Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314087
Nathan Tacha, A. McCarthy, B. Powell, A. Veeramani
Automatic test engineers are faced with replacing obsolete software and hardware in systems that remain in operation longer than individual components are supported. Replacing obsolete hardware can be especially challenging because of the need to modify test software in order to support new instrumentation. Changes to test software in order to support new instrumentation might affect multiple areas of the application and require time-consuming development or costly revalidation. This paper explains how you can mitigate hardware obsolescence with the use of well-designed hardware abstraction layers.
{"title":"How to mitigate hardware obsolescence in next-generation test systems","authors":"Nathan Tacha, A. McCarthy, B. Powell, A. Veeramani","doi":"10.1109/AUTEST.2009.5314087","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314087","url":null,"abstract":"Automatic test engineers are faced with replacing obsolete software and hardware in systems that remain in operation longer than individual components are supported. Replacing obsolete hardware can be especially challenging because of the need to modify test software in order to support new instrumentation. Changes to test software in order to support new instrumentation might affect multiple areas of the application and require time-consuming development or costly revalidation. This paper explains how you can mitigate hardware obsolescence with the use of well-designed hardware abstraction layers.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132653401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.
{"title":"A TPS Integrated Development Environment implementing IEEE1641 and ATML","authors":"Qiao Liyan, Zhao-Lin Liu, Pengpeng Yu, Peng Xiyuan","doi":"10.1109/AUTEST.2009.5314048","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314048","url":null,"abstract":"With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132272714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314066
M. Pfeiffer
Missim is a 3-in-1 Electronic Warfare tester for go/no-go tests right before the start of a mission. Besides performing this simple go/no-go test it to a certain extend can recognize sensor sensitivity degradations. In one operation mode a very fast, automated and reproducible test can be done requiring minimal training of the user. A concept study details the usage with a special dispenser tester in an automatic closed loop test expanding the test scope without the risk of test variations or handling and interpretation errors. Missim can be integrated into a lab setup due to its remote control capability allowing control by a lab computer.
{"title":"Missim - the 3-in-1 Electronic Warfare system tester","authors":"M. Pfeiffer","doi":"10.1109/AUTEST.2009.5314066","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314066","url":null,"abstract":"Missim is a 3-in-1 Electronic Warfare tester for go/no-go tests right before the start of a mission. Besides performing this simple go/no-go test it to a certain extend can recognize sensor sensitivity degradations. In one operation mode a very fast, automated and reproducible test can be done requiring minimal training of the user. A concept study details the usage with a special dispenser tester in an automatic closed loop test expanding the test scope without the risk of test variations or handling and interpretation errors. Missim can be integrated into a lab setup due to its remote control capability allowing control by a lab computer.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"163 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132359638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314093
Anand Jain, S. Delgado
In response to the lack of common formats for documenting automatic test information, the Naval Air Systems Command led the creation of the Automatic Test Markup Language (ATML) to standardize the documentation and reporting of automatic test information. ATML defines classes that represent automatic test system (ATS) components, such as test description, test results and instrument description, and the interoperability between classes. As an emerging standard, ATML classes have different levels of definition and adoption. One of the most adopted classes in the ATML standard is Test Description (TD). Organizations are expecting the adoption of the ATML TD standard to reduce the development and maintenance costs for test program sets (TPSs).
{"title":"Automatic ATML test description translation to a COTS test executive","authors":"Anand Jain, S. Delgado","doi":"10.1109/AUTEST.2009.5314093","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314093","url":null,"abstract":"In response to the lack of common formats for documenting automatic test information, the Naval Air Systems Command led the creation of the Automatic Test Markup Language (ATML) to standardize the documentation and reporting of automatic test information. ATML defines classes that represent automatic test system (ATS) components, such as test description, test results and instrument description, and the interoperability between classes. As an emerging standard, ATML classes have different levels of definition and adoption. One of the most adopted classes in the ATML standard is Test Description (TD). Organizations are expecting the adoption of the ATML TD standard to reduce the development and maintenance costs for test program sets (TPSs).","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125173608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314095
S. Preiss, A. Roderick
Due to budgetary and economic constraints, the Department of Defense (DOD) has taken the “neck down” approach to all areas of military procurement. Commonality has been the buzzword across all services from major aircraft and weapon systems down to the Support Equipment (SE) used to maintain those systems. In the aircraft world, the Joint Service Electronic Combat System Test Set (JSECST) has proliferated across the world replacing many older systems. In the weapons world, the Common Munitions BIT Reprogramming Equipment (CMBRE) has performed a similar function. Despite all these efforts, one area that has not been addressed is the need for a common portable Radio Frequency (RF) tester that would eliminate many redundant systems out in the field. However, that was only the first part; there was also a need for the RF portable tester to be able to perform in high Electromagnetic Interference (EMI) environments, which was considered a significant technical challenge. The unit also had to be reprogrammable to provide “threat of the day” testing scenarios. The maintainer in the field has never before been required to perform this “threat of the day” type of testing. This paper offers insight into the challenges of successful Navy and Marine Corp RF testing of aircraft in the high EMI environment of an aircraft carrier. The Handheld Radar Simulator (HRS) addresses those needs. This paper discusses the management and technical challenges in developing a common test solution that HRS offers as a standardized RF portable tester. Although currently under development and subject to change, the design and concept of operations has already been firmly established. This papers intent is to enlighten the test community of this new and exciting program that will shape the future direction of RF testing for years to come.
{"title":"Handheld Radar Simulator: The future of RF testing","authors":"S. Preiss, A. Roderick","doi":"10.1109/AUTEST.2009.5314095","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314095","url":null,"abstract":"Due to budgetary and economic constraints, the Department of Defense (DOD) has taken the “neck down” approach to all areas of military procurement. Commonality has been the buzzword across all services from major aircraft and weapon systems down to the Support Equipment (SE) used to maintain those systems. In the aircraft world, the Joint Service Electronic Combat System Test Set (JSECST) has proliferated across the world replacing many older systems. In the weapons world, the Common Munitions BIT Reprogramming Equipment (CMBRE) has performed a similar function. Despite all these efforts, one area that has not been addressed is the need for a common portable Radio Frequency (RF) tester that would eliminate many redundant systems out in the field. However, that was only the first part; there was also a need for the RF portable tester to be able to perform in high Electromagnetic Interference (EMI) environments, which was considered a significant technical challenge. The unit also had to be reprogrammable to provide “threat of the day” testing scenarios. The maintainer in the field has never before been required to perform this “threat of the day” type of testing. This paper offers insight into the challenges of successful Navy and Marine Corp RF testing of aircraft in the high EMI environment of an aircraft carrier. The Handheld Radar Simulator (HRS) addresses those needs. This paper discusses the management and technical challenges in developing a common test solution that HRS offers as a standardized RF portable tester. Although currently under development and subject to change, the design and concept of operations has already been firmly established. This papers intent is to enlighten the test community of this new and exciting program that will shape the future direction of RF testing for years to come.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125264506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314011
Yilu Zhang, M. Salman, H. S. Subramania, R. Edwards, J. Correia, G. W. Gantt, Mark Rychlinksi, J. Stanford
This paper reports a recent effort at GM to develop a remote vehicle diagnostics service under a previously proposed framework of Connected Vehicle Diagnostics and Prognostics. An algorithm development methodology combining the physics-based approach and the data-driven approach is presented to identify, select, and calibrate failure precursors to predict vehicle no-start due to battery failures. Initial results based on real field data are promising. Also presented is a proposed implementation solution that supports the cost and performance optimization of remote vehicle no-start prediction.
{"title":"Remote vehicle state of health monitoring and its application to vehicle no-start prediction","authors":"Yilu Zhang, M. Salman, H. S. Subramania, R. Edwards, J. Correia, G. W. Gantt, Mark Rychlinksi, J. Stanford","doi":"10.1109/AUTEST.2009.5314011","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314011","url":null,"abstract":"This paper reports a recent effort at GM to develop a remote vehicle diagnostics service under a previously proposed framework of Connected Vehicle Diagnostics and Prognostics. An algorithm development methodology combining the physics-based approach and the data-driven approach is presented to identify, select, and calibrate failure precursors to predict vehicle no-start due to battery failures. Initial results based on real field data are promising. Also presented is a proposed implementation solution that supports the cost and performance optimization of remote vehicle no-start prediction.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126943370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314037
G. Mitchell, M. Conn, James A. Huffman
Automated data acquisition has become a major part of the military's prognostics and diagnostics program as they move towards a condition based maintenance approach for logistics and mission readiness. The desire to apply this approach to a majority of new and legacy platforms has led to the development of a prototype radio frequency identification (RFID) tag with both serial and wireless communications capabilities that can be easily configured to different mechanical and electrical systems. This paper addresses the command architecture used for inter-node communication within the data acquisition network, and verifies the RFID's data collection capabilities by obtaining vibration signatures from bearings running on a machinery fault simulator. The vibration signatures from the RFID are compared to those obtained from a proven data acquisition method.
{"title":"Radio frequency identification tag design for automated data acquisition","authors":"G. Mitchell, M. Conn, James A. Huffman","doi":"10.1109/AUTEST.2009.5314037","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314037","url":null,"abstract":"Automated data acquisition has become a major part of the military's prognostics and diagnostics program as they move towards a condition based maintenance approach for logistics and mission readiness. The desire to apply this approach to a majority of new and legacy platforms has led to the development of a prototype radio frequency identification (RFID) tag with both serial and wireless communications capabilities that can be easily configured to different mechanical and electrical systems. This paper addresses the command architecture used for inter-node communication within the data acquisition network, and verifies the RFID's data collection capabilities by obtaining vibration signatures from bearings running on a machinery fault simulator. The vibration signatures from the RFID are compared to those obtained from a proven data acquisition method.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"12 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117264078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314030
S. Davidson, L. Ungar
We cannot improve what we cannot measure and a major issue with system test today is that we do not know how effective it is in detecting defects, diagnosing failures, and ensuring field quality. This situation is in contrast to that of ICs, where test quality metrics have resulted in DPMs of 100 – 1000 at board and system test and mean time to failures in the hundreds of millions of hours. This paper proposes a framework for system level coverage metrics, using fault sampling and a variety of defect models.
{"title":"A framework for testability metrics across hierarchical levels of assembly","authors":"S. Davidson, L. Ungar","doi":"10.1109/AUTEST.2009.5314030","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314030","url":null,"abstract":"We cannot improve what we cannot measure and a major issue with system test today is that we do not know how effective it is in detecting defects, diagnosing failures, and ensuring field quality. This situation is in contrast to that of ICs, where test quality metrics have resulted in DPMs of 100 – 1000 at board and system test and mean time to failures in the hundreds of millions of hours. This paper proposes a framework for system level coverage metrics, using fault sampling and a variety of defect models.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132643765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314025
J. Engler
Test engineering often experiences pressures to produce test stations and software in a short time frame with constrained budgets. Since test is a negative influence towards product costs, it is crucial to optimize the processes of test station software creation as well as the configuration of the test station itself. This paper introduces novel methodologies for optimized station configuration and automated station software generation. These two optimizations utilize evolutionary computation to automatically generate software for the test station and to offer optimal configurations of the station based upon testing requirements. Presented is a modified genetic programming algorithm for the creation of test station software (e.g. COTS software drivers). The genetic algorithm is improved through use of adaptive memory to recall historic schemas of high fitness. From the automated software generation an optimal station configuration is produced based upon the requirements of the testing to be performed. This system has been implemented in industry and an actual industrial case study is presented to illustrate the efficiency of this novel optimization technique. Comparisons with standard genetic programming techniques are offered to further illustrate the efficiency of this methodology.
{"title":"Optimization of test engineering utilizing evolutionary computation","authors":"J. Engler","doi":"10.1109/AUTEST.2009.5314025","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314025","url":null,"abstract":"Test engineering often experiences pressures to produce test stations and software in a short time frame with constrained budgets. Since test is a negative influence towards product costs, it is crucial to optimize the processes of test station software creation as well as the configuration of the test station itself. This paper introduces novel methodologies for optimized station configuration and automated station software generation. These two optimizations utilize evolutionary computation to automatically generate software for the test station and to offer optimal configurations of the station based upon testing requirements. Presented is a modified genetic programming algorithm for the creation of test station software (e.g. COTS software drivers). The genetic algorithm is improved through use of adaptive memory to recall historic schemas of high fitness. From the automated software generation an optimal station configuration is produced based upon the requirements of the testing to be performed. This system has been implemented in industry and an actual industrial case study is presented to illustrate the efficiency of this novel optimization technique. Comparisons with standard genetic programming techniques are offered to further illustrate the efficiency of this methodology.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131352816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314024
P. Barton, R. Ogden
Tactical Stirling cryocoolers are life-limited components used in many IR sensing systems. Thousands are deployed in commercial and military systems. Using prognostics to predict impending failures will allow cryocooler replacement when it is convenient and cost-effective, rather than during system operation. This both reduces cost and improves mission reliability A long-life test is underway to validate that expectation with operational data. Interim results of that experiment are presented.
{"title":"Stirling cryocooler prognostics and health management (PHM)","authors":"P. Barton, R. Ogden","doi":"10.1109/AUTEST.2009.5314024","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314024","url":null,"abstract":"Tactical Stirling cryocoolers are life-limited components used in many IR sensing systems. Thousands are deployed in commercial and military systems. Using prognostics to predict impending failures will allow cryocooler replacement when it is convenient and cost-effective, rather than during system operation. This both reduces cost and improves mission reliability A long-life test is underway to validate that expectation with operational data. Interim results of that experiment are presented.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134350223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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