Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327482
A. Zhu, Tianhai Wang, T. Brazil
This contribution addresses the problem of finding a simplified but effective high-level representation of non-linear high-frequency systems, specifically amplifiers, which may exhibit considerable underlying complexity at the detailed circuit/device level of implementation. Two approaches are pursued, one being based on conventional narrow¿band representations, but exploring the fact that different such realisations are possible from the same set of measured (or simulated) terminal data, not all of which exhibit comparable accuracy of representation. The second approach is based on a discrete-time Volterra formulation offering considerable generality and improved computational properties.
{"title":"Narrowband and Volterra-Based Behavioral Models of High Frequency Amplifiers","authors":"A. Zhu, Tianhai Wang, T. Brazil","doi":"10.1109/ARFTG.2001.327482","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327482","url":null,"abstract":"This contribution addresses the problem of finding a simplified but effective high-level representation of non-linear high-frequency systems, specifically amplifiers, which may exhibit considerable underlying complexity at the detailed circuit/device level of implementation. Two approaches are pursued, one being based on conventional narrow¿band representations, but exploring the fact that different such realisations are possible from the same set of measured (or simulated) terminal data, not all of which exhibit comparable accuracy of representation. The second approach is based on a discrete-time Volterra formulation offering considerable generality and improved computational properties.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127269417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327489
W. Woo, J. Kenney
This paper introduces a mixed-signal simulator for the RF power amplifier predistortion linearization. System-level simulation approaches are in demand for designing mixed-signal power amplifier systems and tight time-to-market requirements. A predistortion system using self-adjusting function provides both precise and stable distortion compensation performance. The system performs the linearization for a physical model of a power amplifier (PA) using the dynamic feedback of the difference signal between input and output envelops to adaptively compensate the gain and phase. The simulator was developed on the simulation environment in the HP Advanced Design System (HP ADS). The performance of the simulator is examined by a mixed-signal example. The presented performance illustrates potential applications for DSP implementation in the future wireless systems.
{"title":"Mixed-signal Simulation of a Power Amplifier Predistortion Linearization System","authors":"W. Woo, J. Kenney","doi":"10.1109/ARFTG.2001.327489","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327489","url":null,"abstract":"This paper introduces a mixed-signal simulator for the RF power amplifier predistortion linearization. System-level simulation approaches are in demand for designing mixed-signal power amplifier systems and tight time-to-market requirements. A predistortion system using self-adjusting function provides both precise and stable distortion compensation performance. The system performs the linearization for a physical model of a power amplifier (PA) using the dynamic feedback of the difference signal between input and output envelops to adaptively compensate the gain and phase. The simulator was developed on the simulation environment in the HP Advanced Design System (HP ADS). The performance of the simulator is examined by a mixed-signal example. The presented performance illustrates potential applications for DSP implementation in the future wireless systems.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125624469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327483
J. Pedro, N. Carvalho
Supported on the theoretical framework of Volterra Series, the present paper discusses nonlinear model extraction procedures currently in use for multi-tone signal analysis, and proposes a methodology that has been successfully applied to small and large-signal distortion regimes of microwave circuits. Good agreement between nonlinear simulation results and laboratory measurements of a medium power amplifier driven with band-limited white noise, validated the authors¿ approach.
{"title":"Nonlinear Modeling of RF/Microwave Circuits for Multi-Tone Signal Analysis","authors":"J. Pedro, N. Carvalho","doi":"10.1109/ARFTG.2001.327483","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327483","url":null,"abstract":"Supported on the theoretical framework of Volterra Series, the present paper discusses nonlinear model extraction procedures currently in use for multi-tone signal analysis, and proposes a methodology that has been successfully applied to small and large-signal distortion regimes of microwave circuits. Good agreement between nonlinear simulation results and laboratory measurements of a medium power amplifier driven with band-limited white noise, validated the authors¿ approach.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128638654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327494
A. Ferrero, V. Teppati
A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.
{"title":"A complete measurement Test-Set for non-linear device characterization","authors":"A. Ferrero, V. Teppati","doi":"10.1109/ARFTG.2001.327494","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327494","url":null,"abstract":"A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114099910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327487
N. Ridler, M. Salter
The law of propagation of uncertainty is first reviewed using matrix notation. This notation is appropriate because the uncertainty in a complex-valued quantity can be expressed as a matrix. This approach is then applied to propagate uncertainty from complex-valued S-parameters to other quantities that occur elsewhere in other microwave measurement applications. The procedure is consistent with the ISO Guide to the expression of uncertainty in measurement [1].
{"title":"Propagating S-parameter uncertainties to other measurement quantities","authors":"N. Ridler, M. Salter","doi":"10.1109/ARFTG.2001.327487","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327487","url":null,"abstract":"The law of propagation of uncertainty is first reviewed using matrix notation. This notation is appropriate because the uncertainty in a complex-valued quantity can be expressed as a matrix. This approach is then applied to propagate uncertainty from complex-valued S-parameters to other quantities that occur elsewhere in other microwave measurement applications. The procedure is consistent with the ISO Guide to the expression of uncertainty in measurement [1].","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130125174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327486
D. Rytting
Calibration and error-correction technology is fundamental to accurate network analyzer measurements. This paper will discuss the sources of errors in a network analyzer and which errors can be reduced by the calibration, which errors can not be removed and which errors are increased by the error-correction process. The residual errors that remain after the calibration can then be quantified so that an error-corrected measurement accuracy can be determined. This paper will then summarize a process that can be used to determine sound and traceable specifications for a network analyzer and the tradeoffs between various calibration methods.
{"title":"Network Analyzer Accuracy Overview","authors":"D. Rytting","doi":"10.1109/ARFTG.2001.327486","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327486","url":null,"abstract":"Calibration and error-correction technology is fundamental to accurate network analyzer measurements. This paper will discuss the sources of errors in a network analyzer and which errors can be reduced by the calibration, which errors can not be removed and which errors are increased by the error-correction process. The residual errors that remain after the calibration can then be quantified so that an error-corrected measurement accuracy can be determined. This paper will then summarize a process that can be used to determine sound and traceable specifications for a network analyzer and the tradeoffs between various calibration methods.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127781739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327499
A. Parker, J. Rathmell
Dispersion effects and the operating regions they effect are identified in a HEMT and a MESFET. Large-signal pulse and small-signal RF measurements reveal a simple structure to the otherwise complicated dynamic behavior of the FETs. A simple model demonstrates how heating, impact ionization, and leakage currents can contribute to this behavior and that each has an effect in specific regions of bias and operating frequency. It is possible to identify operating conditions that will or will not be affected by dispersion with measurements over a wide range of frequencies from dc to microwave and a range of terminal potentials.
{"title":"Relating Dynamics of FET Behavior to Operating Regions","authors":"A. Parker, J. Rathmell","doi":"10.1109/ARFTG.2001.327499","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327499","url":null,"abstract":"Dispersion effects and the operating regions they effect are identified in a HEMT and a MESFET. Large-signal pulse and small-signal RF measurements reveal a simple structure to the otherwise complicated dynamic behavior of the FETs. A simple model demonstrates how heating, impact ionization, and leakage currents can contribute to this behavior and that each has an effect in specific regions of bias and operating frequency. It is possible to identify operating conditions that will or will not be affected by dispersion with measurements over a wide range of frequencies from dc to microwave and a range of terminal potentials.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121761940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327491
U. Arz, H. Reader, P. Kabos, Dylan F. Williams
We investigated the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
{"title":"Wideband Frequency-Domain Characterization of High-Impedance Probes","authors":"U. Arz, H. Reader, P. Kabos, Dylan F. Williams","doi":"10.1109/ARFTG.2001.327491","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327491","url":null,"abstract":"We investigated the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121796178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327503
A. Geens, Y. Rolain, W. van Moer
This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or threeport device is developed. Based on this model, the measurement technique - which is a generalisation of the methods developed for amplifiers - is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.
{"title":"Discussion on In-band Distortions of Mixers","authors":"A. Geens, Y. Rolain, W. van Moer","doi":"10.1109/ARFTG.2001.327503","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327503","url":null,"abstract":"This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or threeport device is developed. Based on this model, the measurement technique - which is a generalisation of the methods developed for amplifiers - is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129226658","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-11-01DOI: 10.1109/ARFTG.2001.327492
M. Spirito, P. Valk, R. Mahmoudi, M. deKok, J. Tauritz
A two-step method that avoids cumbersome and lengthy search procedures is described for efficiently calibrating automated load pull tuner systems. The calibration procedure is designed to ensure that the data points are homogeneously spread over the complete Smith chart covering all impedance conditions. The software package developed is adaptable to various types of automated tuners, is applicable to different measurement software systems e.g. Agilent VEE (Unix, Windows NT), Lab View, etc, and is useful in minimizing wear and tear on the tuners.
一个两步的方法，避免繁琐和冗长的搜索程序描述有效地校准自动负载拉动调谐器系统。校准程序旨在确保数据点均匀地分布在覆盖所有阻抗条件的完整史密斯图上。开发的软件包适用于各种类型的自动调谐器，适用于不同的测量软件系统，例如Agilent VEE (Unix, Windows NT)， Lab View等，并且有助于最大限度地减少调谐器的磨损。
{"title":"A Novel Method for Characterizing RF Automated Tuners","authors":"M. Spirito, P. Valk, R. Mahmoudi, M. deKok, J. Tauritz","doi":"10.1109/ARFTG.2001.327492","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327492","url":null,"abstract":"A two-step method that avoids cumbersome and lengthy search procedures is described for efficiently calibrating automated load pull tuner systems. The calibration procedure is designed to ensure that the data points are homogeneously spread over the complete Smith chart covering all impedance conditions. The software package developed is adaptable to various types of automated tuners, is applicable to different measurement software systems e.g. Agilent VEE (Unix, Windows NT), Lab View, etc, and is useful in minimizing wear and tear on the tuners.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131768822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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