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Neutron absorption correction and mean path length calculations for multiple samples with arbitrary shapes: application to highly absorbing samples on the Multi-Axis Crystal Spectrometer at NIST 任意形状多个样品的中子吸收校正和平均路径长度计算:应用于NIST多轴晶体光谱仪上的高吸收样品
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-08-08 DOI: 10.1107/S1600576725006338
Jose A. Rodriguez-Rivera, Chris Stock

Recent advancements in cold neutron instrumentation, designed to achieve the energy resolution necessary for studying strongly correlated materials, have driven the need for sophisticated modeling of neutron spectroscopy data from highly neutron-absorbing materials. These absorption effects are often highly dependent on both angular orientation and wavelength. To address this, the finite-volume algorithm for absorption correction developed by Wuensch & Prewitt [Z. Kristallogr. (1965), 122, 24–59] is examined in this paper in the context of cold neutron spectroscopy. This algorithm is based on the numerical integration of the transmission function, where three-dimensional quadratic surfaces define the sample boundaries. The algorithm can also determine the mean path length required for second-extinction calculations. We apply this method to neutron inelastic scattering measurements of an irregularly shaped CeRhIn5 single crystal using the Multi-Axis Crystal Spectrometer at NIST. The algorithm has been expanded to correct for the absorption of multiple coaligned samples. We show that this procedure can account for the angle-dependent absorption, and the technique can be used to correct the data and plan experiments.

为了达到研究强相关材料所必需的能量分辨率,冷中子仪器的最新进展推动了对高中子吸收材料的中子能谱数据的复杂建模的需求。这些吸收效应通常高度依赖于角取向和波长。为了解决这个问题,由Wuensch &; Prewitt [Z。Kristallogr。(1965), 122,24 - 59]本文在冷中子能谱的背景下进行了研究。该算法基于传输函数的数值积分,其中三维二次曲面定义了样本边界。该算法还可以确定二次消光计算所需的平均路径长度。我们利用NIST的多轴晶体光谱仪对不规则形状的CeRhIn5单晶进行了中子非弹性散射测量。该算法已扩展到校正多个共对准样品的吸收。结果表明,该方法可以解释角相关吸收,并可用于校正数据和计划实验。
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引用次数: 0
Benchmarking a modern laboratory-based powder diffraction instrument for in situ studies in transmission geometry 现代实验室型粉末衍射仪在透射几何中的原位研究
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-08-08 DOI: 10.1107/S1600576725006259
Simon M. Vornholt, John J. Ferrari, Bryan A. Sanchez Monserrate, Bryce G. Mullens, Jan Hofmann, Michelle L. Beauvais, Peter J. Chupas, Karena W. Chapman

In situ X-ray scattering experiments, to study structure–function relationships in materials, have traditionally relied on bright synchrotron X-rays to resolve fast dynamic phenomena and efficiently probe structure as a function of environmental variables. However, recent technological advances have expanded the utility of laboratory-based diffraction instruments. Here we demonstrate how a modern laboratory-based X-ray diffraction instrument, equipped with a photon-counting area detector (EIGER2) and microfocus Mo X-ray source (Incoatec IµS), can effectively complement synchrotrons, bridging the gap between the time resolution of synchrotron-based experiments and what can be achieved in house. Specifically, the ability to acquire quantitative powder diffraction data within 2–3 min enables time-resolved studies of dynamic processes and efficient parametric studies on timescales suitable for solid-state transformations. The transmission measurement geometry using an area detector parallels that used at synchrotrons, allowing complex experiments and new sample environment developments to be prototyped in house before being transferred to synchrotron beamlines for powder diffraction and/or pair distribution function analysis.

为了研究材料的结构-功能关系,原位x射线散射实验传统上依赖于明亮的同步x射线来解决快速的动态现象,并有效地探测结构作为环境变量的函数。然而,最近的技术进步扩大了实验室衍射仪器的用途。在这里,我们展示了一个现代化的实验室x射线衍射仪器,配备了光子计数区域探测器(EIGER2)和微聚焦Mo x射线源(Incoatec IµS),可以有效地补充同步加速器,弥合同步加速器实验的时间分辨率与室内实验之间的差距。具体来说,在2-3分钟内获得定量粉末衍射数据的能力使动态过程的时间分辨研究和适用于固态转化的时间尺度上的有效参数研究成为可能。传输测量几何使用平行于同步加速器的区域探测器,允许复杂的实验和新的样品环境开发在转移到同步加速器光束线进行粉末衍射和/或对分布函数分析之前在内部原型。
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引用次数: 0
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-29
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引用次数: 0
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-29
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引用次数: 0
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-29
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引用次数: 0
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-29
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引用次数: 0
Line profile analysis of energy-scanned Laue microdiffraction peaks using the modified Williamson–Hall and modified Warren–Averbach methods 利用改进的Williamson-Hall和改进的Warren-Averbach方法分析能量扫描Laue微衍射峰的谱线
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-29 DOI: 10.1107/S1600576725005825
Yubin Zhang, András Borbély

A combination of the modified Warren–Averbach (mWA) and modified Williamson–Hall (mWH) methods was applied to characterize the local dislocation structure at the micrometre scale of a laser-shock-peened Ni specimen. Peak profiles obtained by energy scanning of Laue microdiffraction peaks were analyzed in terms of dislocation density, stored energy and interaction between dislocations. The applied methods, exploiting the asymptotic form of the Fourier transform of the peak (mWA method) and the long-range screening described by the full width at half-maximum (mWH), are complementary and offer for the first time the possibility of checking the adequacy of an assumed dislocation model. The combined method is applicable to a dilute dislocation structure, when the mWH plot should be linear. The results for the dislocation density are in reasonable agreement with previous literature data obtained by transmission electron microscopy.

结合改进的Warren-Averbach (mWA)和改进的Williamson-Hall (mWH)方法,在微米尺度上对激光冲击后Ni试样的局部位错结构进行了表征。对劳厄微衍射峰的能量扫描峰谱进行了位错密度、存储能量和位错间相互作用的分析。应用的方法,利用峰的傅里叶变换的渐近形式(mWA方法)和由半最大值全宽度(mWH)描述的远程筛选,是互补的,并首次提供了检查假设的位错模型的充分性的可能性。该组合方法适用于稀位错结构,当mWH图应为线性时。位错密度的测定结果与以往文献中透射电镜得到的数据基本一致。
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引用次数: 0
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-25
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引用次数: 0
Quantifying dispersity in size and shape of nanoparticles from small-angle scattering data using machine learning based CREASE 利用基于机器学习的CREASE从小角度散射数据量化纳米颗粒在尺寸和形状上的分散性
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-25 DOI: 10.1107/S1600576725005746
Rohan S. Adhikari, Sri Vishnuvardhan Reddy Akepati, Matthew R. Carbone, Asritha Polu, Hyeong Jin Kim, Yugang Zhang, Arthi Jayaraman

We use machine learning (ML) enhanced computational reverse engineering analysis of scattering experiments (CREASE) to interpret small-angle X-ray scattering (SAXS) data obtained from a system of nanoparticles without a priori knowledge of their exact shapes (e.g. spheres or ellipsoids), sizes (0.5–50 nm) and distributions. The SAXS measurements yielded three categories of scattering profiles exhibiting `strong', `weak' and `no' features. Diminishing features (e.g. broadening or disappearing peaks) in scattering profiles have always been attributed to the presence of significant dispersity in the system. Such featureless SAXS data are not suitable for traditional analysis using analytical models. If one were to fit a relevant analytical model (e.g. the lmfit analytical model for polydisperse spheres) to these `weak' and `no' SAXS profiles from our nanoparticle systems, one would obtain non-unique interpretations of the data. Relying on electron microscopy to identify the distributions of nanoparticle shapes and sizes is also unfeasible, especially in high-throughput synthesis and characterization loops. In such situations, to identify the distributions of particle sizes and shapes that could be present in the sample, one must rely on methods like ML-CREASE to interpret the data quickly and output all relevant interpretations about the structure present in the system. The ML-CREASE optimization loop takes the experimental scattering profile as input and outputs multiple candidate solutions whose computed scattering profiles match the SAXS profile input. The ML-CREASE method outputs distributions of relevant structural features, such as the volume fraction of the nanoparticles in the system and the mean and standard deviation of the particle size and aspect ratio, assuming a type of distribution (e.g. normal, log-normal) for size and aspect ratio. We find that, for the SAXS profiles analyzed here, accounting for the shape dispersity along with size dispersity of the nanoparticles using ML-CREASE improved the match between the computed scattering profiles and input experimental profiles.

我们使用机器学习(ML)增强的散射实验计算逆向工程分析(CREASE)来解释从纳米粒子系统获得的小角度x射线散射(SAXS)数据,而无需先验地了解其确切形状(例如球体或椭球),尺寸(0.5-50 nm)和分布。SAXS测量产生了三种类型的散射剖面,表现出“强”、“弱”和“无”特征。散射剖面的衰减特征(如峰变宽或消失)一直归因于系统中存在显著的分散性。这种无特征的SAXS数据不适合使用传统的分析模型进行分析。如果将相关的分析模型(例如,多分散球体的lmfit分析模型)拟合到纳米颗粒系统的这些“弱”和“无”SAXS谱上,就会得到对数据的非唯一解释。依靠电子显微镜来识别纳米颗粒形状和大小的分布也是不可行的,特别是在高通量合成和表征回路中。在这种情况下,为了识别样品中可能存在的颗粒大小和形状的分布,必须依赖ML-CREASE等方法来快速解释数据并输出有关系统中存在的结构的所有相关解释。ML-CREASE优化回路以实验散射曲线为输入,输出多个候选解,计算得到的散射曲线与SAXS曲线输入相匹配。ML-CREASE方法输出相关结构特征的分布,例如纳米颗粒在系统中的体积分数,以及粒径和纵横比的平均值和标准差,假设粒径和纵横比的分布类型(例如正态分布,对数正态分布)。我们发现,对于本文分析的SAXS分布,使用ML-CREASE计算纳米颗粒的形状分散性和尺寸分散性可以改善计算散射分布与输入实验分布之间的匹配。
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引用次数: 0
CorFuncSAXSNet: deep-learning-driven extraction of nanostructural parameters from small-angle X-ray scattering data of polymeric materials CorFuncSAXSNet:基于深度学习的聚合物材料小角度x射线散射数据的纳米结构参数提取
IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Pub Date : 2025-07-25 DOI: 10.1107/S1600576725005047
Xuke Li, Lianlian Fu, Yunhang Liu, Xiaodan Meng, Ming Li, Peiling Ke

Small-angle X-ray scattering (SAXS) analysis of semi-crystalline polymers remains a labour-intensive process requiring expert interpretation of correlation functions. To address this challenge, we present CorFuncSAXSNet: a deep neural network framework designed to directly predict nanostructural parameters – including lamellar crystalline thickness (dc) and amorphous layer thickness (da) – from 1D raw SAXS curves. Building upon SAXS datasets collected at the Shanghai Synchrotron Radiation Facility's BL19U2 beamline, we developed three neural architectures: a convolutional neural network, a residual network and a q-space attention network. Data augmentation strategies, including Gaussian noise injection and q-shift interpolation, improved model robustness against experimental uncertainties. Cross-validation results demonstrate that all networks achieve mean absolute errors of 0.109–0.112 nm for dc and 0.459–0.499 nm for da. Though amorphous layer predictions at large values exhibit higher errors due to dataset skewness (83.3% of data clustered at 4.5 < dc < 6.5 nm, 5.0 < da < 20.0 nm), our framework enables rapid parameter extraction (<1 s per curve), reducing reliance on manual graphical methods. CorFuncSAXSNet bridges the gap between AI and synchrotron-based structural analysis, establishing a foundation for real-time smart beamline architectures.

半结晶聚合物的小角x射线散射(SAXS)分析仍然是一个劳动密集型的过程,需要专家解释相关函数。为了解决这一挑战,我们提出了CorFuncSAXSNet:一个深度神经网络框架,旨在直接预测纳米结构参数-包括片层晶体厚度(dc)和非晶层厚度(da) -从1D原始SAXS曲线。基于上海同步辐射设施BL19U2波束线收集的SAXS数据集,我们开发了三种神经结构:卷积神经网络、残差网络和q空间注意力网络。数据增强策略,包括高斯噪声注入和q移插值,提高了模型对实验不确定性的鲁棒性。交叉验证结果表明,所有网络的dc和da的平均绝对误差分别为0.109 ~ 0.112 nm和0.459 ~ 0.499 nm。尽管在大数值下非晶态层的预测由于数据集偏度而表现出更高的误差(83.3%的数据聚集在4.5 <;dc & lt;6.5 nm, 5.0 <;da & lt;20.0 nm),我们的框架能够快速提取参数(每条曲线1秒),减少对手动图形方法的依赖。CorFuncSAXSNet弥补了人工智能和基于同步加速器的结构分析之间的差距,为实时智能梁线架构奠定了基础。
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Journal of Applied Crystallography
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