Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208248
Yarkin Yigit, Engin Afacan
The growth and progress in the radar systems, electronic warfare, and telecommunication industry emerges a big demand for microwave filters. Cavity filters are conventionally used in transmitters and receivers to allow the desired signals in passband while rejecting the harmonics and spurious signal out of the band. The idea behind a cavity filter is that each resonator, which is mounted perpendicular to the length of the cavity block with designed spacing and centered to the width of the cavity, is tuned to the center frequency of the band pass filter by using its resonator and distributed capacitance.
{"title":"Autonomous RF Cavity Filter Tuning","authors":"Yarkin Yigit, Engin Afacan","doi":"10.1109/MIM.2023.10208248","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208248","url":null,"abstract":"The growth and progress in the radar systems, electronic warfare, and telecommunication industry emerges a big demand for microwave filters. Cavity filters are conventionally used in transmitters and receivers to allow the desired signals in passband while rejecting the harmonics and spurious signal out of the band. The idea behind a cavity filter is that each resonator, which is mounted perpendicular to the length of the cavity block with designed spacing and centered to the width of the cavity, is tuned to the center frequency of the band pass filter by using its resonator and distributed capacitance.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49093345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208255
S. Sobolewski, W. L. Adams, Joseph E. Eckersley, R. Sankar
In the current era of ubiquitous communication signals coming from various sources and tremendous proliferation of personal, commercial and military devices it becomes increasingly difficult to manage these systems and appropriately allocate the necessary resources. The concept of Internet of Things (IoT), or Internet of Everything (IoE), puts a great strain on the modern communications networks and increasingly complex and clever methods must be implemented to allow for constantly growing data rate, bandwidth, capacity and speed requirements. The newest 5th Generation (5G) New Radio communication systems may be one of the best examples.
{"title":"Improving High-Demand VDATS TPS Performance Through More Effective ATE Interface Design Using Example of AMR Application","authors":"S. Sobolewski, W. L. Adams, Joseph E. Eckersley, R. Sankar","doi":"10.1109/MIM.2023.10208255","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208255","url":null,"abstract":"In the current era of ubiquitous communication signals coming from various sources and tremendous proliferation of personal, commercial and military devices it becomes increasingly difficult to manage these systems and appropriately allocate the necessary resources. The concept of Internet of Things (IoT), or Internet of Everything (IoE), puts a great strain on the modern communications networks and increasingly complex and clever methods must be implemented to allow for constantly growing data rate, bandwidth, capacity and speed requirements. The newest 5th Generation (5G) New Radio communication systems may be one of the best examples.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44305901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208253
Tyler Cody, Emma Meno, P. Beling, Laura Freeman
Cyber-attacks pose existential, nation-level threats and directly challenge societal stability. The breadth of targets (small businesses to nation-states) and continuous nature of cyber-attacks make automated cyber test and evaluation (T&E) crucial to national security and domestic prosperity. Importantly, automation lowers the cost and increases the frequency of cyber T&E, thereby simultaneously increasing cyber test availability and coverage. Spurred by market demand as well as advancements in artificial intelligence (AI), automated approaches to penetration testing have seen a resurgence of interest in the academic literature. Yet to date, this burgeoning research community lacks a shared, long-term vision. Recently, we proposed a concept of whole campaign emulation (WCE) as a challenge problem and framework for automated penetration testing with reinforcement learning (RL) [1]. In this article, we review the state-of-the-art in RL-based automated penetration testing, assess its relation to WCE, and provide a case study using the open-source Network Attack Simulator (NASim) [2].
{"title":"Whole Campaign Emulation with Reinforcement Learning for Cyber Test","authors":"Tyler Cody, Emma Meno, P. Beling, Laura Freeman","doi":"10.1109/MIM.2023.10208253","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208253","url":null,"abstract":"Cyber-attacks pose existential, nation-level threats and directly challenge societal stability. The breadth of targets (small businesses to nation-states) and continuous nature of cyber-attacks make automated cyber test and evaluation (T&E) crucial to national security and domestic prosperity. Importantly, automation lowers the cost and increases the frequency of cyber T&E, thereby simultaneously increasing cyber test availability and coverage. Spurred by market demand as well as advancements in artificial intelligence (AI), automated approaches to penetration testing have seen a resurgence of interest in the academic literature. Yet to date, this burgeoning research community lacks a shared, long-term vision. Recently, we proposed a concept of whole campaign emulation (WCE) as a challenge problem and framework for automated penetration testing with reinforcement learning (RL) [1]. In this article, we review the state-of-the-art in RL-based automated penetration testing, assess its relation to WCE, and provide a case study using the open-source Network Attack Simulator (NASim) [2].","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49634130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208251
Jordan Schupbach, Elliott Pryor, Kyle Webster, John W. Sheppard
Performing general prognostics and health management (PHM), especially in electronic systems, continues to present significant challenges. The low availability of failure data makes learning generalized models difficult and constructing generalized models during the design phase often requires a level of understanding of the failure mechanisms that elude the designers. In this paper, we present a generalized approach to PHM based on two types of probabilistic models, Bayesian Networks (BNs) and Continuous-Time Bayesian Networks (CTBNs), and we pose the PHM problem from the perspective of risk mitigation rather than failure prediction. This paper also constitutes an extension of previous work where we proposed this framework initially [1]. In this extended version, we also provide a comparison of exact and approximate sample-based inference for CTBNs to provide practical guidance on conducting inference using the proposed framework.
{"title":"A Risk-Based Approach to Prognostics and Health Management Combining Bayesian Networks and Continuous-Time Bayesian Networks","authors":"Jordan Schupbach, Elliott Pryor, Kyle Webster, John W. Sheppard","doi":"10.1109/MIM.2023.10208251","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208251","url":null,"abstract":"Performing general prognostics and health management (PHM), especially in electronic systems, continues to present significant challenges. The low availability of failure data makes learning generalized models difficult and constructing generalized models during the design phase often requires a level of understanding of the failure mechanisms that elude the designers. In this paper, we present a generalized approach to PHM based on two types of probabilistic models, Bayesian Networks (BNs) and Continuous-Time Bayesian Networks (CTBNs), and we pose the PHM problem from the perspective of risk mitigation rather than failure prediction. This paper also constitutes an extension of previous work where we proposed this framework initially [1]. In this extended version, we also provide a comparison of exact and approximate sample-based inference for CTBNs to provide practical guidance on conducting inference using the proposed framework.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42088884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/mim.2023.10208250
Juan Manuel Ramirez Cortés, Mark E. Davis
On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.
{"title":"President's Message","authors":"Juan Manuel Ramirez Cortés, Mark E. Davis","doi":"10.1109/mim.2023.10208250","DOIUrl":"https://doi.org/10.1109/mim.2023.10208250","url":null,"abstract":"On behalf of the Instrumentation and Measurement Society (IMS) I welcome you all to this special edition of the Instrumentation and Measurement Magazine, constituted by selected papers presented during AUTOTESTCON 2022. The Conference Committee has carried out a thorough review process to accept the papers presented at the conference. Subsequently, a few authors were invited to submit an extended version of their papers to conform this special issue with an orientation to wide audiences. As you can see, the Best Student Paper and Best Technical Paper are also proudly included in this edition. I would like to congratulate the authors, editors and reviewers for his valuable work in making this happen.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136065108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208254
M. Don, Gonzalo R. Arce
Compressive sensing (CS) is a signal processing technique that has found applications in numerous fields, providing benefits such as lower power consumption, reduced memory usage, higher resolution, and faster measurement speed. Despite the vast theoretical advancements in CS, its commercial applications have been slow to develop. Moreover, alternative sensing strategies may outperform CS in many real-world scenarios. In a previous publication [1], five guidelines were proposed to facilitate the use of CS in practical applications. In this follow-on article, we delve into each of these guidelines in detail, using compressive antenna pattern measurement as a case study. By understanding the limitations of CS and choosing appropriate applications, the test and measurement community will be able to successfully utilize its benefits in practical systems.
{"title":"Five Guidelines for Practical Compressive Sensing with a Case Study in Antenna Pattern Measurement","authors":"M. Don, Gonzalo R. Arce","doi":"10.1109/MIM.2023.10208254","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208254","url":null,"abstract":"Compressive sensing (CS) is a signal processing technique that has found applications in numerous fields, providing benefits such as lower power consumption, reduced memory usage, higher resolution, and faster measurement speed. Despite the vast theoretical advancements in CS, its commercial applications have been slow to develop. Moreover, alternative sensing strategies may outperform CS in many real-world scenarios. In a previous publication [1], five guidelines were proposed to facilitate the use of CS in practical applications. In this follow-on article, we delve into each of these guidelines in detail, using compressive antenna pattern measurement as a case study. By understanding the limitations of CS and choosing appropriate applications, the test and measurement community will be able to successfully utilize its benefits in practical systems.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45297350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208249
M. Obrecht
Measuring small inductors and capacitors can be challenging with the use of conventional LCR-meters that have a test frequency of 10 kHz or less. With a 10 nH inductor at 10 kHz, the impedance is only 6 mOhms, that is comparable to the resistance of the probes. At a frequency of 100 kHz, the impedance increases to 60 mOhms. On the other hand, a 1 pF capacitor at 10 kHz results in an impedance of 15 MOhms, which makes a capacitive connection between the probes noticeable and affects the measurement of impedance. This paper presents two case studies: an extraction the parasitic inductance of the two-wire probes using the HP4284A LCR-meter and HP16034E test fixture, and extraction of the parasitic capacitance using the LCR-Reader-R2 tweezer-meter. This method enables accurate measurements of sub-nH inductors and sub-pF capacitors using test frequencies below 300 kHz.
{"title":"Simple Offset Elimination Technique for Two-Wire Measurements","authors":"M. Obrecht","doi":"10.1109/MIM.2023.10208249","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208249","url":null,"abstract":"Measuring small inductors and capacitors can be challenging with the use of conventional LCR-meters that have a test frequency of 10 kHz or less. With a 10 nH inductor at 10 kHz, the impedance is only 6 mOhms, that is comparable to the resistance of the probes. At a frequency of 100 kHz, the impedance increases to 60 mOhms. On the other hand, a 1 pF capacitor at 10 kHz results in an impedance of 15 MOhms, which makes a capacitive connection between the probes noticeable and affects the measurement of impedance. This paper presents two case studies: an extraction the parasitic inductance of the two-wire probes using the HP4284A LCR-meter and HP16034E test fixture, and extraction of the parasitic capacitance using the LCR-Reader-R2 tweezer-meter. This method enables accurate measurements of sub-nH inductors and sub-pF capacitors using test frequencies below 300 kHz.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46758216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-08-01DOI: 10.1109/MIM.2023.10208252
F. Reeder, Carol Pomales, Diane M. Kotras, James Lockett
While of great potential benefit, Artificial Intelligence (AI) presents new challenges and exacerbates some existing ones for the Department of Defense (DoD) Test and Evaluation (T&E) community. T&E professionals will need to work to ensure that AI-enabled systems' (AIES) complex and variable nature can be sufficiently characterized by the boundaries of acceptable performance. To help the DoD understand and prepare for the challenges of T&E of AIES, we convened a group of AI adoption, AI development, and policy experts to develop a future vision of T&E with respect to AI. The result is a vision of T&E that incorporates the unique requirements for AIES, encompassing policy changes, user engagement approaches, measures and metrics, data, infrastructure, and cybersecurity. This future vision is accomplishable by identifying focus for efforts across DoD, academia, Federally Funded Research and Development Centers (FFRDCs) and industry to provide processes, policy/standards, tools, data, and infrastructure. Thus, we can assure a more feasible future for the T&E of AIES.
{"title":"Enabling the Department of Defense's Future to Test and Evaluate Artificial Intelligence Enabled Systems","authors":"F. Reeder, Carol Pomales, Diane M. Kotras, James Lockett","doi":"10.1109/MIM.2023.10208252","DOIUrl":"https://doi.org/10.1109/MIM.2023.10208252","url":null,"abstract":"While of great potential benefit, Artificial Intelligence (AI) presents new challenges and exacerbates some existing ones for the Department of Defense (DoD) Test and Evaluation (T&E) community. T&E professionals will need to work to ensure that AI-enabled systems' (AIES) complex and variable nature can be sufficiently characterized by the boundaries of acceptable performance. To help the DoD understand and prepare for the challenges of T&E of AIES, we convened a group of AI adoption, AI development, and policy experts to develop a future vision of T&E with respect to AI. The result is a vision of T&E that incorporates the unique requirements for AIES, encompassing policy changes, user engagement approaches, measures and metrics, data, infrastructure, and cybersecurity. This future vision is accomplishable by identifying focus for efforts across DoD, academia, Federally Funded Research and Development Centers (FFRDCs) and industry to provide processes, policy/standards, tools, data, and infrastructure. Thus, we can assure a more feasible future for the T&E of AIES.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":2.1,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48792918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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