Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810454
Lucas Matana Luza, F. Wrobel, L. Entrena, L. Dilillo
Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to their crucial role, memories and processors are the highest contributors to soft errors in systems, making them the best candidates for studying these effects. This work introduces the radiation environment in space and atmosphere and the main effects that the different types of ionizing particles that are present in these environments may produce on electronic devices. Furthermore, mainly focusing on Single-Event Effects (SEEs), it presents approaches and tools for modeling SEEs and their impact on memories and microprocessors. Additionally, experimental results targeting a Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented. These experiments are based on radiation test campaigns in particle accelerators with neutrons and protons. Finally, an overview of issues and mitigation techniques for microprocessors is exposed.
{"title":"Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices","authors":"Lucas Matana Luza, F. Wrobel, L. Entrena, L. Dilillo","doi":"10.1109/ETS54262.2022.9810454","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810454","url":null,"abstract":"Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to their crucial role, memories and processors are the highest contributors to soft errors in systems, making them the best candidates for studying these effects. This work introduces the radiation environment in space and atmosphere and the main effects that the different types of ionizing particles that are present in these environments may produce on electronic devices. Furthermore, mainly focusing on Single-Event Effects (SEEs), it presents approaches and tools for modeling SEEs and their impact on memories and microprocessors. Additionally, experimental results targeting a Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented. These experiments are based on radiation test campaigns in particle accelerators with neutrons and protons. Finally, an overview of issues and mitigation techniques for microprocessors is exposed.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121607908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810435
Andrew Dobis, Hans Jakob Damsgaard, Enrico Tolotto, K. Hesse, Tjark Petersen, Martin Schoeberl
Ever-increasing performance demands are pushing hardware designers towards designing domain-specific accelerators. This has created a demand for improving the overall efficiency of the hardware design and verification cycles. The design efficiency was improved with the introduction of Chisel. However, verification efficiency has yet to be tackled. One method that can increase verification efficiency is the use of various types of coverage measures. In this paper, we present our open-source, coverage-related verification tools targeting digital designs described in Chisel. Specifically, we have created a new method allowing for statement coverage at an intermediate representation of Chisel, and several methods for gathering functional coverage directly on a Chisel description.
{"title":"Enabling Coverage-Based Verification in Chisel","authors":"Andrew Dobis, Hans Jakob Damsgaard, Enrico Tolotto, K. Hesse, Tjark Petersen, Martin Schoeberl","doi":"10.1109/ETS54262.2022.9810435","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810435","url":null,"abstract":"Ever-increasing performance demands are pushing hardware designers towards designing domain-specific accelerators. This has created a demand for improving the overall efficiency of the hardware design and verification cycles. The design efficiency was improved with the introduction of Chisel. However, verification efficiency has yet to be tackled. One method that can increase verification efficiency is the use of various types of coverage measures. In this paper, we present our open-source, coverage-related verification tools targeting digital designs described in Chisel. Specifically, we have created a new method allowing for statement coverage at an intermediate representation of Chisel, and several methods for gathering functional coverage directly on a Chisel description.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121738274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810388
F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, Ulf Schlichtmann, Giovanni Squillero, M. Reorda, L. Sterpone, V. Tancorre, R. Ugioli
This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.
{"title":"Test, Reliability and Functional Safety Trends for Automotive System-on-Chip","authors":"F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, Ulf Schlichtmann, Giovanni Squillero, M. Reorda, L. Sterpone, V. Tancorre, R. Ugioli","doi":"10.1109/ETS54262.2022.9810388","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810388","url":null,"abstract":"This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116889738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810460
Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Subidh Ali
The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments, which are included on the chip for test, post-silicon debug, in field maintenance, and diagnosis purposes. Although the on-chip instruments access provides data and features explicitly for test and debug, these features are misused by the malicious user to access sensitive data such as encryption keys, Chip-IDs, etc. Hence, it is desired to limit the access to sensitive on-chip instruments via IJT AG network. One of the various schemes proposed to mitigate the vulnerability of the IJT AG network is to use a secure access protocol, which is based on LSIB, Chip-ID, and licensed access software.In this paper, the detailed security analysis is performed on IJT AG, it is shown that the secure access protocol technique is vulnerable to differential analysis attack. It can be used to break the secure communication between the board and the licensed access software and thus, the sensitive on-chip test instruments can be accessed illegitimately. It is shown that our proposed algorithm can recover the template used for secure communication within a fraction of a second.
{"title":"Evaluating Security of New Locking SIB-based Architectures","authors":"Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Subidh Ali","doi":"10.1109/ETS54262.2022.9810460","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810460","url":null,"abstract":"The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments, which are included on the chip for test, post-silicon debug, in field maintenance, and diagnosis purposes. Although the on-chip instruments access provides data and features explicitly for test and debug, these features are misused by the malicious user to access sensitive data such as encryption keys, Chip-IDs, etc. Hence, it is desired to limit the access to sensitive on-chip instruments via IJT AG network. One of the various schemes proposed to mitigate the vulnerability of the IJT AG network is to use a secure access protocol, which is based on LSIB, Chip-ID, and licensed access software.In this paper, the detailed security analysis is performed on IJT AG, it is shown that the secure access protocol technique is vulnerable to differential analysis attack. It can be used to break the secure communication between the board and the licensed access software and thus, the sensitive on-chip test instruments can be accessed illegitimately. It is shown that our proposed algorithm can recover the template used for secure communication within a fraction of a second.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115857131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ets54262.2022.9810371
{"title":"SiGe BiCMOS Technology with Advanced Integration Solutions for for mm-wave and THz Applications","authors":"","doi":"10.1109/ets54262.2022.9810371","DOIUrl":"https://doi.org/10.1109/ets54262.2022.9810371","url":null,"abstract":"","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"53 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130299899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810455
A. Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, R. Weigel
In this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-area-network devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable IC-production test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.
{"title":"Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices","authors":"A. Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, R. Weigel","doi":"10.1109/ETS54262.2022.9810455","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810455","url":null,"abstract":"In this paper, we introduce a novel design for test (DFT) concept to check the compliance of wireless-body-area-network devices for medical applications with the spectral mask for IR-UWB and FM-UWB defined in chapter 9.13 of the IEEE Std. 802.15.6-2012. The design enables a fast and repeatable IC-production test solution for medium to high volume testing, which is independent of the tester type and does not need any extra circuitry on a test board / device interface board.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129917124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810424
Gyohun Jeong, Sangmin Kim, Hye-Rin Kim, S. Lee
In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.
{"title":"A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage","authors":"Gyohun Jeong, Sangmin Kim, Hye-Rin Kim, S. Lee","doi":"10.1109/ETS54262.2022.9810424","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810424","url":null,"abstract":"In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"379 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124729969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-23DOI: 10.1109/ETS54262.2022.9810418
Sergio Vinagrero Gutierrez, G. D. Natale, E. Vatajelu
In this paper we propose an on-line test methodology for RO-PUF reliability which enables high accuracy in the results since it is not based on predictive simplified models of the device variability and noise, but on actual technological electrical models and high versatility since it is not based on measurements extracted from a single technology.
{"title":"On-Line Reliability Estimation of Ring Oscillator PUF","authors":"Sergio Vinagrero Gutierrez, G. D. Natale, E. Vatajelu","doi":"10.1109/ETS54262.2022.9810418","DOIUrl":"https://doi.org/10.1109/ETS54262.2022.9810418","url":null,"abstract":"In this paper we propose an on-line test methodology for RO-PUF reliability which enables high accuracy in the results since it is not based on predictive simplified models of the device variability and noise, but on actual technological electrical models and high versatility since it is not based on measurements extracted from a single technology.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123823998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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