in a gravitational field suspended from a known lever arm and disseminated through a chain of torque transducers. An SI-traceable torque can be directly realized using the Kibble principle where a torque is generated by a calibrated electromagnetic transducer. Here, a set of theoretical designs for a new instrument aimed at direct realization of torque to 0.1% accuracy is analyzed and examined for feasibility. With careful attention to magnet design, a robust and easily implemented torque calibrator can be built.
{"title":"The Design of an Instrument to Realize Small Torque at NIST ","authors":"L. Chao","doi":"10.51843/wsproceedings.2020.14","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.14","url":null,"abstract":"After the recent redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated mass in a gravitational field suspended from a known lever arm and disseminated through a chain of torque transducers. An SI-traceable torque can be directly realized using the Kibble principle where a torque is generated by a calibrated electromagnetic transducer. Here, a set of theoretical designs for a new instrument aimed at direct realization of torque to 0.1% accuracy is analyzed and examined for feasibility. With careful attention to magnet design, a robust and easily implemented torque calibrator can be built.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122062065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.10
H. W. Lai, C. Ma, S. Yang, C. Tsui
Videos recorded by CCTVs or car cameras are often tendered as evidences in legal proceedings and traffic accident investigations. Important information such as vehicle speed may be estimated from the video data to support the case. In such applications, to satisfy the standard of proof in a court of law, the timing parameters of the cameras must be calibrated. A specially designed frame interval timer called the Lightboard is being used in some jurisdictions to determine the frame interval of video recorded by a camera. The accuracy of the time base in this frame interval timer in turn need to be calibrated. This paper proposed methods to calibrate the flashing period and the time difference between two synchronized LED panels of a Lightboard system.
{"title":"Calibration of the Period and Time Difference of Synchronized Flashing Lights","authors":"H. W. Lai, C. Ma, S. Yang, C. Tsui","doi":"10.51843/wsproceedings.2020.10","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.10","url":null,"abstract":"Videos recorded by CCTVs or car cameras are often tendered as evidences in legal proceedings and traffic accident investigations. Important information such as vehicle speed may be estimated from the video data to support the case. In such applications, to satisfy the standard of proof in a court of law, the timing parameters of the cameras must be calibrated. A specially designed frame interval timer called the Lightboard is being used in some jurisdictions to determine the frame interval of video recorded by a camera. The accuracy of the time base in this frame interval timer in turn need to be calibrated. This paper proposed methods to calibrate the flashing period and the time difference between two synchronized LED panels of a Lightboard system.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133702403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.23
M. Kuster
Have you heard of digital calibration certificates? Digital metrology? The digital quality infrastructure? The European Metrology Cloud? These globally scattered initiatives all seek to upgrade our industry from Metrology 2.5 to Metrology 4.0 by automating our remaining manual systems via networked intercommunication. Laboratories have long since automated many of their test and measurement processes, but the global quality infrastructure remains mired in paper and pdf documents that a) require subject-matter experts to interpret, and b) omit information that would have value if automatically put to use. NCSLI’s own initiative, the Measurement Information Infrastructure (MII), envisions a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information seamlessly among our computing systems with little to no manual intervention. In this panel session, the NCSLI MII & Automation Committee will present its MII Vision, progress and outlook and describe some of the ongoing efforts. An open discussion and Q&A session will follow so that you may understand how an MII might affect your business and value stream.
{"title":"Measurement Information Infrastructure (MII) Projects and Outlook ","authors":"M. Kuster","doi":"10.51843/wsproceedings.2020.23","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.23","url":null,"abstract":"Have you heard of digital calibration certificates? Digital metrology? The digital quality infrastructure? The European Metrology Cloud? These globally scattered initiatives all seek to upgrade our industry from Metrology 2.5 to Metrology 4.0 by automating our remaining manual systems via networked intercommunication. Laboratories have long since automated many of their test and measurement processes, but the global quality infrastructure remains mired in paper and pdf documents that a) require subject-matter experts to interpret, and b) omit information that would have value if automatically put to use. NCSLI’s own initiative, the Measurement Information Infrastructure (MII), envisions a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information seamlessly among our computing systems with little to no manual intervention. In this panel session, the NCSLI MII & Automation Committee will present its MII Vision, progress and outlook and describe some of the ongoing efforts. An open discussion and Q&A session will follow so that you may understand how an MII might affect your business and value stream.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116609952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2020.26
Yulieth Fernanda Gutiérrez León
Piston/cylinder assemblies are widely used in the calibration of pressure measuring equipment whose principle of operation is to generate pressure by positioning non-standard weights which generate radial forces when compressing the fluid. The dimensional characterization of the piston/cylinder assemblies is fundamental to the realizations the pressure measurement made with piston/cylinder assemblies. There diameter, straightness and roundness measurements were made for the PG 0806 of the pressure laboratory of the INM - Colombia, both for the cylinder and the piston itself. To do this measurement the Brown & Sharpe coordinate measuring machine (CMM) of the dimensional laboratory of the INM was used. With the measuring method described, we were capable to measure the effective area with a relative uncertainty about 9.7x10-5.
{"title":"Dimensional Characterization and Effective Area Estimation of the 35 mm Piston/Cylinder Assembly -PG0806","authors":"Yulieth Fernanda Gutiérrez León","doi":"10.51843/wsproceedings.2020.26","DOIUrl":"https://doi.org/10.51843/wsproceedings.2020.26","url":null,"abstract":"Piston/cylinder assemblies are widely used in the calibration of pressure measuring equipment whose principle of operation is to generate pressure by positioning non-standard weights which generate radial forces when compressing the fluid. The dimensional characterization of the piston/cylinder assemblies is fundamental to the realizations the pressure measurement made with piston/cylinder assemblies. There diameter, straightness and roundness measurements were made for the PG 0806 of the pressure laboratory of the INM - Colombia, both for the cylinder and the piston itself. To do this measurement the Brown & Sharpe coordinate measuring machine (CMM) of the dimensional laboratory of the INM was used. With the measuring method described, we were capable to measure the effective area with a relative uncertainty about 9.7x10-5.","PeriodicalId":422993,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2020","volume":"345 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123706965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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