{"title":"THE CONTROL SYSTEM OF THE AEgIS EXPERIMENT AT CERN","authors":"Georgy Kornakov","doi":"10.15199/13.2023.8.18","DOIUrl":"https://doi.org/10.15199/13.2023.8.18","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"178 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"ELECTRONIC CONTROL SYSTEM FOR THE QUANTUM COMPUTER INFRASTRUCTURE IN THE MIKOK PROJECT","authors":"Grzegorz Kasprowicz","doi":"10.15199/13.2023.8.14","DOIUrl":"https://doi.org/10.15199/13.2023.8.14","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SAYMA – AN ARBITRARY WAVEFORM GENERATOR FOR SCIENTIFIC EXPERIMENTS IN ION TRAPS","authors":"Paweł Kulik","doi":"10.15199/13.2023.8.12","DOIUrl":"https://doi.org/10.15199/13.2023.8.12","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"LASER BEAM STABILIZATION SYSTEM USING OPEN-SOURCE TOOLS","authors":"Grzegorz Kasprowicz","doi":"10.15199/13.2023.8.11","DOIUrl":"https://doi.org/10.15199/13.2023.8.11","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"2011 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"HIGH VOLTAGE SYSTEM FOR ION TRAPS AND GEM DETECTORS IN THE SINARA OPEN HARDWARE ECOSYSTEM","authors":"Tomasz Przywózki","doi":"10.15199/13.2023.8.9","DOIUrl":"https://doi.org/10.15199/13.2023.8.9","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"APPLICATION OF ARTIQ CONTROL SYSTEM IN MODULAR COSMIC RAY DETECTOR – MCORD","authors":"Mikołaj Sowiński","doi":"10.15199/13.2023.8.19","DOIUrl":"https://doi.org/10.15199/13.2023.8.19","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"FRONTIER SCIENCE IN A QUANTUM EXPERIMENT: AEgIS AT CERN","authors":"Georgy Kornakov","doi":"10.15199/13.2023.8.6","DOIUrl":"https://doi.org/10.15199/13.2023.8.6","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"178 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DESIGN OF A CRYOGENIC INTEGRATED CIRCUIT FOR NEXT-GENERATION QUANTUM COMPUTERS","authors":"Grzegorz Kasprowicz","doi":"10.15199/13.2023.8.13","DOIUrl":"https://doi.org/10.15199/13.2023.8.13","url":null,"abstract":"","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mohammad Faseehuddin, Sadia Shireen, S. M. Md Ali, W. Tangsrirat
In the presented research, the second-generation voltage conveyor (VCII) is used in the design of active capacitance multipliers. In this paper, three positive and one negative lossless grounded capacitance multipliers (GCMs) are designed. All of these GCMs are designed using two VCIIs, one capacitor, and two resistors. There is no need for any passive component matching to implement a GCM. The multiplication factor of GCMs can be set/varied by changing the values of two resistances as per requirement. Considering nonideal constraints, GCMs are analysed mathematically to evaluate the effect of nonideal current and voltage transfer gains on the performance of the proposed GCMs. Also, parasitic analysis is conducted to study the effect of VCII node impedance on the performance of the presented GCMs. The simulation analysis is performed using Cadence Virtuoso in 0.18 µm Silterra Malaysia process design kit (PDK). Additionally, the macro-model of commercially available integrated circuit, AD844, is used to design the proposed GCM-2 to further prove the theoretical findings.
{"title":"Novel Lossless Positive-/Negative-Grounded Capacitance Multipliers Using VCII","authors":"Mohammad Faseehuddin, Sadia Shireen, S. M. Md Ali, W. Tangsrirat","doi":"10.5755/j02.eie.34304","DOIUrl":"https://doi.org/10.5755/j02.eie.34304","url":null,"abstract":"In the presented research, the second-generation voltage conveyor (VCII) is used in the design of active capacitance multipliers. In this paper, three positive and one negative lossless grounded capacitance multipliers (GCMs) are designed. All of these GCMs are designed using two VCIIs, one capacitor, and two resistors. There is no need for any passive component matching to implement a GCM. The multiplication factor of GCMs can be set/varied by changing the values of two resistances as per requirement. Considering nonideal constraints, GCMs are analysed mathematically to evaluate the effect of nonideal current and voltage transfer gains on the performance of the proposed GCMs. Also, parasitic analysis is conducted to study the effect of VCII node impedance on the performance of the presented GCMs. The simulation analysis is performed using Cadence Virtuoso in 0.18 µm Silterra Malaysia process design kit (PDK). Additionally, the macro-model of commercially available integrated circuit, AD844, is used to design the proposed GCM-2 to further prove the theoretical findings.","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44196789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. A. Ahmed, M Zahid Hasan, S. Islam, A. Aman, Nurhizam Safie
Deep learning (DL) is a new option that has just been made available for side-channel analysis. DL approaches for profiled side-channel attacks (SCA) have dominated research till now. In this attack, the attacker has complete control over the profiling device and can collect many traces for a range of critical parameters to characterise device leakage before the attack. In this study, we apply DL algorithms to non-profiled data. An attacker can only retrieve a limited number of side-channel traces from a closed device with an unknown key value in non-profiled mode. The authors conducted this research. Key estimations and deep learning measurements can reveal the secret key. We prove that this is doable. This technology is excellent for non-profits. DL and neural networks can benefit these organisations. Neural networks can provide a new technique to verify the safety of hardware cryptographic algorithms. It was recently suggested. This study creates a non-profiled SCA utilising convolutional neural networks (CNNs) on an AVR microcontroller with 8 bits of memory and the AES-128 cryptographic algorithm. We used aligned power traces with several samples to demonstrate how challenging CNN-based SCA is in practise. This will help us reach our goals. Here is another technique to create a solid CNN data set. In particular, CNN-based SCA experiment data and noise effects are examined. These experiments employ power traces with Gaussian noise. The CNN-based SCA works well with our data set for non-profiled attacks. Gaussian noise on power traces causes many more issues. These results show that our method can recover more bytes successfully from SCA compared to other methods in correlation power analysis (CPA) and DL-SCA without regularisation.
{"title":"Design of Convolutional Neural Networks Architecture for Non-Profiled Side-Channel Attack Detection","authors":"A. A. Ahmed, M Zahid Hasan, S. Islam, A. Aman, Nurhizam Safie","doi":"10.5755/j02.eie.33995","DOIUrl":"https://doi.org/10.5755/j02.eie.33995","url":null,"abstract":"Deep learning (DL) is a new option that has just been made available for side-channel analysis. DL approaches for profiled side-channel attacks (SCA) have dominated research till now. In this attack, the attacker has complete control over the profiling device and can collect many traces for a range of critical parameters to characterise device leakage before the attack. In this study, we apply DL algorithms to non-profiled data. An attacker can only retrieve a limited number of side-channel traces from a closed device with an unknown key value in non-profiled mode. The authors conducted this research. Key estimations and deep learning measurements can reveal the secret key. We prove that this is doable. This technology is excellent for non-profits. DL and neural networks can benefit these organisations. Neural networks can provide a new technique to verify the safety of hardware cryptographic algorithms. It was recently suggested. This study creates a non-profiled SCA utilising convolutional neural networks (CNNs) on an AVR microcontroller with 8 bits of memory and the AES-128 cryptographic algorithm. We used aligned power traces with several samples to demonstrate how challenging CNN-based SCA is in practise. This will help us reach our goals. Here is another technique to create a solid CNN data set. In particular, CNN-based SCA experiment data and noise effects are examined. These experiments employ power traces with Gaussian noise. The CNN-based SCA works well with our data set for non-profiled attacks. Gaussian noise on power traces causes many more issues. These results show that our method can recover more bytes successfully from SCA compared to other methods in correlation power analysis (CPA) and DL-SCA without regularisation.","PeriodicalId":51031,"journal":{"name":"Elektronika Ir Elektrotechnika","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44651506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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