Pub Date : 2024-06-24DOI: 10.1016/j.elspec.2024.147459
Maximiliano Segala , Delano P. Chong
Earlier study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of 31 molecules shows that our Density Functional Theory (DFT) method called ∆PBE0(SAOP) performs very well except for the three perhalogenated molecules included in the study. The present work expands the study to 85 molecules including 40 containing halogens. Analysis of a total of 500 vertical ionization potentials (VIPs) confirms that ∆PBE0(SAOP) continues to excel for nonhalogenated molecules with an average absolute deviations (AAD) of 0.19 eV and reveals that the best method for halogenated molecules is ∆mPW1K(SAOP) with an AAD of 0.21 eV.
{"title":"Further study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of gas-phase molecules","authors":"Maximiliano Segala , Delano P. Chong","doi":"10.1016/j.elspec.2024.147459","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147459","url":null,"abstract":"<div><p>Earlier study of exchange-correlation functionals for the calculations of outer-valence ionization potentials of 31 molecules shows that our Density Functional Theory (DFT) method called ∆PBE0(SAOP) performs very well except for the three perhalogenated molecules included in the study. The present work expands the study to 85 molecules including 40 containing halogens. Analysis of a total of 500 vertical ionization potentials (VIPs) confirms that ∆PBE0(SAOP) continues to excel for nonhalogenated molecules with an average absolute deviations (AAD) of 0.19 eV and reveals that the best method for halogenated molecules is ∆mPW1K(SAOP) with an AAD of 0.21 eV.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"274 ","pages":"Article 147459"},"PeriodicalIF":1.8,"publicationDate":"2024-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141484327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The analysis of X-ray photoelectron spectra often faces challenges due to the lack of standardization in modeling approaches, background subtraction methods, and computational algorithms within the field of computer science. The interpretation of XPS data significantly relies on the unique expertise and judgment of individual researchers. Therefore, the objective of this study is to highlight the difficulties associated with analytical methods that depend heavily on the discretion of individual scientists, to elucidate the prevailing models and background subtraction techniques, and to suggest improvements to these methodologies. This endeavor aims to enhance the reliability and reproducibility of XPS analysis, thereby contributing to the advancement of research in this area. By utilizing the information criterion as part of a thorough search methodology in Bayesian inference, we show that our sophisticated analytical techniques significantly outperform others in the analysis of actual X-ray photoelectron spectroscopy (XPS) spectra. This improvement is evidenced through enhanced accuracy and reliability in spectral interpretation, underscoring the efficacy of our methods in practical applications of XPS.
由于计算机科学领域的建模方法、背景减除方法和计算算法缺乏标准化,X 射线光电子能谱分析经常面临挑战。XPS 数据的解读在很大程度上依赖于研究人员个人独特的专业知识和判断。因此,本研究的目的是强调与严重依赖科学家个人判断的分析方法相关的困难,阐明流行的模型和背景减除技术,并对这些方法提出改进建议。这项工作旨在提高 XPS 分析的可靠性和可重复性,从而推动该领域研究的发展。通过利用信息标准作为贝叶斯推理中彻底搜索方法的一部分,我们表明,在实际 X 射线光电子能谱(XPS)光谱分析中,我们的复杂分析技术明显优于其他技术。这种改进体现在提高了光谱解释的准确性和可靠性,凸显了我们的方法在 XPS 实际应用中的功效。
{"title":"Reassessment of the Shirley and model functions within X-ray photoelectron spectroscopy analysis utilizing comprehensive search methodologies of Bayesian inference","authors":"Genki Suzuki , Eiji Ikenaga , Satoshi Ogawa , Yuichi Yokoyama , Masaichiro Mizumaki","doi":"10.1016/j.elspec.2024.147450","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147450","url":null,"abstract":"<div><p>The analysis of X-ray photoelectron spectra often faces challenges due to the lack of standardization in modeling approaches, background subtraction methods, and computational algorithms within the field of computer science. The interpretation of XPS data significantly relies on the unique expertise and judgment of individual researchers. Therefore, the objective of this study is to highlight the difficulties associated with analytical methods that depend heavily on the discretion of individual scientists, to elucidate the prevailing models and background subtraction techniques, and to suggest improvements to these methodologies. This endeavor aims to enhance the reliability and reproducibility of XPS analysis, thereby contributing to the advancement of research in this area. By utilizing the information criterion as part of a thorough search methodology in Bayesian inference, we show that our sophisticated analytical techniques significantly outperform others in the analysis of actual X-ray photoelectron spectroscopy (XPS) spectra. This improvement is evidenced through enhanced accuracy and reliability in spectral interpretation, underscoring the efficacy of our methods in practical applications of XPS.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"274 ","pages":"Article 147450"},"PeriodicalIF":1.9,"publicationDate":"2024-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204824000331/pdfft?md5=ec2601473e7e650e86fb2cb4e70e4418&pid=1-s2.0-S0368204824000331-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141292010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-08DOI: 10.1016/j.elspec.2024.147452
Haytham Eraky , James J. Dynes , Adam P. Hitchcock
Manganese oxides (MnOx) are used as electrode materials in many different energy storage applications such as batteries and supercapacitors. X-ray spectromicroscopy, using near edge X-ray absorption spectra (NEXAFS) for chemical speciation, is a powerful tool to study reduction and oxidation processes in such systems. High quality reference spectra are required for both qualitative identification and quantitative mapping of MnOx species. Here we present accurate, quantitative Mn 2p and O 1s NEXAFS spectra of MnO, MnSO4, Mn3O4, Mn2O3, α-MnO2, β-MnO2, and KMnO4, measured using both transmission and total electron yield X-ray absorption techniques. An example of the use of these reference spectra in a study of Zn/MnO2 batteries is given.
锰氧化物(MnOx)在电池和超级电容器等许多不同的储能应用中被用作电极材料。利用近边缘 X 射线吸收光谱 (NEXAFS) 进行化学标示的 X 射线光谱学是研究此类系统中还原和氧化过程的有力工具。定性鉴定和定量绘制氧化锰物种图谱都需要高质量的参考光谱。在此,我们利用透射和全电子产率 X 射线吸收技术测量了 MnO、MnSO4、Mn3O4、Mn2O3、α-MnO2、β-MnO2 和 KMnO4 准确、定量的 Mn 2p 和 O 1s NEXAFS 光谱。举例说明了在研究锌/二氧化锰电池时如何使用这些参考光谱。
{"title":"Mn 2p and O 1s X-ray absorption spectroscopy of manganese oxides","authors":"Haytham Eraky , James J. Dynes , Adam P. Hitchcock","doi":"10.1016/j.elspec.2024.147452","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147452","url":null,"abstract":"<div><p>Manganese oxides (MnOx) are used as electrode materials in many different energy storage applications such as batteries and supercapacitors. X-ray spectromicroscopy, using near edge X-ray absorption spectra (NEXAFS) for chemical speciation, is a powerful tool to study reduction and oxidation processes in such systems. High quality reference spectra are required for both qualitative identification and quantitative mapping of MnOx species. Here we present accurate, quantitative Mn 2p and O 1s NEXAFS spectra of MnO, MnSO<sub>4</sub>, Mn<sub>3</sub>O<sub>4</sub>, Mn<sub>2</sub>O<sub>3</sub>, α-MnO<sub>2</sub>, β-MnO<sub>2</sub>, and KMnO<sub>4</sub>, measured using both transmission and total electron yield X-ray absorption techniques. An example of the use of these reference spectra in a study of Zn/MnO<sub>2</sub> batteries is given.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"274 ","pages":"Article 147452"},"PeriodicalIF":1.9,"publicationDate":"2024-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204824000355/pdfft?md5=57f809a3695368db7cd546d643f4cbc6&pid=1-s2.0-S0368204824000355-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141292011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Corrigendum to “Dissociative electron attachment to 1- and 9-chloroanthracene in the gas phase” [J. Electron Spectrosc. Relat. Phenom. 267 (2023) 147383]","authors":"N.L. Asfandiarov , M.V. Muftakhov, S.A. Pshenichnyuk","doi":"10.1016/j.elspec.2023.147415","DOIUrl":"10.1016/j.elspec.2023.147415","url":null,"abstract":"","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"273 ","pages":"Article 147415"},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0368204823001329/pdfft?md5=cb6535133d412e854c8596150a4df7cc&pid=1-s2.0-S0368204823001329-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138493669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-06-01DOI: 10.1016/j.elspec.2024.147438
Adam P. Hitchcock , Nobuhiro Kosugi
{"title":"Introduction to special issue on X-ray spectromicroscopy","authors":"Adam P. Hitchcock , Nobuhiro Kosugi","doi":"10.1016/j.elspec.2024.147438","DOIUrl":"10.1016/j.elspec.2024.147438","url":null,"abstract":"","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"273 ","pages":"Article 147438"},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140403941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique for the nondestructive identification of elemental species and chemical states of solid samples, and the measured spectra are affected by not only sample-specific information but also factors dependent on the measurement environment. This feature makes it difficult to analyze the data for the chemical state identification of mixed samples when referring to the data measured with different models or in different environments. In a previous study, Bayesian inference was successfully applied to the analysis of XPS narrow-scan spectra, but the challenge was to apply Bayesian inference to XPS spectra of samples that are nonuniform in the depth direction. We propose a method to infer the layer structure of a sample from XPS spectra by incorporating Bayesian inference into the simulation of electron spectra for surface analysis (SESSA). SESSA can simulate XPS spectra of samples with specified composition and microstructure, and is already in use as a simulator with highly reproducible results. By utilizing the proposed method, one can estimate the layer structure of a sample from XPS data on the basis of the posterior probability distribution. In a typical XPS measurement, wide-scan data are acquired to qualitatively identify elemental species, and narrow-scan data are acquired to the estimate detailed composition and chemical state information of a sample. In this study, we have shown that given wide-scan or narrow-scan data without angle resolution, Bayesian inference can be applied to quantitatively analyze the layer structure information.
{"title":"Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data","authors":"Atsushi Machida , Kenji Nagata , Ryo Murakami , Hiroshi Shinotsuka , Hayaru Shouno , Hideki Yoshikawa , Masato Okada","doi":"10.1016/j.elspec.2024.147449","DOIUrl":"10.1016/j.elspec.2024.147449","url":null,"abstract":"<div><p>X-ray photoelectron spectroscopy (XPS) is a surface analysis technique for the nondestructive identification of elemental species and chemical states of solid samples, and the measured spectra are affected by not only sample-specific information but also factors dependent on the measurement environment. This feature makes it difficult to analyze the data for the chemical state identification of mixed samples when referring to the data measured with different models or in different environments. In a previous study, Bayesian inference was successfully applied to the analysis of XPS narrow-scan spectra, but the challenge was to apply Bayesian inference to XPS spectra of samples that are nonuniform in the depth direction. We propose a method to infer the layer structure of a sample from XPS spectra by incorporating Bayesian inference into the simulation of electron spectra for surface analysis (SESSA). SESSA can simulate XPS spectra of samples with specified composition and microstructure, and is already in use as a simulator with highly reproducible results. By utilizing the proposed method, one can estimate the layer structure of a sample from XPS data on the basis of the posterior probability distribution. In a typical XPS measurement, wide-scan data are acquired to qualitatively identify elemental species, and narrow-scan data are acquired to the estimate detailed composition and chemical state information of a sample. In this study, we have shown that given wide-scan or narrow-scan data without angle resolution, Bayesian inference can be applied to quantitatively analyze the layer structure information.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"273 ","pages":"Article 147449"},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S036820482400032X/pdfft?md5=dbb403ed40878b1d61924f63795fc2b2&pid=1-s2.0-S036820482400032X-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141189445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In the present work, the Hf target was irradiated by tuning the energy (Ep) of synchrotron radiation across the Li (i = 1–3) edge-energies ranging from 9.6 keV to 14.0 keV in order to measure the cross sections for production of the fluorescent Lk X-rays (k = l, α, η, β1,6, β3, β4, β2,15, β5,7, β9,10, γ1,5, γ2,3,6,8, γ4). These measurements were performed with the aim to check the validity of independent particle approximation (IPA) models at incident photon energies in proximity to the Li absorption edges of a heavy transition element. The measured cross sections were compared with three sets of values calculated using the X-ray emission rates based on the Dirac-Fock model, the Li (i = 1–3) sub-shell photoionization cross-sections based on the non-relativistic Hartree-Fock-Slater model and three sets of the fluorescence (ωi) and Coster-Kronig (fji) yields.
{"title":"L-series X-ray fluorescence cross section measurements for 72Hf employing synchrotron radiation","authors":"Harpreet Singh , Sandeep Kaur , Anil Kumar , A.G. Karydas , Sanjiv Puri","doi":"10.1016/j.elspec.2024.147451","DOIUrl":"10.1016/j.elspec.2024.147451","url":null,"abstract":"<div><p>In the present work, the Hf target was irradiated by tuning the energy (E<sub>p</sub>) of synchrotron radiation across the L<sub>i</sub> (i = 1–3) edge-energies ranging from 9.6 keV to 14.0 keV in order to measure the cross sections for production of the fluorescent L<sub>k</sub> X-rays (k = <em>l</em>, α, η, β<sub>1,6</sub>, β<sub>3</sub>, β<sub>4</sub>, β<sub>2,15</sub>, β<sub>5,7</sub>, β<sub>9,10</sub>, γ<sub>1,5</sub>, γ<sub>2,3,6,8</sub>, γ<sub>4</sub>). These measurements were performed with the aim to check the validity of independent particle approximation (IPA) models at incident photon energies in proximity to the L<sub>i</sub> absorption edges of a heavy transition element. The measured cross sections were compared with three sets of values calculated using the X-ray emission rates based on the Dirac-Fock model, the L<sub>i</sub> (i = 1–3) sub-shell photoionization cross-sections based on the non-relativistic Hartree-Fock-Slater model and three sets of the fluorescence (ω<sub>i</sub>) and Coster-Kronig (f<sub>ji</sub>) yields.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"274 ","pages":"Article 147451"},"PeriodicalIF":1.9,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141277900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The calculated asymmetry parameter () and photoionisation cross sections for eight outermost orbitals (, , , , , , , and ) of benzene, in the gas phase, are presented in the range from threshold to 35 eV. The Schwinger Variational Method with Padé approximants was employed to generate the continuum wavefunction of photoelectrons and the dipole matrix transition was computed in the velocity () and length () approach of the dipole operator. This operator in or form does not affect significantly values in the energy range studied. The cross sections in form produce lower magnitudes than and are closer to the measurements. The resonance peaks were observed in the cross sections for some orbitals and their positions were not affected by the dipole approach. Finally, symmetry analysis is done on the partial cross sections to assign the main contributing final state to the resonance feature and also link this to the minimum in the asymmetry parameter. The comparison of our results with other theories has, in general, good qualitative and some quantitative agreement. For some orbitals (, ), severe disagreements between theory and experiment are highlighted. Some possible causes for these differences are pointed out. Because of this, we conclude that some asymmetry parameters and PICS for benzene, in ionisation studies, cannot yet be considered as a benchmark and will be necessary further investigation to clarify such discrepancies.
文中给出了气相中苯的八个最外层轨道(1e1g、3e2g、1a2u、3e1u、1b2u、2b1u、3a1g 和 2e2g)在阈值至 35 eV 范围内的不对称参数 (β)和光电离截面的计算结果。采用帕代近似的施温格变分法生成光电子的连续波函数,并以偶极子算子的速度(V)和长度(L)方法计算偶极子矩阵转换。在所研究的能量范围内,V 或 L 形式的算子不会对 β 值产生显著影响。V 形式的横截面比 L 形式的横截面产生的数值更低,也更接近测量结果。在某些轨道的横截面上可以观察到共振峰,它们的位置不受偶极子方法的影响。最后,我们对部分截面进行了对称分析,以确定共振特征的主要最终状态,并将其与不对称参数的最小值联系起来。总的来说,我们的结果与其他理论的比较具有良好的定性和定量一致性。对于某些轨道(1a2u、2b1u),理论与实验之间存在严重分歧。我们指出了造成这些差异的一些可能原因。因此,我们得出结论,在电离研究中,苯的某些不对称参数和 PICS 尚不能被视为基准,有必要进一步研究以澄清这些差异。
{"title":"Photoelectron angular distribution of benzene: Can the asymmetry parameter be considered a benchmark?","authors":"M.H. Ribas , J.M.H. Fófano , M.G.P. Homem , M.M. Fujimoto","doi":"10.1016/j.elspec.2024.147441","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147441","url":null,"abstract":"<div><p>The calculated asymmetry parameter (<span><math><mi>β</mi></math></span>) and photoionisation cross sections for eight outermost orbitals (<span><math><mrow><mn>1</mn><msub><mrow><mi>e</mi></mrow><mrow><mn>1</mn><mi>g</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>3</mn><msub><mrow><mi>e</mi></mrow><mrow><mn>2</mn><mi>g</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>1</mn><msub><mrow><mi>a</mi></mrow><mrow><mn>2</mn><mi>u</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>3</mn><msub><mrow><mi>e</mi></mrow><mrow><mn>1</mn><mi>u</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>1</mn><msub><mrow><mi>b</mi></mrow><mrow><mn>2</mn><mi>u</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>2</mn><msub><mrow><mi>b</mi></mrow><mrow><mn>1</mn><mi>u</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>3</mn><msub><mrow><mi>a</mi></mrow><mrow><mn>1</mn><mi>g</mi></mrow></msub></mrow></math></span>, and <span><math><mrow><mn>2</mn><msub><mrow><mi>e</mi></mrow><mrow><mn>2</mn><mi>g</mi></mrow></msub></mrow></math></span>) of benzene, in the gas phase, are presented in the range from threshold to 35 eV. The Schwinger Variational Method with Padé approximants was employed to generate the continuum wavefunction of photoelectrons and the dipole matrix transition was computed in the velocity (<span><math><mi>V</mi></math></span>) and length (<span><math><mi>L</mi></math></span>) approach of the dipole operator. This operator in <span><math><mi>V</mi></math></span> or <span><math><mi>L</mi></math></span> form does not affect significantly <span><math><mi>β</mi></math></span> values in the energy range studied. The cross sections in <span><math><mi>V</mi></math></span> form produce lower magnitudes than <span><math><mi>L</mi></math></span> and are closer to the measurements. The resonance peaks were observed in the cross sections for some orbitals and their positions were not affected by the dipole approach. Finally, symmetry analysis is done on the partial cross sections to assign the main contributing final state to the resonance feature and also link this to the minimum in the asymmetry parameter. The comparison of our results with other theories has, in general, good qualitative and some quantitative agreement. For some orbitals (<span><math><mrow><mn>1</mn><msub><mrow><mi>a</mi></mrow><mrow><mn>2</mn><mi>u</mi></mrow></msub></mrow></math></span>, <span><math><mrow><mn>2</mn><msub><mrow><mi>b</mi></mrow><mrow><mn>1</mn><mi>u</mi></mrow></msub></mrow></math></span>), severe disagreements between theory and experiment are highlighted. Some possible causes for these differences are pointed out. Because of this, we conclude that some asymmetry parameters and PICS for benzene, in ionisation studies, cannot yet be considered as a benchmark and will be necessary further investigation to clarify such discrepancies.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"273 ","pages":"Article 147441"},"PeriodicalIF":1.9,"publicationDate":"2024-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140813349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-04-23DOI: 10.1016/j.elspec.2024.147439
Jiwon Jeon, J.D. Lee
Circular dichroism angle-resolved photoemission spectroscopy (CD-ARPES) receives much attention due to a resolving power of topological and quantum geometrical nature of two-dimensional systems. We propose the Lippmann-Schwinger photoelectron final state, a scattering solution of the lattice model comprising screened short-range potentials at periodically arranged atomic sites, which characterizes the time-reversed low energy electron diffraction (LEED) state well enough to describe the final state effect entailed in CD-ARPES. We find that, through the final state effect, the electron screening length identifies CD-ARPES not only in the qualitative dichroic polarity but also in the quantitative dichroic strength in various graphene systems like the monolayer graphene, the AA-stacking bilayer graphene, and the twisted bilayer graphene especially in a unified fashion. This finding reveals an interplay between electron screening and circular dichroism and enables to extend the spectroscopic expertise of CD-ARPES to a direct probe of the electron screening.
{"title":"Electron screening length identifying circular dichroism of photoemission","authors":"Jiwon Jeon, J.D. Lee","doi":"10.1016/j.elspec.2024.147439","DOIUrl":"https://doi.org/10.1016/j.elspec.2024.147439","url":null,"abstract":"<div><p>Circular dichroism angle-resolved photoemission spectroscopy (CD-ARPES) receives much attention due to a resolving power of topological and quantum geometrical nature of two-dimensional systems. We propose the Lippmann-Schwinger photoelectron final state, a scattering solution of the lattice model comprising screened short-range potentials at periodically arranged atomic sites, which characterizes the time-reversed low energy electron diffraction (LEED) state well enough to describe the final state effect entailed in CD-ARPES. We find that, through the final state effect, the electron screening length identifies CD-ARPES not only in the qualitative dichroic polarity but also in the quantitative dichroic strength in various graphene systems like the monolayer graphene, the AA-stacking bilayer graphene, and the twisted bilayer graphene especially in a unified fashion. This finding reveals an interplay between electron screening and circular dichroism and enables to extend the spectroscopic expertise of CD-ARPES to a direct probe of the electron screening.</p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"273 ","pages":"Article 147439"},"PeriodicalIF":1.9,"publicationDate":"2024-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140639027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}