Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899047
Jue Chen, Bidyut Sen
AC-coupling capacitor and transition via are the two areas discussed in this paper for the impedance transparency design of a PCI Express Gen 3 backplane channel. The simulation results show that the optimized ground gap for the AC-coupling capacitors and the optimized transition vias helps improve the channel impedance transparency.
{"title":"Impedance transparency design for PCI-Express Gen 3 SerDes channel on HDI PCBs","authors":"Jue Chen, Bidyut Sen","doi":"10.1109/ISEMC.2014.6899047","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899047","url":null,"abstract":"AC-coupling capacitor and transition via are the two areas discussed in this paper for the impedance transparency design of a PCI Express Gen 3 backplane channel. The simulation results show that the optimized ground gap for the AC-coupling capacitors and the optimized transition vias helps improve the channel impedance transparency.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116414855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899034
Junsik Park, Jingook Kim, Jong-Sung Lee, Byongsu Seol
The transient voltage waveforms coupled by ESD events are effectively calculated using the partial element equivalent circuit (PEEC) method. The PEEC method has several advantages in prediction of ESD transient waveforms. As a test, a victim structure has been designed for the inductive coupling to be dominant. The calculated waveforms are validated by comparison with measurements both in frequency and time domains.
{"title":"Efficient calculation of ESD inductive coupling on a conductor loop using PEEC method","authors":"Junsik Park, Jingook Kim, Jong-Sung Lee, Byongsu Seol","doi":"10.1109/ISEMC.2014.6899034","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899034","url":null,"abstract":"The transient voltage waveforms coupled by ESD events are effectively calculated using the partial element equivalent circuit (PEEC) method. The PEEC method has several advantages in prediction of ESD transient waveforms. As a test, a victim structure has been designed for the inductive coupling to be dominant. The calculated waveforms are validated by comparison with measurements both in frequency and time domains.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124747594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899090
Ping Li, L. J. Jiang
Uncertainties in realistic lumped and distributive circuit systems are of great importance to today's high yield manufacture demand. However, evaluating the stochastic effect in the time domain for the hybrid electromagnetics (EM)-circuit system was seldom done, especially when Monte Carlo is too expensive to be feasible. In this work, an adaptive hierarchical sparse grid collocation (ASGC) method is presented to quantify the impacts of stochastic inputs on hybrid electromagnetics (EM)-circuit or EM scattering systems. The ASGC method approximates the stochastic observables of interest using interpolation functions over series collocation points. Instead of employing a full-tensor product sense, the collocation points in ASGC method are hierarchically marched with interpolation depth based upon Smolyaks construction algorithm. To further reduce the collocation points, an adaptive scheme is employed by using hierarchical surplus of each collocation point as the error indicator. With the proposed method, the number of collocation points is significantly deduced. To verify the effectiveness and robustness of the proposed stochastic solver, hybrid EM-circuit systems are quantified by a full-wave EM-circuit simulator based upon discontinuous Galerkin time domain (DGTD) method and modified nodal analysis (MNA). The time domain influences of uncertainty inputs such as geometrical information and electrical material properties are thereby benchmarked and demonstrated through this paper.
{"title":"Uncertainty quantification of EM-circuit systems using stochastic polynomial chaos method","authors":"Ping Li, L. J. Jiang","doi":"10.1109/ISEMC.2014.6899090","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899090","url":null,"abstract":"Uncertainties in realistic lumped and distributive circuit systems are of great importance to today's high yield manufacture demand. However, evaluating the stochastic effect in the time domain for the hybrid electromagnetics (EM)-circuit system was seldom done, especially when Monte Carlo is too expensive to be feasible. In this work, an adaptive hierarchical sparse grid collocation (ASGC) method is presented to quantify the impacts of stochastic inputs on hybrid electromagnetics (EM)-circuit or EM scattering systems. The ASGC method approximates the stochastic observables of interest using interpolation functions over series collocation points. Instead of employing a full-tensor product sense, the collocation points in ASGC method are hierarchically marched with interpolation depth based upon Smolyaks construction algorithm. To further reduce the collocation points, an adaptive scheme is employed by using hierarchical surplus of each collocation point as the error indicator. With the proposed method, the number of collocation points is significantly deduced. To verify the effectiveness and robustness of the proposed stochastic solver, hybrid EM-circuit systems are quantified by a full-wave EM-circuit simulator based upon discontinuous Galerkin time domain (DGTD) method and modified nodal analysis (MNA). The time domain influences of uncertainty inputs such as geometrical information and electrical material properties are thereby benchmarked and demonstrated through this paper.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124801763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898971
Md. A. H. Talukder, M. Kabir, Sourajeet Roy, R. Khazaka
Distributed networks with embedded parametric uncertainty can be characterized in the frequency-domain by tabulated augmented multiport S or Y-parameter responses based on a stochastic Galerkins formulation of the network equations. In this work, the Loewner Matrix approach is utilized to generate a compact SPICE-compatible macromodel of the stochastic distributed network from the tabulated frequency-domain data for transient analysis. The key attribute of this work is that the superior scaling of the computational complexity of the Loewner Matrix approach with respect to the augmented number of network ports allows for a more efficient generation of the macromodel than the classical Vector Fitting approach. This leads to faster transient analysis for problems involving large random spaces. The advantage of the proposed approach is validated using a numerical example.
{"title":"Efficient stochastic transient analysis of high-speed passive distributed networks using Loewner Matrix based macromodels","authors":"Md. A. H. Talukder, M. Kabir, Sourajeet Roy, R. Khazaka","doi":"10.1109/ISEMC.2014.6898971","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898971","url":null,"abstract":"Distributed networks with embedded parametric uncertainty can be characterized in the frequency-domain by tabulated augmented multiport S or Y-parameter responses based on a stochastic Galerkins formulation of the network equations. In this work, the Loewner Matrix approach is utilized to generate a compact SPICE-compatible macromodel of the stochastic distributed network from the tabulated frequency-domain data for transient analysis. The key attribute of this work is that the superior scaling of the computational complexity of the Loewner Matrix approach with respect to the augmented number of network ports allows for a more efficient generation of the macromodel than the classical Vector Fitting approach. This leads to faster transient analysis for problems involving large random spaces. The advantage of the proposed approach is validated using a numerical example.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125092548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898992
M. Azpúrua, E. Paez, R. Jaúregui
The Feature Selective Validation (FSV) is the standard method used for validation assessment in Computational Electromagnetics, and it uses both quantitative and qualitative indicators to measure de similarity between a pair of data sets. However, standardized FSV rely on a heuristic procedure for graphical comparison that does not include considerations about the uncertainty of the data sets involved. The reliability of the validation results, and therefore of the model under validation, depends on the uncertainty of the data sets used as input for the FSV, even more considering that some measurements associated to electromagnetic compatibility tests are characterized by a large uncertainty. Nonetheless, the FSV algorithm makes the propagation of such uncertainties a difficult and cumbersome task through the conventional approaches. This paper presents the application of the Monte Carlo Method as an approach to propagate the uncertainty of the input data sets in order to estimate a confidence interval for each FSV indicator. Finally, a numerical example is presented and discussed.
{"title":"Measurement uncertainty propagation through the Feature Selective Validation method","authors":"M. Azpúrua, E. Paez, R. Jaúregui","doi":"10.1109/ISEMC.2014.6898992","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898992","url":null,"abstract":"The Feature Selective Validation (FSV) is the standard method used for validation assessment in Computational Electromagnetics, and it uses both quantitative and qualitative indicators to measure de similarity between a pair of data sets. However, standardized FSV rely on a heuristic procedure for graphical comparison that does not include considerations about the uncertainty of the data sets involved. The reliability of the validation results, and therefore of the model under validation, depends on the uncertainty of the data sets used as input for the FSV, even more considering that some measurements associated to electromagnetic compatibility tests are characterized by a large uncertainty. Nonetheless, the FSV algorithm makes the propagation of such uncertainties a difficult and cumbersome task through the conventional approaches. This paper presents the application of the Monte Carlo Method as an approach to propagate the uncertainty of the input data sets in order to estimate a confidence interval for each FSV indicator. Finally, a numerical example is presented and discussed.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124170542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899003
Q. Yu
The Flexible Alternating Current Transmission System (FACTS), based on power electronic, offers an opportunity to enhance controllability, stability, and power transfer capability of AC power transmission systems. It was identified as a key technology for power stabilization technique for SmartGrid by the U.S. Department of Energy (DOE). It is expected that a large number of distributed FACTS devices will be used in SmartGrid, especially in distribution networks for various control purposes. In the past, FACTS devices were mainly utilized in remote transmission networks. But the RF noise signals from FACTS devices were still carried out by power lines. In the distribution grids which are closer to consumers and have lower voltage and power ratings, faster switches are thus available and will be used in FACTS controllers. Additionally, new FACTS facilities with smart functions will incorporate more electronics for advanced digital and wireless features. Higher RF noises in terms of amplitude and frequency will be anticipated. Therefore, electromagnetic interference (EMI) impact of FACTS devices for SmartGrid applications need to be addressed. In this paper, the major benefits and values of FACTS technology for SmartGrid applications are overviewed. The EMI impact of deploying FACTS devices in SmartGrid is discussed.
{"title":"Applications of flexible AC transmissions system (FACTS) technology in SmartGrid and its EMC impact","authors":"Q. Yu","doi":"10.1109/ISEMC.2014.6899003","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899003","url":null,"abstract":"The Flexible Alternating Current Transmission System (FACTS), based on power electronic, offers an opportunity to enhance controllability, stability, and power transfer capability of AC power transmission systems. It was identified as a key technology for power stabilization technique for SmartGrid by the U.S. Department of Energy (DOE). It is expected that a large number of distributed FACTS devices will be used in SmartGrid, especially in distribution networks for various control purposes. In the past, FACTS devices were mainly utilized in remote transmission networks. But the RF noise signals from FACTS devices were still carried out by power lines. In the distribution grids which are closer to consumers and have lower voltage and power ratings, faster switches are thus available and will be used in FACTS controllers. Additionally, new FACTS facilities with smart functions will incorporate more electronics for advanced digital and wireless features. Higher RF noises in terms of amplitude and frequency will be anticipated. Therefore, electromagnetic interference (EMI) impact of FACTS devices for SmartGrid applications need to be addressed. In this paper, the major benefits and values of FACTS technology for SmartGrid applications are overviewed. The EMI impact of deploying FACTS devices in SmartGrid is discussed.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127584119","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899005
Z. Zhou, Guizhen Lu, Dongdong Zeng
MIMO system is a promising technology for promoting the performance of communication. In order to simulate the multipath channel in real communication, a suitable measurement environment which is not only reliable but also repeatable is very important. The reverberation chamber is a kind of common electromagnetic test environment, and it has many outstanding advantages in MIMO system test. So in this paper, a simulation model of SISO system is set up by Ansoft HFSS, and the simulation results of channel capacity and channel characteristics were compared with measured results. The results were simulated and measured at 900MHz which is the typical operating frequency in communication system. The comparison shows that the model is reliable enough to be used for MIMO system.
{"title":"MIMO channel capacity based on reverberation chamber","authors":"Z. Zhou, Guizhen Lu, Dongdong Zeng","doi":"10.1109/ISEMC.2014.6899005","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899005","url":null,"abstract":"MIMO system is a promising technology for promoting the performance of communication. In order to simulate the multipath channel in real communication, a suitable measurement environment which is not only reliable but also repeatable is very important. The reverberation chamber is a kind of common electromagnetic test environment, and it has many outstanding advantages in MIMO system test. So in this paper, a simulation model of SISO system is set up by Ansoft HFSS, and the simulation results of channel capacity and channel characteristics were compared with measured results. The results were simulated and measured at 900MHz which is the typical operating frequency in communication system. The comparison shows that the model is reliable enough to be used for MIMO system.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115732064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899082
Yujeong Shim, D. Oh, T. Hoang, Y. Ke
As data rate of serial interface has increased dramatically, timing margin has gotten tighter and tighter. Supply voltage has also kept deducing according to silicon process technology. However, supply noise is hardly reduced due to higher data rate, a huge number of transistors and slower improvement of packaging technology. Therefore, the jitter due to supply noise can be quite large compared to other jitter components. The jitter due to supply noise is not cancelled out by CDR or PLL at the receiver since PDN resonance frequency is higher than loop bandwidth of CDR or PLL. It is not cost effective if only PDN improvement is adopted to reduce supply noise induced jitter. It is essential to optimize performance at architecture level including circuits and PDN. In this paper, the new technique is proposed to minimize supply noise induced jitter in high speed serial interface. The proposed techniques called Jitter Equalizer (JEqualizer) improves jitter performance by 80% with minimal power increase and area over head. The impact is evaluated by supply noise induced jitter modeling.
{"title":"A jitter equalization technique for minimizing supply noise induced jitter in high speed serial links","authors":"Yujeong Shim, D. Oh, T. Hoang, Y. Ke","doi":"10.1109/ISEMC.2014.6899082","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899082","url":null,"abstract":"As data rate of serial interface has increased dramatically, timing margin has gotten tighter and tighter. Supply voltage has also kept deducing according to silicon process technology. However, supply noise is hardly reduced due to higher data rate, a huge number of transistors and slower improvement of packaging technology. Therefore, the jitter due to supply noise can be quite large compared to other jitter components. The jitter due to supply noise is not cancelled out by CDR or PLL at the receiver since PDN resonance frequency is higher than loop bandwidth of CDR or PLL. It is not cost effective if only PDN improvement is adopted to reduce supply noise induced jitter. It is essential to optimize performance at architecture level including circuits and PDN. In this paper, the new technique is proposed to minimize supply noise induced jitter in high speed serial interface. The proposed techniques called Jitter Equalizer (JEqualizer) improves jitter performance by 80% with minimal power increase and area over head. The impact is evaluated by supply noise induced jitter modeling.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115779945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6898951
D. Norte
This paper addresses estimating the far-field radiated emissions performance, at 10m, from three coupled microstrip lines, in which the coupling length is 5cm, and in which the risetimes of the propagating signals are 2ns. The load for each microstrip line is a 0.01pF capacitive load, and the signaling on the three lines is unipolar, with the propagating voltages switching between 0V and 3V. The nominal or isolated impedances, Zo, of the three lines are set to about 67Ω. The edge-to-edge distances for the coupled lines are varied between 4mils and 20mils, while the width of the conductors is also varied between 8mils and 4mils. In addition, the thickness of the dielectric is varied between 8mils and 4mils. The estimated radiated emissions results that are presented in this paper are restricted to an upper frequency limit of 6GHz. For the various scenarios presented in this paper, it is shown that the maximum far-field radiated emissions levels are about 35dBμV/m, and occur at about 5.0GHz. In addition to estimating the far-field radiated emissions from the three coupled microstrip lines, the time-domain effects of the coupled lines are shown by highlighting the received eye patterns.
{"title":"Estimating the radiated emissions and received waveforms from coupled microstrip lines with unipolar signaling","authors":"D. Norte","doi":"10.1109/ISEMC.2014.6898951","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6898951","url":null,"abstract":"This paper addresses estimating the far-field radiated emissions performance, at 10m, from three coupled microstrip lines, in which the coupling length is 5cm, and in which the risetimes of the propagating signals are 2ns. The load for each microstrip line is a 0.01pF capacitive load, and the signaling on the three lines is unipolar, with the propagating voltages switching between 0V and 3V. The nominal or isolated impedances, Zo, of the three lines are set to about 67Ω. The edge-to-edge distances for the coupled lines are varied between 4mils and 20mils, while the width of the conductors is also varied between 8mils and 4mils. In addition, the thickness of the dielectric is varied between 8mils and 4mils. The estimated radiated emissions results that are presented in this paper are restricted to an upper frequency limit of 6GHz. For the various scenarios presented in this paper, it is shown that the maximum far-field radiated emissions levels are about 35dBμV/m, and occur at about 5.0GHz. In addition to estimating the far-field radiated emissions from the three coupled microstrip lines, the time-domain effects of the coupled lines are shown by highlighting the received eye patterns.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115450715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-20DOI: 10.1109/ISEMC.2014.6899007
Yang Wu
This paper proposes a novel and efficient jitter analysis method for high speed links. Based on step responses of the high speed link and information of jitters injected, the proposed method generates the eye diagram of link receiver for jitter impact evaluation. In this method, the range of jitter is converted into the range of voltage variation on step responses. Bounds of the eye diagram are calculated through the ultimate value of voltage variation on step responses, which dramatically improves the calculation efficiency with high accuracy. Another advantage of the proposed method is that the jitter is processed in time sequence. It helps the proposed method analyze the time correlated jitter correctly.
{"title":"An efficient eye diagram generation method for jitter analysis in high speed links","authors":"Yang Wu","doi":"10.1109/ISEMC.2014.6899007","DOIUrl":"https://doi.org/10.1109/ISEMC.2014.6899007","url":null,"abstract":"This paper proposes a novel and efficient jitter analysis method for high speed links. Based on step responses of the high speed link and information of jitters injected, the proposed method generates the eye diagram of link receiver for jitter impact evaluation. In this method, the range of jitter is converted into the range of voltage variation on step responses. Bounds of the eye diagram are calculated through the ultimate value of voltage variation on step responses, which dramatically improves the calculation efficiency with high accuracy. Another advantage of the proposed method is that the jitter is processed in time sequence. It helps the proposed method analyze the time correlated jitter correctly.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131581544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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