Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237861
Lin Zhang, K. See, Yue Ping Zhang
In this paper, a novel dual-band antenna for wireless local area networks (WLAN) application is designed and simulated. Firstly, a standalone dual-band antenna on a smaller PCB is designed and satisfactory radiation patterns at 2.4 GHz and 5.2 GHz are achieved. Then, the antenna is integrated on a larger PCB and it is found that the radiation patterns become unsatisfactory, in particular at 5.2 GHz. In order to improve the radiation patterns, four slots are cut on the ground plane. The dual-band antenna consists of a meander strip for 2.4 GHz and a quarter-ring for 5.2 GHz, both printed on FR4 substrate with thickness of 0.8 mm. The final dual-band antenna with the four slots on the ground plane attains 9.3% impedance bandwidth and 1.9 dBi gain at 2.4 GHz, and 16% impedance bandwidth and 3.4 dBi gain at 5.2 GHz, respectively.
{"title":"Impact of PCB ground plane size on dual-band antenna performance","authors":"Lin Zhang, K. See, Yue Ping Zhang","doi":"10.1109/APEMC.2012.6237861","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237861","url":null,"abstract":"In this paper, a novel dual-band antenna for wireless local area networks (WLAN) application is designed and simulated. Firstly, a standalone dual-band antenna on a smaller PCB is designed and satisfactory radiation patterns at 2.4 GHz and 5.2 GHz are achieved. Then, the antenna is integrated on a larger PCB and it is found that the radiation patterns become unsatisfactory, in particular at 5.2 GHz. In order to improve the radiation patterns, four slots are cut on the ground plane. The dual-band antenna consists of a meander strip for 2.4 GHz and a quarter-ring for 5.2 GHz, both printed on FR4 substrate with thickness of 0.8 mm. The final dual-band antenna with the four slots on the ground plane attains 9.3% impedance bandwidth and 1.9 dBi gain at 2.4 GHz, and 16% impedance bandwidth and 3.4 dBi gain at 5.2 GHz, respectively.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114502798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6238002
F. Caignet, N. Monnereau, N. Nolhier, M. Bafleur
For both Equipment Manufacturers (EM) and semiconductor suppliers, the prediction of ElectroStatic Discharge (ESD) events into design phase is becoming a challenging issue to insure rehability into system level considerations. This is mainly due to the shrinking of Integrated Circuits (IC) technology, which decreases the robustness level and increase the probability of failures. In this paper, we will present how to build IC's models taking into account behavioral description of ESD protections, to perform system level ESD simulations. The IBIS (Input/output Buffer Information Specification) models are mixed with information extracted from Transmission Line Pulsing (TLP) measurement's techniques to build system simulations. The methodology is detailed and proved in some case studies addressing the current propagation path and the susceptibility of the ICs. The main goal of the proposed model is that it could be shared by IC suppliers and EMs to ensure that ICs can handle system level ESD events.
{"title":"Behavioral ESD protection modeling to perform system level ESD efficient design","authors":"F. Caignet, N. Monnereau, N. Nolhier, M. Bafleur","doi":"10.1109/APEMC.2012.6238002","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6238002","url":null,"abstract":"For both Equipment Manufacturers (EM) and semiconductor suppliers, the prediction of ElectroStatic Discharge (ESD) events into design phase is becoming a challenging issue to insure rehability into system level considerations. This is mainly due to the shrinking of Integrated Circuits (IC) technology, which decreases the robustness level and increase the probability of failures. In this paper, we will present how to build IC's models taking into account behavioral description of ESD protections, to perform system level ESD simulations. The IBIS (Input/output Buffer Information Specification) models are mixed with information extracted from Transmission Line Pulsing (TLP) measurement's techniques to build system simulations. The methodology is detailed and proved in some case studies addressing the current propagation path and the susceptibility of the ICs. The main goal of the proposed model is that it could be shared by IC suppliers and EMs to ensure that ICs can handle system level ESD events.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132202664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237801
M. Mokhtaari, J. Bornemann
Two new printed-circuit antennas for ultra-wideband (UWB) monitoring applications are introduced. Both microstrip and coplanar waveguide antennas operate between 3 GHz and 30 GHz with a return loss of 10 dB. The vertically polarized omnidirectional radiation characteristics in the lower frequency band change to a more directional pattern at higher frequencies. The cross-polar field component increases with frequency and gives rise to possible dual-polarized applications for the microstrip antenna. Overall, the coplanar antenna shows slightly better performance. Amplitude and group-delay responses are demonstrated over the entire 3-30 GHz band, and radiation patterns at selected frequencies are shown.
{"title":"Printed-circuit antennas for ultra-wideband monitoring applications","authors":"M. Mokhtaari, J. Bornemann","doi":"10.1109/APEMC.2012.6237801","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237801","url":null,"abstract":"Two new printed-circuit antennas for ultra-wideband (UWB) monitoring applications are introduced. Both microstrip and coplanar waveguide antennas operate between 3 GHz and 30 GHz with a return loss of 10 dB. The vertically polarized omnidirectional radiation characteristics in the lower frequency band change to a more directional pattern at higher frequencies. The cross-polar field component increases with frequency and gives rise to possible dual-polarized applications for the microstrip antenna. Overall, the coplanar antenna shows slightly better performance. Amplitude and group-delay responses are demonstrated over the entire 3-30 GHz band, and radiation patterns at selected frequencies are shown.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134580473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237835
J. Stahl, R. Junghaenel, M. Schmidt, M. Albach
Reducing differential mode (dm) noise of switching converters in an effective way is an open issue. Here, a thorough investigation of the filtering technique with integrated magnetics combined with a sensitivity analysis for mismatches in the coupling factor is done together with an analysis of the optimized distribution of capacitance between the two capacitors involved. The whole analysis is done in the frequency domain. Therefore, a proper model is given.
{"title":"Smoothing transformer as effective differential mode filter","authors":"J. Stahl, R. Junghaenel, M. Schmidt, M. Albach","doi":"10.1109/APEMC.2012.6237835","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237835","url":null,"abstract":"Reducing differential mode (dm) noise of switching converters in an effective way is an open issue. Here, a thorough investigation of the filtering technique with integrated magnetics combined with a sensitivity analysis for mismatches in the coupling factor is done together with an analysis of the optimized distribution of capacitance between the two capacitors involved. The whole analysis is done in the frequency domain. Therefore, a proper model is given.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133048090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237878
Qun Wu, Shao-qing Zhang, Tongyu Ding
Based on the FDTD method, the subgrid technique is used is applied to analyze the distribution of electromagnetic fields inside a building structure. The whole lightning channel is calculated with the primary grid while the structure is modelled with subgrid, which would guarantee the calculation accuracy while not increase computation time. The results show that a surge occurs inside a building with peak value of a few times higher than the normal conditions. It also presents critical areas of a building when struck by lightning, and the significant influence of earth on the horizontal electric field.
{"title":"Analysis of the electromagnetic fields inside building structure using the subgrid FDTD method","authors":"Qun Wu, Shao-qing Zhang, Tongyu Ding","doi":"10.1109/APEMC.2012.6237878","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237878","url":null,"abstract":"Based on the FDTD method, the subgrid technique is used is applied to analyze the distribution of electromagnetic fields inside a building structure. The whole lightning channel is calculated with the primary grid while the structure is modelled with subgrid, which would guarantee the calculation accuracy while not increase computation time. The results show that a surge occurs inside a building with peak value of a few times higher than the normal conditions. It also presents critical areas of a building when struck by lightning, and the significant influence of earth on the horizontal electric field.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133153053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237976
Jing Jin, Meng-Lin Zhai, W. Yin
Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP) is carried out in this paper. It mainly consists of antenna, limiter, filter, low noise amplifier (LNA), sensitivity control component, and power amplifier (PA), etc. Certain breakdown of the LNA under the impact of an EMP is demonstrated experimentally with different pulse widths, where its first-stage MESFET is damaged clearly. The output responses of the RF channel are simulated using the commercial software ADS for two types of EMP waveforms, respectively. It is evident that the channel performance is degraded seriously, due to the existence of the EMP. Under such circumstances, some special techniques for an effectively protecting the RF channel should be further employed.
{"title":"Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP)","authors":"Jing Jin, Meng-Lin Zhai, W. Yin","doi":"10.1109/APEMC.2012.6237976","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237976","url":null,"abstract":"Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP) is carried out in this paper. It mainly consists of antenna, limiter, filter, low noise amplifier (LNA), sensitivity control component, and power amplifier (PA), etc. Certain breakdown of the LNA under the impact of an EMP is demonstrated experimentally with different pulse widths, where its first-stage MESFET is damaged clearly. The output responses of the RF channel are simulated using the commercial software ADS for two types of EMP waveforms, respectively. It is evident that the channel performance is degraded seriously, due to the existence of the EMP. Under such circumstances, some special techniques for an effectively protecting the RF channel should be further employed.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132380892","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6238006
Feng Tian, Zhanqing Yu, R. Zeng
Electromagnetic environment (EME) is one of the key issues of UHVDC power transmission projects. This paper presents the installations, methods and calibrations of Radio Interference (RI) and Audible Noise (AN) under the UHVDC test lines in National Laboratory for UHV Technology located in Kunming, with a concerning altitude of 2100 m. Measurement results including statistical values, lateral profiles, RI spectrums, variation with voltage and relative humidity influence are illustrated. Comparisons with various empirical calculation methods revealed before are performed and demonstrate none of them can provide acceptable predicting results under high altitude condition.
{"title":"Radio Interference and Audible Noise of the UHVDC test line under high altitude condition","authors":"Feng Tian, Zhanqing Yu, R. Zeng","doi":"10.1109/APEMC.2012.6238006","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6238006","url":null,"abstract":"Electromagnetic environment (EME) is one of the key issues of UHVDC power transmission projects. This paper presents the installations, methods and calibrations of Radio Interference (RI) and Audible Noise (AN) under the UHVDC test lines in National Laboratory for UHV Technology located in Kunming, with a concerning altitude of 2100 m. Measurement results including statistical values, lateral profiles, RI spectrums, variation with voltage and relative humidity influence are illustrated. Comparisons with various empirical calculation methods revealed before are performed and demonstrate none of them can provide acceptable predicting results under high altitude condition.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126053705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6238003
K. Abouda, P. Besse, T. Laplagne
In particular applications, integrated circuits (ICs) have to be designed to guarantee safe operations during severe electromagnetic aggressions stresses such as Direct Power Injection (DPI). Unfortunately, the simulation of functional failures during DPI events remains very challenging for analogue products due the large frequency domain and to the lack of models for internal parasitic coupling. This paper describes a test method to identify the design functions and the physical mechanisms that lead to functional failures when integrated circuits are submitted to EMC stress.
{"title":"Novel method To identify electrical mechanisms responsible for functional failures during Direct Power Injection “DPI”","authors":"K. Abouda, P. Besse, T. Laplagne","doi":"10.1109/APEMC.2012.6238003","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6238003","url":null,"abstract":"In particular applications, integrated circuits (ICs) have to be designed to guarantee safe operations during severe electromagnetic aggressions stresses such as Direct Power Injection (DPI). Unfortunately, the simulation of functional failures during DPI events remains very challenging for analogue products due the large frequency domain and to the lack of models for internal parasitic coupling. This paper describes a test method to identify the design functions and the physical mechanisms that lead to functional failures when integrated circuits are submitted to EMC stress.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125243515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237830
C. Jullien, P. Besnier, M. Dunand, I. Junqua
This paper focuses on the coupling between a twisted pair cable (TPC), which is modeled as a perfect helix of two conductors, and a single wire. The simulation of the current on a victim wire induced by a TPC made of a single twist gives non-obvious patterns depending on the starting angle of the TPC. An analytical model based on a circuit representation is developed in order to understand these specific current distributions. A coarse simulation of the TPC is first carried out with a minimum number of tubes that exhibits the same behavior as a finely discretized model. Then, the circuit approach applied in this case shows the influence of the arrangement of inductance and capacitance mutual terms along the twisted pair on the distribution of the currents on the nearby wire. It eventually explains the specific role of the starting angle.
{"title":"Analysis of the current distribution induced on a victim wire by a differential voltage source applied onto a twisted pair cable","authors":"C. Jullien, P. Besnier, M. Dunand, I. Junqua","doi":"10.1109/APEMC.2012.6237830","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237830","url":null,"abstract":"This paper focuses on the coupling between a twisted pair cable (TPC), which is modeled as a perfect helix of two conductors, and a single wire. The simulation of the current on a victim wire induced by a TPC made of a single twist gives non-obvious patterns depending on the starting angle of the TPC. An analytical model based on a circuit representation is developed in order to understand these specific current distributions. A coarse simulation of the TPC is first carried out with a minimum number of tubes that exhibits the same behavior as a finely discretized model. Then, the circuit approach applied in this case shows the influence of the arrangement of inductance and capacitance mutual terms along the twisted pair on the distribution of the currents on the nearby wire. It eventually explains the specific role of the starting angle.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124926114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-21DOI: 10.1109/APEMC.2012.6237845
Kelin Jia, R. Thottappillil, G. Bohlin
This paper gives a method to simulate the shielded cable in PSpice. The multiconductor transmission line theory is applied to deal with the cable system. The influence of the grounding conditions on the shielding effect is studied. Through simulations, it is observed that imperfect grounding of the shield can lead different cross-talk in the inner cable. Losing grounding at near-end or far-end of shield gives different impacts on near-end cross-talk. What is more, when one end of the shield is open the cross-talk may be severer than that when both ends of shield are open. The reasons for different cross-talk according to different kinds of imperfect grounding are discussed. By comparison the different voltage responses, advices for better shielding effect are drawn.
{"title":"Shielded cable modeling in PSpice for shielding effect analysis","authors":"Kelin Jia, R. Thottappillil, G. Bohlin","doi":"10.1109/APEMC.2012.6237845","DOIUrl":"https://doi.org/10.1109/APEMC.2012.6237845","url":null,"abstract":"This paper gives a method to simulate the shielded cable in PSpice. The multiconductor transmission line theory is applied to deal with the cable system. The influence of the grounding conditions on the shielding effect is studied. Through simulations, it is observed that imperfect grounding of the shield can lead different cross-talk in the inner cable. Losing grounding at near-end or far-end of shield gives different impacts on near-end cross-talk. What is more, when one end of the shield is open the cross-talk may be severer than that when both ends of shield are open. The reasons for different cross-talk according to different kinds of imperfect grounding are discussed. By comparison the different voltage responses, advices for better shielding effect are drawn.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126184422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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