Pub Date : 2024-07-14DOI: 10.1016/j.elspec.2024.147462
Photoelectron spectroscopy (PES) investigation of two widely used herbicide compounds MCPA and 2,4-D is reported. The GW calculations are shown to offer a good description of their electronic structure. There is excellent agreement between the experimental and theoretical energies of the HOMO states of 2,4-D and MCPA, which are at 8.7 eV and 8.5 eV binding energy, respectively. The low energy tail of the HOMO state extends to about 8 eV. The good agreement between the UPS (ultraviolet photoelectron spectroscopy) spectra and the simulation validates the proposed conformer. The presented gas phase data will help researchers to analyze data from liquid and diluted samples of these herbicide molecules and perform additional theoretical modelling.
报告对两种广泛使用的除草剂化合物 MCPA 和 2,4-D 进行了光电子能谱(PES)研究。结果表明,GW 计算很好地描述了这两种化合物的电子结构。2,4-D 和 MCPA 的 HOMO 状态的结合能分别为 8.7 eV 和 8.5 eV,其实验能量与理论能量非常吻合。HOMO 状态的低能尾延伸至约 8 eV。UPS(紫外光电子能谱)光谱与模拟之间的良好一致性验证了所提出的构象。所提供的气相数据将有助于研究人员分析这些除草剂分子的液态和稀释样品数据,并进行更多的理论建模。
{"title":"Gas-phase PES and GW investigation of two widespread herbicides: MCPA and 2,4-dichlorophenoxyacetic acid","authors":"","doi":"10.1016/j.elspec.2024.147462","DOIUrl":"10.1016/j.elspec.2024.147462","url":null,"abstract":"<div><p>Photoelectron spectroscopy (PES) investigation of two widely used herbicide compounds MCPA and 2,4-D is reported. The GW calculations are shown to offer a good description of their electronic structure. There is excellent agreement between the experimental and theoretical energies of the HOMO states of 2,4-D and MCPA, which are at 8.7 eV and 8.5 eV binding energy, respectively. The low energy tail of the HOMO state extends to about 8 eV. The good agreement between the UPS (ultraviolet photoelectron spectroscopy) spectra and the simulation validates the proposed conformer. The presented gas phase data will help researchers to analyze data from liquid and diluted samples of these herbicide molecules and perform additional theoretical modelling.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141623664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-11DOI: 10.1016/j.elspec.2024.147461
We have investigated the laser induced ultrafast dynamics of Gd 4f spins at the surface of CoxGd100-x alloys by means of surface-sensitive and time-resolved dichroic resonant Auger spectroscopy. We have observed that the laser induced quenching of Gd 4f magnetic order at the surface of the CoxGd100-x alloys occur on a much longer time scale than that previously reported in “bulk sensitive” time-resolved experiments. In parallel, we have characterized the static structural and magnetic properties at the surface and in the bulk of these alloys by combining Physical Property Measurement System (PPMS) magnetometry with X-ray Magnetic Circular Dichroism in absorption spectroscopy (XMCD) and X-Ray Photoelectron spectroscopy (XPS). The PPMS and XMCD measurements give information regarding the composition in the bulk of the alloys. The XPS measurements show non-homogeneous composition at the surface of the alloys with a strongly increased Gd content within the first layers compared to the nominal bulk values. Such larger Gd concentration results in a reduced indirect Gd 4f spin-lattice coupling. It explains the “slower” Gd 4f demagnetization we have observed in our surface-sensitive and time-resolved measurements compared to that previously reported by “bulk-sensitive” measurements.
{"title":"Laser induced ultrafast Gd 4f spin dynamics at the surface of amorphous CoxGd100-x ferrimagnetic alloys","authors":"","doi":"10.1016/j.elspec.2024.147461","DOIUrl":"10.1016/j.elspec.2024.147461","url":null,"abstract":"<div><p>We have investigated the laser induced ultrafast dynamics of Gd 4f spins at the surface of Co<sub>x</sub>Gd<sub>100-x</sub> alloys by means of surface-sensitive and time-resolved dichroic resonant Auger spectroscopy. We have observed that the laser induced quenching of Gd 4f magnetic order at the surface of the Co<sub>x</sub>Gd<sub>100-x</sub> alloys occur on a much longer time scale than that previously reported in “bulk sensitive” time-resolved experiments. In parallel, we have characterized the static structural and magnetic properties at the surface and in the bulk of these alloys by combining Physical Property Measurement System (PPMS) magnetometry with X-ray Magnetic Circular Dichroism in absorption spectroscopy (XMCD) and X-Ray Photoelectron spectroscopy (XPS). The PPMS and XMCD measurements give information regarding the composition in the bulk of the alloys. The XPS measurements show non-homogeneous composition at the surface of the alloys with a strongly increased Gd content within the first layers compared to the nominal bulk values. Such larger Gd concentration results in a reduced indirect Gd 4f spin-lattice coupling. It explains the “slower” Gd 4f demagnetization we have observed in our surface-sensitive and time-resolved measurements compared to that previously reported by “bulk-sensitive” measurements.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141775048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-04DOI: 10.1016/j.elspec.2024.147460
Felipe Arretche , Eliton P. Seidel , Wagner Tenfen
Model exchange potentials are particularly interesting to account for the indistinguishability between the projectile and target electrons in electron-atom scattering in vacuo and plasma environments. It is well known that their performance is pretty satisfactory in the high energies but also that discrepancies from the results obtained with exact exchange are found toward the zero energy limit. In this article, we examine how well established model exchange potentials based on the free electron gas approach compare to phase shifts calculated considering exchange in exact form. In particular, we show that the Hara and the semiclassical exchange potentials are able to reproduce reference low energy phase shifts through a simple scale transformation, in opposition to the previous approaches where energy dependent corrections to the local momentum were adopted. We provide the scale factors and phase shifts for electron scattering by He, Ne and Ar atoms for 1,0 a. Such scaling factors can be determined reproducing the scattering length and the number of s-wave bound states from exact exchange calculations. We also show that the scaling procedure works for electronic densities that present the physically correct asymptotic behavior. The present results are important to the research field, since they form the basis to construction of scattering models based on optical potential approaches.
模型交换势对于解释在真空和等离子体环境下电子原子散射中射弹电子和目标电子之间的不可分性尤为重要。众所周知,模型交换势在高能量下的表现相当令人满意,但在零能量极限下,模型交换势与精确交换得到的结果也存在差异。在本文中,我们研究了基于自由电子气体方法的成熟模型交换势与精确交换计算出的相移的比较。特别是,我们表明哈拉和半经典交换势能够通过简单的尺度变换重现参考的低能相移,这与之前采用的对局部动量进行能量依赖修正的方法截然不同。我们提供了 k< 1,0 a0-1 时 He、Ne 和 Ar 原子电子散射的尺度因子和相移。这些比例因子可以通过精确交换计算再现散射长度和 s 波束缚态的数量来确定。我们还表明,缩放程序适用于呈现物理上正确渐近行为的电子密度。本研究成果对研究领域具有重要意义,因为它们为构建基于光学势方法的散射模型奠定了基础。
{"title":"Scale transformations in model exchange potentials in low energy electron-atom scattering","authors":"Felipe Arretche , Eliton P. Seidel , Wagner Tenfen","doi":"10.1016/j.elspec.2024.147460","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147460","url":null,"abstract":"<div><p>Model exchange potentials are particularly interesting to account for the indistinguishability between the projectile and target electrons in electron-atom scattering in vacuo and plasma environments. It is well known that their performance is pretty satisfactory in the high energies but also that discrepancies from the results obtained with exact exchange are found toward the zero energy limit. In this article, we examine how well established model exchange potentials based on the free electron gas approach compare to phase shifts calculated considering exchange in exact form. In particular, we show that the Hara and the semiclassical exchange potentials are able to reproduce reference low energy phase shifts through a simple scale transformation, in opposition to the previous approaches where energy dependent corrections to the local momentum were adopted. We provide the scale factors and phase shifts for electron scattering by He, Ne and Ar atoms for <span><math><mrow><mi>k</mi><mo><</mo></mrow></math></span> 1,0 a<span><math><msubsup><mrow></mrow><mrow><mn>0</mn></mrow><mrow><mo>−</mo><mn>1</mn></mrow></msubsup></math></span>. Such scaling factors can be determined reproducing the scattering length and the number of s-wave bound states from exact exchange calculations. We also show that the scaling procedure works for electronic densities that present the physically correct asymptotic behavior. The present results are important to the research field, since they form the basis to construction of scattering models based on optical potential approaches.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141592970","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-24DOI: 10.1016/j.elspec.2024.147459
Maximiliano Segala , Delano P. Chong
Earlier study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of 31 molecules shows that our Density Functional Theory (DFT) method called ∆PBE0(SAOP) performs very well except for the three perhalogenated molecules included in the study. The present work expands the study to 85 molecules including 40 containing halogens. Analysis of a total of 500 vertical ionization potentials (VIPs) confirms that ∆PBE0(SAOP) continues to excel for nonhalogenated molecules with an average absolute deviations (AAD) of 0.19 eV and reveals that the best method for halogenated molecules is ∆mPW1K(SAOP) with an AAD of 0.21 eV.
{"title":"Further study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of gas-phase molecules","authors":"Maximiliano Segala , Delano P. Chong","doi":"10.1016/j.elspec.2024.147459","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147459","url":null,"abstract":"<div><p>Earlier study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of 31 molecules shows that our Density Functional Theory (DFT) method called ∆PBE0(SAOP) performs very well except for the three perhalogenated molecules included in the study. The present work expands the study to 85 molecules including 40 containing halogens. Analysis of a total of 500 vertical ionization potentials (VIPs) confirms that ∆PBE0(SAOP) continues to excel for nonhalogenated molecules with an average absolute deviations (AAD) of 0.19 eV and reveals that the best method for halogenated molecules is ∆mPW1K(SAOP) with an AAD of 0.21 eV.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141484327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The analysis of X-ray photoelectron spectra often faces challenges due to the lack of standardization in modeling approaches, background subtraction methods, and computational algorithms within the field of computer science. The interpretation of XPS data significantly relies on the unique expertise and judgment of individual researchers. Therefore, the objective of this study is to highlight the difficulties associated with analytical methods that depend heavily on the discretion of individual scientists, to elucidate the prevailing models and background subtraction techniques, and to suggest improvements to these methodologies. This endeavor aims to enhance the reliability and reproducibility of XPS analysis, thereby contributing to the advancement of research in this area. By utilizing the information criterion as part of a thorough search methodology in Bayesian inference, we show that our sophisticated analytical techniques significantly outperform others in the analysis of actual X-ray photoelectron spectroscopy (XPS) spectra. This improvement is evidenced through enhanced accuracy and reliability in spectral interpretation, underscoring the efficacy of our methods in practical applications of XPS.
由于计算机科学领域的建模方法、背景减除方法和计算算法缺乏标准化,X 射线光电子能谱分析经常面临挑战。XPS 数据的解读在很大程度上依赖于研究人员个人独特的专业知识和判断。因此,本研究的目的是强调与严重依赖科学家个人判断的分析方法相关的困难,阐明流行的模型和背景减除技术,并对这些方法提出改进建议。这项工作旨在提高 XPS 分析的可靠性和可重复性,从而推动该领域研究的发展。通过利用信息标准作为贝叶斯推理中彻底搜索方法的一部分,我们表明,在实际 X 射线光电子能谱(XPS)光谱分析中,我们的复杂分析技术明显优于其他技术。这种改进体现在提高了光谱解释的准确性和可靠性,凸显了我们的方法在 XPS 实际应用中的功效。
{"title":"Reassessment of the Shirley and model functions within X-ray photoelectron spectroscopy analysis utilizing comprehensive search methodologies of Bayesian inference","authors":"Genki Suzuki , Eiji Ikenaga , Satoshi Ogawa , Yuichi Yokoyama , Masaichiro Mizumaki","doi":"10.1016/j.elspec.2024.147450","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147450","url":null,"abstract":"<div><p>The analysis of X-ray photoelectron spectra often faces challenges due to the lack of standardization in modeling approaches, background subtraction methods, and computational algorithms within the field of computer science. The interpretation of XPS data significantly relies on the unique expertise and judgment of individual researchers. Therefore, the objective of this study is to highlight the difficulties associated with analytical methods that depend heavily on the discretion of individual scientists, to elucidate the prevailing models and background subtraction techniques, and to suggest improvements to these methodologies. This endeavor aims to enhance the reliability and reproducibility of XPS analysis, thereby contributing to the advancement of research in this area. By utilizing the information criterion as part of a thorough search methodology in Bayesian inference, we show that our sophisticated analytical techniques significantly outperform others in the analysis of actual X-ray photoelectron spectroscopy (XPS) spectra. This improvement is evidenced through enhanced accuracy and reliability in spectral interpretation, underscoring the efficacy of our methods in practical applications of XPS.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204824000331/pdfft?md5=ec2601473e7e650e86fb2cb4e70e4418&pid=1-s2.0-S0368204824000331-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141292010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-08DOI: 10.1016/j.elspec.2024.147452
Haytham Eraky , James J. Dynes , Adam P. Hitchcock
Manganese oxides (MnOx) are used as electrode materials in many different energy storage applications such as batteries and supercapacitors. X-ray spectromicroscopy, using near edge X-ray absorption spectra (NEXAFS) for chemical speciation, is a powerful tool to study reduction and oxidation processes in such systems. High quality reference spectra are required for both qualitative identification and quantitative mapping of MnOx species. Here we present accurate, quantitative Mn 2p and O 1s NEXAFS spectra of MnO, MnSO4, Mn3O4, Mn2O3, α-MnO2, β-MnO2, and KMnO4, measured using both transmission and total electron yield X-ray absorption techniques. An example of the use of these reference spectra in a study of Zn/MnO2 batteries is given.
锰氧化物(MnOx)在电池和超级电容器等许多不同的储能应用中被用作电极材料。利用近边缘 X 射线吸收光谱 (NEXAFS) 进行化学标示的 X 射线光谱学是研究此类系统中还原和氧化过程的有力工具。定性鉴定和定量绘制氧化锰物种图谱都需要高质量的参考光谱。在此,我们利用透射和全电子产率 X 射线吸收技术测量了 MnO、MnSO4、Mn3O4、Mn2O3、α-MnO2、β-MnO2 和 KMnO4 准确、定量的 Mn 2p 和 O 1s NEXAFS 光谱。举例说明了在研究锌/二氧化锰电池时如何使用这些参考光谱。
{"title":"Mn 2p and O 1s X-ray absorption spectroscopy of manganese oxides","authors":"Haytham Eraky , James J. Dynes , Adam P. Hitchcock","doi":"10.1016/j.elspec.2024.147452","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147452","url":null,"abstract":"<div><p>Manganese oxides (MnOx) are used as electrode materials in many different energy storage applications such as batteries and supercapacitors. X-ray spectromicroscopy, using near edge X-ray absorption spectra (NEXAFS) for chemical speciation, is a powerful tool to study reduction and oxidation processes in such systems. High quality reference spectra are required for both qualitative identification and quantitative mapping of MnOx species. Here we present accurate, quantitative Mn 2p and O 1s NEXAFS spectra of MnO, MnSO<sub>4</sub>, Mn<sub>3</sub>O<sub>4</sub>, Mn<sub>2</sub>O<sub>3</sub>, α-MnO<sub>2</sub>, β-MnO<sub>2</sub>, and KMnO<sub>4</sub>, measured using both transmission and total electron yield X-ray absorption techniques. An example of the use of these reference spectra in a study of Zn/MnO<sub>2</sub> batteries is given.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204824000355/pdfft?md5=57f809a3695368db7cd546d643f4cbc6&pid=1-s2.0-S0368204824000355-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141292011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Corrigendum to “Dissociative electron attachment to 1- and 9-chloroanthracene in the gas phase” [J. Electron Spectrosc. Relat. Phenom. 267 (2023) 147383]","authors":"N.L. Asfandiarov , M.V. Muftakhov, S.A. Pshenichnyuk","doi":"10.1016/j.elspec.2023.147415","DOIUrl":"10.1016/j.elspec.2023.147415","url":null,"abstract":"","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204823001329/pdfft?md5=cb6535133d412e854c8596150a4df7cc&pid=1-s2.0-S0368204823001329-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138493669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-01DOI: 10.1016/j.elspec.2024.147438
Adam P. Hitchcock , Nobuhiro Kosugi
{"title":"Introduction to special issue on X-ray spectromicroscopy","authors":"Adam P. Hitchcock , Nobuhiro Kosugi","doi":"10.1016/j.elspec.2024.147438","DOIUrl":"10.1016/j.elspec.2024.147438","url":null,"abstract":"","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140403941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique for the nondestructive identification of elemental species and chemical states of solid samples, and the measured spectra are affected by not only sample-specific information but also factors dependent on the measurement environment. This feature makes it difficult to analyze the data for the chemical state identification of mixed samples when referring to the data measured with different models or in different environments. In a previous study, Bayesian inference was successfully applied to the analysis of XPS narrow-scan spectra, but the challenge was to apply Bayesian inference to XPS spectra of samples that are nonuniform in the depth direction. We propose a method to infer the layer structure of a sample from XPS spectra by incorporating Bayesian inference into the simulation of electron spectra for surface analysis (SESSA). SESSA can simulate XPS spectra of samples with specified composition and microstructure, and is already in use as a simulator with highly reproducible results. By utilizing the proposed method, one can estimate the layer structure of a sample from XPS data on the basis of the posterior probability distribution. In a typical XPS measurement, wide-scan data are acquired to qualitatively identify elemental species, and narrow-scan data are acquired to the estimate detailed composition and chemical state information of a sample. In this study, we have shown that given wide-scan or narrow-scan data without angle resolution, Bayesian inference can be applied to quantitatively analyze the layer structure information.
{"title":"Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data","authors":"Atsushi Machida , Kenji Nagata , Ryo Murakami , Hiroshi Shinotsuka , Hayaru Shouno , Hideki Yoshikawa , Masato Okada","doi":"10.1016/j.elspec.2024.147449","DOIUrl":"10.1016/j.elspec.2024.147449","url":null,"abstract":"<div><p>X-ray photoelectron spectroscopy (XPS) is a surface analysis technique for the nondestructive identification of elemental species and chemical states of solid samples, and the measured spectra are affected by not only sample-specific information but also factors dependent on the measurement environment. This feature makes it difficult to analyze the data for the chemical state identification of mixed samples when referring to the data measured with different models or in different environments. In a previous study, Bayesian inference was successfully applied to the analysis of XPS narrow-scan spectra, but the challenge was to apply Bayesian inference to XPS spectra of samples that are nonuniform in the depth direction. We propose a method to infer the layer structure of a sample from XPS spectra by incorporating Bayesian inference into the simulation of electron spectra for surface analysis (SESSA). SESSA can simulate XPS spectra of samples with specified composition and microstructure, and is already in use as a simulator with highly reproducible results. By utilizing the proposed method, one can estimate the layer structure of a sample from XPS data on the basis of the posterior probability distribution. In a typical XPS measurement, wide-scan data are acquired to qualitatively identify elemental species, and narrow-scan data are acquired to the estimate detailed composition and chemical state information of a sample. In this study, we have shown that given wide-scan or narrow-scan data without angle resolution, Bayesian inference can be applied to quantitatively analyze the layer structure information.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S036820482400032X/pdfft?md5=dbb403ed40878b1d61924f63795fc2b2&pid=1-s2.0-S036820482400032X-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141189445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-01DOI: 10.1016/j.elspec.2024.147440
Jack Zwettler , Henry Amir , Faren H. Marashi , Nina Bielinski , Sahaj Patel , Pranav Mahaadev , Yijing Huang , Dipanjan Chaudhuri , Xuefei Guo , Tai Chang Chiang , Dirk K. Morr , Peter Abbamonte , Fahad Mahmood
{"title":"Corrigendum to “An extreme ultraviolet 2e-ARPES setup based on dual time-of-flight analyzers”[J. Electron Spectrosc. Relat. Phenom. 270 (2024) 147417]","authors":"Jack Zwettler , Henry Amir , Faren H. Marashi , Nina Bielinski , Sahaj Patel , Pranav Mahaadev , Yijing Huang , Dipanjan Chaudhuri , Xuefei Guo , Tai Chang Chiang , Dirk K. Morr , Peter Abbamonte , Fahad Mahmood","doi":"10.1016/j.elspec.2024.147440","DOIUrl":"10.1016/j.elspec.2024.147440","url":null,"abstract":"","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204824000239/pdfft?md5=0a1b0beeb0efde28fd1e71cec28b253c&pid=1-s2.0-S0368204824000239-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140768931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}