Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898945
Eunkyeong Park, Jingook Kim, Hyungsoo Kim, Kwansu Shon
The analytical procedure to calculate the step response and the probability density functions (PDFs) of two-stage buffers with arbitrary power-supply voltage fluctuation is proposed. The calculated results are validated by comparison with HSPICE simulation results.
{"title":"Analytical jitter estimation of two-stage output buffers with supply voltage fluctuations","authors":"Eunkyeong Park, Jingook Kim, Hyungsoo Kim, Kwansu Shon","doi":"10.1109/ISEMC.2014.6898945","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898945","url":null,"abstract":"The analytical procedure to calculate the step response and the probability density functions (PDFs) of two-stage buffers with arbitrary power-supply voltage fluctuation is proposed. The calculated results are validated by comparison with HSPICE simulation results.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"216 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121554258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898959
C. Rostamzadeh, Kimball Williams, R. Kado
Modern automobiles feature more than 80 applications that rely on magnetic sensors. Magnetic or hall-effect sensor ICs are extremely temperature-stable and stress resistant devices especially suited for operating over extended temperature ranges to 150°C ideal for harsh automotive environment. More than 2 billion hall-effect sensors are manufactured annually for automotive applications. Hall-effect sensors are integral part of safety, power train, and body electronics. The potential for magnetic sensor IC damage when exposed to Operating Field Coupled Electrostatic Discharge is of key interest. Continuous trends in IC industry (shrinking geometries), and wire-bond transitioning from gold to copper (15 μm) may decrease the reliability and increase the failure rate.
{"title":"Operational field coupled ESD susceptibility of magnetic sensor IC's in automotive applications","authors":"C. Rostamzadeh, Kimball Williams, R. Kado","doi":"10.1109/ISEMC.2014.6898959","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898959","url":null,"abstract":"Modern automobiles feature more than 80 applications that rely on magnetic sensors. Magnetic or hall-effect sensor ICs are extremely temperature-stable and stress resistant devices especially suited for operating over extended temperature ranges to 150°C ideal for harsh automotive environment. More than 2 billion hall-effect sensors are manufactured annually for automotive applications. Hall-effect sensors are integral part of safety, power train, and body electronics. The potential for magnetic sensor IC damage when exposed to Operating Field Coupled Electrostatic Discharge is of key interest. Continuous trends in IC industry (shrinking geometries), and wire-bond transitioning from gold to copper (15 μm) may decrease the reliability and increase the failure rate.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121723983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899083
D. Oh, Yujeong Shim
An improved framework of power integrity analysis for core logic timing analysis is presented in this paper. Due to ever increasing power consumption of core digital blocks, jitter due to supply noise contributes a significant timing error, and on-chip logic timing analysis requires accurate modeling of supply noise induced jitter. Jitter information provides additional information to define precise power distribution network (PDN) requirements. The formulation to predict the jitter due to core noise is first presented in this paper followed by the modeling flow that can conveniently be incorporated into existing static timing analysis (STA) analysis. The presented method accounts for potential jitter tracking or anti-tracking between data and clock paths and any AC noise behavior. It covers a general topology including unbalanced clock trees, multi-cycle data paths, and multiple-power domains.
提出了一种改进的电源完整性分析框架，用于电芯逻辑时序分析。由于核心数字模块的功耗不断增加，由电源噪声引起的抖动会导致显著的时序误差，而片上逻辑时序分析需要精确建模电源噪声引起的抖动。抖动信息为精确定义PDN (power distribution network)要求提供了附加信息。本文首先提出了预测核噪声引起的抖动的公式，然后给出了建模流程，该流程可以方便地纳入现有的静态时序分析(STA)分析。该方法考虑了数据和时钟路径之间潜在的抖动跟踪或反跟踪以及任何交流噪声行为。它涵盖了一般的拓扑结构，包括不平衡时钟树、多周期数据路径和多功率域。
{"title":"Power integrity analysis for core timing models","authors":"D. Oh, Yujeong Shim","doi":"10.1109/ISEMC.2014.6899083","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899083","url":null,"abstract":"An improved framework of power integrity analysis for core logic timing analysis is presented in this paper. Due to ever increasing power consumption of core digital blocks, jitter due to supply noise contributes a significant timing error, and on-chip logic timing analysis requires accurate modeling of supply noise induced jitter. Jitter information provides additional information to define precise power distribution network (PDN) requirements. The formulation to predict the jitter due to core noise is first presented in this paper followed by the modeling flow that can conveniently be incorporated into existing static timing analysis (STA) analysis. The presented method accounts for potential jitter tracking or anti-tracking between data and clock paths and any AC noise behavior. It covers a general topology including unbalanced clock trees, multi-cycle data paths, and multiple-power domains.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134046126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898937
R. Araneo, G. Lovat, S. Celozzi, P. Burghignoli
The fundamental modes supported by a pair of identical graphene nanoribbons in the presence of a ground plane are analyzed. Dispersion, attenuation, and characteristic impedance of each mode are determined and an equivalent circuit is extracted. An efficient full-wave approach is adopted, based on a Method-of-Moments discretization of the relevant electric-field integral equation in which the graphene is modeled through a simple local conductivity. A spatial-domain formulation is adopted as it allows for efficiently treating nanoribbons with wide transverse separations and having in mind the future inclusion in the simulation model of the spatial nonuniformity possibly exhibited by the graphene conductivity.
{"title":"Crosstalk analysis in graphene multiconductor transmission lines","authors":"R. Araneo, G. Lovat, S. Celozzi, P. Burghignoli","doi":"10.1109/ISEMC.2014.6898937","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898937","url":null,"abstract":"The fundamental modes supported by a pair of identical graphene nanoribbons in the presence of a ground plane are analyzed. Dispersion, attenuation, and characteristic impedance of each mode are determined and an equivalent circuit is extracted. An efficient full-wave approach is adopted, based on a Method-of-Moments discretization of the relevant electric-field integral equation in which the graphene is modeled through a simple local conductivity. A spatial-domain formulation is adopted as it allows for efficiently treating nanoribbons with wide transverse separations and having in mind the future inclusion in the simulation model of the spatial nonuniformity possibly exhibited by the graphene conductivity.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128620702","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899012
Yanjie Dong, Gaofeng Cui, Yinghai Zhang, Weidong Wang
The multiple input multiple output (MIMO) technology increases the capacity of wireless communication system remarkably. However, it is unrealistic to deploy distributed antenna system (DAS) owing to several problems, including power imbalance, frequency difference and time delay difference between different data streams. In this paper, we analyze MIMO system capacity theoretically at first. Then we analyze effects of the problems above on MIMO system performance. At last, we conduct LTE link level simulation to verify our assumptions and draw our conclusions.
{"title":"Theoretical analysis of limiting factors for distributed MIMO system","authors":"Yanjie Dong, Gaofeng Cui, Yinghai Zhang, Weidong Wang","doi":"10.1109/ISEMC.2014.6899012","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899012","url":null,"abstract":"The multiple input multiple output (MIMO) technology increases the capacity of wireless communication system remarkably. However, it is unrealistic to deploy distributed antenna system (DAS) owing to several problems, including power imbalance, frequency difference and time delay difference between different data streams. In this paper, we analyze MIMO system capacity theoretically at first. Then we analyze effects of the problems above on MIMO system performance. At last, we conduct LTE link level simulation to verify our assumptions and draw our conclusions.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128629507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899015
G. Shen, V. Khilkevich, Sen Yang, D. Pommerenke, Hermann L. Aichele, D. Eichel, C. Keller
As the ESD stress is becoming more and more important for integrated circuits (ICs), the ability to predict IC failures becomes critical. In this paper, an 18 MHz D flip-flop IC is characterized and its behavioral model is presented. The resulting IC model is validated in the setup according to the ISO 10605 standard. A complete model of the setup combining the IC behavioral model and the passive parts of the setup is built to estimate the failure prediction accuracy in a totally simulated environment. The results show that the model can predict the triggering level with the error of less than 20%.
{"title":"Simple D flip-flop behavioral model of ESD immunity for use in the ISO 10605 standard","authors":"G. Shen, V. Khilkevich, Sen Yang, D. Pommerenke, Hermann L. Aichele, D. Eichel, C. Keller","doi":"10.1109/ISEMC.2014.6899015","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899015","url":null,"abstract":"As the ESD stress is becoming more and more important for integrated circuits (ICs), the ability to predict IC failures becomes critical. In this paper, an 18 MHz D flip-flop IC is characterized and its behavioral model is presented. The resulting IC model is validated in the setup according to the ISO 10605 standard. A complete model of the setup combining the IC behavioral model and the passive parts of the setup is built to estimate the failure prediction accuracy in a totally simulated environment. The results show that the model can predict the triggering level with the error of less than 20%.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129346507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899097
Logan J. Washbourne, V. Rajamani, C. Bunting, J. West, B. Archambeault, S. Connor
Electromagnetic interference can hinder the operations of systems near the source of the interference. This paper details the process of using a nested reverberation setup in order to determine the absorptive effectiveness of several absorbing materials. Results show that the position of absorbing materials is inconsequential as long as they are placed outside of the working volume and away from wall joints of the cavity given that the cavity is overmoded and the cavity under consideration produces a well stirred environment during normal operation.
{"title":"Effectiveness of absorbing materials on reducing electromagnetic emissions from cavities measured using a nested reverberation chamber approach","authors":"Logan J. Washbourne, V. Rajamani, C. Bunting, J. West, B. Archambeault, S. Connor","doi":"10.1109/ISEMC.2014.6899097","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899097","url":null,"abstract":"Electromagnetic interference can hinder the operations of systems near the source of the interference. This paper details the process of using a nested reverberation setup in order to determine the absorptive effectiveness of several absorbing materials. Results show that the position of absorbing materials is inconsequential as long as they are placed outside of the working volume and away from wall joints of the cavity given that the cavity is overmoded and the cavity under consideration produces a well stirred environment during normal operation.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130484060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899018
Youngwoo Kim, Kiyeong Kim, Jonghyun Cho, Joungho Kim, V. Sundaram, R. Tummala
3D integration using a glass interposer and through glass via technologies is expected to improve the performance of a whole system significantly. However, due to the high quality factor of the glass substrate, the sharp impedance peaks on the Power Distribution Networks arise at the resonances. When the mode resonances occur, performance of a whole system could be degraded. Segmentation based impedance-estimation was used to analyze the PDN impedance and analyzed system degradation at resonance frequencies. To maximize advantages of the glass interposers, the PDN should be carefully designed to suppress the resonances. Considering the current status of the glass fabrication processes, we propose that placing the ground vias near the signal vias is the most promising solution for maximizing the advantages of the glass interposers.
{"title":"Analysis of Power Distribution Network in glass, silicon interposer and PCB","authors":"Youngwoo Kim, Kiyeong Kim, Jonghyun Cho, Joungho Kim, V. Sundaram, R. Tummala","doi":"10.1109/ISEMC.2014.6899018","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899018","url":null,"abstract":"3D integration using a glass interposer and through glass via technologies is expected to improve the performance of a whole system significantly. However, due to the high quality factor of the glass substrate, the sharp impedance peaks on the Power Distribution Networks arise at the resonances. When the mode resonances occur, performance of a whole system could be degraded. Segmentation based impedance-estimation was used to analyze the PDN impedance and analyzed system degradation at resonance frequencies. To maximize advantages of the glass interposers, the PDN should be carefully designed to suppress the resonances. Considering the current status of the glass fabrication processes, we propose that placing the ground vias near the signal vias is the most promising solution for maximizing the advantages of the glass interposers.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126086098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898972
G. Antonini, D. Romano, M. Bandinelli, A. Mori, G. Sammarone
In this paper, a new iterative full-wave frequency domain PEEC solver is proposed. Based on the classical modified nodal analysis, the convergence of the iterative solution is optimized by resorting to a pertinent scaling of sub-matrices which improves the conditioning of the global left hand side matrix and to a multiscale-based effective preconditioner. The efficiency of the proposed approach in terms of either accuracy and number of iterations is demonstrated through its application to a relevant problem.
{"title":"Broadband full-wave frequency domain PEEC solver using effective scaling and preconditioning for SIPI models","authors":"G. Antonini, D. Romano, M. Bandinelli, A. Mori, G. Sammarone","doi":"10.1109/ISEMC.2014.6898972","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898972","url":null,"abstract":"In this paper, a new iterative full-wave frequency domain PEEC solver is proposed. Based on the classical modified nodal analysis, the convergence of the iterative solution is optimized by resorting to a pertinent scaling of sub-matrices which improves the conditioning of the global left hand side matrix and to a multiscale-based effective preconditioner. The efficiency of the proposed approach in terms of either accuracy and number of iterations is demonstrated through its application to a relevant problem.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121178018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899073
G. Gradoni, V. M. Primiani, F. Moglie
Finite-difference time-domain simulations of reverberation chambers exhibit a strong frequency dependence of field/power fluctuations on distributed losses. The performances of a reverberation chamber are calculated at different loss conditions and in a wide frequency band in terms of backscatter coefficient, and number of independent positions. Those performance indicators are related to field and power statistics through the scattering coefficients. A goodness-of-fit test is applied to analyze the statistical distribution functions of the numerical transmission scattering coefficient. Strong deviations from idealized distribution functions, some unexpected, are observed varying the chamber loading at both low- and high-frequencies. Observed phenomena are confirmed from the random coupling model, which reconciliates findings with the universal behavior of wave chaotic systems, as well as with previous studies of other investigators.
{"title":"Dependence of reverberation chamber performance on distributed losses: A numerical study","authors":"G. Gradoni, V. M. Primiani, F. Moglie","doi":"10.1109/ISEMC.2014.6899073","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899073","url":null,"abstract":"Finite-difference time-domain simulations of reverberation chambers exhibit a strong frequency dependence of field/power fluctuations on distributed losses. The performances of a reverberation chamber are calculated at different loss conditions and in a wide frequency band in terms of backscatter coefficient, and number of independent positions. Those performance indicators are related to field and power statistics through the scattering coefficients. A goodness-of-fit test is applied to analyze the statistical distribution functions of the numerical transmission scattering coefficient. Strong deviations from idealized distribution functions, some unexpected, are observed varying the chamber loading at both low- and high-frequencies. Observed phenomena are confirmed from the random coupling model, which reconciliates findings with the universal behavior of wave chaotic systems, as well as with previous studies of other investigators.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122660217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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