Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513469
G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak
Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations
{"title":"Validation of circuit extraction procedure by means of frequency and time domain measurement","authors":"G. Antonini, A. Scogna, A. Orlandi, V. Ricchiuti, G. Selli, S. Luan, J. Drewniak","doi":"10.1109/ISEMC.2005.1513469","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513469","url":null,"abstract":"Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"63 1","pages":"45-50"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91239912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513625
Chingchi Chen
In this paper, the immunity of electronic modules to external electromagnetic interference (EMI) was evaluated using transfer functions, which correlate the external disturbances with the noise encountered by the components inside the module. Simple lumped-circuit models are used to describe noise coupling mechanisms, and they can be verified by straight-forward test procedures. Based on these simple models, the dominant coupling mechanisms were identified and mitigation effectiveness verified. This approach was utilized to examine an electronic module with immunity weaknesses. The module was first studied on-bench, at no power. Counter measures were then applied and effectiveness quantified. This component was then tested on a functional vehicle, with measured effectiveness matching on-bench predictions flawlessly.
{"title":"Examination of electronic module immunity using transfer functions","authors":"Chingchi Chen","doi":"10.1109/ISEMC.2005.1513625","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513625","url":null,"abstract":"In this paper, the immunity of electronic modules to external electromagnetic interference (EMI) was evaluated using transfer functions, which correlate the external disturbances with the noise encountered by the components inside the module. Simple lumped-circuit models are used to describe noise coupling mechanisms, and they can be verified by straight-forward test procedures. Based on these simple models, the dominant coupling mechanisms were identified and mitigation effectiveness verified. This approach was utilized to examine an electronic module with immunity weaknesses. The module was first studied on-bench, at no power. Counter measures were then applied and effectiveness quantified. This component was then tested on a functional vehicle, with measured effectiveness matching on-bench predictions flawlessly.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"61 1","pages":"756-761 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83146386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513613
E. Sicard, A. Boyer, A. Tankielun
This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.
{"title":"On the prediction of near-field microcontroller emission","authors":"E. Sicard, A. Boyer, A. Tankielun","doi":"10.1109/ISEMC.2005.1513613","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513613","url":null,"abstract":"This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"108 1","pages":"695-699 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81751887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513673
Y. Watanabe, M. Tokuda
In this paper, we focused attention on the system that used the MHz band in a power line communication, and calculated the influence of electric condition of ground plane to distance dependence and electric field distribution of leaked electric field by method of moments. As a result, we understood the standard ground attenuated leaked electric field to distance as not 20 dB/dec but 40 dB/dec. And we understood the almost uniform attenuation in the standard ground independency of direction from the electric field distribution.
{"title":"Influence of ground plane to distance dependence leaked electric field from power line","authors":"Y. Watanabe, M. Tokuda","doi":"10.1109/ISEMC.2005.1513673","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513673","url":null,"abstract":"In this paper, we focused attention on the system that used the MHz band in a power line communication, and calculated the influence of electric condition of ground plane to distance dependence and electric field distribution of leaked electric field by method of moments. As a result, we understood the standard ground attenuated leaked electric field to distance as not 20 dB/dec but 40 dB/dec. And we understood the almost uniform attenuation in the standard ground independency of direction from the electric field distribution.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"27 1","pages":"1008-1013 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84604946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513465
J. Colburn, H.J. Song, H. Hsu, R. Wiese
A procedure is presented to simulate the complete automobile radio system, from antenna to speaker. The method involves generating reduced order models of all relevant components and interactions, which are then linked together in a time-domain system solver. To illustrate the usefulness of this simulation capability in vehicle-level system design a novel algorithm for automated computer rating of automobile audio tracks is developed. The algorithm uses wavelet and Fourier decompositions for automated computer rating of audio quality. The algorithm developed is validated by comparing its output to a study using human subjects to score recorded audio tracks
{"title":"Assessment of automobile radio system performance in noisy EM environments","authors":"J. Colburn, H.J. Song, H. Hsu, R. Wiese","doi":"10.1109/ISEMC.2005.1513465","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513465","url":null,"abstract":"A procedure is presented to simulate the complete automobile radio system, from antenna to speaker. The method involves generating reduced order models of all relevant components and interactions, which are then linked together in a time-domain system solver. To illustrate the usefulness of this simulation capability in vehicle-level system design a novel algorithm for automated computer rating of automobile audio tracks is developed. The algorithm uses wavelet and Fourier decompositions for automated computer rating of audio quality. The algorithm developed is validated by comparing its output to a study using human subjects to score recorded audio tracks","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"87 1","pages":"24-28"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83421671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513476
Daniel Brooks, S. Nicol, Jacek Wojcik
Finite difference time domain (FDTD) methods were employed to develop the complete mechanical structure (complex) of the half-wavelength experimental dipole models used to conduct this research. This paper examines how the phantom shell dielectric boundary affects the specific absorption rate (SAR) for simulations based on experimental system validation measurement protocols and the resultant calculations. Numerical calculations are made to determine complex electric and magnetic field magnitudes along with the SAR values within the APREL Laboratories universal phantom filled with tissue simulation fluid. Secondary calculations are made without the universal phantom shell (elimination of phantom shell boundary) being in place and compared against the prime phantom model data
{"title":"Analysis of phantom boundary shell and the resultant matching effect of shell on SAR (specific absorption rate) values","authors":"Daniel Brooks, S. Nicol, Jacek Wojcik","doi":"10.1109/ISEMC.2005.1513476","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513476","url":null,"abstract":"Finite difference time domain (FDTD) methods were employed to develop the complete mechanical structure (complex) of the half-wavelength experimental dipole models used to conduct this research. This paper examines how the phantom shell dielectric boundary affects the specific absorption rate (SAR) for simulations based on experimental system validation measurement protocols and the resultant calculations. Numerical calculations are made to determine complex electric and magnetic field magnitudes along with the SAR values within the APREL Laboratories universal phantom filled with tissue simulation fluid. Secondary calculations are made without the universal phantom shell (elimination of phantom shell boundary) being in place and compared against the prime phantom model data","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"79-83"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89269806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513618
K.R. Rao, S. Satav, V.V.R. Sarma
Developing of a rugged launch mobile computer system in rack mountable form is not an easy task. If the system is going to be used in a stringent EMI environment, then achieving the EMC is a challenging task for the designers and EMI engineers. Initially the system did not qualify to met all the EMC requirements even after implementing the possible EMC measures in the design and development Achieving EMC by design is must. The EMC engineers analyzed the design concept of the system and its failures during EMI/EMC performance evaluation. In this paper the authors mainly highlighted and expressed their views about the incorporation of EMC measures, fixes and final achievement in qualifying the system. The authors also explained the electromagnetic compatibility achievement. The sequence adapted in achieving EMC is explained.
{"title":"EMI controlling in a rugged launch computer","authors":"K.R. Rao, S. Satav, V.V.R. Sarma","doi":"10.1109/ISEMC.2005.1513618","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513618","url":null,"abstract":"Developing of a rugged launch mobile computer system in rack mountable form is not an easy task. If the system is going to be used in a stringent EMI environment, then achieving the EMC is a challenging task for the designers and EMI engineers. Initially the system did not qualify to met all the EMC requirements even after implementing the possible EMC measures in the design and development Achieving EMC by design is must. The EMC engineers analyzed the design concept of the system and its failures during EMI/EMC performance evaluation. In this paper the authors mainly highlighted and expressed their views about the incorporation of EMC measures, fixes and final achievement in qualifying the system. The authors also explained the electromagnetic compatibility achievement. The sequence adapted in achieving EMC is explained.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"721-725 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89975256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513593
R. Kaw, I. Novak, M. Swaminathan
This paper explores the design and verification environment of power delivery networks (PDN) in an attempt to point out areas for improving the tools and the methods. It also points out potential interfaces between PDN tools that can be standardized so that the models can be ported between various available tools
{"title":"Towards developing a standard for data input/output format for PDN modeling & simulation tools","authors":"R. Kaw, I. Novak, M. Swaminathan","doi":"10.1109/ISEMC.2005.1513593","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513593","url":null,"abstract":"This paper explores the design and verification environment of power delivery networks (PDN) in an attempt to point out areas for improving the tools and the methods. It also points out potential interfaces between PDN tools that can be standardized so that the models can be ported between various available tools","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"30 1","pages":"644-649"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83358988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513576
H. Krauthauser, T. Winzerling, J. Nitsch
The autocorrelation function of electrical field strengths for different boundary conditions (tuner positions) at a given special position is proposed in the IEC standard 61000-4-21 as a measure for the determination of the number of uncorrelated boundary conditions in mode-stirred chambers. Additionally, an upper limit for the autocorrelation coefficient is given for a fixed number N of measured tuner positions only. In this paper, we analyze an approach given in the literature that includes the treatment of different N, but still gives results that are inconsistent with the daily measurement practice in mode-stirred chambers. A slight modification of this approach is proposed that leads to consistent results. This paper gives critical values for the autocorrelation coefficients for any number of measured tuner positions based on a statistical analysis of the well known probability distribution of autocorrelation coefficients. The degree of determination and the significance level remain as free parameters that have to be established by the community. The authors propose values for these parameters that are consistent with the example given in the standard
{"title":"Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers","authors":"H. Krauthauser, T. Winzerling, J. Nitsch","doi":"10.1109/ISEMC.2005.1513576","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513576","url":null,"abstract":"The autocorrelation function of electrical field strengths for different boundary conditions (tuner positions) at a given special position is proposed in the IEC standard 61000-4-21 as a measure for the determination of the number of uncorrelated boundary conditions in mode-stirred chambers. Additionally, an upper limit for the autocorrelation coefficient is given for a fixed number N of measured tuner positions only. In this paper, we analyze an approach given in the literature that includes the treatment of different N, but still gives results that are inconsistent with the daily measurement practice in mode-stirred chambers. A slight modification of this approach is proposed that leads to consistent results. This paper gives critical values for the autocorrelation coefficients for any number of measured tuner positions based on a statistical analysis of the well known probability distribution of autocorrelation coefficients. The degree of determination and the significance level remain as free parameters that have to be established by the community. The authors propose values for these parameters that are consistent with the example given in the standard","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"46 1","pages":"550-555"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73340323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2005-10-03DOI: 10.1109/ISEMC.2005.1513572
J. Hamalainen, M. Aunola, T. Martin, M. Backstrom
Histograms of the electromagnetic field amplitudes inside rectangular enclosures with different inner structures are studied. We consider the variations of the histograms as the inner structure of the enclosure becomes more complex. Furthermore, we study differences of the field component histograms and introduce a shielding effectiveness histogram. We concentrate on enclosures, which are not overmoded on studied frequencies. Obtained results show the usability of histograms in examination of statistical shielding effectiveness and point out that it is not very sensitive against small changes of the inner structure of the enclosure.
{"title":"Comparing and visualising statistical shielding effectiveness for rectangular enclosures with different inner structures","authors":"J. Hamalainen, M. Aunola, T. Martin, M. Backstrom","doi":"10.1109/ISEMC.2005.1513572","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513572","url":null,"abstract":"Histograms of the electromagnetic field amplitudes inside rectangular enclosures with different inner structures are studied. We consider the variations of the histograms as the inner structure of the enclosure becomes more complex. Furthermore, we study differences of the field component histograms and introduce a shielding effectiveness histogram. We concentrate on enclosures, which are not overmoded on studied frequencies. Obtained results show the usability of histograms in examination of statistical shielding effectiveness and point out that it is not very sensitive against small changes of the inner structure of the enclosure.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"69 1","pages":"530-533 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74713243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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