Tianzi Tian, Ning Wang, Jun Yang, Zhuqing Miao, Lei Li
{"title":"Availability Evaluation and Maintenance Optimization of Balanced Systems Considering State-Dependent Inspection Intervals","authors":"Tianzi Tian, Ning Wang, Jun Yang, Zhuqing Miao, Lei Li","doi":"10.1109/tr.2024.3394862","DOIUrl":"https://doi.org/10.1109/tr.2024.3394862","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"17 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tse-Chuan Hsu, Yao-Hong Tsai, William Cheng-Chung Chu
{"title":"Enhancing Digit Recognition for Luminous Images in Edge Computing Through Transfer Learning With Robustness and Fault Tolerance","authors":"Tse-Chuan Hsu, Yao-Hong Tsai, William Cheng-Chung Chu","doi":"10.1109/tr.2024.3393424","DOIUrl":"https://doi.org/10.1109/tr.2024.3393424","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"79 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Generative Transfer Learning Method for Extreme Class Imbalance Problem and Applied to Piston Aero-Engine Fault Cross-Domain Diagnosis","authors":"Pengfei Shen, Fengrong Bi, Xiaoyang Bi, Xiao Yang, Daijie Tang, Mingzhi Guo","doi":"10.1109/tr.2024.3403660","DOIUrl":"https://doi.org/10.1109/tr.2024.3403660","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"15 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In today's digital environment, nearly every industry faces challenges concerning reliability, security, and trust. Ensuring that systems persist in operation despite hacker threats and that enterprises can effectively safeguard their assets are paramount concerns.
{"title":"Editorial Ensuring Reliability, Security, and Trust for Enterprises","authors":"Winston Shieh","doi":"10.1109/TR.2024.3398409","DOIUrl":"https://doi.org/10.1109/TR.2024.3398409","url":null,"abstract":"In today's digital environment, nearly every industry faces challenges concerning reliability, security, and trust. Ensuring that systems persist in operation despite hacker threats and that enterprises can effectively safeguard their assets are paramount concerns.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 2","pages":"805-807"},"PeriodicalIF":5.9,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10547162","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141245078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Robust Neural Network Modeling With Small-Worldness for Effluent Total Phosphorus Prediction in Wastewater Treatment Process","authors":"Wenjing Li, Chong Ding, Junfei Qiao","doi":"10.1109/tr.2024.3399735","DOIUrl":"https://doi.org/10.1109/tr.2024.3399735","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"68 1","pages":""},"PeriodicalIF":5.9,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141942540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Reliability Society Information","authors":"","doi":"10.1109/TR.2024.3400073","DOIUrl":"https://doi.org/10.1109/TR.2024.3400073","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 2","pages":"C2-C2"},"PeriodicalIF":5.9,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10547143","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141245158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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