Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619830
M. Yoshiura, F. Yoshida
The development of the dye-sensitized solar cell (DSC) has been expected to supply another solar cell other than the silicon solar cells, for its convenient production processes. The nano-porous titanium oxide (TiO2) layer, photo-electrode of DSC, is constructed on a F-doped SnO2 transparent electrode(FTO), before the dye deposition. The structure of the porous TiO2 layer, such as the existence of charge traps, seems to influence the photoelectric conversion efficiency of DSC. The possibility of estimating the photo-electrode efficiency by the charge trap structure was studied with thermally stimulated current (TSC) measurement. As a result of the TSC measurement, four charge traps were detected in the electrode and were evaluated the energy trap depths of 0.07 eV, 0.138 eV, 0.385 eV and 0.381 eV. The escape frequency factors were also evaluated in large span from 10 s-1 to 108 s-1.
{"title":"Evaluation of defect levels formed in the nano-porous titanium oxide layer of dye-sensitized solar cell","authors":"M. Yoshiura, F. Yoshida","doi":"10.1109/ICSD.2013.6619830","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619830","url":null,"abstract":"The development of the dye-sensitized solar cell (DSC) has been expected to supply another solar cell other than the silicon solar cells, for its convenient production processes. The nano-porous titanium oxide (TiO2) layer, photo-electrode of DSC, is constructed on a F-doped SnO2 transparent electrode(FTO), before the dye deposition. The structure of the porous TiO2 layer, such as the existence of charge traps, seems to influence the photoelectric conversion efficiency of DSC. The possibility of estimating the photo-electrode efficiency by the charge trap structure was studied with thermally stimulated current (TSC) measurement. As a result of the TSC measurement, four charge traps were detected in the electrode and were evaluated the energy trap depths of 0.07 eV, 0.138 eV, 0.385 eV and 0.381 eV. The escape frequency factors were also evaluated in large span from 10 s-1 to 108 s-1.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125136551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619828
G. Meng, Yonghong Cheng, Liang Chen, Yu Chen, Kai Wu
Micro-electro-mechanical systems (MEMS) and Nano-electro-mechanical systems (NEMS) are emerging technologies that uses tools and techniques in the microelectronics industry to build microscopic machines. Electrostatic force is often employed to drive the motion components in MEMS and NEMS devices, which could cause extremely high electric field (more than 108 V/m) between two metal conductors. However, the high field intensity may result in electrical breakdown across the conductors in case of improper operations or overvoltage. Therefore, this paper presented a novel experimental technique to study the discharge behaviors across nanometer gaps between 20 nm and 300 nm. The influence of gap separations on breakdown characteristics and the voltage contrast effect in the gap spacing were both investigated. Results showed that the field electron emission did not play a dominate role in the electrical breakdown process across nanometer gaps, which was different from the classical theory of vacuum breakdown, and the breakdown voltage increased as the increase of gap separations. Besides, the voltage contrast effect in the gap spacing was also observed through the scanning electron microscope, which was related to the electric field intensity.
{"title":"Discharge behaviors of electrical breakdown across nanometer vacuum gaps","authors":"G. Meng, Yonghong Cheng, Liang Chen, Yu Chen, Kai Wu","doi":"10.1109/ICSD.2013.6619828","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619828","url":null,"abstract":"Micro-electro-mechanical systems (MEMS) and Nano-electro-mechanical systems (NEMS) are emerging technologies that uses tools and techniques in the microelectronics industry to build microscopic machines. Electrostatic force is often employed to drive the motion components in MEMS and NEMS devices, which could cause extremely high electric field (more than 108 V/m) between two metal conductors. However, the high field intensity may result in electrical breakdown across the conductors in case of improper operations or overvoltage. Therefore, this paper presented a novel experimental technique to study the discharge behaviors across nanometer gaps between 20 nm and 300 nm. The influence of gap separations on breakdown characteristics and the voltage contrast effect in the gap spacing were both investigated. Results showed that the field electron emission did not play a dominate role in the electrical breakdown process across nanometer gaps, which was different from the classical theory of vacuum breakdown, and the breakdown voltage increased as the increase of gap separations. Besides, the voltage contrast effect in the gap spacing was also observed through the scanning electron microscope, which was related to the electric field intensity.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127930052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619673
L. Zeghichi, L. Mokhnache, M. Djebabra
The aim of this work is to present the contribution of the Monte Carlo Method to simulate the basic phenomena in an electrical discharge, taking into account the different processes of atomic collisions (elastic or inelastic), in the case of oxygene and in a plan-plan system. Results have been compared with modelisation results to verify the breakdown criteria. The determination of the ambient electrical field depends on distributions of charged particles; by solving the Maxwell equations we get the resulting radial field.
{"title":"The Monte Carlo Method for the study of an electrical discharge","authors":"L. Zeghichi, L. Mokhnache, M. Djebabra","doi":"10.1109/ICSD.2013.6619673","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619673","url":null,"abstract":"The aim of this work is to present the contribution of the Monte Carlo Method to simulate the basic phenomena in an electrical discharge, taking into account the different processes of atomic collisions (elastic or inelastic), in the case of oxygene and in a plan-plan system. Results have been compared with modelisation results to verify the breakdown criteria. The determination of the ambient electrical field depends on distributions of charged particles; by solving the Maxwell equations we get the resulting radial field.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129754009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619864
J. Ho, T. Jow
Poly(aryl ether ether ketone) (PEEK) is one of the primary candidates for a high temperature capacitor dielectric as a result of its outstanding mechanical strength and thermal stability. However, its breakdown strength is unsatisfactory (~400 MV/m) and high field (>100 MV/m) volumetric resistivity at elevated temperature is largely unknown. In this work, the inter-relationship among crystallinity, morphology, breakdown strength, and volumetric resistivity of PEEK at elevated temperature is studied in order to gain insight to factors which adversely affect breakdown. This paper presents preliminary results of the study.
{"title":"Effect of crystallinity and morphology on dielectric properties of PEEK at elevated temperature","authors":"J. Ho, T. Jow","doi":"10.1109/ICSD.2013.6619864","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619864","url":null,"abstract":"Poly(aryl ether ether ketone) (PEEK) is one of the primary candidates for a high temperature capacitor dielectric as a result of its outstanding mechanical strength and thermal stability. However, its breakdown strength is unsatisfactory (~400 MV/m) and high field (>100 MV/m) volumetric resistivity at elevated temperature is largely unknown. In this work, the inter-relationship among crystallinity, morphology, breakdown strength, and volumetric resistivity of PEEK at elevated temperature is studied in order to gain insight to factors which adversely affect breakdown. This paper presents preliminary results of the study.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130282446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619748
D. van der Born, I. Tsekmes, P. Morshuis, J. J. Smit, T. J. Person, S. J. Sutton
Polymeric insulation materials have not been used in HVDC cable systems until recently because of the tendency of polymers to deplete accumulated charges very slowly. Research on space charge injection, conduction and trapping mechanisms can reveal information about which materials are the best candidates for HVDC cable insulation. In this paper, space charge de-trapping and extraction processes are evaluated in polymeric mini-cables consisting of several different XLPE based insulation materials and PE based semi-conductive layers. The main difference between the materials can be found in the type and concentration of additives. De-trapping and extraction of accumulated space charge in the insulation is investigated with the help of depolarization measurements, which are performed with the Pulsed Electro-Acoustic (PEA) method for cable geometry objects.
{"title":"Evaluation of apparent trap-controlled mobility and trap depth in polymeric HVDC mini-cables","authors":"D. van der Born, I. Tsekmes, P. Morshuis, J. J. Smit, T. J. Person, S. J. Sutton","doi":"10.1109/ICSD.2013.6619748","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619748","url":null,"abstract":"Polymeric insulation materials have not been used in HVDC cable systems until recently because of the tendency of polymers to deplete accumulated charges very slowly. Research on space charge injection, conduction and trapping mechanisms can reveal information about which materials are the best candidates for HVDC cable insulation. In this paper, space charge de-trapping and extraction processes are evaluated in polymeric mini-cables consisting of several different XLPE based insulation materials and PE based semi-conductive layers. The main difference between the materials can be found in the type and concentration of additives. De-trapping and extraction of accumulated space charge in the insulation is investigated with the help of depolarization measurements, which are performed with the Pulsed Electro-Acoustic (PEA) method for cable geometry objects.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130471723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619863
J. Ardila-Rey, J. Martínez-Tarifa, M. Mejino, R. Albarracín, M. Rojas-Moreno, G. Robles
Electromagnetic radiation emissions from partial discharges (PD) can be measured, which could be helpful for avoiding unwanted asset disconnections in the power grid for insulation evaluation. These radio-frequency (RF) measurements do not require galvanic contact with high-voltage (HV) devices, which seems to be a clear advantage, but the lack of synchronization voltage makes PD source recognition a difficult task. Moreover, the presence of RF noise sources in the wideband required for PD detection, can lead to false warnings in the HV apparatus evaluation. In this paper, some specific parameters for signal characterization have been used in three-dimensional maps: signal energy, bandwidth and characteristic frequency. A digital acquisition system has been programmed to measure thousands of emissions from environmental noise and controlled PD sources in laboratory experiments. The aim of this paper is to state if this signal classification technique is reliable for PD and noise characterization in the RF range.
{"title":"Chromatic classification of RF signals for partial discharges and noise characterization","authors":"J. Ardila-Rey, J. Martínez-Tarifa, M. Mejino, R. Albarracín, M. Rojas-Moreno, G. Robles","doi":"10.1109/ICSD.2013.6619863","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619863","url":null,"abstract":"Electromagnetic radiation emissions from partial discharges (PD) can be measured, which could be helpful for avoiding unwanted asset disconnections in the power grid for insulation evaluation. These radio-frequency (RF) measurements do not require galvanic contact with high-voltage (HV) devices, which seems to be a clear advantage, but the lack of synchronization voltage makes PD source recognition a difficult task. Moreover, the presence of RF noise sources in the wideband required for PD detection, can lead to false warnings in the HV apparatus evaluation. In this paper, some specific parameters for signal characterization have been used in three-dimensional maps: signal energy, bandwidth and characteristic frequency. A digital acquisition system has been programmed to measure thousands of emissions from environmental noise and controlled PD sources in laboratory experiments. The aim of this paper is to state if this signal classification technique is reliable for PD and noise characterization in the RF range.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117122838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619783
Liyuan Xie, Yanhui Huang, Fei Liu, Xingyi Huang, P. Jiang
Barium titanate@ poly (methyl methacrylate) (BT@PMMA) nanocomposites were prepared via in situ atom transfer radical polymerization (ATRP). It was observed that the BT nanoparticles were coated with PMMA and excellently dispersed in the polymer matrix. Compared with the BT/PMMA nanocomposites prepared by the traditional solution blending, BT@PMMA nanocomposites show higher thermal conductivity and lower dielectric loss. The result is attributed to the strong interfacial bonding between the BT nanoparticles and the PMMA matrix.
{"title":"Comparative investigation on dielectric property and thermal conductivity of in situ polymerized and solution mixed polymer nanocoposites","authors":"Liyuan Xie, Yanhui Huang, Fei Liu, Xingyi Huang, P. Jiang","doi":"10.1109/ICSD.2013.6619783","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619783","url":null,"abstract":"Barium titanate@ poly (methyl methacrylate) (BT@PMMA) nanocomposites were prepared via in situ atom transfer radical polymerization (ATRP). It was observed that the BT nanoparticles were coated with PMMA and excellently dispersed in the polymer matrix. Compared with the BT/PMMA nanocomposites prepared by the traditional solution blending, BT@PMMA nanocomposites show higher thermal conductivity and lower dielectric loss. The result is attributed to the strong interfacial bonding between the BT nanoparticles and the PMMA matrix.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122625075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619690
Xingyi Huang, Fei Liu, P. Jiang, Toshikatsu Tanaka
Graphene and graphene oxide are increasingly attracting worldwide attention from academia and industry. The physical properties of graphene have been documented recently, and we have known that the sea of electrons in the two-dimensional, single layer of sp2 hybridized carbon atoms causes graphene to act both as electrical and thermal conductors. In contrast, graphene oxide, an oxidized graphene sheet with carboxylic acid at the edges and phenol hydroxyl and epoxide groups on the basal plane, is generally considered to be an insulating material. Is graphene oxide is an insulating material? This work tries to answer this question by measuring the temperature-dependent electrical property of graphene oxide paper by using a broadband dielectric spectroscopy.
{"title":"Is graphene oxide an insulating material?","authors":"Xingyi Huang, Fei Liu, P. Jiang, Toshikatsu Tanaka","doi":"10.1109/ICSD.2013.6619690","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619690","url":null,"abstract":"Graphene and graphene oxide are increasingly attracting worldwide attention from academia and industry. The physical properties of graphene have been documented recently, and we have known that the sea of electrons in the two-dimensional, single layer of sp2 hybridized carbon atoms causes graphene to act both as electrical and thermal conductors. In contrast, graphene oxide, an oxidized graphene sheet with carboxylic acid at the edges and phenol hydroxyl and epoxide groups on the basal plane, is generally considered to be an insulating material. Is graphene oxide is an insulating material? This work tries to answer this question by measuring the temperature-dependent electrical property of graphene oxide paper by using a broadband dielectric spectroscopy.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121720701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619904
Naiyi Li, Tianxi Xie, Zongren Peng, Shiling Zhang
Corona test is necessary for verifying the validity of grading ring design for insulators on ac transmission lines. But there seems a lack of standards about simulation test method for ultra-high voltage (UHV) power fittings, such as grading ring for insulators. This paper describes a test approach that specifically applies to grading ring for UHV insulators. First, based on finite-element (FE) calculation, a gradient equivalent coefficient which reflects difference of electric stresses acting on surface of grading rings mounted on different sites is determined. Next, refer to IEC and national standard, an available test voltage is corrected by previous coefficient considering interactions of three-dimensional environment. Finally, the corona test of a type of grading ring for UHV suspension composite insulators is performed using above method as an example. This method shows good effect by field observation on tangent towers with an ultraviolet camera and the tested grading rings have been applied in the UHV pilot project in China successfully.
{"title":"Corona test of grading ring for UHV insulators using gradient equivalent method","authors":"Naiyi Li, Tianxi Xie, Zongren Peng, Shiling Zhang","doi":"10.1109/ICSD.2013.6619904","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619904","url":null,"abstract":"Corona test is necessary for verifying the validity of grading ring design for insulators on ac transmission lines. But there seems a lack of standards about simulation test method for ultra-high voltage (UHV) power fittings, such as grading ring for insulators. This paper describes a test approach that specifically applies to grading ring for UHV insulators. First, based on finite-element (FE) calculation, a gradient equivalent coefficient which reflects difference of electric stresses acting on surface of grading rings mounted on different sites is determined. Next, refer to IEC and national standard, an available test voltage is corrected by previous coefficient considering interactions of three-dimensional environment. Finally, the corona test of a type of grading ring for UHV suspension composite insulators is performed using above method as an example. This method shows good effect by field observation on tangent towers with an ultraviolet camera and the tested grading rings have been applied in the UHV pilot project in China successfully.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122754073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-08DOI: 10.1109/ICSD.2013.6619870
D. Tehlar, U. Riechert, G. Behrmann, Markus Schraudolph
Top quality high voltage pre-test of solid insulating material requires long test intervals because the initiation of partial discharge (PD) in voids not only demands a sufficiently high electric field, but also the availability of a start electron. The latter leads to a statistical distribution of the time to PD inception, such that long test intervals are required to rule out the presence of voids. This makes 100% screening economically infeasible. However, if the PD is activated using ionizing radiation, the necessary test interval can be reduced to a minimum, without risking that small voids will be missed. It has already been shown that pulsed X-rays are able to trigger PD in voids and not affect the measured PD magnitude. Based on this method, known as Pulsed X-ray Induced Partial Discharge (PXIPD), a test stand for routine testing of insulators up to 420 kV has been developed and put into commercial operation. A very low measurement noise level permits an automatic analysis of the results. Already more than 20,000 insulators for installation in GIS have been screened using this PXIPD method on an industrial scale. Investigation of insulators with natural defects demonstrates the effectiveness and reliability of this new system. In combination with the short test cycle time and the ability to unambiguously link PD to a specific insulator the system allows for a leaner GIS production.
{"title":"Test stand for high voltage insulator partial discharge testing with ultra short X-ray pulses","authors":"D. Tehlar, U. Riechert, G. Behrmann, Markus Schraudolph","doi":"10.1109/ICSD.2013.6619870","DOIUrl":"https://doi.org/10.1109/ICSD.2013.6619870","url":null,"abstract":"Top quality high voltage pre-test of solid insulating material requires long test intervals because the initiation of partial discharge (PD) in voids not only demands a sufficiently high electric field, but also the availability of a start electron. The latter leads to a statistical distribution of the time to PD inception, such that long test intervals are required to rule out the presence of voids. This makes 100% screening economically infeasible. However, if the PD is activated using ionizing radiation, the necessary test interval can be reduced to a minimum, without risking that small voids will be missed. It has already been shown that pulsed X-rays are able to trigger PD in voids and not affect the measured PD magnitude. Based on this method, known as Pulsed X-ray Induced Partial Discharge (PXIPD), a test stand for routine testing of insulators up to 420 kV has been developed and put into commercial operation. A very low measurement noise level permits an automatic analysis of the results. Already more than 20,000 insulators for installation in GIS have been screened using this PXIPD method on an industrial scale. Investigation of insulators with natural defects demonstrates the effectiveness and reliability of this new system. In combination with the short test cycle time and the ability to unambiguously link PD to a specific insulator the system allows for a leaner GIS production.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123120635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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