Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357392
K. Chung, H.D. Jung, J. Park, Y. Hwang
A compact cylindrical neutron generator using RF (radio-frequency) inductively-coupled plasma has been developed in radially convergent ion beam extraction configuration. Since the RF plasma source has characteristics of high plasma density, low gas pressure, high mono-atomic fraction, and long lifetime, it is known to be suitable for generating high neutron yield with high efficiency. In order to increase neutron yield, the energy and the number of incident particles should be as large as possible. Since the cylindrical source can be operated as a line source configuration the extracted beam current can be increased easily. In this paper, experimental results with the cylindrical neutron generator are given and the operating characteristics of the device are discussed to improve neutron generation efficiency
{"title":"Development of a Cylindrical Neutron Generator using RF-driven Plasma","authors":"K. Chung, H.D. Jung, J. Park, Y. Hwang","doi":"10.1109/DEIV.2006.357392","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357392","url":null,"abstract":"A compact cylindrical neutron generator using RF (radio-frequency) inductively-coupled plasma has been developed in radially convergent ion beam extraction configuration. Since the RF plasma source has characteristics of high plasma density, low gas pressure, high mono-atomic fraction, and long lifetime, it is known to be suitable for generating high neutron yield with high efficiency. In order to increase neutron yield, the energy and the number of incident particles should be as large as possible. Since the cylindrical source can be operated as a line source configuration the extracted beam current can be increased easily. In this paper, experimental results with the cylindrical neutron generator are given and the operating characteristics of the device are discussed to improve neutron generation efficiency","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129490003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357387
A. Fukamachi, M. Watanabe, A. Okino, K. Ko, E. Hotta
Non-thermal plasma technologies using electrical discharges or electron beam irradiation offer an energy- and cost-efficient approach to the decomposition of gaseous compounds. We have developed a low-energy secondary emission electron gun (SEEG) using wire ion plasma source (WIPS) for gaseous pollutant treatment. The devise has some inherent advantages such as compact in size, wide and uniform electron beam. In this work, divergence of electron beam energy was measured and NO removal characteristics have been studied under increasing gun voltage and changing dimension of gas treatment chamber. It has been observed that the smaller chamber gives better removal efficiency of NO and we are trying to apply this device to VOC treatment
{"title":"Application of low-energy secondary emission electron gun for VOC treatment","authors":"A. Fukamachi, M. Watanabe, A. Okino, K. Ko, E. Hotta","doi":"10.1109/DEIV.2006.357387","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357387","url":null,"abstract":"Non-thermal plasma technologies using electrical discharges or electron beam irradiation offer an energy- and cost-efficient approach to the decomposition of gaseous compounds. We have developed a low-energy secondary emission electron gun (SEEG) using wire ion plasma source (WIPS) for gaseous pollutant treatment. The devise has some inherent advantages such as compact in size, wide and uniform electron beam. In this work, divergence of electron beam energy was measured and NO removal characteristics have been studied under increasing gun voltage and changing dimension of gas treatment chamber. It has been observed that the smaller chamber gives better removal efficiency of NO and we are trying to apply this device to VOC treatment","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129935563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357277
Fan Xing-ming, Qiu Hong-hui, Liao Min-fu, Zou Ji-yan
During synthetic making test a high speed making device is necessary to connect the switching device under test immediately after pre-strike during closing operation under applied voltage. A new kind of fast making device is emphatically expounded in this research, which is composed of triggered vacuum switch (TVS) and a fast vacuum circuit breaker (FVCB) with permanent magnetic actuator. Parallel-connected TVS and FVCB make up the basic optic-controlled module. And basic modules arranging in series can be increase the hold-off (withstand) voltage. When the closing command is triggered, TVS acts in several microseconds and carries the high making current first FVCB acts as the parallel protecting device for TVS, its closing command is sent simultaneously with TVS. Once FVCB closed the making current will shift to this branch, the erosion in TVS can be remarkably decreased. In this paper, a theoretical analysis is made and typical result is simulated with the power system simulation software EMTDC/PSCAD. The simulation result is similar to the experiment one. From the experiment and theoretical result it is known that the new kind of fast making device is feasible for synthetic making test of high voltage circuit breakers
{"title":"Verification of a Fast Making Switch Based on Triggered Vacuum Switch and Vacuum Circuit Breaker","authors":"Fan Xing-ming, Qiu Hong-hui, Liao Min-fu, Zou Ji-yan","doi":"10.1109/DEIV.2006.357277","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357277","url":null,"abstract":"During synthetic making test a high speed making device is necessary to connect the switching device under test immediately after pre-strike during closing operation under applied voltage. A new kind of fast making device is emphatically expounded in this research, which is composed of triggered vacuum switch (TVS) and a fast vacuum circuit breaker (FVCB) with permanent magnetic actuator. Parallel-connected TVS and FVCB make up the basic optic-controlled module. And basic modules arranging in series can be increase the hold-off (withstand) voltage. When the closing command is triggered, TVS acts in several microseconds and carries the high making current first FVCB acts as the parallel protecting device for TVS, its closing command is sent simultaneously with TVS. Once FVCB closed the making current will shift to this branch, the erosion in TVS can be remarkably decreased. In this paper, a theoretical analysis is made and typical result is simulated with the power system simulation software EMTDC/PSCAD. The simulation result is similar to the experiment one. From the experiment and theoretical result it is known that the new kind of fast making device is feasible for synthetic making test of high voltage circuit breakers","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125279912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357336
R. Parashar, A. Baker, A. Sitzia
Vacuum interrupters form the key component of a medium voltage (MV) vacuum switchgear design. Vacuum interrupter technology is now well established and key manufacturers across the world are routinely producing interrupters for ratings up to 52kVrms. Manufacturers have focused on reducing the cost of interrupter components by adapting to more efficient contact geometry, improved contact materials, finite element modelling for improved field distribution and new processing techniques. However, these methods are now such that further cost reductions are becoming difficult. This may become a driving force to improve design capability with further scope for cost reductions. For example, in the low voltage (LV) sector (< lkV) vacuum interrupters are available at costs that are much higher than air break switches. Similarly, in the high voltage (HV) sector (52kV les Ur les 145kV) no efficient and cost effective designs are available, and in addition, radiation related safety concerns must be considered. This paper explores the existing switchgear portfolio in LV, MV and HV segments, corresponding demand and emerging market needs for vacuum interrupters and explores areas where the technology needs to be developed and new products brought to market
{"title":"Challenges For Vacuum Interrupter Design","authors":"R. Parashar, A. Baker, A. Sitzia","doi":"10.1109/DEIV.2006.357336","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357336","url":null,"abstract":"Vacuum interrupters form the key component of a medium voltage (MV) vacuum switchgear design. Vacuum interrupter technology is now well established and key manufacturers across the world are routinely producing interrupters for ratings up to 52kVrms. Manufacturers have focused on reducing the cost of interrupter components by adapting to more efficient contact geometry, improved contact materials, finite element modelling for improved field distribution and new processing techniques. However, these methods are now such that further cost reductions are becoming difficult. This may become a driving force to improve design capability with further scope for cost reductions. For example, in the low voltage (LV) sector (< lkV) vacuum interrupters are available at costs that are much higher than air break switches. Similarly, in the high voltage (HV) sector (52kV les Ur les 145kV) no efficient and cost effective designs are available, and in addition, radiation related safety concerns must be considered. This paper explores the existing switchgear portfolio in LV, MV and HV segments, corresponding demand and emerging market needs for vacuum interrupters and explores areas where the technology needs to be developed and new products brought to market","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125894766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357216
G. Sandolache, S. Rowe
The presence of molten metal on the surface of the electrodes of vacuum circuit breakers, following the interruption of high currents, is a potential source of reduction of breakdown strength. The authors thus devised special experiments to study this effect by separating the roles of the presence of the metal vapour from that of the presence of a molten metal. The experiments also separate the pure dielectric effect from that of the post arc plasma sheath and its dynamic movement, under the influence of the transient recovery voltage, TRV. The results show clearly the large reduction of breakdown voltage which can occur in under these circumstances. These results allow an improved understanding of the physical mechanisms taking place under the transient plasma sheath during the TRV
{"title":"Vacuum Breakdown between Molten Metal Electrodes","authors":"G. Sandolache, S. Rowe","doi":"10.1109/DEIV.2006.357216","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357216","url":null,"abstract":"The presence of molten metal on the surface of the electrodes of vacuum circuit breakers, following the interruption of high currents, is a potential source of reduction of breakdown strength. The authors thus devised special experiments to study this effect by separating the roles of the presence of the metal vapour from that of the presence of a molten metal. The experiments also separate the pure dielectric effect from that of the post arc plasma sheath and its dynamic movement, under the influence of the transient recovery voltage, TRV. The results show clearly the large reduction of breakdown voltage which can occur in under these circumstances. These results allow an improved understanding of the physical mechanisms taking place under the transient plasma sheath during the TRV","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114370553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357265
Danshuheng, Tang Xinlong, Wang Dezhong, Zhupingyuan
The ultra high voltage transmission lines rated 1000kV will be the effective and practical strategy for the interconnection of the national wide power grid in China. In order to test the equipment with ultra high voltage the synthesis circuit which uses voltage and current source to work together will be adopted because of the lower test cost. The very important device which will determine and influence the validity of the synthesis circuit test will be introduced and designed in this paper. The voltage is high so the gap in air will be very long to sustain such high voltage even in vacuum the gap will also be long enough. Long gap is not easy to be influenced by the tripping signal. The simulation test is carried out with air gaps in series. The function of the tripping signal on the breakdown of the gaps is tested. The minimum breakdown voltage is tested and compared between the same gap with and without tripping signal. The relationship of the voltage smaller than the minimum breakdown voltage and the breakdown time is also tested. The test result proves that tripping signal can control the breakdown time of the gaps in series, which will be true for the long vacuum gaps in series. Furthermore the tripped vacuum gaps in series rated 500kV with 3.8m long is designed
{"title":"The ultra high voltage device with vacuum insulation","authors":"Danshuheng, Tang Xinlong, Wang Dezhong, Zhupingyuan","doi":"10.1109/DEIV.2006.357265","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357265","url":null,"abstract":"The ultra high voltage transmission lines rated 1000kV will be the effective and practical strategy for the interconnection of the national wide power grid in China. In order to test the equipment with ultra high voltage the synthesis circuit which uses voltage and current source to work together will be adopted because of the lower test cost. The very important device which will determine and influence the validity of the synthesis circuit test will be introduced and designed in this paper. The voltage is high so the gap in air will be very long to sustain such high voltage even in vacuum the gap will also be long enough. Long gap is not easy to be influenced by the tripping signal. The simulation test is carried out with air gaps in series. The function of the tripping signal on the breakdown of the gaps is tested. The minimum breakdown voltage is tested and compared between the same gap with and without tripping signal. The relationship of the voltage smaller than the minimum breakdown voltage and the breakdown time is also tested. The test result proves that tripping signal can control the breakdown time of the gaps in series, which will be true for the long vacuum gaps in series. Furthermore the tripped vacuum gaps in series rated 500kV with 3.8m long is designed","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121820596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357226
K. Nitta, S. Matsuoka, M. Chiba, K. Hidaka
This paper studies the discharge development in a micro gap between metal materials in air experimentally and analytically. As a high voltage side electrode is stressed by different voltages at a fixed gap length with UV irradiation, the electrical breakdown voltage is measured as a function of the time lag. The measured time lag until the spark breakdown ranges from 10-1 to 10-4 s between 190 Torr and 760Torr. Using the measured time lag to the breakdown, the formative time lag to breakdown is obtained and the formative time lag to breakdown is calculated by gammai, gammap and gammam. The calculation results of the formative time lag agree with the experiment results. The obtained values of gamma i, gammap and gammam are applied to the estimate the formative time lag to breakdown at various pressures, from 190 Torr to 760 Torr, between metal electrodes in a uniform electric field
{"title":"Formative Time Lag to Breakdown in Micro Gap at Low Atmospheric Pressure","authors":"K. Nitta, S. Matsuoka, M. Chiba, K. Hidaka","doi":"10.1109/DEIV.2006.357226","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357226","url":null,"abstract":"This paper studies the discharge development in a micro gap between metal materials in air experimentally and analytically. As a high voltage side electrode is stressed by different voltages at a fixed gap length with UV irradiation, the electrical breakdown voltage is measured as a function of the time lag. The measured time lag until the spark breakdown ranges from 10-1 to 10-4 s between 190 Torr and 760Torr. Using the measured time lag to the breakdown, the formative time lag to breakdown is obtained and the formative time lag to breakdown is calculated by gammai, gammap and gammam. The calculation results of the formative time lag agree with the experiment results. The obtained values of gamma i, gammap and gammam are applied to the estimate the formative time lag to breakdown at various pressures, from 190 Torr to 760 Torr, between metal electrodes in a uniform electric field","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130048999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357383
T. Takamatsu, T. Oishi, K. Masuda, K. Yoshikawa
An inertial electrostatic confinement (IEC) device is studied for a compact fusion neutron/proton source using a magnetron discharge as an external ion source. The addition of ion sources to the IEC device is to enhance the efficiency of fusion reactions by lowering the operating gas pressure and by providing high energetic ion. Doppler shift spectroscopy was carried out to evaluate an improvement of the IEC. It was found that mean energy of fast neutral was increased by 20-50 % in this IEC, as compared to conventional glow-discharge-based IEC
{"title":"Improvement of Inertial Electrostatic Confinement Device by Lowed Operating Gas Pressure using Magnetron-Discharge-Based Ion Source","authors":"T. Takamatsu, T. Oishi, K. Masuda, K. Yoshikawa","doi":"10.1109/DEIV.2006.357383","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357383","url":null,"abstract":"An inertial electrostatic confinement (IEC) device is studied for a compact fusion neutron/proton source using a magnetron discharge as an external ion source. The addition of ion sources to the IEC device is to enhance the efficiency of fusion reactions by lowering the operating gas pressure and by providing high energetic ion. Doppler shift spectroscopy was carried out to evaluate an improvement of the IEC. It was found that mean energy of fast neutral was increased by 20-50 % in this IEC, as compared to conventional glow-discharge-based IEC","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126915003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357375
M. Okamoto, K. Koyama, H. Kurokawa, H. Motomura, M. Jinno
The fluorescent lamps are widely used for general lighting because of their high efficacy, long life and so forth. Mercury which is used in fluorescent lamps for general lighting has a possibility to cause environmental problems. The author's group has been developing fluorescent lamps which contain only rare gases without mercury. The wavelength of the xenon resonance line is the longest in the rare-gas resonance lines, so that the Stokes-loss becomes smaller than the other rare-gases' cases. Therefore the authors have investigated pulsed xenon fluorescent lamps. However luminous flux of xenon fluorescent lamps was not large enough. The authors have been making efforts to improve luminous flux of the xenon lamp by expanding positive column. By setting an auxiliary external electrode on the outside wall of the lamp, positive column expands and luminous flux increases. However luminous efficacy decreases because power consumption through the external electrode is too large. So by using resistor, the current flowing through the external electrode is suppressed and power consumption decreased. Consequently higher luminous efficacy up to 100 lm/W with high luminance 6894 cd/m2 is achieved
{"title":"The Effect of an Auxiliary External Electrode on Low-pressure Xenon Pulsed Discharge","authors":"M. Okamoto, K. Koyama, H. Kurokawa, H. Motomura, M. Jinno","doi":"10.1109/DEIV.2006.357375","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357375","url":null,"abstract":"The fluorescent lamps are widely used for general lighting because of their high efficacy, long life and so forth. Mercury which is used in fluorescent lamps for general lighting has a possibility to cause environmental problems. The author's group has been developing fluorescent lamps which contain only rare gases without mercury. The wavelength of the xenon resonance line is the longest in the rare-gas resonance lines, so that the Stokes-loss becomes smaller than the other rare-gases' cases. Therefore the authors have investigated pulsed xenon fluorescent lamps. However luminous flux of xenon fluorescent lamps was not large enough. The authors have been making efforts to improve luminous flux of the xenon lamp by expanding positive column. By setting an auxiliary external electrode on the outside wall of the lamp, positive column expands and luminous flux increases. However luminous efficacy decreases because power consumption through the external electrode is too large. So by using resistor, the current flowing through the external electrode is suppressed and power consumption decreased. Consequently higher luminous efficacy up to 100 lm/W with high luminance 6894 cd/m2 is achieved","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127813609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-09-01DOI: 10.1109/DEIV.2006.357346
Yundong Cao, Feng Li, Xiaoming Liu, Chunguang Hou
An intelligent releaser with embedded network control function is introduced. And the field bus technology, embedded technology, Ethernet technology and intelligent protection control technology are integrated and applied to the actual products. Based on the front edge of the world's intelligent electric appliance, the mining vacuum circuit breaker (VCB) of low voltage and large current, which has protective and communication function, has been developed. Moreover, the intelligent protection and control function, network communication and monitor function are implemented by adding the intelligent control module and adopting embedded system and TCP/IP protocol. The system covers the main functions, such as, the protection of short circuit, over-voltage, under voltage, overload and earthing, the real-time communication between Ethernet and terminal computer, the display about the current and voltage of circuit and faults information, the historical data review and print. In order to increase the efficiency, realize the monitoring on-line for remote distance, the intelligent VCB based on the network, communication, openness and compatibility has been developed
{"title":"Research on Intelligent Vacuum Circuit Breaker Controller based on Embedded Network Control System","authors":"Yundong Cao, Feng Li, Xiaoming Liu, Chunguang Hou","doi":"10.1109/DEIV.2006.357346","DOIUrl":"https://doi.org/10.1109/DEIV.2006.357346","url":null,"abstract":"An intelligent releaser with embedded network control function is introduced. And the field bus technology, embedded technology, Ethernet technology and intelligent protection control technology are integrated and applied to the actual products. Based on the front edge of the world's intelligent electric appliance, the mining vacuum circuit breaker (VCB) of low voltage and large current, which has protective and communication function, has been developed. Moreover, the intelligent protection and control function, network communication and monitor function are implemented by adding the intelligent control module and adopting embedded system and TCP/IP protocol. The system covers the main functions, such as, the protection of short circuit, over-voltage, under voltage, overload and earthing, the real-time communication between Ethernet and terminal computer, the display about the current and voltage of circuit and faults information, the historical data review and print. In order to increase the efficiency, realize the monitoring on-line for remote distance, the intelligent VCB based on the network, communication, openness and compatibility has been developed","PeriodicalId":369861,"journal":{"name":"2006 International Symposium on Discharges and Electrical Insulation in Vacuum","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131329639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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