Pub Date : 2024-07-11DOI: 10.1107/S1600576724005065
Hideo Toraya
A new procedure for determining the degree of crystallinity (DOC) has been recently proposed, and it has been verified using experimental and computer-generated powder diffractometry data [Toraya (2023). J. Appl. Cryst.56, 1751–1763]. As an application to real materials like engineering plastics, this procedure is here applied to the DOC determination of plate-like polyphenylene sulfide (PPS) samples, composited with crystalline and non-crystalline fillers. The coexistence of partially crystallized polymer with non-crystalline fillers in target materials makes it difficult to separate the non-crystalline part of the partially crystallized polymer. This problem is here solved by the inverse application of the direct derivation (DD) method for quantitative phase analysis (QPA). The intensity–composition (IC) formula used in the DD method can derive the weight fractions of the individual components from just the total sums of observed intensities and the chemical composition data for these components [Toraya (2016). J. Appl. Cryst.49, 1508–1516]. For the present purpose, the IC formula has been inversely applied to calculate the relative intensity ratios of individual components under the assumption that the chemical compositions and weight fractions of the respective components are known. The total halo intensity could then be separated into the non-crystalline part of the polymer and the non-crystalline filler. Analyzed results of PPS composites in four different DOCs are reported.
{"title":"Determination of the degree of crystallinity of polyphenylene sulfide composited with crystalline and non-crystalline fillers by applying the direct derivation method","authors":"Hideo Toraya","doi":"10.1107/S1600576724005065","DOIUrl":"10.1107/S1600576724005065","url":null,"abstract":"<p>A new procedure for determining the degree of crystallinity (DOC) has been recently proposed, and it has been verified using experimental and computer-generated powder diffractometry data [Toraya (2023). <i>J. Appl. Cryst.</i><b>56</b>, 1751–1763]. As an application to real materials like engineering plastics, this procedure is here applied to the DOC determination of plate-like polyphenylene sulfide (PPS) samples, composited with crystalline and non-crystalline fillers. The coexistence of partially crystallized polymer with non-crystalline fillers in target materials makes it difficult to separate the non-crystalline part of the partially crystallized polymer. This problem is here solved by the inverse application of the direct derivation (DD) method for quantitative phase analysis (QPA). The intensity–composition (IC) formula used in the DD method can derive the weight fractions of the individual components from just the total sums of observed intensities and the chemical composition data for these components [Toraya (2016). <i>J. Appl. Cryst.</i><b>49</b>, 1508–1516]. For the present purpose, the IC formula has been inversely applied to calculate the relative intensity ratios of individual components under the assumption that the chemical compositions and weight fractions of the respective components are known. The total halo intensity could then be separated into the non-crystalline part of the polymer and the non-crystalline filler. Analyzed results of PPS composites in four different DOCs are reported.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 4","pages":"1115-1126"},"PeriodicalIF":5.2,"publicationDate":"2024-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141655878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-11DOI: 10.1107/S1600576724005727
Masaki Yamanashi
Analytical methods with wide field range and high spatial resolution are required to observe the distribution of the crystal structure in micro-regions undergoing macroscopic chemical reactions. A recent X-ray diffraction (XRD) imaging method combines XRD with an X-ray optical device such as a glass polycapillary consisting of a bundle of numerous monocapillaries. The former provides the crystal structure, while the latter controls the shape of the incident or diffracted X-rays and retains the positional information of the sample. Although reducing the monocapillary pore size should improve the spatial resolution, manufacturing technology challenges must be overcome. Here, an anodic aluminium oxide (AAO) film, which forms self-ordered porous nanostructures by anodic oxidation in an electrolyte, is applied as an X-ray optical device. The AAO film (pore diameter: 110 nm; size of the disc: 11 mm; and thickness: 620 µm) was fabricated by anodization in a mixture of oxalic acid and ethylene glycol. The film was incorporated into a laboratory XRD instrument. Compared with using a glass polycapillary alone, using a combination of a glass polycapillary and the AAO film improved the spatial resolution of the XRD imaging method by 40%. This XRD imaging method should not only provide practical analysis in a laboratory environment but also support various observations of the crystal structure distribution.
要观察正在发生宏观化学反应的微观区域的晶体结构分布,需要采用具有宽场范围和高空间分辨率的分析方法。最近的一种 X 射线衍射(XRD)成像方法将 XRD 与 X 射线光学设备(如由无数单毛细管组成的玻璃聚毛细管)相结合。前者提供晶体结构,后者控制入射或衍射 X 射线的形状,并保留样品的位置信息。虽然缩小单毛细管孔径可以提高空间分辨率,但必须克服制造技术上的挑战。阳极氧化铝(AAO)薄膜在电解质中通过阳极氧化形成了自有序的多孔纳米结构,本文将其用作 X 射线光学器件。AAO 薄膜(孔径:110 纳米;圆盘尺寸:11 毫米;厚度:620 微米)是在草酸和乙二醇的混合物中通过阳极氧化制得的。该薄膜被安装在实验室 XRD 仪器中。与单独使用玻璃聚毛细管相比,结合使用玻璃聚毛细管和 AAO 薄膜可将 XRD 成像方法的空间分辨率提高 40%。这种 XRD 成像方法不仅能在实验室环境中进行实用分析,还能支持对晶体结构分布的各种观测。
{"title":"Exploring a nanostructured X-ray optical device for improved spatial resolution in laboratory X-ray diffraction imaging","authors":"Masaki Yamanashi","doi":"10.1107/S1600576724005727","DOIUrl":"https://doi.org/10.1107/S1600576724005727","url":null,"abstract":"<p>Analytical methods with wide field range and high spatial resolution are required to observe the distribution of the crystal structure in micro-regions undergoing macroscopic chemical reactions. A recent X-ray diffraction (XRD) imaging method combines XRD with an X-ray optical device such as a glass polycapillary consisting of a bundle of numerous monocapillaries. The former provides the crystal structure, while the latter controls the shape of the incident or diffracted X-rays and retains the positional information of the sample. Although reducing the monocapillary pore size should improve the spatial resolution, manufacturing technology challenges must be overcome. Here, an anodic aluminium oxide (AAO) film, which forms self-ordered porous nanostructures by anodic oxidation in an electrolyte, is applied as an X-ray optical device. The AAO film (pore diameter: 110 nm; size of the disc: 11 mm; and thickness: 620 µm) was fabricated by anodization in a mixture of oxalic acid and ethylene glycol. The film was incorporated into a laboratory XRD instrument. Compared with using a glass polycapillary alone, using a combination of a glass polycapillary and the AAO film improved the spatial resolution of the XRD imaging method by 40%. This XRD imaging method should not only provide practical analysis in a laboratory environment but also support various observations of the crystal structure distribution.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 4","pages":"1137-1144"},"PeriodicalIF":5.2,"publicationDate":"2024-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141967887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-11DOI: 10.1107/S1600576724005387
Olga Dikaia, Alessandra Luchini, Tommy Nylander, Alexei Grunin, Alexei Vorobiev, Alexandr Goikhman
This study introduces silicon substrates with a switchable magnetic contrast layer (MCL) for polarized neutron reflectometry (PNR) experiments at the solid–liquid interface to study soft-matter surface layers. During standard neutron reflectometry (NR) experiments on soft-matter samples, structural and compositional information is obtained by collecting experimental data with different isotopic contrasts on the same sample. This approach is normally referred to as contrast matching, and it can be achieved by using solvents with different isotopic contrast, e.g. different H2O/D2O ratios, and/or by selective deuteration of the molecules. However, some soft-matter systems might be perturbed by this approach, or it might be difficult to implement, particularly in the case of biological samples. In these scenarios, solid substrates with an MCL are an appealing alternative, as the magnetic contrast with the substrate can be used for partial recovery of information on the sample structure. More specifically, in this study, a magnetically soft Fe layer coated with SiO2 was produced by ion-beam sputter deposition on silicon substrates of different sizes. The structure was evaluated using X-ray reflectometry, atomic force microscopy, vibrating sample magnetometry and PNR. The collected data showed the high quality and repeatability of the MCL parameters, regardless of the substrate size or the thickness of the capping SiO2 layer. Previously proposed substrates with an iron MCL used an Au capping layer. The SiO2 capping layer proposed here allows reproduction of the typical surface of a standard silicon substrate used for NR experiments and is compatible with a large variety of soft-matter samples. This application is demonstrated with ready-to-use 50 × 50 × 10 mm substrates in PNR experiments for the characterization of a lipid bilayer in a single solvent contrast. Overall, the article highlights the potential of PNR with an MCL for the investigation of soft-matter samples.
{"title":"Magnetic contrast layers with functional SiO2 coatings for soft-matter studies with polarized neutron reflectometry","authors":"Olga Dikaia, Alessandra Luchini, Tommy Nylander, Alexei Grunin, Alexei Vorobiev, Alexandr Goikhman","doi":"10.1107/S1600576724005387","DOIUrl":"https://doi.org/10.1107/S1600576724005387","url":null,"abstract":"<p>This study introduces silicon substrates with a switchable magnetic contrast layer (MCL) for polarized neutron reflectometry (PNR) experiments at the solid–liquid interface to study soft-matter surface layers. During standard neutron reflectometry (NR) experiments on soft-matter samples, structural and compositional information is obtained by collecting experimental data with different isotopic contrasts on the same sample. This approach is normally referred to as contrast matching, and it can be achieved by using solvents with different isotopic contrast, <i>e.g.</i> different H<sub>2</sub>O/D<sub>2</sub>O ratios, and/or by selective deuteration of the molecules. However, some soft-matter systems might be perturbed by this approach, or it might be difficult to implement, particularly in the case of biological samples. In these scenarios, solid substrates with an MCL are an appealing alternative, as the magnetic contrast with the substrate can be used for partial recovery of information on the sample structure. More specifically, in this study, a magnetically soft Fe layer coated with SiO<sub>2</sub> was produced by ion-beam sputter deposition on silicon substrates of different sizes. The structure was evaluated using X-ray reflectometry, atomic force microscopy, vibrating sample magnetometry and PNR. The collected data showed the high quality and repeatability of the MCL parameters, regardless of the substrate size or the thickness of the capping SiO<sub>2</sub> layer. Previously proposed substrates with an iron MCL used an Au capping layer. The SiO<sub>2</sub> capping layer proposed here allows reproduction of the typical surface of a standard silicon substrate used for NR experiments and is compatible with a large variety of soft-matter samples. This application is demonstrated with ready-to-use 50 × 50 × 10 mm substrates in PNR experiments for the characterization of a lipid bilayer in a single solvent contrast. Overall, the article highlights the potential of PNR with an MCL for the investigation of soft-matter samples.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 4","pages":"1145-1153"},"PeriodicalIF":5.2,"publicationDate":"2024-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141967886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-04DOI: 10.1107/S1600576724004692
Adam Morawiec
Rotation axes (together with rotation angles) are often used to describe crystal orientations and misorientations, and they are also needed to characterize some properties of crystalline materials. Since experimental orientation data are subject to errors, the directions of the axes obtained from such data are also inaccurate. A natural question arises: given the resolution of input rotations, what is the average error of the rotation axes? Assuming that rotation data characterized by a rotation angle ω deviate from the actual data by error rotations with fixed angle δ but which are otherwise random, the average error of the rotation axes of the data is expressed analytically as a function of ω and δ. A scheme for using this formula in practical cases when rotation errors δ follow the von Mises–Fisher distribution is also described. Finally, the impact of crystal symmetry on the determination of the average errors of the axis directions is discussed. The presented results are important for assessing the reliability of rotation axes in studies where the directions of crystal rotations play a role, e.g. in identifying deformation slip mechanisms.
{"title":"On the magnitude of error in the determination of rotation axes","authors":"Adam Morawiec","doi":"10.1107/S1600576724004692","DOIUrl":"https://doi.org/10.1107/S1600576724004692","url":null,"abstract":"<p>Rotation axes (together with rotation angles) are often used to describe crystal orientations and misorientations, and they are also needed to characterize some properties of crystalline materials. Since experimental orientation data are subject to errors, the directions of the axes obtained from such data are also inaccurate. A natural question arises: given the resolution of input rotations, what is the average error of the rotation axes? Assuming that rotation data characterized by a rotation angle ω deviate from the actual data by error rotations with fixed angle δ but which are otherwise random, the average error of the rotation axes of the data is expressed analytically as a function of ω and δ. A scheme for using this formula in practical cases when rotation errors δ follow the von Mises–Fisher distribution is also described. Finally, the impact of crystal symmetry on the determination of the average errors of the axis directions is discussed. The presented results are important for assessing the reliability of rotation axes in studies where the directions of crystal rotations play a role, <i>e.g.</i> in identifying deformation slip mechanisms.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 4","pages":"1059-1066"},"PeriodicalIF":5.2,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141967242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}