Pub Date : 1998-07-17DOI: 10.1109/NAECON.1998.710122
L. Hallman
{"title":"Problems in the Production of Microelectronic Equipments","authors":"L. Hallman","doi":"10.1109/NAECON.1998.710122","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710122","url":null,"abstract":"","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126204836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710118
Reinhart, Carolyn Boettcher, Hal Wasserman
New techniques are required to speed the software testing process and to enhance the ultimate reliability of mission-critical embedded information systems. Here we employ result-checking, a technique in which software assures the correctness of its own computations through efficient: run-time checks. Building on previous work at U.C. Berkeley and Raytheon Systems Company, the Air Force Research Laboratory is funding the Automated Generation of Avionics Software Tests (AGAST) program to demonstrate that result-checking can be the basis for a flexible new methodology of software testing. This methodology aims at the production of software which has an enhanced sensitivity to its own errors (complemented with appropriate instrumentation), and which therefore may be tested with extremely high efficiency and accuracy.
{"title":"An automated testing methodology based on self-checking software","authors":"Reinhart, Carolyn Boettcher, Hal Wasserman","doi":"10.1109/NAECON.1998.710118","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710118","url":null,"abstract":"New techniques are required to speed the software testing process and to enhance the ultimate reliability of mission-critical embedded information systems. Here we employ result-checking, a technique in which software assures the correctness of its own computations through efficient: run-time checks. Building on previous work at U.C. Berkeley and Raytheon Systems Company, the Air Force Research Laboratory is funding the Automated Generation of Avionics Software Tests (AGAST) program to demonstrate that result-checking can be the basis for a flexible new methodology of software testing. This methodology aims at the production of software which has an enhanced sensitivity to its own errors (complemented with appropriate instrumentation), and which therefore may be tested with extremely high efficiency and accuracy.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116935096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710135
J. Bacso, R. F. Moody
A development strategy for transitioning a legacy radar modeling system to a fully object oriented standards based architecture is presented The strategy involves a series of model "Builds" that preserves the legacy investment (including VV&A), while addressing the highest priority customer needs for HLA and JMASS compliant modeling products. The strategy emphasizes collaboration within the M&S community to foster model commonality, minimize the number of legacy models, and reduce organizational M&S costs.
{"title":"Project amber: re-engineering a legacy ground radar modeling system into a standards based object oriented architecture","authors":"J. Bacso, R. F. Moody","doi":"10.1109/NAECON.1998.710135","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710135","url":null,"abstract":"A development strategy for transitioning a legacy radar modeling system to a fully object oriented standards based architecture is presented The strategy involves a series of model \"Builds\" that preserves the legacy investment (including VV&A), while addressing the highest priority customer needs for HLA and JMASS compliant modeling products. The strategy emphasizes collaboration within the M&S community to foster model commonality, minimize the number of legacy models, and reduce organizational M&S costs.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126039755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710142
Li Qing, Guo Pan, Shen Chunlin
This paper discusses several problems of digital map technique in low altitude penetration, which includes the characteristics of airborne digital map in low altitude penetration, the modeling of threats, the treatment of threats' data, the interpolation and smoothing method of terrain data. It also offers methods to solve these problems. These methods are very simple and can fulfill the special requirements of low altitude penetration.
{"title":"Terrain map data treatment for low altitude penetration","authors":"Li Qing, Guo Pan, Shen Chunlin","doi":"10.1109/NAECON.1998.710142","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710142","url":null,"abstract":"This paper discusses several problems of digital map technique in low altitude penetration, which includes the characteristics of airborne digital map in low altitude penetration, the modeling of threats, the treatment of threats' data, the interpolation and smoothing method of terrain data. It also offers methods to solve these problems. These methods are very simple and can fulfill the special requirements of low altitude penetration.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115567692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710173
R. J. Martel, J. J. Sudano
System response times are too long and decision error too high in today's computer-missile combat systems. One of the most serious shortfalls of current combat system operations is time to perform identification tasks with reliable level of certainty when, predictably, reliable decisions are most needed time is too short and system demands are high. Automated methods of reliable information generation can reduce operator workload and the probability of decision error. Multisensor data fusion concept models that address this problem have been developed. The potential advantage of multisensor data fusion is its ability to process more kinds of sensor data and more complex variables at greater speed and with less error than human decision makers. Automation speeds the identification process and frees the operator to perform higher levels of decision making. This paper attempts to bring together a concept model of multisensor data fusion with a concept model of human-computer interaction that mutually support the system engineering effort to reduce decision error in combat system identification processes.
{"title":"Reduction of decision error in track identification by utilization of data fusion","authors":"R. J. Martel, J. J. Sudano","doi":"10.1109/NAECON.1998.710173","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710173","url":null,"abstract":"System response times are too long and decision error too high in today's computer-missile combat systems. One of the most serious shortfalls of current combat system operations is time to perform identification tasks with reliable level of certainty when, predictably, reliable decisions are most needed time is too short and system demands are high. Automated methods of reliable information generation can reduce operator workload and the probability of decision error. Multisensor data fusion concept models that address this problem have been developed. The potential advantage of multisensor data fusion is its ability to process more kinds of sensor data and more complex variables at greater speed and with less error than human decision makers. Automation speeds the identification process and frees the operator to perform higher levels of decision making. This paper attempts to bring together a concept model of multisensor data fusion with a concept model of human-computer interaction that mutually support the system engineering effort to reduce decision error in combat system identification processes.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121784545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710096
F. Oliveto
System Efficiency/Merit is a complete evaluation as to how well a system is designed with regard to performance, design adequacy, reliability, human factors, survivability, and cost effective production and maintenance. System efficiency/merit (a total system evaluation) can be defined as the assessment of all the system parameters that contribute to how well the system is designed for a successful, cost effective operation. The main ingredients of system efficiency are: system effectiveness and cost. Therefore maximum system efficiency is obtained only if the system is optimized in all parameters that influence capability, either from the performance aspect or the operational aspect. The various factors not only cannot be ignored but also must be evaluated continuously for improvements and innovations from the beginning of the design phase to the end of the production phase. Weak links must be identified and singled out for upgrading to achieve the highest possible system efficiency.
{"title":"System efficiency/merit (a total system evaluation)","authors":"F. Oliveto","doi":"10.1109/NAECON.1998.710096","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710096","url":null,"abstract":"System Efficiency/Merit is a complete evaluation as to how well a system is designed with regard to performance, design adequacy, reliability, human factors, survivability, and cost effective production and maintenance. System efficiency/merit (a total system evaluation) can be defined as the assessment of all the system parameters that contribute to how well the system is designed for a successful, cost effective operation. The main ingredients of system efficiency are: system effectiveness and cost. Therefore maximum system efficiency is obtained only if the system is optimized in all parameters that influence capability, either from the performance aspect or the operational aspect. The various factors not only cannot be ignored but also must be evaluated continuously for improvements and innovations from the beginning of the design phase to the end of the production phase. Weak links must be identified and singled out for upgrading to achieve the highest possible system efficiency.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132225494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710200
H. Hirsch, P. Chawla, H. Carter
VHDL-AMS simulation is a compute intensive activity, particularly for large models, which motivates the development and use of approaches for accelerating the simulation process. An approach that is showing some promise is to execute the simulator in parallel on a distributed computer. The SEAMS VHDL-AMS simulator created at the University of Cincinnati exploits component-level partitioning, optimistic time synchronization, analog island modeling and a new discrete-analog time algorithm to completely partition the VHDL-AMS description at the entity-architecture level, and simulate the partitioned system on separate processors on a distributed computer. Results show significant speedups are possible.
{"title":"Parallel simulation of VHDL-AMS models","authors":"H. Hirsch, P. Chawla, H. Carter","doi":"10.1109/NAECON.1998.710200","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710200","url":null,"abstract":"VHDL-AMS simulation is a compute intensive activity, particularly for large models, which motivates the development and use of approaches for accelerating the simulation process. An approach that is showing some promise is to execute the simulator in parallel on a distributed computer. The SEAMS VHDL-AMS simulator created at the University of Cincinnati exploits component-level partitioning, optimistic time synchronization, analog island modeling and a new discrete-analog time algorithm to completely partition the VHDL-AMS description at the entity-architecture level, and simulate the partitioned system on separate processors on a distributed computer. Results show significant speedups are possible.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130434167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710211
I. Younus, J. Loomis, G. Al-Salehi
Phase stepped interferometry (PSI) technique uses a charge coupled device (CCD) camera for intensity image acquisition and allow for near real-time full field object displacement measurements. Since this technique deals with nanometer level displacements, accuracy is a big factor for this method. System parameters of this technique control the accuracy of the measurement and hence determine the system's performance. In this paper an effort is made to explain the characteristics of the key parameters and their role in determining system's performance. The optimum value of the parameters have been chosen after a careful observation. A simulated result has also been presented using the valve of the parameters in order to show the importance of key parameters on system's performance.
{"title":"System performance of PSI technique as a function of key parameters","authors":"I. Younus, J. Loomis, G. Al-Salehi","doi":"10.1109/NAECON.1998.710211","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710211","url":null,"abstract":"Phase stepped interferometry (PSI) technique uses a charge coupled device (CCD) camera for intensity image acquisition and allow for near real-time full field object displacement measurements. Since this technique deals with nanometer level displacements, accuracy is a big factor for this method. System parameters of this technique control the accuracy of the measurement and hence determine the system's performance. In this paper an effort is made to explain the characteristics of the key parameters and their role in determining system's performance. The optimum value of the parameters have been chosen after a careful observation. A simulated result has also been presented using the valve of the parameters in order to show the importance of key parameters on system's performance.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132596301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710150
Jian-Ming Qu, Chen-yang Yang, S. Mao, Shao-hong Li
A scheme based on conical-like scan method is proposed to solve the problem of the missile capture with phased array radar. The factors, which affect the missile capture process, are analyzed. The direction cosine measurement variance, which is the main factor dealing with the radar signal processing, is decreased by applying the weighed least square estimator with conical-like method. The measurement variance is derived and different beam packing arrangements are discussed. The triangular packing arrangement, as an example, is specially analyzed. Finally the scheme is described step by step to fit for programming.
{"title":"A missile capture scheme based on conical-like scan method","authors":"Jian-Ming Qu, Chen-yang Yang, S. Mao, Shao-hong Li","doi":"10.1109/NAECON.1998.710150","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710150","url":null,"abstract":"A scheme based on conical-like scan method is proposed to solve the problem of the missile capture with phased array radar. The factors, which affect the missile capture process, are analyzed. The direction cosine measurement variance, which is the main factor dealing with the radar signal processing, is decreased by applying the weighed least square estimator with conical-like method. The measurement variance is derived and different beam packing arrangements are discussed. The triangular packing arrangement, as an example, is specially analyzed. Finally the scheme is described step by step to fit for programming.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129404906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710222
M. O’Keefe, J. Hagge, R. Camilletti, G. Rinne, L. White, J. Rates
This paper discusses the results of comparative reliability testing of electronic MultiChip Modules (MCMs) fabricated with laminate substrates (MCM-L) and protected with various bare-die coatings. The demonstration MCMs included flip-chip and wire-bond design versions of the digital portion of a Global Positioning System (GPS) Receiver MCM and an analog MCM far use in general aviation applications. Standard encapsulants and new inorganic coatings, Dow Corning's ChipSeal/sup (R)/ hermetic coating materials, were evaluated using environmental stress exposures for high reliability avionics applications. Full wafer probe testing was performed before and after the Supplemental ChipSeal/sup (R)/ processing and flip-chip processing steps. ChipSeal/sup (R)/ and flip-chip processing steps were shown to cause no device yield degradation on the five different semiconductor wafer lots tested. Environmental test results demonstrated that low cost MCM-L units with bare die packaging can be designed for very robust, high reliability applications such as military and commercial avionics.
{"title":"Packaging of low cost electronic multichip module-laminate (MCM-L) assemblies for hermetic-equivalent performance in high reliability avionics applications","authors":"M. O’Keefe, J. Hagge, R. Camilletti, G. Rinne, L. White, J. Rates","doi":"10.1109/NAECON.1998.710222","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710222","url":null,"abstract":"This paper discusses the results of comparative reliability testing of electronic MultiChip Modules (MCMs) fabricated with laminate substrates (MCM-L) and protected with various bare-die coatings. The demonstration MCMs included flip-chip and wire-bond design versions of the digital portion of a Global Positioning System (GPS) Receiver MCM and an analog MCM far use in general aviation applications. Standard encapsulants and new inorganic coatings, Dow Corning's ChipSeal/sup (R)/ hermetic coating materials, were evaluated using environmental stress exposures for high reliability avionics applications. Full wafer probe testing was performed before and after the Supplemental ChipSeal/sup (R)/ processing and flip-chip processing steps. ChipSeal/sup (R)/ and flip-chip processing steps were shown to cause no device yield degradation on the five different semiconductor wafer lots tested. Environmental test results demonstrated that low cost MCM-L units with bare die packaging can be designed for very robust, high reliability applications such as military and commercial avionics.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133318992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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