Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314031
S. O'Donnell, A. Zarcone
Lockheed Martin Simulation, Training and Support (LM-STS) has designed and fielded the LM-STAR® family of test systems to numerous customers to meet their production delivery schedules. The LM-STAR systems test avionics and other electronic systems and subsystems in factories and depots on multiple U.S. and International platforms supplying the end user with accurate fault diagnostics to repair Units Under Test (UUT). Galileo Avionica has acquired an LM-STAR system for their production facility and have successfully rehosted legacy Test Program Sets (TPS) from the Consolidated Automated Support System (CASS) to LM-STAR. Galileo Avionica needed a new variant of LM-STAR to support the unique new requirements of their customer. The system needed to be expandable and flexible to meet these needs, and system performance had to be optimized for high speed synchronous/asynchronous data I/O. The new configuration posed many technological challenges from both a hardware and software standpoint that had to be overcome. An aggressive schedule coupled with limited budget presented obstacles. The project also had dynamic test requirements. This paper will describe how a project can still meet time-to-market, cost, and quality objectives while addressing a myriad of requirement changes without spiraling out of control.
{"title":"Managing evolving hardware and software requirements","authors":"S. O'Donnell, A. Zarcone","doi":"10.1109/AUTEST.2009.5314031","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314031","url":null,"abstract":"Lockheed Martin Simulation, Training and Support (LM-STS) has designed and fielded the LM-STAR® family of test systems to numerous customers to meet their production delivery schedules. The LM-STAR systems test avionics and other electronic systems and subsystems in factories and depots on multiple U.S. and International platforms supplying the end user with accurate fault diagnostics to repair Units Under Test (UUT). Galileo Avionica has acquired an LM-STAR system for their production facility and have successfully rehosted legacy Test Program Sets (TPS) from the Consolidated Automated Support System (CASS) to LM-STAR. Galileo Avionica needed a new variant of LM-STAR to support the unique new requirements of their customer. The system needed to be expandable and flexible to meet these needs, and system performance had to be optimized for high speed synchronous/asynchronous data I/O. The new configuration posed many technological challenges from both a hardware and software standpoint that had to be overcome. An aggressive schedule coupled with limited budget presented obstacles. The project also had dynamic test requirements. This paper will describe how a project can still meet time-to-market, cost, and quality objectives while addressing a myriad of requirement changes without spiraling out of control.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124581664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314054
Elijah Kerry, S. Delgado
Test engineers developing test systems for mission-critical applications have to prove that the test system is reliable and accurate. As a result, software engineering practices are becoming increasingly important in order to mitigate any risk of failure that could result in costly downtime, incorrect behavior, or safety failures.
{"title":"Applying software engineering practices to produce reliable, high-quality and accurate automated test systems","authors":"Elijah Kerry, S. Delgado","doi":"10.1109/AUTEST.2009.5314054","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314054","url":null,"abstract":"Test engineers developing test systems for mission-critical applications have to prove that the test system is reliable and accurate. As a result, software engineering practices are becoming increasingly important in order to mitigate any risk of failure that could result in costly downtime, incorrect behavior, or safety failures.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131728075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314053
Ngai Nguyen, Jacob Spencer, Mark Oblander, N. Herbert, Casey Bynum
The process of TPS development is an increasingly complicated endeavor. As Units Under Test become more and more complex, a greater investment of time for analysis and simulation is required than ever before. Additionally, traditional TPS software development environments are monolithic, necessitating costly training time for the engineer to learn the environment as well as forcing tedious and difficult development interfaces on the engineer. The Simplified TPS Encoding Process (STEP), developed by the 76 SMXG at Tinker AFB, is a novel process for the development of TPSs that removes dependency on specific programming languages from the TPS engineer. STEP reduces the up-front time required to train new engineers and provides the TPS engineer with an easy-to-use development environment that can be modularly extended to work with any programming language or hardware interface. In addition, STEP uses plain text files to contain program code and store data results. The ease-of-use, modularity, and plain text source code provided by STEP result in the TPS engineer spending more time analyzing the Unit Under Test instead of spending that time struggling to develop in a particular programming language.
{"title":"The Simplified TPS Encoding Process","authors":"Ngai Nguyen, Jacob Spencer, Mark Oblander, N. Herbert, Casey Bynum","doi":"10.1109/AUTEST.2009.5314053","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314053","url":null,"abstract":"The process of TPS development is an increasingly complicated endeavor. As Units Under Test become more and more complex, a greater investment of time for analysis and simulation is required than ever before. Additionally, traditional TPS software development environments are monolithic, necessitating costly training time for the engineer to learn the environment as well as forcing tedious and difficult development interfaces on the engineer. The Simplified TPS Encoding Process (STEP), developed by the 76 SMXG at Tinker AFB, is a novel process for the development of TPSs that removes dependency on specific programming languages from the TPS engineer. STEP reduces the up-front time required to train new engineers and provides the TPS engineer with an easy-to-use development environment that can be modularly extended to work with any programming language or hardware interface. In addition, STEP uses plain text files to contain program code and store data results. The ease-of-use, modularity, and plain text source code provided by STEP result in the TPS engineer spending more time analyzing the Unit Under Test instead of spending that time struggling to develop in a particular programming language.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127204230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314045
C. Ziomek, E. S. Jones
Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasingly complex, more sophisticated signal stimuli are required. ATE requires signal stimuli varying from advanced communication signals to the playback of captured real-world analog signals. Waveform generators can synthesize signals that can be broadly categorized into four types: standard functions, advanced functions, arbitrary waveforms, and waveform sequences. Standard functions include the simple sine, square, triangle, pulse, and ramp waveforms. Advanced functions include complex signals such as multi-tone, AM, FM, sinc pulse, haversine, half-cycle sine, Gaussian pulse, Lorentz pulse, noise and others. Arbitrary waveforms involve the point-by-point user-defined waveform synthesis. Waveform sequences provide a mechanism to piece together standard or arbitrary waveforms in stages to create a user-defined compound waveform. Example applications for each of these four waveform categories are described in this paper. Modern waveform generators are extremely powerful, but can also add significant complexity for the user. The arbitrary waveform generator, an instrument found in most ATE systems, is a very powerful signal synthesis tool. Unfortunately, many users take advantage of only a small fraction of the powerful features available to them in an arbitrary waveform generator. Also, selecting the right arbitrary waveform generator can be daunting when comparing specifications such as DAC resolution, clock rates and topology, memory depth, sequencing, sweeping, triggering and synchronization. This paper describes the technical differences between various signal generation techniques, presents the signal fidelity impact of clock topology, discusses dynamic range limitations due to noise, accuracy and resolution, and provides typical applications to illustrate signal generation usage. Ultimately, this information should help the user avoid common pitfalls in applying waveform generators within ATE.
{"title":"Advanced waveform generation techniques for ATE","authors":"C. Ziomek, E. S. Jones","doi":"10.1109/AUTEST.2009.5314045","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314045","url":null,"abstract":"Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasingly complex, more sophisticated signal stimuli are required. ATE requires signal stimuli varying from advanced communication signals to the playback of captured real-world analog signals. Waveform generators can synthesize signals that can be broadly categorized into four types: standard functions, advanced functions, arbitrary waveforms, and waveform sequences. Standard functions include the simple sine, square, triangle, pulse, and ramp waveforms. Advanced functions include complex signals such as multi-tone, AM, FM, sinc pulse, haversine, half-cycle sine, Gaussian pulse, Lorentz pulse, noise and others. Arbitrary waveforms involve the point-by-point user-defined waveform synthesis. Waveform sequences provide a mechanism to piece together standard or arbitrary waveforms in stages to create a user-defined compound waveform. Example applications for each of these four waveform categories are described in this paper. Modern waveform generators are extremely powerful, but can also add significant complexity for the user. The arbitrary waveform generator, an instrument found in most ATE systems, is a very powerful signal synthesis tool. Unfortunately, many users take advantage of only a small fraction of the powerful features available to them in an arbitrary waveform generator. Also, selecting the right arbitrary waveform generator can be daunting when comparing specifications such as DAC resolution, clock rates and topology, memory depth, sequencing, sweeping, triggering and synchronization. This paper describes the technical differences between various signal generation techniques, presents the signal fidelity impact of clock topology, discusses dynamic range limitations due to noise, accuracy and resolution, and provides typical applications to illustrate signal generation usage. Ultimately, this information should help the user avoid common pitfalls in applying waveform generators within ATE.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115005117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314044
S. Williams
The Radio Frequency (RF) Channel Simulator is rapidly emerging as a standard test and measurement instrument for RF communication systems, since it is capable of easily generating RF signals that that precisely duplicate those between transmitters and receivers that when deployed, will be in motion with respect to one another.
{"title":"RF Channel Simulators enhance communication system quality and decrease costs","authors":"S. Williams","doi":"10.1109/AUTEST.2009.5314044","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314044","url":null,"abstract":"The Radio Frequency (RF) Channel Simulator is rapidly emerging as a standard test and measurement instrument for RF communication systems, since it is capable of easily generating RF signals that that precisely duplicate those between transmitters and receivers that when deployed, will be in motion with respect to one another.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115264191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314064
Ron Taylor
The IEEE Automatic Test Markup Language (ATML) family of standards allows Automatic Test System (ATS) and test information to be exchanged in a common format adhering to the Extensible Markup Language (XML) standard. Now that the standards have been published, through the IEEE SCC20, the next key step is the incorporation of these standards on actual ATS programs. The DoD ATS Framework Working Group (FWG) is participating in the Phase II ATML Interoperability Demonstration effort to provide practical applications of these standards to promote their use on current and future programs. This paper examines one aspect of the ATML demonstration which is the use of the ATML standards in the generation of test diagrams to support Test Program Sets (TPSs).
{"title":"Test diagram generation: A practical application of the ATML standards","authors":"Ron Taylor","doi":"10.1109/AUTEST.2009.5314064","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314064","url":null,"abstract":"The IEEE Automatic Test Markup Language (ATML) family of standards allows Automatic Test System (ATS) and test information to be exchanged in a common format adhering to the Extensible Markup Language (XML) standard. Now that the standards have been published, through the IEEE SCC20, the next key step is the incorporation of these standards on actual ATS programs. The DoD ATS Framework Working Group (FWG) is participating in the Phase II ATML Interoperability Demonstration effort to provide practical applications of these standards to promote their use on current and future programs. This paper examines one aspect of the ATML demonstration which is the use of the ATML standards in the generation of test diagrams to support Test Program Sets (TPSs).","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124773721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314001
M. Cornish
Drawing on a recent study, sponsored by the UK MoD, this paper provides details of a compile-time approach to the implementation of an IEEE Std. 1641™ [1] test program (in contrast to previous implementations, which have adopted a run-time approach). Consideration is given to methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with the general run-time approach [3], in terms of portability and validation. As a detailed view of this particular aspect of a 1641 implementation, this paper incorporates the example tests; Gain and 1 dB Compression Point, for a mobile communications device. These tests are defined using the Standard's Test Signal Framework (TSF); test programs are produced using the TSFs in the C# carrier language; IEEE ATML Test Station and Instrument Description are created and used to determine suitable test resources; and, an XML document is created and used to create a translation from the IEEE 1641 & TSF defined test instructions to the test resources' IVI driver calls; this process effectively ‘compiling’ the C#, IEEE 1641 test program into an IVI test program (in this case, the native driver framework for the test platform).
{"title":"Implementing IEEE 1641 - compilation techniques (to IVI driver code)","authors":"M. Cornish","doi":"10.1109/AUTEST.2009.5314001","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314001","url":null,"abstract":"Drawing on a recent study, sponsored by the UK MoD, this paper provides details of a compile-time approach to the implementation of an IEEE Std. 1641™ [1] test program (in contrast to previous implementations, which have adopted a run-time approach). Consideration is given to methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with the general run-time approach [3], in terms of portability and validation. As a detailed view of this particular aspect of a 1641 implementation, this paper incorporates the example tests; Gain and 1 dB Compression Point, for a mobile communications device. These tests are defined using the Standard's Test Signal Framework (TSF); test programs are produced using the TSFs in the C# carrier language; IEEE ATML Test Station and Instrument Description are created and used to determine suitable test resources; and, an XML document is created and used to create a translation from the IEEE 1641 & TSF defined test instructions to the test resources' IVI driver calls; this process effectively ‘compiling’ the C#, IEEE 1641 test program into an IVI test program (in this case, the native driver framework for the test platform).","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128710388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314016
A. Chenakin, S. Ojha, Iqbal Sihra
This paper presents a compact, broadband frequency synthesizer module, which covers 0.1 to 10 GHz frequency range with a 0.001 Hz step size. The synthesizer combines fast switching speed, low phase noise, and low spurious characteristics. The measured phase noise at an output frequency of 10 GHz and 10 kHz offset is −122 dBc/Hz. For an output frequency of 0.1 GHz and 10 kHz offset the phase noise is −150 dBc/Hz. Spurs do not exceed the −70 dBc level and the switching time of the main PLL is less than 10 uSec. This module can be used as a broadband, agile, high-fidelity signal source in a variety of test-and-measurement, communication, and surveillance systems.
{"title":"An innovative approach in the design of fast-switching microwave synthesizers","authors":"A. Chenakin, S. Ojha, Iqbal Sihra","doi":"10.1109/AUTEST.2009.5314016","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314016","url":null,"abstract":"This paper presents a compact, broadband frequency synthesizer module, which covers 0.1 to 10 GHz frequency range with a 0.001 Hz step size. The synthesizer combines fast switching speed, low phase noise, and low spurious characteristics. The measured phase noise at an output frequency of 10 GHz and 10 kHz offset is −122 dBc/Hz. For an output frequency of 0.1 GHz and 10 kHz offset the phase noise is −150 dBc/Hz. Spurs do not exceed the −70 dBc level and the switching time of the main PLL is less than 10 uSec. This module can be used as a broadband, agile, high-fidelity signal source in a variety of test-and-measurement, communication, and surveillance systems.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124524014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314065
T. Wilmering, David A. Van Rossum
Development of information systems for the Systems Health Management domain are typically concerned with data collection assets, such as customer data systems or on-platform data recording devices, or the need for data warehouses to integrate copies of data from these sources. We propose that there exists a significant capability gap in this area — there is a need in the Health Management domain to manage information in support of engineering research and analysis, going well beyond the scope of typical decision support systems and data warehouses. This paper will explore this need within the context of the development and maturation of Health Management (HM) analytical processes and application development. We will examine the issues associated with aggregating, integrating, and mining information of the sort needed to support HM processes and suggest an evolutionary approach to improving the current means by which information support is provided.
system Health Management领域的信息系统开发通常涉及数据收集资产，例如客户数据系统或平台上的数据记录设备，或者需要数据仓库来集成来自这些源的数据副本。我们认为在这一领域存在着显著的能力差距——健康管理领域需要管理支持工程研究和分析的信息，这远远超出了典型的决策支持系统和数据仓库的范围。本文将在健康管理(HM)分析过程和应用开发的发展和成熟的背景下探讨这一需求。我们将研究与支持HM流程所需的信息的聚合、集成和挖掘相关的问题，并提出一种改进当前提供信息支持的方法。
{"title":"Information support for integrative analytical approaches for Health Management application development and maturation","authors":"T. Wilmering, David A. Van Rossum","doi":"10.1109/AUTEST.2009.5314065","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314065","url":null,"abstract":"Development of information systems for the Systems Health Management domain are typically concerned with data collection assets, such as customer data systems or on-platform data recording devices, or the need for data warehouses to integrate copies of data from these sources. We propose that there exists a significant capability gap in this area — there is a need in the Health Management domain to manage information in support of engineering research and analysis, going well beyond the scope of typical decision support systems and data warehouses. This paper will explore this need within the context of the development and maturation of Health Management (HM) analytical processes and application development. We will examine the issues associated with aggregating, integrating, and mining information of the sort needed to support HM processes and suggest an evolutionary approach to improving the current means by which information support is provided.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126535490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314090
A. Pirker-Fruhauf
Developing test programs for taking measurements on different test systems is still a common procedure within the IC verification process. The complexity of a test program is strongly related to the complexity of ICs and test systems. These test programs usually are non-modular and maintenance is time-consuming. Test programs based on ATML standard [1] have to perform special tasks like parsing XML (Extensible Markup Language) documents, resource allocation, resource mapping, etc. On the other hand, these prerequisites increase modularity and flexibility of the test program. This paper introduces a knowledge-based test program following the ATML standard implemented within LabVIEW [2]. The developed test program can be used for any test system. This helps saving time considering programming effort and improving the verification process.
{"title":"A knowledge-based test program following the ATML standard","authors":"A. Pirker-Fruhauf","doi":"10.1109/AUTEST.2009.5314090","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314090","url":null,"abstract":"Developing test programs for taking measurements on different test systems is still a common procedure within the IC verification process. The complexity of a test program is strongly related to the complexity of ICs and test systems. These test programs usually are non-modular and maintenance is time-consuming. Test programs based on ATML standard [1] have to perform special tasks like parsing XML (Extensible Markup Language) documents, resource allocation, resource mapping, etc. On the other hand, these prerequisites increase modularity and flexibility of the test program. This paper introduces a knowledge-based test program following the ATML standard implemented within LabVIEW [2]. The developed test program can be used for any test system. This helps saving time considering programming effort and improving the verification process.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127417320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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