Biconditional Binary Decision Diagrams (BBDDs) are a novel class of binary decision diagrams where the branching condition, and its associated logic expansion, is biconditional on two variables. Reduced and ordered BBDDs are remarkably compact and unique for a given Boolean function. In order to exploit BBDDs in Electronic Design Automation (EDA) applications, efficient manipulation algorithms must be developed and integrated in a software package. In this paper, we present the theory for efficient BBDD manipulation and its practical software implementation. The key features of the proposed approach are strong canonical form pre-conditioning of stored BBDD nodes, recursive formulation of Boolean operations in terms of biconditional expansions, performance-oriented memory management and dedicated BBDD re-ordering techniques. Experimental results show that the developed BBDD package achieves an average node count reduction of 19.48% and a speed-up factor of 1.63x with respect to a state-of-art decision diagram manipulation package. Employed in the synthesis of datapath circuits, the BBDD manipulation package is capable to advantageously restructure arithmetic operations producing 11.02% smaller and 32.29% faster circuits as compared to a commercial synthesis flow.
{"title":"An efficient manipulation package for Biconditional Binary Decision Diagrams","authors":"L. Amarù, P. Gaillardon, G. Micheli","doi":"10.7873/DATE.2014.309","DOIUrl":"https://doi.org/10.7873/DATE.2014.309","url":null,"abstract":"Biconditional Binary Decision Diagrams (BBDDs) are a novel class of binary decision diagrams where the branching condition, and its associated logic expansion, is biconditional on two variables. Reduced and ordered BBDDs are remarkably compact and unique for a given Boolean function. In order to exploit BBDDs in Electronic Design Automation (EDA) applications, efficient manipulation algorithms must be developed and integrated in a software package. In this paper, we present the theory for efficient BBDD manipulation and its practical software implementation. The key features of the proposed approach are strong canonical form pre-conditioning of stored BBDD nodes, recursive formulation of Boolean operations in terms of biconditional expansions, performance-oriented memory management and dedicated BBDD re-ordering techniques. Experimental results show that the developed BBDD package achieves an average node count reduction of 19.48% and a speed-up factor of 1.63x with respect to a state-of-art decision diagram manipulation package. Employed in the synthesis of datapath circuits, the BBDD manipulation package is capable to advantageously restructure arithmetic operations producing 11.02% smaller and 32.29% faster circuits as compared to a commercial synthesis flow.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"26 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87286470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Physical Unclonable Functions (PUFs) provide secure cryptographic keys for resource constrained embedded systems without secure storage. A PUF measures internal manufacturing variations to create a unique, but noisy secret inside a device. Syndrome coding schemes create and store helper data about the structure of a specific PUF to correct errors within subsequent PUF measurements and generate a reliable key. This helper data can contain redundancy. We analyze existing schemes and show that data compression can be applied to decrease the size of the helper data of existing implementations. We introduce compressed Differential Sequence Coding (DSC), which is the most efficient syndrome coding scheme known to date for a popular reference scenario. Adding helper data compression to the DSC algorithm leads to an overall decrease of 68% in helper data size compared to other algorithms in a reference scenario. This is achieved without increasing the number of PUF bits and a minimal increase in logic size.
{"title":"Increasing the efficiency of syndrome coding for PUFs with helper data compression","authors":"Matthias Hiller, G. Sigl","doi":"10.7873/DATE.2014.084","DOIUrl":"https://doi.org/10.7873/DATE.2014.084","url":null,"abstract":"Physical Unclonable Functions (PUFs) provide secure cryptographic keys for resource constrained embedded systems without secure storage. A PUF measures internal manufacturing variations to create a unique, but noisy secret inside a device. Syndrome coding schemes create and store helper data about the structure of a specific PUF to correct errors within subsequent PUF measurements and generate a reliable key. This helper data can contain redundancy. We analyze existing schemes and show that data compression can be applied to decrease the size of the helper data of existing implementations. We introduce compressed Differential Sequence Coding (DSC), which is the most efficient syndrome coding scheme known to date for a popular reference scenario. Adding helper data compression to the DSC algorithm leads to an overall decrease of 68% in helper data size compared to other algorithms in a reference scenario. This is achieved without increasing the number of PUF bits and a minimal increase in logic size.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"26 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85550693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Manufacturing and environmental variability lead to timing errors in computing systems that are typically corrected by error detection and correction mechanisms at the circuit level. The cost and speed of recovery can be improved by memoization-based optimization methods that exploit spatial or temporal parallelisms in suitable computing fabrics such as general-purpose graphics processing units (GPGPUs). We propose here a temporal memoization technique for use in floating-point units (FPUs) in GPGPUs that uses value locality inside data-parallel programs. The technique recalls (memorizes) the context of error-free execution of an instruction on a FPU. To enable scalable and independent recovery, a single-cycle lookup table (LUT) is tightly coupled to every FPU to maintain contexts of recent error-free executions. The LUT reuses these memorized contexts to exactly, or approximately, correct errant FP instructions based on application needs. In real-world applications, the temporal memoization technique achieves an average energy saving of 8%-28% for a wide range of timing error rates (0%-4%) and outperforms recent advances in resilient architectures. This technique also enhances robustness in the voltage overscaling regime and achieves relative average energy saving of 66 % with 11% voltage overscaling.
{"title":"Temporal memoization for energy-efficient timing error recovery in GPGPUs","authors":"Abbas Rahimi, L. Benini, Rajesh K. Gupta","doi":"10.7873/DATE.2014.113","DOIUrl":"https://doi.org/10.7873/DATE.2014.113","url":null,"abstract":"Manufacturing and environmental variability lead to timing errors in computing systems that are typically corrected by error detection and correction mechanisms at the circuit level. The cost and speed of recovery can be improved by memoization-based optimization methods that exploit spatial or temporal parallelisms in suitable computing fabrics such as general-purpose graphics processing units (GPGPUs). We propose here a temporal memoization technique for use in floating-point units (FPUs) in GPGPUs that uses value locality inside data-parallel programs. The technique recalls (memorizes) the context of error-free execution of an instruction on a FPU. To enable scalable and independent recovery, a single-cycle lookup table (LUT) is tightly coupled to every FPU to maintain contexts of recent error-free executions. The LUT reuses these memorized contexts to exactly, or approximately, correct errant FP instructions based on application needs. In real-world applications, the temporal memoization technique achieves an average energy saving of 8%-28% for a wide range of timing error rates (0%-4%) and outperforms recent advances in resilient architectures. This technique also enhances robustness in the voltage overscaling regime and achieves relative average energy saving of 66 % with 11% voltage overscaling.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"75 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86024035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Loïc Zussa, Amine Dehbaoui, Karim Tobich, J. Dutertre, P. Maurine, L. Guillaume-Sage, J. Clédière, A. Tria
The use of electromagnetic glitches has recently emerged as an effective fault injection technique for the purpose of conducting physical attacks against integrated circuits. First research works have shown that electromagnetic faults are induced by timing constraint violations and that they are also located in the vicinity of the injection probe. This paper reports the study of the efficiency of a glitch detector against EM injection. This detector was originally designed to detect any attempt of inducing timing violations by means of clock or power glitches. Because electromagnetic disturbances are more local than global, the use of a single detector proved to be inefficient. Our subsequent investigation of the use of several detectors to obtain a full fault detection coverage is reported, it also provides further insights into the properties of electromagnetic injection and into the key role played by the injection probe.
{"title":"Efficiency of a glitch detector against electromagnetic fault injection","authors":"Loïc Zussa, Amine Dehbaoui, Karim Tobich, J. Dutertre, P. Maurine, L. Guillaume-Sage, J. Clédière, A. Tria","doi":"10.7873/DATE.2014.216","DOIUrl":"https://doi.org/10.7873/DATE.2014.216","url":null,"abstract":"The use of electromagnetic glitches has recently emerged as an effective fault injection technique for the purpose of conducting physical attacks against integrated circuits. First research works have shown that electromagnetic faults are induced by timing constraint violations and that they are also located in the vicinity of the injection probe. This paper reports the study of the efficiency of a glitch detector against EM injection. This detector was originally designed to detect any attempt of inducing timing violations by means of clock or power glitches. Because electromagnetic disturbances are more local than global, the use of a single detector proved to be inefficient. Our subsequent investigation of the use of several detectors to obtain a full fault detection coverage is reported, it also provides further insights into the properties of electromagnetic injection and into the key role played by the injection probe.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86044770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Recently, many works have shown that adjustable delay buffer (ADB) whose delay is adjustable dynamically can effectively solve the clock skew variation problem in the designs with multiple power modes. However, all the previous works of ADB allocation inherently entail two critical limitations, which are the adjusted delays by ADB are always increments and the low cost buffer sizing has never been or not been primarily taken into account. To demonstrate how much overcoming the two limitations is effective in resolving the clock skew constraint, we characterize the two types of ADBs called CADB (capacitor based ADB) and IADB (inverter based ADB) and show that the adjusted delays by IADB can be decremented, and show that the clock skew violation in some clock trees of multiple power modes can be resolved by applying buffer sizing together with using only a small number of IADBs and CADBs.
{"title":"Mixed allocation of adjustable delay buffers combined with buffer sizing in clock tree synthesis of multiple power mode designs","authors":"Kitae Park, Geunho Kim, Taewhan Kim","doi":"10.7873/DATE.2014.276","DOIUrl":"https://doi.org/10.7873/DATE.2014.276","url":null,"abstract":"Recently, many works have shown that adjustable delay buffer (ADB) whose delay is adjustable dynamically can effectively solve the clock skew variation problem in the designs with multiple power modes. However, all the previous works of ADB allocation inherently entail two critical limitations, which are the adjusted delays by ADB are always increments and the low cost buffer sizing has never been or not been primarily taken into account. To demonstrate how much overcoming the two limitations is effective in resolving the clock skew constraint, we characterize the two types of ADBs called CADB (capacitor based ADB) and IADB (inverter based ADB) and show that the adjusted delays by IADB can be decremented, and show that the clock skew violation in some clock trees of multiple power modes can be resolved by applying buffer sizing together with using only a small number of IADBs and CADBs.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"28 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73118234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sebastien Fabrie, J. Echeverri, M. Vertregt, J. P. D. Gyvez
In today's semiconductor industry we see a move towards smaller technology feature sizes. These smaller feature sizes pose a problem due to mismatch between identical cells on a single die known as local variation. In this paper a library tuning method is proposed which makes a smart selection of cells in a standard cell library to reduce the design's sensitivity to local variability. This results in a robust IC design with an identifiable behavior towards local variations. Experimental results performed on a widely used microprocessor design synthesized for a high performance timing show that we can achieve a timing spread reduction of 37% at an area increase cost of 7%.
{"title":"Standard cell library tuning for variability tolerant designs","authors":"Sebastien Fabrie, J. Echeverri, M. Vertregt, J. P. D. Gyvez","doi":"10.7873/DATE.2014.242","DOIUrl":"https://doi.org/10.7873/DATE.2014.242","url":null,"abstract":"In today's semiconductor industry we see a move towards smaller technology feature sizes. These smaller feature sizes pose a problem due to mismatch between identical cells on a single die known as local variation. In this paper a library tuning method is proposed which makes a smart selection of cells in a standard cell library to reduce the design's sensitivity to local variability. This results in a robust IC design with an identifiable behavior towards local variations. Experimental results performed on a widely used microprocessor design synthesized for a high performance timing show that we can achieve a timing spread reduction of 37% at an area increase cost of 7%.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"24 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73740409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Giannopoulou, N. Stoimenov, Pengcheng Huang, L. Thiele
A common trend in real-time embedded systems is to integrate multiple applications on a single platform. Such systems are known as mixed-criticality (MC) systems when the applications are characterized by different criticality levels. Nowadays, multicore platforms are promoted due to cost and performance benefits. However, certification of multicore MC systems is challenging as concurrently executed applications of different criticalities may block each other when accessing shared platform resources. Most of the existing research on multicore MC scheduling ignores the effects of resource sharing on the response times of applications. Recently, a MC scheduling strategy was proposed, which explicitly accounts for these effects. This paper discusses how to combine this policy with an optimization method for the partitioning of tasks to cores as well as the static mapping of memory blocks, i.e., task data and communication buffers, to the banks of a shared memory architecture. Optimization is performed at design time targeting at minimizing the worst-case response times of tasks and achieving efficient resource utilization. The proposed optimization method is evaluated using an industrial application.
{"title":"Mapping mixed-criticality applications on multi-core architectures","authors":"G. Giannopoulou, N. Stoimenov, Pengcheng Huang, L. Thiele","doi":"10.7873/DATE.2014.111","DOIUrl":"https://doi.org/10.7873/DATE.2014.111","url":null,"abstract":"A common trend in real-time embedded systems is to integrate multiple applications on a single platform. Such systems are known as mixed-criticality (MC) systems when the applications are characterized by different criticality levels. Nowadays, multicore platforms are promoted due to cost and performance benefits. However, certification of multicore MC systems is challenging as concurrently executed applications of different criticalities may block each other when accessing shared platform resources. Most of the existing research on multicore MC scheduling ignores the effects of resource sharing on the response times of applications. Recently, a MC scheduling strategy was proposed, which explicitly accounts for these effects. This paper discusses how to combine this policy with an optimization method for the partitioning of tasks to cores as well as the static mapping of memory blocks, i.e., task data and communication buffers, to the banks of a shared memory architecture. Optimization is performed at design time targeting at minimizing the worst-case response times of tasks and achieving efficient resource utilization. The proposed optimization method is evaluated using an industrial application.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"10 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74001210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We present a novel, sound, and complete algorithm for deciding safety properties in programs with static memory allocation. The new algorithm extends the program verification paradigm using loop invariants presented in [1] with a counterexample guided abstraction refinement (CEGAR) loop [2] where the refinement is achieved by strengthening loop invariants using the QFBV generalization of Property Directed Reachability (PDR) discussed in [3, 4]. We compare the algorithm with other approaches to program verification and report experimental results.
{"title":"Property directed invariant refinement for program verification","authors":"Tobias Welp, A. Kuehlmann","doi":"10.7873/DATE.2014.127","DOIUrl":"https://doi.org/10.7873/DATE.2014.127","url":null,"abstract":"We present a novel, sound, and complete algorithm for deciding safety properties in programs with static memory allocation. The new algorithm extends the program verification paradigm using loop invariants presented in [1] with a counterexample guided abstraction refinement (CEGAR) loop [2] where the refinement is achieved by strengthening loop invariants using the QFBV generalization of Property Directed Reachability (PDR) discussed in [3, 4]. We compare the algorithm with other approaches to program verification and report experimental results.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"27 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74771297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Clemens Helfmeier, C. Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert
In recent years one of the most popular areas of research in hardware security has been Physically Unclonable Functions (PUF). PUFs provide primitives for implementing tamper detection, encryption and device fingerprinting. One particularly common application is replacing Non-volatile Memory (NVM) as key storage in embedded devices like smart cards and secure microcontrollers. Though a wide array of PUF have been demonstrated in the academic literature, vendors have only begun to roll out PUFs in their end-user products. Moreover, the improvement to overall system security provided by PUFs is still the subject of much debate. This work reviews the state of the art of PUFs in general, and as a replacement for key storage in particular. We review also techniques and methodologies which make the physical response characterization and physical/digital cloning of PUFs possible.
{"title":"Physical vulnerabilities of Physically Unclonable Functions","authors":"Clemens Helfmeier, C. Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert","doi":"10.7873/DATE.2014.363","DOIUrl":"https://doi.org/10.7873/DATE.2014.363","url":null,"abstract":"In recent years one of the most popular areas of research in hardware security has been Physically Unclonable Functions (PUF). PUFs provide primitives for implementing tamper detection, encryption and device fingerprinting. One particularly common application is replacing Non-volatile Memory (NVM) as key storage in embedded devices like smart cards and secure microcontrollers. Though a wide array of PUF have been demonstrated in the academic literature, vendors have only begun to roll out PUFs in their end-user products. Moreover, the improvement to overall system security provided by PUFs is still the subject of much debate. This work reviews the state of the art of PUFs in general, and as a replacement for key storage in particular. We review also techniques and methodologies which make the physical response characterization and physical/digital cloning of PUFs possible.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75235305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Swaminathan Narayanaswamy, S. Steinhorst, M. Lukasiewycz, M. Kauer, S. Chakraborty
This paper presents an approach to optimal dimensioning of active cell balancing architectures, which are of increasing relevance in Electrical Energy Storages (EESs) for Electric Vehicles (EVs) or stationary applications such as smart grids. Active cell balancing equalizes the state of charge of cells within a battery pack via charge transfers, increasing the effective capacity and lifetime. While optimization approaches have been introduced into the design process of several aspects of EESs, active cell balancing architectures have, until now, not been systematically optimized in terms of their components. Therefore, this paper analyzes existing architectures to develop design metrics for energy dissipation, installation volume, and balancing current. Based on these design metrics, a methodology to efficiently obtain Pareto-optimal configurations for a wide range of inductors and transistors at different balancing currents is developed. Our methodology is then applied to a case study, optimizing two state-of-the-art architectures using realistic balancing algorithms. The results give evidence of the applicability of systematic optimization in the domain of cell balancing, leading to higher energy efficiencies with minimized installation space.
{"title":"Optimal dimensioning of active cell balancing architectures","authors":"Swaminathan Narayanaswamy, S. Steinhorst, M. Lukasiewycz, M. Kauer, S. Chakraborty","doi":"10.7873/DATE.2014.153","DOIUrl":"https://doi.org/10.7873/DATE.2014.153","url":null,"abstract":"This paper presents an approach to optimal dimensioning of active cell balancing architectures, which are of increasing relevance in Electrical Energy Storages (EESs) for Electric Vehicles (EVs) or stationary applications such as smart grids. Active cell balancing equalizes the state of charge of cells within a battery pack via charge transfers, increasing the effective capacity and lifetime. While optimization approaches have been introduced into the design process of several aspects of EESs, active cell balancing architectures have, until now, not been systematically optimized in terms of their components. Therefore, this paper analyzes existing architectures to develop design metrics for energy dissipation, installation volume, and balancing current. Based on these design metrics, a methodology to efficiently obtain Pareto-optimal configurations for a wide range of inductors and transistors at different balancing currents is developed. Our methodology is then applied to a case study, optimizing two state-of-the-art architectures using realistic balancing algorithms. The results give evidence of the applicability of systematic optimization in the domain of cell balancing, leading to higher energy efficiencies with minimized installation space.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"150 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77426582","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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