Pub Date : 2024-04-25DOI: 10.1109/MEI.2024.10508414
Yoshimichi Ohki
The world's annual average temperature in 2023 is expected to be the highest on record [1]. Although its principal cause is unknown, many people believe the increase in global warming gases such as carbon dioxide is mainly responsible. Therefore, governments, various institutions, and major companies around the world are embarking on countermeasures. For example, efforts are being made to replace conventional power generation using fossil fuels with nuclear power plants and various renewable energy sources that can reduce global warming gases.
{"title":"News From Japan","authors":"Yoshimichi Ohki","doi":"10.1109/MEI.2024.10508414","DOIUrl":"https://doi.org/10.1109/MEI.2024.10508414","url":null,"abstract":"The world's annual average temperature in 2023 is expected to be the highest on record [1]. Although its principal cause is unknown, many people believe the increase in global warming gases such as carbon dioxide is mainly responsible. Therefore, governments, various institutions, and major companies around the world are embarking on countermeasures. For example, efforts are being made to replace conventional power generation using fossil fuels with nuclear power plants and various renewable energy sources that can reduce global warming gases.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 3","pages":"26-28"},"PeriodicalIF":2.9,"publicationDate":"2024-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10508414","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140648038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-25DOI: 10.1109/MEI.2024.10508429
Nihal Kularatna
The following books are reviewed: Energy Smart Appliances: Applications, Methodologies, and Challenges (Moreno-Munoz, A. and N. Giacomini, N.; 2023); Protection of Modern Power Systems (J. Ekanayake, J., et al; 2023); and Electrical and Mechanical Fault Diagnosis in Wind Energy Conversion Systems (Ben Khader Bouzid, M. and Champenois, G.; 2023)
对以下书籍进行了评论：能源智能电器：应用、方法和挑战》（Moreno-Munoz, A. 和 N. Giacomini, N.；2023 年）；《现代电力系统的保护》（J. Ekanayake, J. 等；2023 年）；《风能转换系统中的电气和机械故障诊断》（Ben Khader Bouzid, M. 和 Champenois, G.；2023 年）。
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Pub Date : 2024-04-25DOI: 10.1109/MEI.2024.10508416
Zachary Gibson
Like many of us, I have attended numerous panels, seminars, and workshops geared toward helping young professionals and students. The more senior professionals are gathered for us to question and tap them for wisdom and anecdotes. One such question that inevitably comes up in one form or another is, “How did you get to where you are?” A thinly veiled question intending to ask how can one get to the same or similar position. The response often begins with a soft chuckle and a “well … ” Their answers are caveated by “my path was not the typical path.”
{"title":"Young Professionals","authors":"Zachary Gibson","doi":"10.1109/MEI.2024.10508416","DOIUrl":"https://doi.org/10.1109/MEI.2024.10508416","url":null,"abstract":"Like many of us, I have attended numerous panels, seminars, and workshops geared toward helping young professionals and students. The more senior professionals are gathered for us to question and tap them for wisdom and anecdotes. One such question that inevitably comes up in one form or another is, “How did you get to where you are?” A thinly veiled question intending to ask how can one get to the same or similar position. The response often begins with a soft chuckle and a “well … ” Their answers are caveated by “my path was not the typical path.”","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 3","pages":"31-32"},"PeriodicalIF":2.9,"publicationDate":"2024-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10508416","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140648037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-25DOI: 10.1109/MEI.2024.10508412
Andrea Caprara;Kai Xian Lai;Giacomo Ciotti;Javan Chun Fong Lee;Bing Hong Leck;Lorenzo Paschini
This article describes an on-line condition monitoring system for a countrywide distribution network together with the reasons for adopting it, its architecture, the measurement approach, and the case studies obtained during the early stages of its adoption.
{"title":"Implementing Condition Monitoring for Medium Voltage Switchgear for the Distribution Network in Singapore","authors":"Andrea Caprara;Kai Xian Lai;Giacomo Ciotti;Javan Chun Fong Lee;Bing Hong Leck;Lorenzo Paschini","doi":"10.1109/MEI.2024.10508412","DOIUrl":"https://doi.org/10.1109/MEI.2024.10508412","url":null,"abstract":"This article describes an on-line condition monitoring system for a countrywide distribution network together with the reasons for adopting it, its architecture, the measurement approach, and the case studies obtained during the early stages of its adoption.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 3","pages":"15-25"},"PeriodicalIF":2.9,"publicationDate":"2024-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140648012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-26DOI: 10.1109/MEI.2024.10444768
Mu Lin;Guangning Wu;Kai Liu;Xinyu Yan;Hao Tang
This article reviews the typical faults of and detection methods for transformer bushings and forecasts the future trends of transformer-bushing detection methods.
本文回顾了变压器套管的典型故障和检测方法，并预测了变压器套管检测方法的未来发展趋势。
{"title":"Review of Detection Methods for Typical Faults in Transformer Bushings*","authors":"Mu Lin;Guangning Wu;Kai Liu;Xinyu Yan;Hao Tang","doi":"10.1109/MEI.2024.10444768","DOIUrl":"https://doi.org/10.1109/MEI.2024.10444768","url":null,"abstract":"This article reviews the typical faults of and detection methods for transformer bushings and forecasts the future trends of transformer-bushing detection methods.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 2","pages":"33-44"},"PeriodicalIF":2.9,"publicationDate":"2024-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139976191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-26DOI: 10.1109/MEI.2024.10444764
Nihal Kularatna
The invention of the transistor during the late 1940s had a significant effect on the high-technology systems we enjoy today, and the inventors of the transistor (in its first form called the point contact transistor) won the Nobel prize in 1964. John Bardeen and Walter Brattain's early work followed by the contribution of William Schockley to invent the junction transistor affected the early electronic engineering systems, driving them into the miniaturization path of modern integrated circuit technology. Bardeen is recorded in history as the scientist who won the Nobel prize for the same subject (physics) twice. This book provides a highly readable historic account of the development of the transistors over a quarter century leading into the VLSI technology we see in portable products and consumer electronics today.
{"title":"75th anniversary of the transistor [Book review}","authors":"Nihal Kularatna","doi":"10.1109/MEI.2024.10444764","DOIUrl":"https://doi.org/10.1109/MEI.2024.10444764","url":null,"abstract":"The invention of the transistor during the late 1940s had a significant effect on the high-technology systems we enjoy today, and the inventors of the transistor (in its first form called the point contact transistor) won the Nobel prize in 1964. John Bardeen and Walter Brattain's early work followed by the contribution of William Schockley to invent the junction transistor affected the early electronic engineering systems, driving them into the miniaturization path of modern integrated circuit technology. Bardeen is recorded in history as the scientist who won the Nobel prize for the same subject (physics) twice. This book provides a highly readable historic account of the development of the transistors over a quarter century leading into the VLSI technology we see in portable products and consumer electronics today.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 2","pages":"54-56"},"PeriodicalIF":2.9,"publicationDate":"2024-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10444764","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139976176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-26DOI: 10.1109/MEI.2024.10444729
Christian M. Franck;Michael Walter;Sergo Sagareli;Karsten Juhre
This article provides a comprehensive overview of the essential prerequisites for conducting electrical tests on emerging non-SF 6 insulation gas mixtures in real-world scenarios. It puts forward a dedicated test series designed to offer a holistic assessment of insulation performance. Additionally, the article showcases two extensive round-robin test series carried out by contributors from the CIGRE D1.67 working group. These test results can serve as a foundational framework for the establishment of international standards tailored to the testing of innovative gas mixtures in insulation applications.
{"title":"Electric Performance of New Non-SF6 Gases and Gas Mixtures for Gas-Insulated Systems","authors":"Christian M. Franck;Michael Walter;Sergo Sagareli;Karsten Juhre","doi":"10.1109/MEI.2024.10444729","DOIUrl":"https://doi.org/10.1109/MEI.2024.10444729","url":null,"abstract":"This article provides a comprehensive overview of the essential prerequisites for conducting electrical tests on emerging non-SF\u0000<inf>6</inf>\u0000insulation gas mixtures in real-world scenarios. It puts forward a dedicated test series designed to offer a holistic assessment of insulation performance. Additionally, the article showcases two extensive round-robin test series carried out by contributors from the CIGRE D1.67 working group. These test results can serve as a foundational framework for the establishment of international standards tailored to the testing of innovative gas mixtures in insulation applications.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"40 2","pages":"5-13"},"PeriodicalIF":2.9,"publicationDate":"2024-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139976219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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