Environmental pollution as a result of industrial activity is widespread in many urban areas including Chicago. In an effort to evaluate the heavy metal fraction originating from industrial activities, plant samples of Daucus Carota or wild carrot were collected at or adjacent to six sites located in two of Chicago's designated industrial corridors. Plants, especially herbaceous species, have been deemed suitable as environmental pollution monitors as they are able to provide information about the heavy metal fraction accessible to biota. The leaves of Daucus Carota were acid digested and analyzed with total reflection X‐ray fluorescence spectrometry TXRF. The results showed elevated heavy metal mass fractions for at least one collection site which is close to an operational railyard. Other studies investigating heavy metals in proximity to railroad operations found elevated mass fractions for several elements, but specifically manganese as well. This suggests that abrasion from shunting and breaking releases certain pollutants into the local environment. The data were compared with studies executed in Rome, Italy, and Pakistan, which used Daucus Carota to evaluate heavy metal pollution. It was found that the heavy metal mass fractions obtained for Chicago were higher for some elements indicating an increased pollutant burden for these elements. The same samples were also analyzed by graphite furnace atomic absorption spectrometry GFAAS for the elements copper and lead and the data compared. Those two elements were chosen as they were present at each location and GFAAS has proven to be highly sensitive for them. It was found that the two methods provided comparable results for copper, whereas for lead, TXRF overestimated the mass fractions most likely due to limitations of the spectra evaluation software. The analysis of a certified reference material ‘BCR 679 white cabbage’ showed that most data obtained by TXRF were in good agreement with the certified values, with the exception of lead, which was not certified. However, since GFAAS has high sensitivity toward lead and is considered reference method for that element by regulatory agencies, a comparison between GFAAS and TXRF data for lead in the same sample can serve as good indicator for TXRF performance.
{"title":"Biomonitoring of urban industrial pollution using total reflection X‐ray fluorescence","authors":"M. Schmeling, M. Gende, A. Tovar","doi":"10.1002/xrs.3439","DOIUrl":"https://doi.org/10.1002/xrs.3439","url":null,"abstract":"Environmental pollution as a result of industrial activity is widespread in many urban areas including Chicago. In an effort to evaluate the heavy metal fraction originating from industrial activities, plant samples of <jats:italic>Daucus Carota</jats:italic> or wild carrot were collected at or adjacent to six sites located in two of Chicago's designated industrial corridors. Plants, especially herbaceous species, have been deemed suitable as environmental pollution monitors as they are able to provide information about the heavy metal fraction accessible to biota. The leaves of <jats:italic>Daucus Carota</jats:italic> were acid digested and analyzed with total reflection X‐ray fluorescence spectrometry TXRF. The results showed elevated heavy metal mass fractions for at least one collection site which is close to an operational railyard. Other studies investigating heavy metals in proximity to railroad operations found elevated mass fractions for several elements, but specifically manganese as well. This suggests that abrasion from shunting and breaking releases certain pollutants into the local environment. The data were compared with studies executed in Rome, Italy, and Pakistan, which used <jats:italic>Daucus Carota</jats:italic> to evaluate heavy metal pollution. It was found that the heavy metal mass fractions obtained for Chicago were higher for some elements indicating an increased pollutant burden for these elements. The same samples were also analyzed by graphite furnace atomic absorption spectrometry GFAAS for the elements copper and lead and the data compared. Those two elements were chosen as they were present at each location and GFAAS has proven to be highly sensitive for them. It was found that the two methods provided comparable results for copper, whereas for lead, TXRF overestimated the mass fractions most likely due to limitations of the spectra evaluation software. The analysis of a certified reference material ‘BCR 679 white cabbage’ showed that most data obtained by TXRF were in good agreement with the certified values, with the exception of lead, which was not certified. However, since GFAAS has high sensitivity toward lead and is considered reference method for that element by regulatory agencies, a comparison between GFAAS and TXRF data for lead in the same sample can serve as good indicator for TXRF performance.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"148 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141508116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Paula Silveira, Hugo Marcelo Veit, Johnny Dias, Tiago Falcade
Historical heritage pieces allow a better comprehension of the characteristics of different civilizations over time. The characterization of such pieces is of paramount importance for their preservation. Energy‐dispersive X‐ray fluorescence (EDXRF) is recommended for this application, mostly because it is non‐destructive and the equipment is portable. However, one of its limitations is the difficulty in separating the signal from the substrate and the coating of multilayered samples, as it does not provide depth resolution. This project investigates the application of EDXRF in the characterization of metallic coatings, in the context of historical heritage. The elemental concentration of electrodeposited Ni coatings onto carbon steel substrates was obtained from EDXRF analyses. The relationship between the layer thickness and the variation of the Kα/Kβ intensity ratio of nickel peaks was exploited and the thicknesses of the coatings were estimated through EDXRF measurements. For comparison, particle‐induced x‐ray emission spectroscopy and scanning electron microscopy of the cross‐section were employed, providing a depth profile of the coatings. The estimated thicknesses from EDXRF analysis were comparable to those observed in the microscopy images for thinner films (up to 8 μm). On the other hand, for thicker films, the thicknesses were underestimated, due to the technique's depth limit and matrix effects, as secondary absorption. Despite these limitations, EDXRF remains valuable for evaluating cultural heritage pieces, often providing sufficient information to address authenticity concerns or to guide restoration processes. A case study was also performed to apply the methodology discussed on historical metallic pieces.
历史遗产可以让人们更好地了解不同文明在不同时期的特征。对这些文物进行鉴定对其保护至关重要。能量色散 X 射线荧光 (EDXRF) 被推荐用于这种应用，主要是因为它是非破坏性的，而且设备便于携带。然而，其局限性之一是难以将信号从多层样品的基底和涂层中分离出来，因为它无法提供深度分辨率。本项目以历史遗产为背景，研究了电离辐射 X 射线荧光光谱在金属涂层表征中的应用。通过 EDXRF 分析获得了碳钢基底上电解沉积镍涂层的元素浓度。利用镀层厚度与镍峰 Kα/Kβ 强度比值变化之间的关系，通过 EDXRF 测量估算了镀层厚度。为了进行比较，还使用了粒子诱导 X 射线发射光谱和横截面扫描电子显微镜，以提供涂层的深度剖面图。对于较薄的薄膜（最厚 8 μm），EDXRF 分析得出的估计厚度与显微镜图像中观察到的厚度相当。另一方面，对于较厚的薄膜，由于该技术的深度限制和基质效应（二次吸收），厚度被低估了。尽管存在这些局限性，EDXRF 对于评估文化遗产仍然很有价值，通常可以提供足够的信息来解决真实性问题或指导修复过程。我们还进行了一项案例研究，将所讨论的方法应用于历史上的金属文物。
{"title":"Investigation of the X‐ray fluorescence technique in the characterization of Ni coatings applied to historical heritage studies","authors":"Paula Silveira, Hugo Marcelo Veit, Johnny Dias, Tiago Falcade","doi":"10.1002/xrs.3429","DOIUrl":"https://doi.org/10.1002/xrs.3429","url":null,"abstract":"Historical heritage pieces allow a better comprehension of the characteristics of different civilizations over time. The characterization of such pieces is of paramount importance for their preservation. Energy‐dispersive X‐ray fluorescence (EDXRF) is recommended for this application, mostly because it is non‐destructive and the equipment is portable. However, one of its limitations is the difficulty in separating the signal from the substrate and the coating of multilayered samples, as it does not provide depth resolution. This project investigates the application of EDXRF in the characterization of metallic coatings, in the context of historical heritage. The elemental concentration of electrodeposited Ni coatings onto carbon steel substrates was obtained from EDXRF analyses. The relationship between the layer thickness and the variation of the Kα/Kβ intensity ratio of nickel peaks was exploited and the thicknesses of the coatings were estimated through EDXRF measurements. For comparison, particle‐induced x‐ray emission spectroscopy and scanning electron microscopy of the cross‐section were employed, providing a depth profile of the coatings. The estimated thicknesses from EDXRF analysis were comparable to those observed in the microscopy images for thinner films (up to 8 μm). On the other hand, for thicker films, the thicknesses were underestimated, due to the technique's depth limit and matrix effects, as secondary absorption. Despite these limitations, EDXRF remains valuable for evaluating cultural heritage pieces, often providing sufficient information to address authenticity concerns or to guide restoration processes. A case study was also performed to apply the methodology discussed on historical metallic pieces.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"1 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140841815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Khalil Hassebi, Nicolas Rividi, Michel Fialin, Anne Verlaguet, Gaston Godard, Jürgen Probst, Heike Löchel, Thomas Krist, Christoph Braig, Christian Seifert, Rabah Benbalagh, Régis Vacheresse, Vita Ilakovac, Karine Le Guen, Philippe Jonnard
Implementing a newly developed spectrometer for the soft x‐ray range of (35–130) eV based on reflection zone plates was successfully accomplished on an electron probe microanalyzer. In this context, we present the first spectra acquired using this setup, including those of elements such as Be (Kα), C (Kα), Mg (L2,3), Al (L2,3), and Si (L2,3). We have also conducted an analysis of several lithium compounds and measured the emission of Li Kα from metallic Li, LiF, and LiNbO3. Some of the results were compared with density functional theory calculations. The spectrum obtained for the lithium‐bearing mineral amblygonite Li0.75Na0.25Al(PO4)F0.75(OH)0.25 is chosen to discuss some of the challenges faced.
在电子探针显微分析仪上成功实现了基于反射区板的新开发的 (35-130) eV 软 X 射线范围光谱仪。在此背景下，我们展示了利用该装置获得的第一批光谱，包括 Be (Kα)、C (Kα)、Mg (L2,3)、Al (L2,3) 和 Si (L2,3) 等元素的光谱。我们还对几种锂化合物进行了分析，并测量了金属锂、LiF 和 LiNbO3 的 Li Kα 发射。其中一些结果与密度泛函理论计算结果进行了比较。我们选择了含锂矿物伏锂辉石 Li0.75Na0.25Al(PO4)F0.75(OH)0.25 的光谱来讨论所面临的一些挑战。
{"title":"High‐resolution x‐ray emission spectrometry in the lithium K range with a reflection zone plate spectrometer","authors":"Khalil Hassebi, Nicolas Rividi, Michel Fialin, Anne Verlaguet, Gaston Godard, Jürgen Probst, Heike Löchel, Thomas Krist, Christoph Braig, Christian Seifert, Rabah Benbalagh, Régis Vacheresse, Vita Ilakovac, Karine Le Guen, Philippe Jonnard","doi":"10.1002/xrs.3427","DOIUrl":"https://doi.org/10.1002/xrs.3427","url":null,"abstract":"Implementing a newly developed spectrometer for the soft x‐ray range of (35–130) eV based on reflection zone plates was successfully accomplished on an electron probe microanalyzer. In this context, we present the first spectra acquired using this setup, including those of elements such as Be (Kα), C (Kα), Mg (L<jats:sub>2,3</jats:sub>), Al (L<jats:sub>2,3</jats:sub>), and Si (L<jats:sub>2,3</jats:sub>). We have also conducted an analysis of several lithium compounds and measured the emission of Li Kα from metallic Li, LiF, and LiNbO<jats:sub>3</jats:sub>. Some of the results were compared with density functional theory calculations. The spectrum obtained for the lithium‐bearing mineral amblygonite Li<jats:sub>0.75</jats:sub>Na<jats:sub>0.25</jats:sub>Al(PO<jats:sub>4</jats:sub>)F<jats:sub>0.75</jats:sub>(OH)<jats:sub>0.25</jats:sub> is chosen to discuss some of the challenges faced.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"212 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140629450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Olga Yu. Belozerova, Victor S. Antipin, Larisa V. Kushch, D. Odgerel
The multicomponent technique of x‐ray electron probe microanalysis for rock‐forming and minor minerals of granites, pegmatites, and metasomatites was developed using the scanning electron microscopy (SEM) and x‐ray electron probe microanalysis (EPMA) methods. The conditions for excitation and recording of elements analytical lines were chosen taking into account the properties of the investigated material. The distortion of analytical signal due to the effect of mutual overlapping of determined elements analytical lines was corrected using overlap coefficients, previously determined on the samples that did not contain the determined element. An assessment of metrological characteristics of EPMA technique showed, that it satisfies the requirements for the second category of quality of quantitative determinations and the second category of analyses adopted in the International Program for Professional Testing of Geoanalytical Laboratories (GeoPT). This developed technique was used for studying rare‐metal granites, pegmatites, and metasomatites of Central Mongolia (multiphase Baga Gazriin massif).
利用扫描电子显微镜（SEM）和 X 射线电子探针显微分析（EPMA）方法，开发了针对花岗岩、伟晶岩和变质岩的成岩矿物和次要矿物的多组分 X 射线电子探针显微分析技术。在选择元素分析线的激发和记录条件时，考虑了所研究材料的特性。由于测定的元素分析线相互重叠而造成的分析信号失真，使用重叠系数进行了校正，重叠系数是之前在不含测定元素的样品上测定的。对 EPMA 技术计量特性的评估表明，该技术符合《国际地质分析实验室专业测试计划》（GeoPT）采用的第二类定量测定质量要求和第二类分析要求。所开发的这一技术被用于研究蒙古中部（多相 Baga Gazriin 地块）的稀有金属花岗岩、伟晶岩和变质岩。
{"title":"Investigation of rare‐metal granites, pegmatites, and metasomatites minerals of Mongolia by scanning electron microscopy and x‐ray electron probe microanalysis methods","authors":"Olga Yu. Belozerova, Victor S. Antipin, Larisa V. Kushch, D. Odgerel","doi":"10.1002/xrs.3428","DOIUrl":"https://doi.org/10.1002/xrs.3428","url":null,"abstract":"The multicomponent technique of x‐ray electron probe microanalysis for rock‐forming and minor minerals of granites, pegmatites, and metasomatites was developed using the scanning electron microscopy (SEM) and x‐ray electron probe microanalysis (EPMA) methods. The conditions for excitation and recording of elements analytical lines were chosen taking into account the properties of the investigated material. The distortion of analytical signal due to the effect of mutual overlapping of determined elements analytical lines was corrected using overlap coefficients, previously determined on the samples that did not contain the determined element. An assessment of metrological characteristics of EPMA technique showed, that it satisfies the requirements for the second category of quality of quantitative determinations and the second category of analyses adopted in the International Program for Professional Testing of Geoanalytical Laboratories (GeoPT). This developed technique was used for studying rare‐metal granites, pegmatites, and metasomatites of Central Mongolia (multiphase Baga Gazriin massif).","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"12 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140614883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yasuto Isozumi, Jun Kawai, Takeshi Mukoyama, Fumitaka Nishiyama, Takashi Yamada
{"title":"Escape peaks of Ge detector in X‐ray fluorescence (XRF)","authors":"Yasuto Isozumi, Jun Kawai, Takeshi Mukoyama, Fumitaka Nishiyama, Takashi Yamada","doi":"10.1002/xrs.3426","DOIUrl":"https://doi.org/10.1002/xrs.3426","url":null,"abstract":"","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"149 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140572745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
<p><b>Deciphering Burnt and Carbonized Scroll Books with Deep Learning-Assisted X-ray Imaging (February 5, 2024)</b>.</p> <p>There is a program called the Vesuvius Challenge in which investors are funding the deciphering of what was written in the extremely fragile scrolls that were carbonized when Mount Vesuvius erupted in 79 A.D., some 2000 years ago (https://scrollprize.org/). Pompeii is famous for the eruption of Mount Vesuvius, which was buried by volcanic ejecta, etc. Not only Pompeii, but also towns near Mount Vesuvius were buried in the same way. The city of Herculaneum is one of them. The scrolls discovered in Herculaneum in the 1750s are one of the most important research subjects. Looking back in history, one would immediately think of using non-destructive methods of analysis such as X-rays, but in the days before the discovery of X-rays, this was obviously not possible. The method of dismantling the scrolls was unavoidable, and it seems that actual dismantling was done. Afterwards, they were probably restored by hand, but it is still difficult to read the text on them. In 2015, other ancient scrolls, though not from the Vesuvius eruption, were successfully read by X-ray imaging without touching them at all. A commercially available micro X-ray CT device was used (for details, see the paper, William Brent Seales, Clifford Seth Parker, Michael Segal, Emanuel Tov, Pnina Shor, and Yosef Porath, “From damage to discovery via virtual unwrapping: reading the scroll from En-Gedi”, Science Advances, 2, e1601247 (2016). https://doi.org/10.1126/sciadv.1601247). Using X-ray imaging, it is possible to read the inside of a scroll-like book without touching it to open it and reveal its contents. The Vesuvius Challenge program appears to have been inspired by this 2015 success story. Furthermore, while X-ray CT simply images three-dimensional electron density contrasts, deep learning techniques can be used to read text from them (for details, see the paper, Yannis Assael, Thea Sommerschield, Brendan Shillingford, Mahyar Bordbar, John Pavlopoulos, Marita Chatzipanagiotou, Ion Androutsopoulos, Jonathan Prag and Nando de Freitas, “Restoring and attributing ancient texts using deep neural networks”, Nature 603, 280–283 (2022). https://doi.org/10.1038/s41586-022-04448). Recently, the Vesuvius Challenge experiment was conducted using the imaging beamline of the Diamond Light Source synchrotron radiation facility in the UK to collect a large number of 3D CT images of carbonized scrolls. Deep learning was used to decipher the text.</p> <p>Eventually, the first success was achieved, although only a small part of the text was deciphered. What was written on the scroll turned out to be a philosophical statement about sensation and pleasure. It was announced that three 21-year-old graduate students from Egypt, Switzerland, and the U.S. were awarded $700,000 for their success in using X-rays to decipher what was written in such extremely fragile ancient burnt sc
利用深度学习辅助 X 射线成像破译烧焦和碳化的卷轴书（2024 年 2 月 5 日）。有一个名为 "维苏威火山挑战"（Vesuvius Challenge）的项目，投资者正在资助破译公元 79 年（约 2000 年前）维苏威火山爆发时碳化的极其脆弱的卷轴中的文字（https://scrollprize.org/）。庞贝古城因维苏威火山爆发而闻名，火山喷出物等将其掩埋。不仅是庞贝，维苏威火山附近的城镇也以同样的方式被掩埋。赫库兰尼姆城就是其中之一。17 世纪 50 年代在赫库兰尼姆发现的卷轴是最重要的研究课题之一。回顾历史，人们会立即想到使用 X 射线等非破坏性分析方法，但在发现 X 射线之前的时代，这显然是不可能的。拆解卷轴的方法是不可避免的，而且似乎确实进行了拆解。之后，这些卷轴可能经过人工修复，但仍然难以读懂上面的文字。2015 年，通过 X 射线成像技术成功读取了其他古代卷轴，尽管这些卷轴并非来自维苏威火山爆发，但完全无需接触。我们使用了一台市售的微型 X 射线 CT 设备（详见论文 William Brent Seales, Clifford Seth Parker, Michael Segal, Emanuel Tov, Pnina Shor, and Yosef Porath, "From damage to discovery via virtual unwrapping: reading the scroll from En-Gedi", Science Advances, 2, e1601247 (2016). https://doi.org/10.1126/sciadv.1601247）。利用 X 射线成像技术，可以在不接触卷轴状书籍的情况下阅读其内部内容，从而打开并揭示其内容。维苏威挑战计划似乎就是受到了 2015 年这一成功案例的启发。此外，虽然X射线CT只是简单地对三维电子密度对比进行成像，但深度学习技术却可用于从中读取文字（详见论文：Yannis Assael, Thea Sommerschield, Brendan Shillingford, Mahyar Bordbar, John Pavlopoulos, Marita Chatzipanagiotou, Ion Androutsopoulos, Jonathan Prag and Nando de Freitas, "Restoring and attributing ancient texts using deep neural networks", Nature 603, 280-283 (2022). https://doi.org/10.1038/s41586-022-04448）。最近，利用英国钻石光源同步辐射设施的成像光束线进行了维苏威挑战实验，收集了大量碳化卷轴的三维 CT 图像。最终，虽然只破译了一小部分文字，但首次取得了成功。卷轴上所写的内容原来是关于感觉和快乐的哲学论述。据宣布，来自埃及、瑞士和美国的三名 21 岁研究生获得了 70 万美元的奖金，以表彰他们成功利用 X 射线破译了这种极其脆弱的古代烧焦卷轴上的文字。欲了解更多详情，请参阅文章 "赫库兰尼姆卷轴的首批经文被揭示"，《自然》626，461-462（2024 年）。https://doi.org/10.1038/d41586-024-00346-8。
{"title":"News Article","authors":"Kenji Sakurai","doi":"10.1002/xrs.3424","DOIUrl":"https://doi.org/10.1002/xrs.3424","url":null,"abstract":"<p><b>Deciphering Burnt and Carbonized Scroll Books with Deep Learning-Assisted X-ray Imaging (February 5, 2024)</b>.</p>\u0000<p>There is a program called the Vesuvius Challenge in which investors are funding the deciphering of what was written in the extremely fragile scrolls that were carbonized when Mount Vesuvius erupted in 79 A.D., some 2000 years ago (https://scrollprize.org/). Pompeii is famous for the eruption of Mount Vesuvius, which was buried by volcanic ejecta, etc. Not only Pompeii, but also towns near Mount Vesuvius were buried in the same way. The city of Herculaneum is one of them. The scrolls discovered in Herculaneum in the 1750s are one of the most important research subjects. Looking back in history, one would immediately think of using non-destructive methods of analysis such as X-rays, but in the days before the discovery of X-rays, this was obviously not possible. The method of dismantling the scrolls was unavoidable, and it seems that actual dismantling was done. Afterwards, they were probably restored by hand, but it is still difficult to read the text on them. In 2015, other ancient scrolls, though not from the Vesuvius eruption, were successfully read by X-ray imaging without touching them at all. A commercially available micro X-ray CT device was used (for details, see the paper, William Brent Seales, Clifford Seth Parker, Michael Segal, Emanuel Tov, Pnina Shor, and Yosef Porath, “From damage to discovery via virtual unwrapping: reading the scroll from En-Gedi”, Science Advances, 2, e1601247 (2016). https://doi.org/10.1126/sciadv.1601247). Using X-ray imaging, it is possible to read the inside of a scroll-like book without touching it to open it and reveal its contents. The Vesuvius Challenge program appears to have been inspired by this 2015 success story. Furthermore, while X-ray CT simply images three-dimensional electron density contrasts, deep learning techniques can be used to read text from them (for details, see the paper, Yannis Assael, Thea Sommerschield, Brendan Shillingford, Mahyar Bordbar, John Pavlopoulos, Marita Chatzipanagiotou, Ion Androutsopoulos, Jonathan Prag and Nando de Freitas, “Restoring and attributing ancient texts using deep neural networks”, Nature 603, 280–283 (2022). https://doi.org/10.1038/s41586-022-04448). Recently, the Vesuvius Challenge experiment was conducted using the imaging beamline of the Diamond Light Source synchrotron radiation facility in the UK to collect a large number of 3D CT images of carbonized scrolls. Deep learning was used to decipher the text.</p>\u0000<p>Eventually, the first success was achieved, although only a small part of the text was deciphered. What was written on the scroll turned out to be a philosophical statement about sensation and pleasure. It was announced that three 21-year-old graduate students from Egypt, Switzerland, and the U.S. were awarded $700,000 for their success in using X-rays to decipher what was written in such extremely fragile ancient burnt sc","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"427 2 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140572755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
<p> </p><div> <div tabindex="0"> <table> <thead> <tr> <th>2024</th> <td></td> </tr> </thead> <tbody> <tr> <td style="background-color:#F2F2F2"><b>April 15–19</b></td> <td style="background-color:#F2F2F2"><p><b>ICDD X-ray Fluorescence Clinic</b></p> <p>ICDD Headquarters, Newtown Square, PA, USA</p> <p>https://www.icdd.com/xrf/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>April 22–26</b></td> <td style="background-color:#F2F2F2"><p><b>Materials Research Society 2024 Spring Meeting</b></p> <p>Seattle, Washington, USA</p> <p>https://www.mrs.org/meetings-events/spring-meetings-exhibits</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>April 22–26</b></td> <td style="background-color:#F2F2F2"><p><b>2024 International Congress on Emerging Fields and Exploratory Research in Optics and Photonics (OPIC2024)</b></p> <p>PACIFICO Yokohama, Japan</p> <p>https://opicon.jp/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>April 23–26</b></td> <td style="background-color:#F2F2F2"><p><b>International Conference on X-ray Optics and Applications (XOPT2024)</b></p> <p>PACIFICO Yokohama, Japan</p> <p>https://xopt.opicon.jp/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>May 18–24</b></td> <td style="background-color:#F2F2F2"><p><b>15<sup>th</sup> International Particle Accelerator Conference (IPAC 2024)</b></p> <p>Nashville, Tennessee, USA</p> <p>https://ipac24.org/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>May 27–31</b></td> <td style="background-color:#F2F2F2"><p><b>ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materials</b></p> <p>Strasbourg, France</p> <p>https://www.european-mrs.com/altech-2024-analytical-techniques-accurate-nanoscale-characterization-advanced-materials-emrs</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>June 2–4</b></td> <td style="background-color:#F2F2F2"><p><b>Lehigh Microscopy School</b></p> <p>Lehigh University, Bethlehem, PA USA</p> <p>https://ifmd.lehigh.edu/lehigh-microscopy-school</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>June 3–7</b></td> <td style="background-color:#F2F2F2"><p><b>ICDD X-ray Diffraction Clinics - Session I - Fundamentals of X-ray Powder Diffraction</b></p> <p>ICDD Headquarters, Newtown Square, PA, USA</p> <p>http://www.icdd.com/xrd/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>June 9–12</b></td> <td style="background-color:#F2F2F2"><p><b>XVIII</b><sup><b>th</b></sup> <b>International Conference on Electron Microscopy (EM 2024)</b></p> <p>Zakopane, Poland</p> <p>https://em2024.pl/</p> </td> </tr> <tr> <td style="background-color:#F2F2F2"><b>June 10–13</b></td> <td style="background-color:#F2F2F2"><p><b>9<sup>th</sup> International Workshop on Numerical Modelling of High Temperature Superconductors (HTS 2024)</b></p> <p>Parkhotel Bad Zurzach, Switzerland</p> <p>https://indico.psi.ch/event/14456/overview</p> </td> </tr> <tr> <td style="background-color:#F2F2F2">
2024April 15-19ICDD X-ray Fluorescence ClinicICDD Headquarters, Newtown Square, PA, USAhttps://www.icdd.com/xrf/April 22-26Materials Research Society 2024 Spring MeetingSeattle, Washington, USAhttps://www.mrs.org/meetings-events/spring-meetings-exhibitsApril 22-262024 International Congress on Emerging Fields and Exploratory Research in Optics and Photonics (OPIC2024)PACIFICO Yokohama, Japanhttps://opicon.jp/April 23-26International Conference on X-ray Optics and Applications (XOPT2024)PACIFICO Yokohama, Japanhttps://xopt.opicon.jp/May 18-2415th International Particle Accelerator Conference (IPAC 2024)Nashville, Tennessee, USAhttps://ipac24.org/May 27-31ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materialsStrasbourg, Francehttps://www.european-mrs.com/altech-2024-analytical-techniques-accurate-nanoscale-characterization-advanced-materials-emrsJune 2-4Lehigh Microscopy SchoolLehigh University, Bethlehem, PA USAhttps://ifmd.lehigh.edu/lehigh-microscopy-schoolJune 3-7ICDD X-ray Diffraction Clinics - Session I - Fundamentals of X-ray Powder DiffractionICDD Headquarters, Newtown Square, PA, USAhttp://www.icdd.com/xrd/June 9-12XVIIIth International Conference on Electron Microscopy (EM 2024)Zakopane, Polandhttps://em2024.pl/June 10-139th International Workshop on Numerical Modelling of High Temperature Superconductors (HTS 2024)Parkhotel Bad Zurzach, Switzerlandhttps://indico.psi.ch/event/14456/overview6月10-14日ICDD X射线衍射诊所--第二场--X射线粉末衍射的高级方法ICDD总部，美国宾夕法尼亚州纽敦广场http://www.icdd.com/xrd/June 16-2011年第16届相位检索和相干散射国际会议（Coherence 2024）瑞典赫尔辛堡Clarion Sea U酒店https://indico.maxiv.lu.se/event/5213/June 17-19Science at FELs conference 2024Synchrotron SOLEIL and Sorbonne University, Francehttps://www.synchrotron-soleil.fr/en/events/sciencefels-2024June 17-20Recent Advances in Computer-aided X-ray SpectroscopyAalto University, Helsinki, Finlandhttps://ocamm.fi/event/recent-advances-in-computer-aided-x-ray-spectroscopy/June 20-21Forum on Advanced FEL techniques 2024Synchrotron SOLEIL and Sorbonne University, Francehttps://www.synchrotron-soleil.fr/en/events/sciencefels-2024June 24-26International Symposium on Compact Synchrotron X-ray Sources 2024 (ICXS2024)Technical University of Munich, Germanyhttps://icxs.ph.nat.tum.de/June 24-28European Conference on X-ray Spectrometry 2024 (EXRS2024)Athens, Greecehttps://exrs2024.demokritos.gr/June 27-2812th International symposium on medical application of X-ray phase contrast & photon counting (IMXP 2024)Technical University of Munich, Germanyhttps://einrichtungen.ph.nat.tum.de/imxp/?page=homeJune 30-July 425th International Workshop on Radiation Imaging DetectorsLisbon, Portugalhttps://indico.cern.ch/event/1284854/July 1-56th International Conference on Tomography of Materials and Structures (ICTMS)Stellenbosch, South Africahttps://tomography2024.com/July 15-1817th International Conference on Surface X-ray and Neutron Scattering (SXNS17)Grenoble, Francehttps://workshops.ill.f
{"title":"Calendar Article","authors":"Kenji Sakurai","doi":"10.1002/xrs.3425","DOIUrl":"https://doi.org/10.1002/xrs.3425","url":null,"abstract":"<p>\u0000</p><div>\u0000<div tabindex=\"0\">\u0000<table>\u0000<thead>\u0000<tr>\u0000<th>2024</th>\u0000<td></td>\u0000</tr>\u0000</thead>\u0000<tbody>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 15–19</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ICDD X-ray Fluorescence Clinic</b></p>\u0000<p>ICDD Headquarters, Newtown Square, PA, USA</p>\u0000<p>https://www.icdd.com/xrf/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 22–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>Materials Research Society 2024 Spring Meeting</b></p>\u0000<p>Seattle, Washington, USA</p>\u0000<p>https://www.mrs.org/meetings-events/spring-meetings-exhibits</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 22–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>2024 International Congress on Emerging Fields and Exploratory Research in Optics and Photonics (OPIC2024)</b></p>\u0000<p>PACIFICO Yokohama, Japan</p>\u0000<p>https://opicon.jp/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 23–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>International Conference on X-ray Optics and Applications (XOPT2024)</b></p>\u0000<p>PACIFICO Yokohama, Japan</p>\u0000<p>https://xopt.opicon.jp/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>May 18–24</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>15<sup>th</sup> International Particle Accelerator Conference (IPAC 2024)</b></p>\u0000<p>Nashville, Tennessee, USA</p>\u0000<p>https://ipac24.org/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>May 27–31</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materials</b></p>\u0000<p>Strasbourg, France</p>\u0000<p>https://www.european-mrs.com/altech-2024-analytical-techniques-accurate-nanoscale-characterization-advanced-materials-emrs</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 2–4</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>Lehigh Microscopy School</b></p>\u0000<p>Lehigh University, Bethlehem, PA USA</p>\u0000<p>https://ifmd.lehigh.edu/lehigh-microscopy-school</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 3–7</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ICDD X-ray Diffraction Clinics - Session I - Fundamentals of X-ray Powder Diffraction</b></p>\u0000<p>ICDD Headquarters, Newtown Square, PA, USA</p>\u0000<p>http://www.icdd.com/xrd/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 9–12</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>XVIII</b><sup><b>th</b></sup> <b>International Conference on Electron Microscopy (EM 2024)</b></p>\u0000<p>Zakopane, Poland</p>\u0000<p>https://em2024.pl/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 10–13</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>9<sup>th</sup> International Workshop on Numerical Modelling of High Temperature Superconductors (HTS 2024)</b></p>\u0000<p>Parkhotel Bad Zurzach, Switzerland</p>\u0000<p>https://indico.psi.ch/event/14456/overview</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\">","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"28 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140602930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Micro‐x‐ray fluorescence (μ‐XRF) is a commonly used elemental analysis technique for glass physical evidence in forensic cases, which can detect major and trace elements in samples and potentially identify glass fragments according to the differences in elemental composition. However, when a sample is irradiated with polychromatic x‐rays, bremsstrahlung scattering from the source radiation provides noise in the fluorescence spectrum and affects the detection results. To improve the signal‐to‐noise ratio of the fluorescence spectrum, a Mμ‐XRF spectrometer constructed under the low‐power Mo target x‐ray tube condition was used to analyze ten kinds of common glass fragments. The application of laboratory Mμ‐XRF analysis in single‐point detection of tiny glass materials was studied. Experimental results show that the detection limit of Sr element was 51 μg/L, and the spectrometer can distinguish different types of small glass fragments according to the fluorescence spectrum information.
显微 X 射线荧光（μ-XRF）是法医案件中玻璃物证常用的元素分析技术，可检测样品中的主要元素和痕量元素，并可根据元素组成的差异识别玻璃碎片。然而，当用多色 X 射线照射样品时，源辐射的轫致辐射散射会在荧光光谱中产生噪声，影响检测结果。为了提高荧光光谱的信噪比，在低功率 Mo 靶 X 射线管条件下构建了 Mμ-XRF 光谱仪，用于分析十种常见的玻璃碎片。研究了实验室 Mμ-XRF 分析在单点检测微小玻璃材料中的应用。实验结果表明，Sr 元素的检测限为 51 μg/L，光谱仪可根据荧光光谱信息区分不同类型的微小玻璃碎片。
{"title":"Application research of monochromatic micro x‐ray fluorescence in glass physical evidence traceability","authors":"Xingyi Wang, Yude Li, Chenmeng Wang, Shaobo Huang, Fengzi Zhou, Xiaoyan Lin","doi":"10.1002/xrs.3423","DOIUrl":"https://doi.org/10.1002/xrs.3423","url":null,"abstract":"Micro‐x‐ray fluorescence (μ‐XRF) is a commonly used elemental analysis technique for glass physical evidence in forensic cases, which can detect major and trace elements in samples and potentially identify glass fragments according to the differences in elemental composition. However, when a sample is irradiated with polychromatic x‐rays, bremsstrahlung scattering from the source radiation provides noise in the fluorescence spectrum and affects the detection results. To improve the signal‐to‐noise ratio of the fluorescence spectrum, a Mμ‐XRF spectrometer constructed under the low‐power Mo target x‐ray tube condition was used to analyze ten kinds of common glass fragments. The application of laboratory Mμ‐XRF analysis in single‐point detection of tiny glass materials was studied. Experimental results show that the detection limit of Sr element was 51 μg/L, and the spectrometer can distinguish different types of small glass fragments according to the fluorescence spectrum information.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"1 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140602969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wavelength dispersive X-ray fluorescence (WD-XRF) spectrometry is a fast and widely used technique for elemental analysis of geological samples from Na to U. However, it has seldom been applied for quantitative determination of oxidation states of elements in complex matrices. In this study, we present a method to determine the oxidation states of iron in geological samples by WD-XRF. We used the FeLα1,2 fluorescence line as a tool for iron speciation and Fe(II)/Fetotal ratio determination. We found that the normalized intensity (peak height) of FeLα1,2 fluorescence line was linearly correlated with the spin multiplicity (2S + 1) of ferrous and ferric content in the samples. To account for the matrix effects of chemical environment (matrix and chemical bonding) on FeLα1,2 fluorescence line, we introduced a chemical index factor (μ) that enabled accurate determination of Fe(II)/Fetotal ratio in different types of geological samples. The method was validated using international certified reference materials and their mixtures and obtained promising results, with only 6 out of 55 determinations showing relative error more than 5% of the certified values.
波长色散 X 射线荧光光谱法（WD-XRF）是一种快速而广泛应用的元素分析技术，可用于分析从 Na 到 U 的地质样品，但很少用于定量测定复杂基质中元素的氧化态。在本研究中，我们提出了一种利用 WD-XRF 测定地质样品中铁氧化态的方法。我们将 FeLα1,2 荧光线作为铁的种类和铁(II)/总比率测定的工具。我们发现，FeLα1,2 荧光线的归一化强度（峰高）与样品中亚铁和铁含量的自旋倍数（2S + 1）呈线性相关。为了考虑化学环境（基质和化学键）对 FeLα1,2 荧光线的基质效应，我们引入了化学指数因子 (μ)，从而能够准确测定不同类型地质样品中的铁(II)/总铁比率。我们使用国际认证的参考物质及其混合物对该方法进行了验证，结果令人满意，在 55 次测定中，只有 6 次的相对误差超过认证值的 5%。
{"title":"WD-XRF technique for speciation of iron and quantification of its oxidation states in geological samples using L-series of iron X-ray spectrum","authors":"Ashok Kumar Maurya, Piyali Deb Barman","doi":"10.1002/xrs.3422","DOIUrl":"https://doi.org/10.1002/xrs.3422","url":null,"abstract":"Wavelength dispersive X-ray fluorescence (WD-XRF) spectrometry is a fast and widely used technique for elemental analysis of geological samples from Na to U. However, it has seldom been applied for quantitative determination of oxidation states of elements in complex matrices. In this study, we present a method to determine the oxidation states of iron in geological samples by WD-XRF. We used the FeLα<sub>1,2</sub> fluorescence line as a tool for iron speciation and Fe(II)/Fe<sup>total</sup> ratio determination. We found that the normalized intensity (peak height) of FeLα<sub>1,2</sub> fluorescence line was linearly correlated with the spin multiplicity (2S + 1) of ferrous and ferric content in the samples. To account for the matrix effects of chemical environment (matrix and chemical bonding) on FeLα<sub>1,2</sub> fluorescence line, we introduced a chemical index factor (μ) that enabled accurate determination of Fe(II)/Fe<sup>total</sup> ratio in different types of geological samples. The method was validated using international certified reference materials and their mixtures and obtained promising results, with only 6 out of 55 determinations showing relative error more than 5% of the certified values.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"51 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-02-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140006746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Forensic Archeology is the application of techniques and principles of archeology in the pursuit of examining a crime or incident with legal interest. A wide range of analytical studies are employed in examining archeological remains. X-ray fluorescence (XRF) spectroscopy remains to be one of the most used techniques for rapid examination of trace evidence typically found on an archeological crime scene. Studies of interest generally include finding trace elements from various sources, samples, and different environmental conditions and distinguishing whether a skeletal remains under examination is human, animal, or marine species. The present study has been designed to focus on the application of XRF in archeological and anthropological evidences such as the examination of human skeletal and dental remains, determination of species, examination of soil, ceramics, paintings, coins, and so on. The advantage of XRF as derived from the reported literature is that it is a non-destructive technique making it ideal for forensic analysis and in situ examination. The study also discusses the factors affecting forensic investigations of archeological evidences and the limitations of XRF.
{"title":"Application of X-ray fluorescence in forensic archeology: A review","authors":"Mehak Manhas, Anjali Tomar, Maanvendra Tiwari, Shweta Sharma","doi":"10.1002/xrs.3421","DOIUrl":"https://doi.org/10.1002/xrs.3421","url":null,"abstract":"Forensic Archeology is the application of techniques and principles of archeology in the pursuit of examining a crime or incident with legal interest. A wide range of analytical studies are employed in examining archeological remains. X-ray fluorescence (XRF) spectroscopy remains to be one of the most used techniques for rapid examination of trace evidence typically found on an archeological crime scene. Studies of interest generally include finding trace elements from various sources, samples, and different environmental conditions and distinguishing whether a skeletal remains under examination is human, animal, or marine species. The present study has been designed to focus on the application of XRF in archeological and anthropological evidences such as the examination of human skeletal and dental remains, determination of species, examination of soil, ceramics, paintings, coins, and so on. The advantage of XRF as derived from the reported literature is that it is a non-destructive technique making it ideal for forensic analysis and in situ examination. The study also discusses the factors affecting forensic investigations of archeological evidences and the limitations of XRF.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":"63 1","pages":""},"PeriodicalIF":1.2,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139766455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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