Pub Date : 2018-09-01DOI: 10.1109/iceee.2018.8534002
{"title":"CCE 2018 Committees","authors":"","doi":"10.1109/iceee.2018.8534002","DOIUrl":"https://doi.org/10.1109/iceee.2018.8534002","url":null,"abstract":"","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"32 8 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82765821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/iceee.2018.8533875
{"title":"CCE 2018 Topics","authors":"","doi":"10.1109/iceee.2018.8533875","DOIUrl":"https://doi.org/10.1109/iceee.2018.8533875","url":null,"abstract":"","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83008469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533939
L. Hill-Pastor, L. Juarez-Amador, M. Vasquez-Agustin, M. G. Arellano, T. Diaz-Becerril, R. Peña-Sierra
High-quality single phase p-type nanometric films of cuprous oxide with controllable properties were produced by thermal oxidation of copper thin films from 600 to 950°C in a nitrogen (N2) atmosphere with 5ppm of oxygen content at atmospheric pressure. The resistivity of films was of 300 Ω-cm for samples produced at high temperatures and decreased below of 80 Ω-cm for samples grown at lower temperatures. The minimum hole concentration was 8×1014 cm-3 for films grown at high temperatures and increased up to 8×1015 cm-3 for low temperatures, the corresponding Hall mobilities vary in the range of 20-45 cm2/V-s with the best values for samples grown at high temperatures. The observed electrical behavior is related to the structural lattice defects controlled mainly by the oxidation kinetics process under low oxygen atmosphere concentration conditions. When the oxidation temperature was decreased some traces of the cupric oxide phase was observed, the formation of this phase was apparent because of the characteristic reddish color of the Cu2O films changes to the blackish aspect for the tenorite phase. The Cu2O phase was assessed through the XRD and Raman characterization techniques. This work demonstrates that the thermal oxidation method produces Cu2O nanometric films with enough quality to be used in electronic device applications.
{"title":"Characterization of Single Phase Nanometric Cu2O Films Grown by Thermal Oxidation in the Range of 600 to 950° C in an Atmosphere with Low Oxygen Content","authors":"L. Hill-Pastor, L. Juarez-Amador, M. Vasquez-Agustin, M. G. Arellano, T. Diaz-Becerril, R. Peña-Sierra","doi":"10.1109/ICEEE.2018.8533939","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533939","url":null,"abstract":"High-quality single phase p-type nanometric films of cuprous oxide with controllable properties were produced by thermal oxidation of copper thin films from 600 to 950°C in a nitrogen (N2) atmosphere with 5ppm of oxygen content at atmospheric pressure. The resistivity of films was of 300 Ω-cm for samples produced at high temperatures and decreased below of 80 Ω-cm for samples grown at lower temperatures. The minimum hole concentration was 8×1014 cm-3 for films grown at high temperatures and increased up to 8×1015 cm-3 for low temperatures, the corresponding Hall mobilities vary in the range of 20-45 cm2/V-s with the best values for samples grown at high temperatures. The observed electrical behavior is related to the structural lattice defects controlled mainly by the oxidation kinetics process under low oxygen atmosphere concentration conditions. When the oxidation temperature was decreased some traces of the cupric oxide phase was observed, the formation of this phase was apparent because of the characteristic reddish color of the Cu2O films changes to the blackish aspect for the tenorite phase. The Cu2O phase was assessed through the XRD and Raman characterization techniques. This work demonstrates that the thermal oxidation method produces Cu2O nanometric films with enough quality to be used in electronic device applications.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"20 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86006185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/iceee.2018.8533956
{"title":"CCE 2018 Introduction","authors":"","doi":"10.1109/iceee.2018.8533956","DOIUrl":"https://doi.org/10.1109/iceee.2018.8533956","url":null,"abstract":"","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"60 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84627666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533987
A. Kustov
In this paper, the problem of computation of anisotropic norm of linear discrete time varying finite horizon stochastic system in state-space terms is solved. The relationship with the similar problem in deterministic setting is given. In contrary to this case, the obtained formulas consist of one more matrix equation because of the decomposition of random matrices of a system into two parts associated with the two first stochastic moments.
{"title":"State-Space Formulas for Anisotropic Norm of Linear Discrete Time Varying Stochastic System","authors":"A. Kustov","doi":"10.1109/ICEEE.2018.8533987","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533987","url":null,"abstract":"In this paper, the problem of computation of anisotropic norm of linear discrete time varying finite horizon stochastic system in state-space terms is solved. The relationship with the similar problem in deterministic setting is given. In contrary to this case, the obtained formulas consist of one more matrix equation because of the decomposition of random matrices of a system into two parts associated with the two first stochastic moments.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"37 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88626410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533878
R. Mora-Martínez, E. Suaste-Gómez
Automatic user verification/identification algorithms are an imperative necessity within the field of security systems. The design of more reliable and robust options represents a broad research aim. Biometric systems emerge as a solution for such requirement, but these are not immune to attacks. In the present paper, a biometric solution based on analysis of spontaneous pupillary oscillation (hoppus) are submitted, highlighting its robustness against impostors and spoofs, due to the property of liveness. Throughout the text we describe the methodology for obtaining the information (about a pilot group of seven persons), as well as the proposed feature set for classification purpose. Results for selected classifiers reach maximum values of 100% of training and 85.7% in testing.
{"title":"Biometric Identification System Based on Pupillary Hippus: a Preliminary Study","authors":"R. Mora-Martínez, E. Suaste-Gómez","doi":"10.1109/ICEEE.2018.8533878","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533878","url":null,"abstract":"Automatic user verification/identification algorithms are an imperative necessity within the field of security systems. The design of more reliable and robust options represents a broad research aim. Biometric systems emerge as a solution for such requirement, but these are not immune to attacks. In the present paper, a biometric solution based on analysis of spontaneous pupillary oscillation (hoppus) are submitted, highlighting its robustness against impostors and spoofs, due to the property of liveness. Throughout the text we describe the methodology for obtaining the information (about a pilot group of seven persons), as well as the proposed feature set for classification purpose. Results for selected classifiers reach maximum values of 100% of training and 85.7% in testing.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"1 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88291483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/iceee.2018.8533965
{"title":"CCE 2018 Technical Support Information","authors":"","doi":"10.1109/iceee.2018.8533965","DOIUrl":"https://doi.org/10.1109/iceee.2018.8533965","url":null,"abstract":"","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"31 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88321650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533923
V. Boichenko, A. Kurdyukov, A. Kustov
In this paper the spectral method of the analysis of linear control systems is considered. In framework of this approach the σ-entropy of input signals and the σ-entropy norm of systems are introduced. The invariance of the introduced norm allows to get invariant results of σ-entropy analysis.
{"title":"From the Anisotropy-based Theory towards the σ-entropy Theory","authors":"V. Boichenko, A. Kurdyukov, A. Kustov","doi":"10.1109/ICEEE.2018.8533923","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533923","url":null,"abstract":"In this paper the spectral method of the analysis of linear control systems is considered. In framework of this approach the σ-entropy of input signals and the σ-entropy norm of systems are introduced. The invariance of the introduced norm allows to get invariant results of σ-entropy analysis.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88489919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533949
A. Flores-Perez, M. Gonzalez-Olvera, Yu Tang
In this work, a scheme for the identification of a nonlinearly parameterized neural system described by the Hindmarsh-Rose model, using synchronization and contraction for stability, is proposed. The given algorithm is based on the construction of an adaptive law which helps to render contractive, in a generalized sense, certain virtual system. This virtual dynamics is obtained as an abstract model for which the ideal identification goals and the identification error of the system under study are particular solutions. Contraction ensures that ideal and real trajectories tend to each other whenever they are initialized within the contraction region.The algorithm was successfully applied to identify the scalar nonlinear parameter of the Hindmarsh-Rose model and numerical results are shown in order to demonstrate the effectiveness of the method.
{"title":"Contraction-Based Identification of a Neuron Model with Nonlinear Parameterization via Synchronization","authors":"A. Flores-Perez, M. Gonzalez-Olvera, Yu Tang","doi":"10.1109/ICEEE.2018.8533949","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533949","url":null,"abstract":"In this work, a scheme for the identification of a nonlinearly parameterized neural system described by the Hindmarsh-Rose model, using synchronization and contraction for stability, is proposed. The given algorithm is based on the construction of an adaptive law which helps to render contractive, in a generalized sense, certain virtual system. This virtual dynamics is obtained as an abstract model for which the ideal identification goals and the identification error of the system under study are particular solutions. Contraction ensures that ideal and real trajectories tend to each other whenever they are initialized within the contraction region.The algorithm was successfully applied to identify the scalar nonlinear parameter of the Hindmarsh-Rose model and numerical results are shown in order to demonstrate the effectiveness of the method.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"35 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87203768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/ICEEE.2018.8533937
Y. F. López-Álvarez, F. Casillas-Rodriguez, F. G. Peña-Lecona, J. Munos-Maciel, M. E. Rodríguez-Franco, S. Orozco-Soto
The use of non-destructive methods for physical variables estimation in materials characterization has allowed the structural analysis of response when an external excitation force is applied on a study object [1]. Digital shearography is an optical tool used to estimate micro-deformations by processing information collected with an image acquisition system of an object illuminated with coherent light for two deformation states [2]. This technique has many advantages in industrial applications due to its low sensibility to environmental disturbances. In this work are reported the results obtained in the mechanical response analysis of an electronic device used for voltage regulation (LM7805CT). For testing, a bias voltage was applied to reach maximum power dissipation in the device, localizing a deformation surface around six micrometers close to the input pin. Furthermore, the use of a thermal camera revealed that regions with higher temperature correspond to the maximum deformation detected.
{"title":"Implementation of Optical Shearography for Electronic Devices Analysis","authors":"Y. F. López-Álvarez, F. Casillas-Rodriguez, F. G. Peña-Lecona, J. Munos-Maciel, M. E. Rodríguez-Franco, S. Orozco-Soto","doi":"10.1109/ICEEE.2018.8533937","DOIUrl":"https://doi.org/10.1109/ICEEE.2018.8533937","url":null,"abstract":"The use of non-destructive methods for physical variables estimation in materials characterization has allowed the structural analysis of response when an external excitation force is applied on a study object [1]. Digital shearography is an optical tool used to estimate micro-deformations by processing information collected with an image acquisition system of an object illuminated with coherent light for two deformation states [2]. This technique has many advantages in industrial applications due to its low sensibility to environmental disturbances. In this work are reported the results obtained in the mechanical response analysis of an electronic device used for voltage regulation (LM7805CT). For testing, a bias voltage was applied to reach maximum power dissipation in the device, localizing a deformation surface around six micrometers close to the input pin. Furthermore, the use of a thermal camera revealed that regions with higher temperature correspond to the maximum deformation detected.","PeriodicalId":6924,"journal":{"name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","volume":"31 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74295847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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