Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4345710
L. Aranchuk, J. Larour
A series of seven XRD and four p-i-n detectors with K- and L-filters was employed to measure absolute time resolved spectra of 200-ns 200-kA molybdenum and copper X-pinch plasmas.
{"title":"Absolute spectral radiation from 200-ns X-pinch plasma","authors":"L. Aranchuk, J. Larour","doi":"10.1109/PPPS.2007.4345710","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4345710","url":null,"abstract":"A series of seven XRD and four p-i-n detectors with K- and L-filters was employed to measure absolute time resolved spectra of 200-ns 200-kA molybdenum and copper X-pinch plasmas.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133594918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4345656
P. Wakeland, J. Corley, K. Hodge, D. Guthrie, V. Anaya, Z. Wallace, T. Thompson, G. Feltz, R. Maier, K. LeChien, M. Savage, D. Susan, R. Grant, J. Van Den Avyle
The Z machine at Sandia National Laboratories is a thirty six module pulsed power driver utilized for the study of inertial confinement fusion, isentropic compression experiments, and high density physics. Currently it is undergoing an upgrade, called Z-Refurbishment (ZR). The upgraded Z pulsed power driver requires thirty six gas switches to be capable of low jitter high voltage switching, to deliver energy to the load. The switches must remain open as voltage rises in ∼one microsecond, then close with a few nanosecond jitter upon arrival of the laser pulse. Switch performance is directly related to component materials since switches must routinely withstand a 6.25 MV, 750 kA pulsed power environment and perform reliably upon each command fire. Switch lifetime is primarily influenced by insulator flashover and electrode degradation. Early in the program the most high profile problem was random flashing of the insulator housing. Triple point shielding, cleaning procedures and an isolation window that separated the gas switch volume from the laser can volume were implemented which reduced housing flashes, to problems attributed to material debris. Electrode materials were studied in an attempt to optimize switch lifetime with respect to erosion rate, housing flashes associated with material debris and to reduce degradation of laser optics that are in close proximity to the switch. Theories on electrode ablation have contributed it to enhancing fields in the trigger section and flashing of the cascade housing. Electrode materials investigated included, tungsten-copper, stainless steel, molybdenum, tantalum and brass. SEM imaging was utilized to examine effects of arc damage for different materials. SEM imaging is also being used in attempts to understand preconditioning of electrodes and early shot switch performance.
{"title":"Material testing on high voltage laser triggered gas switches for ZR","authors":"P. Wakeland, J. Corley, K. Hodge, D. Guthrie, V. Anaya, Z. Wallace, T. Thompson, G. Feltz, R. Maier, K. LeChien, M. Savage, D. Susan, R. Grant, J. Van Den Avyle","doi":"10.1109/PPPS.2007.4345656","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4345656","url":null,"abstract":"The Z machine at Sandia National Laboratories is a thirty six module pulsed power driver utilized for the study of inertial confinement fusion, isentropic compression experiments, and high density physics. Currently it is undergoing an upgrade, called Z-Refurbishment (ZR). The upgraded Z pulsed power driver requires thirty six gas switches to be capable of low jitter high voltage switching, to deliver energy to the load. The switches must remain open as voltage rises in ∼one microsecond, then close with a few nanosecond jitter upon arrival of the laser pulse. Switch performance is directly related to component materials since switches must routinely withstand a 6.25 MV, 750 kA pulsed power environment and perform reliably upon each command fire. Switch lifetime is primarily influenced by insulator flashover and electrode degradation. Early in the program the most high profile problem was random flashing of the insulator housing. Triple point shielding, cleaning procedures and an isolation window that separated the gas switch volume from the laser can volume were implemented which reduced housing flashes, to problems attributed to material debris. Electrode materials were studied in an attempt to optimize switch lifetime with respect to erosion rate, housing flashes associated with material debris and to reduce degradation of laser optics that are in close proximity to the switch. Theories on electrode ablation have contributed it to enhancing fields in the trigger section and flashing of the cascade housing. Electrode materials investigated included, tungsten-copper, stainless steel, molybdenum, tantalum and brass. SEM imaging was utilized to examine effects of arc damage for different materials. SEM imaging is also being used in attempts to understand preconditioning of electrodes and early shot switch performance.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133894951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4346004
A. Woods, L. Ludeking
Electromagnetic (EM) boundary treatments have been investigated using the Magic 3D particle-in-cell (PIC) code. The historic conventional free space approach to absorbing boundary layers and the convolutional perfectly matched layer (CPML) are investigated. A comparison of the utility of such approaches in various practical applications is provided with some of the liabilities associated. The CPML method gives vast improvement for evanescent wave problems, but benefits are modest for a 3D waveguide in the radiation zone based on present modeling capabilities.
{"title":"Some practical issues in the treatment of electromagnetic boundaries in FDTD-PIC","authors":"A. Woods, L. Ludeking","doi":"10.1109/PPPS.2007.4346004","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4346004","url":null,"abstract":"Electromagnetic (EM) boundary treatments have been investigated using the Magic 3D particle-in-cell (PIC) code. The historic conventional free space approach to absorbing boundary layers and the convolutional perfectly matched layer (CPML) are investigated. A comparison of the utility of such approaches in various practical applications is provided with some of the liabilities associated. The CPML method gives vast improvement for evanescent wave problems, but benefits are modest for a 3D waveguide in the radiation zone based on present modeling capabilities.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134452138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4652351
D. Welch, D. Rose, N. Bruner, S. Portillo, B. Oliver
The self-magnetic pinch diode is being developed as an intense electron beam source for high-power x-ray radiography. The diode is comprised of a ∼1-cm diameter, hollow cathode with a rounded tip from which a high-current electron beam is emitted. The beam self focuses in its own magnetic field as it propagates across a ∼1-cm vacuum gap where it deposits its energy onto a planar high-atomic-number bremsstrahlung target. Heating of the anode by the beam quickly provides an ion emitting plasma and bipolar diode operation. The dynamics of expanding electrode plasmas can affect the impedance lifetime of the diode. Realistic modeling of such plasmas is being pursued to aid in the understanding of the operating characteristics of these diodes as well as establishing scaling relations for reliable extrapolation to higher voltages. Here, a hybrid particle-in-cell code is used to study the evolution of electrode plasmas in the self-magnetic pinch diode for a nominal 6-MV voltage and different anode-cathode gaps. The impact of the intense ion beam on the cathode surface can lead to enhancement of the cathode plasma production and faster diode impedance loss.
{"title":"Role of plasmas in the operation of a self-magnetically pinched diode","authors":"D. Welch, D. Rose, N. Bruner, S. Portillo, B. Oliver","doi":"10.1109/PPPS.2007.4652351","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4652351","url":null,"abstract":"The self-magnetic pinch diode is being developed as an intense electron beam source for high-power x-ray radiography. The diode is comprised of a ∼1-cm diameter, hollow cathode with a rounded tip from which a high-current electron beam is emitted. The beam self focuses in its own magnetic field as it propagates across a ∼1-cm vacuum gap where it deposits its energy onto a planar high-atomic-number bremsstrahlung target. Heating of the anode by the beam quickly provides an ion emitting plasma and bipolar diode operation. The dynamics of expanding electrode plasmas can affect the impedance lifetime of the diode. Realistic modeling of such plasmas is being pursued to aid in the understanding of the operating characteristics of these diodes as well as establishing scaling relations for reliable extrapolation to higher voltages. Here, a hybrid particle-in-cell code is used to study the evolution of electrode plasmas in the self-magnetic pinch diode for a nominal 6-MV voltage and different anode-cathode gaps. The impact of the intense ion beam on the cathode surface can lead to enhancement of the cathode plasma production and faster diode impedance loss.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133156104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4651823
D. Morgan, D. Macy, M. Madlener, J. Morgan
A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71-Å monochromatic X rays and a P-43 fluor coupled to a cooled, charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1° divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm-diameter molybdenum anode. X rays are produced by a high-energy electron beam transiting inward from the cathode to the anode in a needle-and-washer configuration. The anode’s characteristic K-α X-ray emission lines are utilized for this diffraction system. The X-ray anode is heavily shielded in all directions other than the collimated beam. The X-ray diode has a sealed reentrant system, allowing X rays to be produced inside a vacuum containment vessel, close to the sample under study.
{"title":"Flash X-ray diffraction system for fast, single-pulse temperature and phase transition measurements","authors":"D. Morgan, D. Macy, M. Madlener, J. Morgan","doi":"10.1109/PPPS.2007.4651823","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4651823","url":null,"abstract":"A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71-Å monochromatic X rays and a P-43 fluor coupled to a cooled, charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1° divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm-diameter molybdenum anode. X rays are produced by a high-energy electron beam transiting inward from the cathode to the anode in a needle-and-washer configuration. The anode’s characteristic K-α X-ray emission lines are utilized for this diffraction system. The X-ray anode is heavily shielded in all directions other than the collimated beam. The X-ray diode has a sealed reentrant system, allowing X rays to be produced inside a vacuum containment vessel, close to the sample under study.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"58 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124325227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4652495
Z. D. Parker
Electric discharge patterns, seen in a thin layer of dust, have a striking resemblance to many features seen on moons, asteroids and planets. A low-tech experiment has revealed a potential alternative cause of certain features on celestial bodies. Covered in this paper are the features that are hard to explain through the mechanism of an impact. The anomalies will be addressed and an option to standard impact theory presented. Chained craters, which appear to overlap each other or lay in very close linear proximity, will be compared to the results of experiments with electric discharge. Star shaped patterns will also be discussed and compared with planetary features as will craters on the rims of other craters. All these can be made predictably by electric discharge.
{"title":"Electric arcs provide clue to crater-chain formation","authors":"Z. D. Parker","doi":"10.1109/PPPS.2007.4652495","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4652495","url":null,"abstract":"Electric discharge patterns, seen in a thin layer of dust, have a striking resemblance to many features seen on moons, asteroids and planets. A low-tech experiment has revealed a potential alternative cause of certain features on celestial bodies. Covered in this paper are the features that are hard to explain through the mechanism of an impact. The anomalies will be addressed and an option to standard impact theory presented. Chained craters, which appear to overlap each other or lay in very close linear proximity, will be compared to the results of experiments with electric discharge. Star shaped patterns will also be discussed and compared with planetary features as will craters on the rims of other craters. All these can be made predictably by electric discharge.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124328741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4345679
T. Williams, S. Clough
Pulsed-power machines at AWE are routinely used for flash X-ray radiographic applications in the 1–10 MV range to drive high- and low-impedance electron-beam diodes. During the pulse-forming line (PFL) charging phase, certain diode types are sensitive to pre-pulse voltages as low as a few tens of kilovolts due to small anode-cathode gaps and geometries that enhance electric fields. This results in electron emission before the main pulse is applied which can alter the conditions within the anode cathode gap, preventing the diode from operating properly. It is therefore crucial to limit the pre-pulse appearing at the diode to below the emission level.
{"title":"Dual-waveform ringing gain analysis and its application to pre-pulse reduction on Blumlein-based X-ray machines","authors":"T. Williams, S. Clough","doi":"10.1109/PPPS.2007.4345679","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4345679","url":null,"abstract":"Pulsed-power machines at AWE are routinely used for flash X-ray radiographic applications in the 1–10 MV range to drive high- and low-impedance electron-beam diodes. During the pulse-forming line (PFL) charging phase, certain diode types are sensitive to pre-pulse voltages as low as a few tens of kilovolts due to small anode-cathode gaps and geometries that enhance electric fields. This results in electron emission before the main pulse is applied which can alter the conditions within the anode cathode gap, preventing the diode from operating properly. It is therefore crucial to limit the pre-pulse appearing at the diode to below the emission level.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124404227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4346094
D. Nelson, E. Ormond, S. Cordova, I. Molina, J. Smith, G. Corrow, M. Hansen, D. Henderson, C. Mitton
The Cygnus Dual Beam Radiographic Facility consists of two radiographic sources (Cygnus 1, Cygnus 2) each with a dose rating of 4 rads at 1 m, and a 1-mm diameter spot size. The electrical specifications are: 2.25 MV, 60 kA, 60 ns. This facility is located in an underground environment at the Nevada Test Site (NTS). These sources were developed as a primary diagnostic for subcritical tests, which are single-shot, high-value events. In such an application there is an emphasis on reliability and reproducibility. A robust, low-jitter trigger system is a key element for meeting these goals. The trigger system was developed with both commercial and project-specific equipment. In addition to the traditional functions of a trigger system there are novel features added to protect the investment of a high-value shot. Details of the trigger system, including elements designed specifically for a subcritical test application, will be presented. The individual electronic components have their nominal throughput, and when assembled have a system throughput with a measured range of jitter. The shot-to-shot jitter will be assessed both individually and in combination. Trigger reliability and reproducibility results will be presented for a substantial number of shots executed at the NTS.
Cygnus双光束放射设备由两个放射源(Cygnus 1, Cygnus 2)组成，每个放射源在1米处的剂量等级为4拉德，直径为1毫米。电气规格:2.25 MV, 60 kA, 60 ns。该设施位于内华达州试验场(NTS)的地下环境中。这些源是作为亚临界试验的主要诊断而开发的，亚临界试验是单次高值事件。在这样的应用程序中，强调可靠性和可重复性。一个健壮的、低抖动的触发系统是实现这些目标的关键因素。该触发系统是由商用和项目专用设备共同开发的。除了触发系统的传统功能外，还增加了新颖的功能，以保护高价值镜头的投资。将介绍触发系统的细节，包括专门为亚临界测试应用设计的元件。单个电子元件有其标称吞吐量，组装时具有测量抖动范围的系统吞吐量。镜头到镜头的抖动将被单独和组合评估。在NTS执行的大量射击中，将呈现触发器可靠性和再现性结果。
{"title":"Cygnus trigger system","authors":"D. Nelson, E. Ormond, S. Cordova, I. Molina, J. Smith, G. Corrow, M. Hansen, D. Henderson, C. Mitton","doi":"10.1109/PPPS.2007.4346094","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4346094","url":null,"abstract":"The Cygnus Dual Beam Radiographic Facility consists of two radiographic sources (Cygnus 1, Cygnus 2) each with a dose rating of 4 rads at 1 m, and a 1-mm diameter spot size. The electrical specifications are: 2.25 MV, 60 kA, 60 ns. This facility is located in an underground environment at the Nevada Test Site (NTS). These sources were developed as a primary diagnostic for subcritical tests, which are single-shot, high-value events. In such an application there is an emphasis on reliability and reproducibility. A robust, low-jitter trigger system is a key element for meeting these goals. The trigger system was developed with both commercial and project-specific equipment. In addition to the traditional functions of a trigger system there are novel features added to protect the investment of a high-value shot. Details of the trigger system, including elements designed specifically for a subcritical test application, will be presented. The individual electronic components have their nominal throughput, and when assembled have a system throughput with a measured range of jitter. The shot-to-shot jitter will be assessed both individually and in combination. Trigger reliability and reproducibility results will be presented for a substantial number of shots executed at the NTS.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133615144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4345779
C. Farnell, John D. Williams
A genetic algorithm was used to optimize ion thruster grid sets with regard to maximizing impulse per unit area, essentially equivalent to maximizing propellant throughput capability per unit area. The genetic algorithm presented herein made use of the ffx ion optics simulation code for grid lifetime predictions. Grid sets were optimized for several combinations of net accelerating voltage and current density, and grid feature recommendations are made concerning how future missions can be met.
{"title":"Genetic algorithm for ion thruster grid design","authors":"C. Farnell, John D. Williams","doi":"10.1109/PPPS.2007.4345779","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4345779","url":null,"abstract":"A genetic algorithm was used to optimize ion thruster grid sets with regard to maximizing impulse per unit area, essentially equivalent to maximizing propellant throughput capability per unit area. The genetic algorithm presented herein made use of the ffx ion optics simulation code for grid lifetime predictions. Grid sets were optimized for several combinations of net accelerating voltage and current density, and grid feature recommendations are made concerning how future missions can be met.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133685099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-06-17DOI: 10.1109/PPPS.2007.4651989
L. Wang
After evaluating the engineering requirements, costs, and performance simulations of various Capacitive and Inductive Energy Storage Pulsed Power Systems concepts, we have settled on some concise design capable of generating peak current pulse of 200 KA, with 6.36 μs rise-time, and di/dt of 139 kA/μs for the Lightning Direct Strike Test Facility at White Sands Missile Range, NM. Unlike the recently refurbished Sandia Lightning Simulator which uses YAG laser induced spark-gap triggering, our design relies on high-power diodes as crowbar switch that automatically shunts the peak current pulse at the desired point in time, and for the desired decay through RL sub-circuitry. Also discussed herein are the various aspects of engineering, performance, and reliability of the diodes, the crucial switching components, and evaluation of the key parameters, such as dynamic resistance during forward recovery transient, and high di/dt impact on modulation conductivity, all of which will eventually be resolved using advanced diffusion physics simulations.
在评估了各种电容式和电感式储能脉冲功率系统概念的工程需求、成本和性能模拟后，我们确定了一些简洁的设计，能够产生峰值电流脉冲200 KA，上升时间6.36 μs, di/dt为139 KA /μs，用于白沙导弹靶场的闪电直接打击试验设施。与最近翻新的桑迪亚闪电模拟器不同，该模拟器使用YAG激光诱导火花隙触发，我们的设计依赖于高功率二极管作为撬杆开关，在所需的时间点自动分流峰值电流脉冲，并通过RL子电路实现所需的衰减。本文还讨论了二极管的工程、性能和可靠性的各个方面，关键的开关元件，以及关键参数的评估，例如正向恢复瞬态期间的动态电阻，以及高di/dt对调制电导率的影响，所有这些最终都将通过先进的扩散物理模拟来解决。
{"title":"A prototype design approach for Lightning Direct Strike Test Facility","authors":"L. Wang","doi":"10.1109/PPPS.2007.4651989","DOIUrl":"https://doi.org/10.1109/PPPS.2007.4651989","url":null,"abstract":"After evaluating the engineering requirements, costs, and performance simulations of various Capacitive and Inductive Energy Storage Pulsed Power Systems concepts, we have settled on some concise design capable of generating peak current pulse of 200 KA, with 6.36 μs rise-time, and di/dt of 139 kA/μs for the Lightning Direct Strike Test Facility at White Sands Missile Range, NM. Unlike the recently refurbished Sandia Lightning Simulator which uses YAG laser induced spark-gap triggering, our design relies on high-power diodes as crowbar switch that automatically shunts the peak current pulse at the desired point in time, and for the desired decay through RL sub-circuitry. Also discussed herein are the various aspects of engineering, performance, and reliability of the diodes, the crucial switching components, and evaluation of the key parameters, such as dynamic resistance during forward recovery transient, and high di/dt impact on modulation conductivity, all of which will eventually be resolved using advanced diffusion physics simulations.","PeriodicalId":275106,"journal":{"name":"2007 16th IEEE International Pulsed Power Conference","volume":"845 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132782043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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