In this paper, we have investigated the effect of thermal interface materials (TIMs) on the accuracy and uncertainty of thermal conductivity measurements. A modified ASTM D5470 thermal resistance tester (TRT) has been developed to measure the out-of-plane thermal conductivity of pyrolytic graphite (PG) and titanium grade 2 (TiG2) with and without TIMs. Compared to the ASTM D5470 standard, this modified design uses three thermocouples per side to support regressive analysis of the temperature profile and quantifies the uncertainty of the measurements with and without TIMs. Nine PG samples and four TiG2 samples of varying thickness have been tested to obtain thermal resistance as a function of sample thickness. The steady-state temperature profiles were used for heat flux and thermal resistance calculation. The results reveal that TIMs significantly reduce measurement uncertainty for both samples, i.e., 38.8 % for TiG2 and 27.8 % for PG. The effect of TIMs on the measurement accuracy diverges, with a far more pronounced effect on TiG2 than PG. This can be owed to the higher out-of-plane thermal conductivity of TiG2 (∼16.2 W/m-K) than PG (∼2 W/m-K). Contact resistance is expected to play a more critical role in tests of materials with higher thermal conductivity, and TIMs can effectively mitigate contact resistance. For lower conductivity materials, the weight of contact resistance is lower, and the effect of TIMs is thus less pronounced. This work establishes a robust framework for quantifying and mitigating uncertainties in thermal conductivity measurements, which will lead to more accurate characterization of materials for the design and qualification of advanced thermal management systems in aerospace, electronics, and energy applications.
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