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IEEE Transactions on Reliability最新文献

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Graph Embedding-Based Bayesian Network for Fault Isolation in Complex Equipment 基于图嵌入的贝叶斯网络用于复杂设备的故障隔离
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-07-09 DOI: 10.1109/tr.2024.3416064
Liqiao Xia, Pai Zheng, Manuel Herrera, Yongshi Liang, Xinyu Li, Liang Gao
{"title":"Graph Embedding-Based Bayesian Network for Fault Isolation in Complex Equipment","authors":"Liqiao Xia, Pai Zheng, Manuel Herrera, Yongshi Liang, Xinyu Li, Liang Gao","doi":"10.1109/tr.2024.3416064","DOIUrl":"https://doi.org/10.1109/tr.2024.3416064","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"17 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141572717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comprehensive Reliability Review and Assessment of Switched-Capacitor Step-Up DC–DC Converters 开关电容器升压型 DC-DC 转换器的全面可靠性审查和评估
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-07-09 DOI: 10.1109/tr.2024.3421329
Milad Khoubrooy Eslamloo, Kazem Varesi, Hadi Tarzamni, Sze Sing Lee
{"title":"Comprehensive Reliability Review and Assessment of Switched-Capacitor Step-Up DC–DC Converters","authors":"Milad Khoubrooy Eslamloo, Kazem Varesi, Hadi Tarzamni, Sze Sing Lee","doi":"10.1109/tr.2024.3421329","DOIUrl":"https://doi.org/10.1109/tr.2024.3421329","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"10 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141572716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Physics-Enhanced NMF Toward Anomaly Detection in Rotating Mechanical Systems 物理增强型 NMF 用于旋转机械系统的异常检测
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-07-01 DOI: 10.1109/tr.2024.3417262
Bingxin Yan, Xiaobing Ma, Qiuzhuang Sun, Lijuan Shen
{"title":"Physics-Enhanced NMF Toward Anomaly Detection in Rotating Mechanical Systems","authors":"Bingxin Yan, Xiaobing Ma, Qiuzhuang Sun, Lijuan Shen","doi":"10.1109/tr.2024.3417262","DOIUrl":"https://doi.org/10.1109/tr.2024.3417262","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"6 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sensor Self-Declaration of Numeric Data Reliability in Internet of Things 物联网中传感器对数值数据可靠性的自我声明
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-27 DOI: 10.1109/tr.2024.3416967
Sakib Shahriar Shafin, Gour Karmakar, Iven Mareels, Venki Balasubramanian, Ramachandra Rao Kolluri
{"title":"Sensor Self-Declaration of Numeric Data Reliability in Internet of Things","authors":"Sakib Shahriar Shafin, Gour Karmakar, Iven Mareels, Venki Balasubramanian, Ramachandra Rao Kolluri","doi":"10.1109/tr.2024.3416967","DOIUrl":"https://doi.org/10.1109/tr.2024.3416967","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"205 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Ensemble Data-Model-Label Three-Level Regularization Framework for Imbalanced Intelligent Fault Diagnosis 用于不平衡智能故障诊断的集合数据-模型-标签三级正则化框架
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-27 DOI: 10.1109/tr.2024.3415117
Yixiong Luo, Jianhua Shi, Jinbiao Tan, Zijie Ren, Jiafu Wan, Mejdl Safran, Salman A. AlQahtani
{"title":"An Ensemble Data-Model-Label Three-Level Regularization Framework for Imbalanced Intelligent Fault Diagnosis","authors":"Yixiong Luo, Jianhua Shi, Jinbiao Tan, Zijie Ren, Jiafu Wan, Mejdl Safran, Salman A. AlQahtani","doi":"10.1109/tr.2024.3415117","DOIUrl":"https://doi.org/10.1109/tr.2024.3415117","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"20 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Links Fault Tolerant Analysis: g-Good r-Component Edge-Connectivity of Interconnection Networks With Applications to Hypercubes 新颖的链接容错分析：互联网络的 g-Good r-Component 边缘连通性与超立方体的应用
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-25 DOI: 10.1109/tr.2024.3410526
Hongxi Liu, Mingzu Zhang, Sun-Yuan Hsieh, Chia-Wei Lee
{"title":"A Novel Links Fault Tolerant Analysis: g-Good r-Component Edge-Connectivity of Interconnection Networks With Applications to Hypercubes","authors":"Hongxi Liu, Mingzu Zhang, Sun-Yuan Hsieh, Chia-Wei Lee","doi":"10.1109/tr.2024.3410526","DOIUrl":"https://doi.org/10.1109/tr.2024.3410526","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"40 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141511373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Vulnerability Assessment of Large-Scale Dynamic Transportation Networks 大规模动态交通网络的高效脆弱性评估
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-19 DOI: 10.1109/tr.2024.3413315
Venkateswaran Shekar, Lance Fiondella
{"title":"Efficient Vulnerability Assessment of Large-Scale Dynamic Transportation Networks","authors":"Venkateswaran Shekar, Lance Fiondella","doi":"10.1109/tr.2024.3413315","DOIUrl":"https://doi.org/10.1109/tr.2024.3413315","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"69 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fault Diagnosis Algorithm for Pumping Unit Based on Dual-Branch Time–Frequency Fusion 基于双分支时频融合的抽水装置故障诊断算法
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-14 DOI: 10.1109/tr.2024.3409427
Fangfang Zhang, Yebin Li, Dongri Shan, Yuanhong Liu, Fengying Ma, Weiyong Yu
{"title":"Fault Diagnosis Algorithm for Pumping Unit Based on Dual-Branch Time–Frequency Fusion","authors":"Fangfang Zhang, Yebin Li, Dongri Shan, Yuanhong Liu, Fengying Ma, Weiyong Yu","doi":"10.1109/tr.2024.3409427","DOIUrl":"https://doi.org/10.1109/tr.2024.3409427","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"15 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
GuessGas: Tell Me Fine-Grained Gas Consumption of My Smart Contract and Why GuessGas：告诉我智能合约的精细耗气量及其原因
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-10 DOI: 10.1109/tr.2024.3404238
Qing Huang, Renxiong Chen, Zhenchang Xing, Jinshan Zeng, Qinghua Lu, Xiwei Xu
{"title":"GuessGas: Tell Me Fine-Grained Gas Consumption of My Smart Contract and Why","authors":"Qing Huang, Renxiong Chen, Zhenchang Xing, Jinshan Zeng, Qinghua Lu, Xiwei Xu","doi":"10.1109/tr.2024.3404238","DOIUrl":"https://doi.org/10.1109/tr.2024.3404238","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"68 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Active Labeling Aided Semi-Supervised Safety Assessment With Task-Related Unknown Scenarios 主动标记辅助半监督安全评估与任务相关的未知场景
IF 5.9 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Transactions on Reliability
Pub Date : 2024-06-06 DOI: 10.1109/tr.2024.3376601
Chang Liu, Xiao He, Minyue Li, Yi Zhang, Zhongjun Ding
{"title":"Active Labeling Aided Semi-Supervised Safety Assessment With Task-Related Unknown Scenarios","authors":"Chang Liu, Xiao He, Minyue Li, Yi Zhang, Zhongjun Ding","doi":"10.1109/tr.2024.3376601","DOIUrl":"https://doi.org/10.1109/tr.2024.3376601","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"79 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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