{"title":"Cornerstones of Measurement and Analysis","authors":"Akira Kurokawa","doi":"10.1384/jsa.26.227","DOIUrl":"https://doi.org/10.1384/jsa.26.227","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
W. Werner, Martin Hronek, M. Pollach, Henryk Kalbe
Different approaches to quantify shell thicknesses are presented and compared. These comprise: (1) The infinitesimal columns model (IC), (2) Shard’s empirical formula (TNP-model) and (3) SESSA (Simulation of Electron Spectra for Surface Analysis) simulations with and (4) without elastic scattering. Experimental data on of a round robin experiment of PMMA@PTFE CSNPs were analysed with the aforementioned approaches and show a good mutual consistency and agree with the nominal shell thickness. However, use of the F1s signal leads to significant deviations. Transmission Electron Microscopy measurements revealed that the core-shell structure is non-ideal, i.e. the particles are aspherical and the cores are acentric within the particles. SESSA simulations were employed to estimate the effect of various types of deviations of ideal NPs on the outcome of shell thickness determination. The usefulness and importance of different kind of electron beam techniques for CSNP analysis and in particular shell thickness determination is discussed.
{"title":"Characterisation of nanomaterials: XPS analysis of Core-Shell Nanoparticles","authors":"W. Werner, Martin Hronek, M. Pollach, Henryk Kalbe","doi":"10.1384/jsa.26.102","DOIUrl":"https://doi.org/10.1384/jsa.26.102","url":null,"abstract":"Different approaches to quantify shell thicknesses are presented and compared. These comprise: (1) The infinitesimal columns model (IC), (2) Shard’s empirical formula (TNP-model) and (3) SESSA (Simulation of Electron Spectra for Surface Analysis) simulations with and (4) without elastic scattering. Experimental data on of a round robin experiment of PMMA@PTFE CSNPs were analysed with the aforementioned approaches and show a good mutual consistency and agree with the nominal shell thickness. However, use of the F1s signal leads to significant deviations. Transmission Electron Microscopy measurements revealed that the core-shell structure is non-ideal, i.e. the particles are aspherical and the cores are acentric within the particles. SESSA simulations were employed to estimate the effect of various types of deviations of ideal NPs on the outcome of shell thickness determination. The usefulness and importance of different kind of electron beam techniques for CSNP analysis and in particular shell thickness determination is discussed.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"27 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66653294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kohei Matsumura, so-hee Kang, B. Tomiyasu, M. Owari
Secondary ion mass spectrometry (SIMS) has some disadvantages including degradation in depth resolution depending on the depth which are difficult to resolve. To address these disadvantages, we have previously developed shave-off SIMS and achieved two-dimensional mapping. In this study, we designed the appropriate secondary ion optical system by simulation to achieve three-dimensional shave-off SIMS. We developed new optical parts and evaluated the abilities of the designed secondary ion optical system. We acquired the following abilities of the secondary ion optical system: magnification ratio 1.6 × 10, Z-axial resolution 0.70 m, and transmission > 0.1%.
{"title":"Development of Secondary Ion Optical System to Achieve Three-Dimensional Shave-off SIMS","authors":"Kohei Matsumura, so-hee Kang, B. Tomiyasu, M. Owari","doi":"10.1384/jsa.25.172","DOIUrl":"https://doi.org/10.1384/jsa.25.172","url":null,"abstract":"Secondary ion mass spectrometry (SIMS) has some disadvantages including degradation in depth resolution depending on the depth which are difficult to resolve. To address these disadvantages, we have previously developed shave-off SIMS and achieved two-dimensional mapping. In this study, we designed the appropriate secondary ion optical system by simulation to achieve three-dimensional shave-off SIMS. We developed new optical parts and evaluated the abilities of the designed secondary ion optical system. We acquired the following abilities of the secondary ion optical system: magnification ratio 1.6 × 10, Z-axial resolution 0.70 m, and transmission > 0.1%.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66653684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Desorption/Ionization Induced by Neutral SO 2 Clusters (DINeC) is employed as a very soft and efficient desorption/ionization source for mass spectrometry of molecules and their reactions on surfaces. The matrix-free desorption method is based on cluster-surface impact of SO 2 clusters at low cluster energy. As a result, fragmentation-free spectra from surfaces composed of or covered with complex molecules such as peptides and proteins are observed. Molecules at a surface coverage as low as 0.1 monolayers were detected; surface reactions such as H/D exchange or thermal decomposition were observed in real-time and the kinetics of the reactions could be deduced.
{"title":"Cluster-induced desorption/ionization mass spectrometry as a versatile tool for the analysis of complex molecules and their reactions on surfaces","authors":"Karolin Bomhardt, P. Schneider, M. Dürr","doi":"10.1384/jsa.26.122","DOIUrl":"https://doi.org/10.1384/jsa.26.122","url":null,"abstract":"Desorption/Ionization Induced by Neutral SO 2 Clusters (DINeC) is employed as a very soft and efficient desorption/ionization source for mass spectrometry of molecules and their reactions on surfaces. The matrix-free desorption method is based on cluster-surface impact of SO 2 clusters at low cluster energy. As a result, fragmentation-free spectra from surfaces composed of or covered with complex molecules such as peptides and proteins are observed. Molecules at a surface coverage as low as 0.1 monolayers were detected; surface reactions such as H/D exchange or thermal decomposition were observed in real-time and the kinetics of the reactions could be deduced.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66653926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We have calculated inelastic mean free paths (IMFPs) for 45 compounds for electron energies over the 50 eV to 200 keV range with the full Penn algorithm from the energy-loss functions of the compounds. Our calculated IMFPs could be fitted to a modified form of the relativistic Bethe equation for inelastic scattering in matter for energies from 50 eV to 200 keV. The average root-mean-square deviation in these fits was 0.60 %. The IMFPs were also compared with a relativistic version of our predictive Tanuma-Powell-Penn (TPP-2M) equation.
{"title":"Electron inelastic mean free paths in compounds","authors":"S. Tanuma, H. Shinotsuka, C. Powell, D. R. Penn","doi":"10.1384/jsa.26.106","DOIUrl":"https://doi.org/10.1384/jsa.26.106","url":null,"abstract":"We have calculated inelastic mean free paths (IMFPs) for 45 compounds for electron energies over the 50 eV to 200 keV range with the full Penn algorithm from the energy-loss functions of the compounds. Our calculated IMFPs could be fitted to a modified form of the relativistic Bethe equation for inelastic scattering in matter for energies from 50 eV to 200 keV. The average root-mean-square deviation in these fits was 0.60 %. The IMFPs were also compared with a relativistic version of our predictive Tanuma-Powell-Penn (TPP-2M) equation.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Since diesel soot particles (black carbon, BC) is a very fine particle of about 10 to 50 nm, there is a possibility that it invades deep into human lungs. In order to evaluate the impact of BC on human health, it is necessary to observe the detailed structure of BC along with toxicology. Focused ion beam time-of-flight secondary ion mass spectrometer (FIB-TOF-SIMS) developed by the authors, has a high spatial resolution and low detection limit, and the components imaging of individual particle can be analyzed with many kinds of aerosol. However, since BC is very small, the detailed structure of particles cannot be observed directly with the FIB-TOF-SIMS. In this study, in order to evaluate the structure of BC, we combined a new aerosol dialysis method and the FIB-TOF-SIMS. In this method, even if the lateral resolution is insufficient, the structure of BC can be visualized with separating the particles and surface adhering components, respectively.
{"title":"Analysis of dissolved components from diesel soot particles","authors":"Toru Murata, Kodai Takano, M. Morita, T. Sakamoto","doi":"10.1384/jsa.26.196","DOIUrl":"https://doi.org/10.1384/jsa.26.196","url":null,"abstract":"Since diesel soot particles (black carbon, BC) is a very fine particle of about 10 to 50 nm, there is a possibility that it invades deep into human lungs. In order to evaluate the impact of BC on human health, it is necessary to observe the detailed structure of BC along with toxicology. Focused ion beam time-of-flight secondary ion mass spectrometer (FIB-TOF-SIMS) developed by the authors, has a high spatial resolution and low detection limit, and the components imaging of individual particle can be analyzed with many kinds of aerosol. However, since BC is very small, the detailed structure of particles cannot be observed directly with the FIB-TOF-SIMS. In this study, in order to evaluate the structure of BC, we combined a new aerosol dialysis method and the FIB-TOF-SIMS. In this method, even if the lateral resolution is insufficient, the structure of BC can be visualized with separating the particles and surface adhering components, respectively.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Gerrard, J. Counsell, A. Roberts, C. Blomfield, C. Moffitt, T. Conard
Here we provide an overview of a multi-technique investigation of layered thin film and ultra-thin film coatings. Surface sensitive analytical techniques are chosen for their different sampling depths and include a combination of conventional Al K and higher photon energy Ag L excited XPS, angle resolved X-ray photoelectron spectroscopy (ARXPS) with maximum entropy method (MEM) reconstruction of concentration depth profiles and argon cluster
{"title":"A Multi-Technique Approach for a Complete Thin Film Characterisation","authors":"N. Gerrard, J. Counsell, A. Roberts, C. Blomfield, C. Moffitt, T. Conard","doi":"10.1384/jsa.26.184","DOIUrl":"https://doi.org/10.1384/jsa.26.184","url":null,"abstract":"Here we provide an overview of a multi-technique investigation of layered thin film and ultra-thin film coatings. Surface sensitive analytical techniques are chosen for their different sampling depths and include a combination of conventional Al K and higher photon energy Ag L excited XPS, angle resolved X-ray photoelectron spectroscopy (ARXPS) with maximum entropy method (MEM) reconstruction of concentration depth profiles and argon cluster","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Kurokawa, K. Kumagai, Satoru Akai, N. Handa, Yoshikazu Sasaki, N. Kikuchi, S. Kitamura, H. Manabe
The detection method for the ring-shaped agglomerations of nanoparticles (NPs) on a microgrid surface is described. The ring distribution of NPs is typically formed by naturally drying the droplet of nanoparticle-dispersed water. Fluorescent (FL) NPs dispersed in water and an FL microscope were used for the identification of the ring formation. With this method, the reduction of the ring formation was observed by a freeze-drying specimen preparation. The comparison with the transmission electron microscope image showed that this method gives not only for ring-shape detection but also for the evaluation of the particle-density homogeneity.
{"title":"Detection method for ring-shape agglomerations formed by drying nanoparticle-dispersed droplet","authors":"A. Kurokawa, K. Kumagai, Satoru Akai, N. Handa, Yoshikazu Sasaki, N. Kikuchi, S. Kitamura, H. Manabe","doi":"10.1384/jsa.26.210","DOIUrl":"https://doi.org/10.1384/jsa.26.210","url":null,"abstract":"The detection method for the ring-shaped agglomerations of nanoparticles (NPs) on a microgrid surface is described. The ring distribution of NPs is typically formed by naturally drying the droplet of nanoparticle-dispersed water. Fluorescent (FL) NPs dispersed in water and an FL microscope were used for the identification of the ring formation. With this method, the reduction of the ring formation was observed by a freeze-drying specimen preparation. The comparison with the transmission electron microscope image showed that this method gives not only for ring-shape detection but also for the evaluation of the particle-density homogeneity.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nishida Shinsuke, Yasunaga Shinya, Shinya Otomo, H. Sasaki
{"title":"Chemical state analysis for Al2O3 layer of Y2O3/Al2O3 multi-layer using laboratory HAXPES","authors":"Nishida Shinsuke, Yasunaga Shinya, Shinya Otomo, H. Sasaki","doi":"10.1384/jsa.26.216","DOIUrl":"https://doi.org/10.1384/jsa.26.216","url":null,"abstract":"","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66654726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The confocal Raman microscope is a very useful tool that spatially visualizes the Raman activity of a sample with diffraction-limited high spatial resolution. Spatial resolution is a key specification of the performance of a manufactured Raman microscope but is often characterized differently. Here, test specimens made using dispersed carbon nanotubes and suspended graphene were prepared and measured to provide standardized estimation of the lateral and axial spatial resolution of the Raman microscope. General information of the standard specimen for lateral or axial resolution and case studies of actual measurements are also provided.
{"title":"Standardized Estimation of Spatial Resolution of Confocal Raman Imaging","authors":"E. J. Lee, Youngbum Kim, Jeongyong Kim","doi":"10.1384/jsa.26.154","DOIUrl":"https://doi.org/10.1384/jsa.26.154","url":null,"abstract":"The confocal Raman microscope is a very useful tool that spatially visualizes the Raman activity of a sample with diffraction-limited high spatial resolution. Spatial resolution is a key specification of the performance of a manufactured Raman microscope but is often characterized differently. Here, test specimens made using dispersed carbon nanotubes and suspended graphene were prepared and measured to provide standardized estimation of the lateral and axial spatial resolution of the Raman microscope. General information of the standard specimen for lateral or axial resolution and case studies of actual measurements are also provided.","PeriodicalId":90628,"journal":{"name":"Journal of surface analysis (Online)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"66653837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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