Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513584
J. Regué, M. Ribó, J. Gomila, A. Perez, A. Martín
This paper presents a method useful to extract a dipole model of radiating equipment. This model is used to predict the far-field radiated emissions from near-field measurements. The model of the EUT is an equivalent set of infinitesimal dipoles distributed inside a volume enclosing the EUT. The position, orientation and excitation current of each dipole of the equivalent set is obtained by means of a metaheuristic algorithm. The usefulness of the method is demonstrated by real measurements
{"title":"Modeling of radiating equipment by distributed dipoles using metaheuristic methods","authors":"J. Regué, M. Ribó, J. Gomila, A. Perez, A. Martín","doi":"10.1109/ISEMC.2005.1513584","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513584","url":null,"abstract":"This paper presents a method useful to extract a dipole model of radiating equipment. This model is used to predict the far-field radiated emissions from near-field measurements. The model of the EUT is an equivalent set of infinitesimal dipoles distributed inside a volume enclosing the EUT. The position, orientation and excitation current of each dipole of the equivalent set is obtained by means of a metaheuristic algorithm. The usefulness of the method is demonstrated by real measurements","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"3 1","pages":"596-601"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76331652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513510
K. Haake, J. Haseborg
This paper analyzes a disturbance effect that occurs at measurement setups with looped ground connections. It is shown how this effect arises by measuring it with a special setup. Further the effect is deconstructed in detail using a simplified model. Hence steps to be taken are shown in order to suppress this disturbance effect.
{"title":"Problems caused by insufficient electrical isolation in RF-measurement setups","authors":"K. Haake, J. Haseborg","doi":"10.1109/ISEMC.2005.1513510","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513510","url":null,"abstract":"This paper analyzes a disturbance effect that occurs at measurement setups with looped ground connections. It is shown how this effect arises by measuring it with a special setup. Further the effect is deconstructed in detail using a simplified model. Hence steps to be taken are shown in order to suppress this disturbance effect.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"21 1","pages":"256-261 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81243437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513513
A. Duffy, A. Martin, G. Antonini, A. Orlandi, C. Ritota
The feature selective validation (FSV) method is one of the candidate techniques for the quantitative validation of computational electromagnetics (CEM), particularly within electromagnetic compatibility (EMC) and signal integrity (SI). In applications so far, it has demonstrated significant promise and is likely to be a central feature of the growing research interest in CEM validation. This paper presents a detailed review of the FSV method and implementation. It concludes with a discussion of some of the current research topics.
{"title":"The feature selective validation (FSV) method","authors":"A. Duffy, A. Martin, G. Antonini, A. Orlandi, C. Ritota","doi":"10.1109/ISEMC.2005.1513513","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513513","url":null,"abstract":"The feature selective validation (FSV) method is one of the candidate techniques for the quantitative validation of computational electromagnetics (CEM), particularly within electromagnetic compatibility (EMC) and signal integrity (SI). In applications so far, it has demonstrated significant promise and is likely to be a central feature of the growing research interest in CEM validation. This paper presents a detailed review of the FSV method and implementation. It concludes with a discussion of some of the current research topics.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"22 1","pages":"272-277 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88814046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513621
Yibo Ye, G. Lin, Zhenlu Li
China's market has lured many manufacturers and companies globally. This paper provides readers with a communication channel to help people understand and follow the regulations, thus speeding up the approval process of measuring instrument imported into China.
{"title":"Pattern approval of measuring instrument in China","authors":"Yibo Ye, G. Lin, Zhenlu Li","doi":"10.1109/ISEMC.2005.1513621","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513621","url":null,"abstract":"China's market has lured many manufacturers and companies globally. This paper provides readers with a communication channel to help people understand and follow the regulations, thus speeding up the approval process of measuring instrument imported into China.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"3 1","pages":"736-740 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88850124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513614
R. Aranco, F. Maradei
The paper deals with the modelization of complex discontinuities by passive lumped equivalent circuits. To this aim, an improved circuit extraction technique is proposed The procedure is based on the approximation of the admittance/impedance parameters of the discontinuities derived by full-wave numerical simulations, in terms of rational functions suitable for the synthesis of high-order equivalent lumped circuits. The proposed extraction technique permits to derive directly feasible equivalent circuits which implicitly satisfy the passivity requirement.
{"title":"Passive equivalent circuits of complex discontinuities: an improved extraction technique","authors":"R. Aranco, F. Maradei","doi":"10.1109/ISEMC.2005.1513614","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513614","url":null,"abstract":"The paper deals with the modelization of complex discontinuities by passive lumped equivalent circuits. To this aim, an improved circuit extraction technique is proposed The procedure is based on the approximation of the admittance/impedance parameters of the discontinuities derived by full-wave numerical simulations, in terms of rational functions suitable for the synthesis of high-order equivalent lumped circuits. The proposed extraction technique permits to derive directly feasible equivalent circuits which implicitly satisfy the passivity requirement.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"118 1 1","pages":"700-704 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77150149","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513561
J. Brunett, R. Ringler, V. Liepa
This paper discusses issues, methods, and limitations of using scalar near field measurements for determining radiator EIRP. Standard measurement methods and extrapolations used in compliance testing of UWB devices are reviewed. Next, measurements are performed which examine field attenuation rates in the near field of different radiating sources. Finally, these field attenuation rates are reviewed in relation to demonstrating DUT compliance.
{"title":"On measurements for EIRP compliance of UWB devices","authors":"J. Brunett, R. Ringler, V. Liepa","doi":"10.1109/ISEMC.2005.1513561","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513561","url":null,"abstract":"This paper discusses issues, methods, and limitations of using scalar near field measurements for determining radiator EIRP. Standard measurement methods and extrapolations used in compliance testing of UWB devices are reviewed. Next, measurements are performed which examine field attenuation rates in the near field of different radiating sources. Finally, these field attenuation rates are reviewed in relation to demonstrating DUT compliance.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"9 10","pages":"473-476 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91433162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513484
T. Wada, T. Mori, M. Tokuda, S. Suenaga, H. Igarashi
Radiated electromagnetic field from a solar cell has been studied experimentally and theoretically in order to clear antenna effect of the solar cell. The radiated electromagnetic field of a solar cell was measured, and a solar cell was modeled by a conducting wire with the limited electric conductivity, which is obtained by measuring DC resistance, and electric field strength radiated from the solar cell was calculated by the method of moment. In consequence, it is revealed that the calculated frequency response of the solar cell coincides with the mean frequency response of the measured values without steeply varying component.
{"title":"Radiated electromagnetic field from a solar cell for CISPR radiated emission measurement method","authors":"T. Wada, T. Mori, M. Tokuda, S. Suenaga, H. Igarashi","doi":"10.1109/ISEMC.2005.1513484","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513484","url":null,"abstract":"Radiated electromagnetic field from a solar cell has been studied experimentally and theoretically in order to clear antenna effect of the solar cell. The radiated electromagnetic field of a solar cell was measured, and a solar cell was modeled by a conducting wire with the limited electric conductivity, which is obtained by measuring DC resistance, and electric field strength radiated from the solar cell was calculated by the method of moment. In consequence, it is revealed that the calculated frequency response of the solar cell coincides with the mean frequency response of the measured values without steeply varying component.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"110 1","pages":"112-117 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87652169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513505
H. Krauthauser, J. Nitsch, S. Tkachenko, N. Korovkin, H.-J. Scheibe
A partially new analysis method to determine the transfer impedance (TI) of coaxial cables is proposed. The method involves two steps. The first (experimental) step consists in the determination of the voltage between the interior wire and the cable shield which is exposed to an exterior TEM field. In the experiment the investigated cable forms a semicircular loop, whose plane is orthogonal to an ideally conductive plane. The measurements have been performed in a GTEM cell. In the second step the calculation of the TI of the cable is carried out. These calculations are based on the analytical solutions for the current in the cable shield. It is shown that with the proposed method - in principal - one can determine the complex transfer impedance for frequencies up to 10 GHz for typical cable diameters. Furthermore, the experimental setup is rather simple compared to other methods. At the moment, the evaluation of the experimental data is limited to 600-700 MHz, approximately. This is due to the lack of a more adequate Green's function for the description of the loop in the field inside the GTEM cell.
{"title":"Transfer impedance at high frequencies","authors":"H. Krauthauser, J. Nitsch, S. Tkachenko, N. Korovkin, H.-J. Scheibe","doi":"10.1109/ISEMC.2005.1513505","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513505","url":null,"abstract":"A partially new analysis method to determine the transfer impedance (TI) of coaxial cables is proposed. The method involves two steps. The first (experimental) step consists in the determination of the voltage between the interior wire and the cable shield which is exposed to an exterior TEM field. In the experiment the investigated cable forms a semicircular loop, whose plane is orthogonal to an ideally conductive plane. The measurements have been performed in a GTEM cell. In the second step the calculation of the TI of the cable is carried out. These calculations are based on the analytical solutions for the current in the cable shield. It is shown that with the proposed method - in principal - one can determine the complex transfer impedance for frequencies up to 10 GHz for typical cable diameters. Furthermore, the experimental setup is rather simple compared to other methods. At the moment, the evaluation of the experimental data is limited to 600-700 MHz, approximately. This is due to the lack of a more adequate Green's function for the description of the loop in the field inside the GTEM cell.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"63 1","pages":"228-233 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85702467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513612
W. Cui, P. Parmar, J. Morgan, U. Sheth
The method of power delivery analysis on a network processor and package design is presented. A current profile was developed from the processor design and validated by the measurements. Distributed current sources were used to model the transient current drawn by the silicon. To model the package correctly, distributed circuit elements were used. The sensitivity of the voltage droop to the current stimulus was studied in order to design the appropriate current ramping steps. Two current profiles were studied with measurements to improve the processor design for power integrity.
{"title":"Modeling the network processor and package for power delivery analysis","authors":"W. Cui, P. Parmar, J. Morgan, U. Sheth","doi":"10.1109/ISEMC.2005.1513612","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513612","url":null,"abstract":"The method of power delivery analysis on a network processor and package design is presented. A current profile was developed from the processor design and validated by the measurements. Distributed current sources were used to model the transient current drawn by the silicon. To model the package correctly, distributed circuit elements were used. The sensitivity of the voltage droop to the current stimulus was studied in order to design the appropriate current ramping steps. Two current profiles were studied with measurements to improve the processor design for power integrity.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"24 1","pages":"690-694 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91105009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513645
Yi Huang, Xu Zhu, B. Nair
The reverberation chamber is a facility mainly for electromagnetic compatibility (EMC) tests whilst the microwave oven is used for heating applications. They both generate a time-averaged uniform field in the area of interest. In this paper, these two facilities are compared in terms of their applications, operation principles, design philosophy and especially the field uniformity with the aid of electromagnetic simulation techniques, where a dyadic Green's function is employed. It is revealed that a well-designed reverberation chamber can outperform a conventional microwave oven in terms of the field uniformity. A modified microwave oven design is suggested accordingly.
{"title":"A comparison of the microwave oven and reverberation chamber","authors":"Yi Huang, Xu Zhu, B. Nair","doi":"10.1109/ISEMC.2005.1513645","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513645","url":null,"abstract":"The reverberation chamber is a facility mainly for electromagnetic compatibility (EMC) tests whilst the microwave oven is used for heating applications. They both generate a time-averaged uniform field in the area of interest. In this paper, these two facilities are compared in terms of their applications, operation principles, design philosophy and especially the field uniformity with the aid of electromagnetic simulation techniques, where a dyadic Green's function is employed. It is revealed that a well-designed reverberation chamber can outperform a conventional microwave oven in terms of the field uniformity. A modified microwave oven design is suggested accordingly.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"82 1","pages":"856-860 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85947127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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