Pub Date : 2024-09-16DOI: 10.1109/temc.2024.3454081
Zheng-Wei Du, Zhe Chen, Dongyan Zhao, Yuankui Wang, Rui Wu, Hui Li, Jin Meng, Wei-Heng Shao, Xin Zhang, Wen-Yan Yin
{"title":"Study on the Effects of Burst Pulse Magnetic Field Interference in IGBT Switching Circuit for High Power Application","authors":"Zheng-Wei Du, Zhe Chen, Dongyan Zhao, Yuankui Wang, Rui Wu, Hui Li, Jin Meng, Wei-Heng Shao, Xin Zhang, Wen-Yan Yin","doi":"10.1109/temc.2024.3454081","DOIUrl":"https://doi.org/10.1109/temc.2024.3454081","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"32 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-16DOI: 10.1109/temc.2024.3454985
Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Ning Dong
{"title":"Modeling of 10 kV Distribution Transformer Excited by Three-Phase Common Mode Transients","authors":"Zong-Yang Wang, Yan-Zhao Xie, Yu-Hao Chen, Ning Dong","doi":"10.1109/temc.2024.3454985","DOIUrl":"https://doi.org/10.1109/temc.2024.3454985","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"32 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142236127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-12DOI: 10.1109/TEMC.2024.3434397
Tom Hartman;Martin van Mast;Bas ten Have;Niek Moonen;Frank Leferink
Static energy meters are used for billing purposes of the energy consumption. Those that utilize a Rogowski coil as their current transducer have shown the highest susceptibility to conducted electromagnetic interference resulting in misreadings. These disturbances occur due to pulsed currents with steep slopes with higher frequency content, drawn by nonlinear household appliances. This has resulted in over- and underestimations of the energy bill, and even in a perceived energy generation. This article describes improving the robustness against conducted electromagnetic interference by using the orthogonality of power flow principle, thus focusing only on the fundamental, in contrary to the energy metering trend of increasing the measurement bandwidth. A first-order low-pass filter is implemented between the current transducer and the amplifier to reduce interference without affecting the 50 Hz signal. The results show a reduction of errors from 1632% down to below 2.5%.
{"title":"Improving Static Energy Meter Robustness Against Conducted EMI With an Analog Low-Pass Filter","authors":"Tom Hartman;Martin van Mast;Bas ten Have;Niek Moonen;Frank Leferink","doi":"10.1109/TEMC.2024.3434397","DOIUrl":"10.1109/TEMC.2024.3434397","url":null,"abstract":"Static energy meters are used for billing purposes of the energy consumption. Those that utilize a Rogowski coil as their current transducer have shown the highest susceptibility to conducted electromagnetic interference resulting in misreadings. These disturbances occur due to pulsed currents with steep slopes with higher frequency content, drawn by nonlinear household appliances. This has resulted in over- and underestimations of the energy bill, and even in a perceived energy generation. This article describes improving the robustness against conducted electromagnetic interference by using the orthogonality of power flow principle, thus focusing only on the fundamental, in contrary to the energy metering trend of increasing the measurement bandwidth. A first-order low-pass filter is implemented between the current transducer and the amplifier to reduce interference without affecting the 50 Hz signal. The results show a reduction of errors from 1632% down to below 2.5%.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1382-1388"},"PeriodicalIF":2.0,"publicationDate":"2024-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142174592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-11DOI: 10.1109/TEMC.2024.3445346
Chiu-Chih Chou
The 2x-thru de-embedding has emerged as an attractive alternative to the classical TRL for S parameter measurement of printed circuit board and packaging devices, mainly due to its simplicity that only one THRU standard suffices to fully characterize the test fixtures over broad bandwidth. The S parameters after 2x-thru de-embedding are referenced to the characteristic impedance of the transmission line in THRU, and accurate estimation of this reference impedance (Zref) is important for subsequent renormalization and time-domain simulation. In 2x-thru literature, only constant estimate of Zref, mostly based on the time-domain reflectometry (TDR), has been reported. However, the characteristic impedance of a transmission line is frequency dependent, and the TDR may not be flat for high conductor-loss lines. In this article, we analytically show that the TDR is an increasing function in time, and propose an innovative method to estimate Zref by fitting the TDR with a causal impedance model. Simulation and measurement examples are provided to validate the proposed theory and technique, and to show the importance of using accurate Zref for renormalization in 2x-thru de-embedding.
{"title":"Estimation of Reference Impedance in 2x-thru De-embedding With High Conductor-Loss Lines","authors":"Chiu-Chih Chou","doi":"10.1109/TEMC.2024.3445346","DOIUrl":"10.1109/TEMC.2024.3445346","url":null,"abstract":"The 2x-thru de-embedding has emerged as an attractive alternative to the classical TRL for \u0000<italic>S</i>\u0000 parameter measurement of printed circuit board and packaging devices, mainly due to its simplicity that only one THRU standard suffices to fully characterize the test fixtures over broad bandwidth. The \u0000<italic>S</i>\u0000 parameters after 2x-thru de-embedding are referenced to the characteristic impedance of the transmission line in THRU, and accurate estimation of this reference impedance (Zref) is important for subsequent renormalization and time-domain simulation. In 2x-thru literature, only constant estimate of Zref, mostly based on the time-domain reflectometry (TDR), has been reported. However, the characteristic impedance of a transmission line is frequency dependent, and the TDR may not be flat for high conductor-loss lines. In this article, we analytically show that the TDR is an increasing function in time, and propose an innovative method to estimate Zref by fitting the TDR with a causal impedance model. Simulation and measurement examples are provided to validate the proposed theory and technique, and to show the importance of using accurate Zref for renormalization in 2x-thru de-embedding.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1315-1328"},"PeriodicalIF":2.0,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142170782","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-05DOI: 10.1109/TEMC.2024.3431687
Rabah Florian Monsef
In the context of reverberation chambers, correlations observed in stirring processes are almost always modeled by linear time series (LTS). Although this approach is known to be reasonable for sliding stirrers, it turns out that its relevance has never been discussed for rotating stirrers. For the first time, we propose to use circular time series (CTS) to model rotating stirring processes. This allows one to exhibit operational conditions under which LTS and CTS perform similarly in terms of modeling accuracy and those where CTS should be used instead of LTS; in particular, the number of stirrer positions is shown to play a key role for this choice.
{"title":"Rotating-Stirring Process and Circular Time Series","authors":"Rabah Florian Monsef","doi":"10.1109/TEMC.2024.3431687","DOIUrl":"10.1109/TEMC.2024.3431687","url":null,"abstract":"In the context of reverberation chambers, correlations observed in stirring processes are almost always modeled by linear time series (LTS). Although this approach is known to be reasonable for sliding stirrers, it turns out that its relevance has never been discussed for rotating stirrers. For the first time, we propose to use circular time series (CTS) to model rotating stirring processes. This allows one to exhibit operational conditions under which LTS and CTS perform similarly in terms of modeling accuracy and those where CTS should be used instead of LTS; in particular, the number of stirrer positions is shown to play a key role for this choice.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1679-1682"},"PeriodicalIF":2.0,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142142383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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