In order to improve the surface properties of wool fiber, the wool fabric was treated with liquid ammonia and protease treatments successively. The results showed that liquid ammonia pretreatment could cause certain damage to the surface structure and disulfide bonds in keratin, which enhanced the action of protease on wool surface and catalytic hydrolysis of the cuticle. The joint treatment of liquid ammonia and protease changed the secondary structure of wool. The content of α‐helix and random crimp increased, while the content of β‐sheet decreased. In addition, the shrink resistance of wool fabric was significantly improved without obvious losses in tensile strength and elongation. The combination of liquid ammonia and protease treatments provides a potential new method for the surface modification and eco‐friendly shrink‐resistant finishing of wool and further widens the application of liquid ammonia in textile industry.
{"title":"Effect of liquid ammonia and protease on surface modification and shrink resistance of wool","authors":"Xianqin Shang, Qiang Wang, Zhe Jiang, Haitao Ma","doi":"10.1002/sia.7262","DOIUrl":"https://doi.org/10.1002/sia.7262","url":null,"abstract":"In order to improve the surface properties of wool fiber, the wool fabric was treated with liquid ammonia and protease treatments successively. The results showed that liquid ammonia pretreatment could cause certain damage to the surface structure and disulfide bonds in keratin, which enhanced the action of protease on wool surface and catalytic hydrolysis of the cuticle. The joint treatment of liquid ammonia and protease changed the secondary structure of wool. The content of α‐helix and random crimp increased, while the content of β‐sheet decreased. In addition, the shrink resistance of wool fabric was significantly improved without obvious losses in tensile strength and elongation. The combination of liquid ammonia and protease treatments provides a potential new method for the surface modification and eco‐friendly shrink‐resistant finishing of wool and further widens the application of liquid ammonia in textile industry.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135461996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Various secondary particles are emitted when the surface of solid matter is irradiated with ions. This phenomenon has been utilized in several methods to analyze target materials. In analytical techniques, the method used to detect secondary ions is called “secondary ion mass spectrometry (SIMS).” In contrast, “secondary ion mass spectrometry with optical emission spectrometry (SIMS‐OES)” detects photons emitted from sputtered, excited atoms. Both SIMS and OES can characterize a sample surface and perform local elemental analysis of the surface, depth profiling of elements, and detection of any atom. SIMS with high sensitivity has mainly been developed for the impurity analyses of semiconductors. However, no research has been reported on applications using SIMS‐OES or a combination of SIMS and SIMS‐OES. In this study, we prove that atomic emission can be observed via ion irradiation. In addition, we show that the composition analysis is possible using the SIMS‐OES method. Herein, impurity and composition analyses were enabled by utilizing atomic emission. Moreover, we proved that an assessment with high‐depth direction resolution is feasible by etching the circumference of a crater in advance.
{"title":"Simultaneous measurement of impurities and composition by secondary ion mass spectrometry with optical emission spectrometry","authors":"Takashi Miyamoto, Shigenori Numao, Junichiro Sameshima, Masanobu Yoshikawa","doi":"10.1002/sia.7255","DOIUrl":"https://doi.org/10.1002/sia.7255","url":null,"abstract":"Various secondary particles are emitted when the surface of solid matter is irradiated with ions. This phenomenon has been utilized in several methods to analyze target materials. In analytical techniques, the method used to detect secondary ions is called “secondary ion mass spectrometry (SIMS).” In contrast, “secondary ion mass spectrometry with optical emission spectrometry (SIMS‐OES)” detects photons emitted from sputtered, excited atoms. Both SIMS and OES can characterize a sample surface and perform local elemental analysis of the surface, depth profiling of elements, and detection of any atom. SIMS with high sensitivity has mainly been developed for the impurity analyses of semiconductors. However, no research has been reported on applications using SIMS‐OES or a combination of SIMS and SIMS‐OES. In this study, we prove that atomic emission can be observed via ion irradiation. In addition, we show that the composition analysis is possible using the SIMS‐OES method. Herein, impurity and composition analyses were enabled by utilizing atomic emission. Moreover, we proved that an assessment with high‐depth direction resolution is feasible by etching the circumference of a crater in advance.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135853673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Structural, electronic, and thermoelectric properties of bridging OH b and terminal OH t groups adsorbed on stoichiometric SnO 2 (110) surfaces have been investigated using density functional theory and semiclassical Boltzmann transport theory with effective core pseudopotential implemented in CRYSTAL17 program. Our results indicate that H and OH yield significant structural relaxation around the adsorption sites O 2c and Sn 5c . The results have shown that the absolute value of adsorption energy increases with decreasing the coverage from 1 to 1/4 monolayer. Mulliken charge analysis, band structures, and density of states were calculated and discussed. We found that H and OH adsorption increases the band gap energy from 2.81 eV for clean surfaces to 3.04, 2.95, and 2.89 eV with, respectively, 1, 1/2 and 1/4 monolayer surface coverages. Thermoelectric properties revealed that the presence of hydroxyl groups on the SnO 2 (110) surfaces may enhance the Seebeck coefficient, electrical conductivity, and electronic thermal conductivity.
{"title":"Structural, electronic, and thermoelectric properties of hydroxyl groups adsorption on SnO<sub>2</sub> (110) surface: A first‐principles study","authors":"N. Bouchelarem, F. Bouamra, M. Derbal, M. Rérat","doi":"10.1002/sia.7261","DOIUrl":"https://doi.org/10.1002/sia.7261","url":null,"abstract":"Structural, electronic, and thermoelectric properties of bridging OH b and terminal OH t groups adsorbed on stoichiometric SnO 2 (110) surfaces have been investigated using density functional theory and semiclassical Boltzmann transport theory with effective core pseudopotential implemented in CRYSTAL17 program. Our results indicate that H and OH yield significant structural relaxation around the adsorption sites O 2c and Sn 5c . The results have shown that the absolute value of adsorption energy increases with decreasing the coverage from 1 to 1/4 monolayer. Mulliken charge analysis, band structures, and density of states were calculated and discussed. We found that H and OH adsorption increases the band gap energy from 2.81 eV for clean surfaces to 3.04, 2.95, and 2.89 eV with, respectively, 1, 1/2 and 1/4 monolayer surface coverages. Thermoelectric properties revealed that the presence of hydroxyl groups on the SnO 2 (110) surfaces may enhance the Seebeck coefficient, electrical conductivity, and electronic thermal conductivity.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136359957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This Insight Note follows a series of three previous insight notes on X‐ray photoelectron spectroscopy image analysis that focused on the importance of analyzing the raw data, the use of summary statistics, and principal component analysis (PCA). The same X‐ray photoelectron spectroscopy image data set was analyzed in all three notes. We now show an analysis of this same data set using multivariate curve resolution (MCR). MCR is a widely used exploratory data analysis method. Because of MCR's nonnegativity constraints, it has the important advantage of producing factors that look like real spectra. That is, both its scores and loadings are positive, so its results are often more interpretable than those from PCA. The requirements for preprocessing data are also, in general, lower for MCR compared with PCA. To help determine the number of factors that best describe the data set, a series of MCR models with different numbers of factors was created. Based on the chemical reasonableness of its factors, a two‐factor model was selected. Scores plots/images show the regions of the image that correspond to these two factors.
{"title":"Surface analysis insight note: Multivariate curve resolution of an X‐ray photoelectron spectroscopy image","authors":"Behnam Moeini, Neal Gallagher, Matthew R. Linford","doi":"10.1002/sia.7260","DOIUrl":"https://doi.org/10.1002/sia.7260","url":null,"abstract":"This Insight Note follows a series of three previous insight notes on X‐ray photoelectron spectroscopy image analysis that focused on the importance of analyzing the raw data, the use of summary statistics, and principal component analysis (PCA). The same X‐ray photoelectron spectroscopy image data set was analyzed in all three notes. We now show an analysis of this same data set using multivariate curve resolution (MCR). MCR is a widely used exploratory data analysis method. Because of MCR's nonnegativity constraints, it has the important advantage of producing factors that look like real spectra. That is, both its scores and loadings are positive, so its results are often more interpretable than those from PCA. The requirements for preprocessing data are also, in general, lower for MCR compared with PCA. To help determine the number of factors that best describe the data set, a series of MCR models with different numbers of factors was created. Based on the chemical reasonableness of its factors, a two‐factor model was selected. Scores plots/images show the regions of the image that correspond to these two factors.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134976018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In our previous work, we find that the ethylene glycol (EG) is transferred to amorphous carbon or graphene during sliding under the effect of the tribochemical reactions; herein, in this work, we control the concentration of the modified Al 2 O 3 nanoparticles in the EG solution in order to modulate the tribological properties of the tribosystem sliding in the mixed lubricant consisting of the modified Al 2 O 3 nanoparticles and EG. The tribological tests show that the concentrations of the modified Al 2 O 3 nanoparticles ranging from 0 to 1.0 wt% in the mixed lubricant are helpful for obtaining low wear rate due to the formation of graphene‐like materials induced by tribochemical reactions. On the other hand, when the concentration reaches 1.5 wt.%, the tribosystem exhibits high coefficient of friction (COF) and wear rate, which is attributed to the formation of reunited groups consisting of the modified Al 2 O 3 nanoparticles and graphene‐like materials. This investigation should give a positive guidance for the design of the mixed lubricant with excellent lubrication properties.
{"title":"Tribochemistry effect on the friction reduction of Al<sub>2</sub>O<sub>3</sub>/ethylene glycol composite lubricant between steel self‐mated tribosystem","authors":"Peng Liu, Qing Xu, Renhui Zhang","doi":"10.1002/sia.7259","DOIUrl":"https://doi.org/10.1002/sia.7259","url":null,"abstract":"In our previous work, we find that the ethylene glycol (EG) is transferred to amorphous carbon or graphene during sliding under the effect of the tribochemical reactions; herein, in this work, we control the concentration of the modified Al 2 O 3 nanoparticles in the EG solution in order to modulate the tribological properties of the tribosystem sliding in the mixed lubricant consisting of the modified Al 2 O 3 nanoparticles and EG. The tribological tests show that the concentrations of the modified Al 2 O 3 nanoparticles ranging from 0 to 1.0 wt% in the mixed lubricant are helpful for obtaining low wear rate due to the formation of graphene‐like materials induced by tribochemical reactions. On the other hand, when the concentration reaches 1.5 wt.%, the tribosystem exhibits high coefficient of friction (COF) and wear rate, which is attributed to the formation of reunited groups consisting of the modified Al 2 O 3 nanoparticles and graphene‐like materials. This investigation should give a positive guidance for the design of the mixed lubricant with excellent lubrication properties.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136236968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Surface sputtering and structural modifications induced in silicon dioxide thin films (SiO 2 /Si) deposited on silicon substrates and irradiated by swift (10–40 MeV) heavy Au q+ (q = +4, +6, +7, and +9) ions were investigated by grazing‐incidence X‐ray diffraction (GIXRD) spectroscopy, Rutherford backscattering (RBS) spectrometry and time‐of‐flight elastic recoil detection (ToF‐ERDA) technique. The GIXRD analysis of the as‐deposited and irradiated samples revealed increasing structural modifications of the SiO 2 thin films under Au q+ ion impacts with increasing ion‐beam energy. The changes consisted of decreased grain sizes with increased strain accompanied by a phase transformation from crystalline to amorphous films. RBS analysis showed a decrease in the mean stoichiometric (O/Si) ratio from (2.2 ± 0.1) to (1.7 ± 0.1), due to preferential sputtering of oxygen, as the incident ion energy increased. The obtained RBS‐results were then completed by those of ToF‐ERDA analysis technique using a 40 MeV Au 9+ heavy ion beam. The preferential sputtering yield ratios (Y Si /Y O ) were determined experimentally both versus electronic stopping power and ion fluence. The obtained results were then compared to numerical values derived from the inelastic thermal spike (i‐TS) model, Sigmund's analytical formula and SRIM simulation code. A good agreement was observed between the measured preferential sputtering data and the i‐TS calculated values, when considering both nuclear elastic and electronic inelastic collision mechanisms. Besides, a close correlation is observed between the electronic stopping power dependent measured sputtering yields and the XRD peak intensity degradation per unit fluence. These observations suggest that the same mechanism of MeV heavy ion‐irradiation induced extended atomic disordering, occurs both in the case of structural modifications and surface sputtering. Finally, the obtained experimental results are discussed on the basis of the i‐TS model.
采用掠入射X射线衍射(GIXRD)光谱、卢瑟福后向散射(RBS)光谱和飞行时间弹性反冲检测(ToF - ERDA)技术研究了快速(10-40 MeV)重Au q+ (q = +4、+6、+7和+9)离子辐照沉积在硅衬底上的二氧化硅薄膜(sio2 /Si)表面溅射和结构修饰。砷沉积和辐照样品的GIXRD分析表明，随着离子束能量的增加，Au q+离子作用下sio2薄膜的结构修饰增加。随着应变的增加，晶粒尺寸减小，并伴有从晶态到非晶态的相变。RBS分析表明，随着入射离子能量的增加，由于氧优先溅射，平均化学计量比(O/Si)从(2.2±0.1)下降到(1.7±0.1)。利用40mev Au 9+重离子束，用ToF - ERDA分析技术完成RBS‐结果。实验确定了电子停止功率和离子影响下的优先溅射良率(Y Si /Y O)。然后将所得结果与非弹性热峰值(i‐TS)模型、西格蒙德解析公式和SRIM模拟代码的数值进行比较。当考虑核弹性和电子非弹性碰撞机制时，观测到的优先溅射数据与i - TS计算值吻合得很好。此外，在电子停止功率依赖的溅射量与单位通量的XRD峰强度降解之间观察到密切的相关性。这些观察结果表明，在结构修饰和表面溅射的情况下，MeV重离子辐照诱导扩展原子无序的机制是相同的。最后，在i‐TS模型的基础上对得到的实验结果进行了讨论。
{"title":"Sputtering and structural modifications induced in silicon dioxide (SiO<sub>2</sub>) thin films under (10–40 MeV) Au<sup>q+</sup> heavy ion irradiation","authors":"Ster Mammeri, Mhamed Salhi, Abir Boubir, Mandla Msimanga, Christopher Mtshali, Mlungisi Nkosi","doi":"10.1002/sia.7257","DOIUrl":"https://doi.org/10.1002/sia.7257","url":null,"abstract":"Surface sputtering and structural modifications induced in silicon dioxide thin films (SiO 2 /Si) deposited on silicon substrates and irradiated by swift (10–40 MeV) heavy Au q+ (q = +4, +6, +7, and +9) ions were investigated by grazing‐incidence X‐ray diffraction (GIXRD) spectroscopy, Rutherford backscattering (RBS) spectrometry and time‐of‐flight elastic recoil detection (ToF‐ERDA) technique. The GIXRD analysis of the as‐deposited and irradiated samples revealed increasing structural modifications of the SiO 2 thin films under Au q+ ion impacts with increasing ion‐beam energy. The changes consisted of decreased grain sizes with increased strain accompanied by a phase transformation from crystalline to amorphous films. RBS analysis showed a decrease in the mean stoichiometric (O/Si) ratio from (2.2 ± 0.1) to (1.7 ± 0.1), due to preferential sputtering of oxygen, as the incident ion energy increased. The obtained RBS‐results were then completed by those of ToF‐ERDA analysis technique using a 40 MeV Au 9+ heavy ion beam. The preferential sputtering yield ratios (Y Si /Y O ) were determined experimentally both versus electronic stopping power and ion fluence. The obtained results were then compared to numerical values derived from the inelastic thermal spike (i‐TS) model, Sigmund's analytical formula and SRIM simulation code. A good agreement was observed between the measured preferential sputtering data and the i‐TS calculated values, when considering both nuclear elastic and electronic inelastic collision mechanisms. Besides, a close correlation is observed between the electronic stopping power dependent measured sputtering yields and the XRD peak intensity degradation per unit fluence. These observations suggest that the same mechanism of MeV heavy ion‐irradiation induced extended atomic disordering, occurs both in the case of structural modifications and surface sputtering. Finally, the obtained experimental results are discussed on the basis of the i‐TS model.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135206084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper, we calculated the different forms of BaTiO 3 /BiCoO 3 composite structure, predicting their visible light absorption performance based on the electronic structure using the first principles calculations. Firstly, six possible compounds that come from BaTiO 3 and BiCoO 3 were constructed. By calculating the different antiferromagnetic (AFM) structures of strip, columnar, and layered composite structures, it is found that the ground state of the composite structure changes to G‐type AFM structure from C‐type AFM structure of pure BiCoO 3 under the influence of BaTiO 3 . Energy band calculations show that band gaps of three composite structures are smaller than those of pure BaTiO 3 and pure BiCoO 3 . Furthermore, density of states analysis shows that the conduction band minimum (CBM) and valence band maximum (VBM) of three composite structures are mainly from the contribution of Co 3 d and O 2 p . For the characteristic that CBM and VBM of materials come from different atoms, it would reduce the recombination opportunities of electrons and holes and is conducive to the increase of photoelectric conversion efficiency under visible light irradiation. The calculation of optical properties shows that optical absorption coefficients of three composite structures are much larger than that of BaTiO 3 , especially the layered composite structure. There is a high absorption peak near 500 nm of the solar spectral irradiation maximum, which is significantly important to improve the optical energy conversion efficiency of the composite materials. The work provides an effective way for the application of wide band gap ferroelectric materials in ferroelectric photovoltaic.
{"title":"Electronic structure and optical absorption property of BaTiO<sub>3</sub>/BiCoO<sub>3</sub>","authors":"Lijing Wei, Ling Pang, Shaoyuan Pang, Jianan Sun, Pan Yang, Jianxin Guo","doi":"10.1002/sia.7258","DOIUrl":"https://doi.org/10.1002/sia.7258","url":null,"abstract":"In this paper, we calculated the different forms of BaTiO 3 /BiCoO 3 composite structure, predicting their visible light absorption performance based on the electronic structure using the first principles calculations. Firstly, six possible compounds that come from BaTiO 3 and BiCoO 3 were constructed. By calculating the different antiferromagnetic (AFM) structures of strip, columnar, and layered composite structures, it is found that the ground state of the composite structure changes to G‐type AFM structure from C‐type AFM structure of pure BiCoO 3 under the influence of BaTiO 3 . Energy band calculations show that band gaps of three composite structures are smaller than those of pure BaTiO 3 and pure BiCoO 3 . Furthermore, density of states analysis shows that the conduction band minimum (CBM) and valence band maximum (VBM) of three composite structures are mainly from the contribution of Co 3 d and O 2 p . For the characteristic that CBM and VBM of materials come from different atoms, it would reduce the recombination opportunities of electrons and holes and is conducive to the increase of photoelectric conversion efficiency under visible light irradiation. The calculation of optical properties shows that optical absorption coefficients of three composite structures are much larger than that of BaTiO 3 , especially the layered composite structure. There is a high absorption peak near 500 nm of the solar spectral irradiation maximum, which is significantly important to improve the optical energy conversion efficiency of the composite materials. The work provides an effective way for the application of wide band gap ferroelectric materials in ferroelectric photovoltaic.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135208099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiaofan Xie, David Zanders, Florian Preischel, Teresa de los Arcos, Anjana Devi, Guido Grundmeier
In the present study, the effects of oxygen plasma treatment and subsequent 2 nm thin Al 2 O 3 film deposition by atomic layer deposition on about 30 nm thick hexamethyldisilazane polymer layers are investigated by using a combination of spectroscopic and electrochemical analysis. The investigations focus on the microporosity of the corresponding films and their structural changes. Upon oxygen plasma treatment, the surface near region of the films is converted into SiO x , and the microporosity is increased. Atomic layer deposition of Al 2 O 3 on the plasma oxidized films leads to the decrease of pore sizes and an effective sealing. A correlation between the film microporosity and the change of hydroxyl groups of the films with the adsorption of water was established by ellipsometric porosimetry and in situ Fourier transform infrared (FTIR) spectroscopy. Moreover, electrochemical analysis provided complementary information on the electrolyte up‐take in the differently conditioned thin films.
{"title":"Complementary spectroscopic and electrochemical analysis of the sealing of micropores in hexamethyldisilazane plasma polymer films by Al<sub>2</sub>O<sub>3</sub> atomic layer deposition","authors":"Xiaofan Xie, David Zanders, Florian Preischel, Teresa de los Arcos, Anjana Devi, Guido Grundmeier","doi":"10.1002/sia.7256","DOIUrl":"https://doi.org/10.1002/sia.7256","url":null,"abstract":"In the present study, the effects of oxygen plasma treatment and subsequent 2 nm thin Al 2 O 3 film deposition by atomic layer deposition on about 30 nm thick hexamethyldisilazane polymer layers are investigated by using a combination of spectroscopic and electrochemical analysis. The investigations focus on the microporosity of the corresponding films and their structural changes. Upon oxygen plasma treatment, the surface near region of the films is converted into SiO x , and the microporosity is increased. Atomic layer deposition of Al 2 O 3 on the plasma oxidized films leads to the decrease of pore sizes and an effective sealing. A correlation between the film microporosity and the change of hydroxyl groups of the films with the adsorption of water was established by ellipsometric porosimetry and in situ Fourier transform infrared (FTIR) spectroscopy. Moreover, electrochemical analysis provided complementary information on the electrolyte up‐take in the differently conditioned thin films.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135205928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Primarily due to its inherent redox chemistry, ceria (CeO2) is of use in many diverse areas of research. However, there is a wealth of misinterpretation of the oxygen spectra when discussing the result of damage or reduction to the CeO2 lattice, especially with regard to a signal in this region attributed to oxygen vacancies. In this paper, it is shown that this peak cannot be due to vacancies and that a better understanding of the changes in stoichiometry of CeO2 is best viewed from that of the Ce(III) component when considered in tandem with the O 1s signal.
{"title":"Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis","authors":"David J. Morgan","doi":"10.1002/sia.7254","DOIUrl":"https://doi.org/10.1002/sia.7254","url":null,"abstract":"Primarily due to its inherent redox chemistry, ceria (CeO2) is of use in many diverse areas of research. However, there is a wealth of misinterpretation of the oxygen spectra when discussing the result of damage or reduction to the CeO2 lattice, especially with regard to a signal in this region attributed to oxygen vacancies. In this paper, it is shown that this peak cannot be due to vacancies and that a better understanding of the changes in stoichiometry of CeO2 is best viewed from that of the Ce(III) component when considered in tandem with the O 1s signal.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48568179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Issue Information","authors":"","doi":"10.1002/sia.7119","DOIUrl":"https://doi.org/10.1002/sia.7119","url":null,"abstract":"No abstract is available for this article.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.7,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43915730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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