Pub Date : 2023-10-16DOI: 10.1109/MEI.2023.10286131
Emilio Calo
My name is Emilio Calo, electrical engineer graduated from Universidad Nacional de La Plata (UNLP), Argentina. In 2018 I began my PhD studies at the same university. My research was conducted at the High Voltage Laboratory of IITREE (Instituto de Investigaciones Tecnologicas para Redes $mathrm{y}$ Equipos Electricos), where I also worked as a field engineer focused mainly on power transformers and electrical rotating machinery diagnosis.
我的名字叫埃米利奥·卡罗，毕业于阿根廷国家拉普拉塔大学（UNLP）的电气工程师。2018年，我开始在同一所大学攻读博士学位。我的研究是在IITREE的高压实验室（Instituto de Investigaciones Tecnologiccas para Redes$mathrm{y}$Equipos Electricos）进行的，在那里我还是一名现场工程师，主要专注于电力变压器和旋转电机诊断。
{"title":"Young Professionals","authors":"Emilio Calo","doi":"10.1109/MEI.2023.10286131","DOIUrl":"https://doi.org/10.1109/MEI.2023.10286131","url":null,"abstract":"My name is Emilio Calo, electrical engineer graduated from Universidad Nacional de La Plata (UNLP), Argentina. In 2018 I began my PhD studies at the same university. My research was conducted at the High Voltage Laboratory of IITREE (Instituto de Investigaciones Tecnologicas para Redes \u0000<tex>$mathrm{y}$</tex>\u0000 Equipos Electricos), where I also worked as a field engineer focused mainly on power transformers and electrical rotating machinery diagnosis.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"39 6","pages":"38-39"},"PeriodicalIF":2.9,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/57/10286130/10286131.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41228219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-10-16DOI: 10.1109/MEI.2023.10286191
{"title":"Bulletin Board: Call for Nominations: 2024 Thomas W. Dakin Distinguished Technical Contributions Award Deadline: January 31, 2024","authors":"","doi":"10.1109/MEI.2023.10286191","DOIUrl":"https://doi.org/10.1109/MEI.2023.10286191","url":null,"abstract":"","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"39 6","pages":"51-51"},"PeriodicalIF":2.9,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/57/10286130/10286191.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41228236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-10-16DOI: 10.1109/MEI.2023.10286194
{"title":"Call for Nominations: 2024 Steven A. Boggs Young Professional Achievement Award Deadline: January 31, 2024","authors":"","doi":"10.1109/MEI.2023.10286194","DOIUrl":"https://doi.org/10.1109/MEI.2023.10286194","url":null,"abstract":"","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"39 6","pages":"50-50"},"PeriodicalIF":2.9,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/57/10286130/10286194.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41228203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-10-16DOI: 10.1109/MEI.2023.10286140
Yidong Chen;Kai Zhou;Jiamin Kong;Qi Zhao;Yuan Li;Xiaofeng Xu;Pengxian Song
This article summarizes recent studies on the buffer layer in high-voltage cables, focusing on the white spots phenomenon on the faulted buffer layer.
本文综述了近年来对高压电缆缓冲层的研究，重点研究了故障缓冲层上的白点现象。
{"title":"A Review of Failure Analysis and Detection Methods for Buffer Layers in High-Voltage Cables","authors":"Yidong Chen;Kai Zhou;Jiamin Kong;Qi Zhao;Yuan Li;Xiaofeng Xu;Pengxian Song","doi":"10.1109/MEI.2023.10286140","DOIUrl":"https://doi.org/10.1109/MEI.2023.10286140","url":null,"abstract":"This article summarizes recent studies on the buffer layer in high-voltage cables, focusing on the white spots phenomenon on the faulted buffer layer.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"39 6","pages":"7-15"},"PeriodicalIF":2.9,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41228343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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