Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396852
M. Kowal, S. Kubal, R. Zielinski
The paper presents a shielding effectiveness measuring procedure for the large dimensions textile materials in an anechoic chamber. The construction of the set-up partially based on IEEE Std 299-2006 document. This construction was described as well as measuring method and analysis of collected data. Also some examples of the measurement results were presented.
{"title":"Measuring the shielding effectiveness of large textile materials in an anechoic chamber","authors":"M. Kowal, S. Kubal, R. Zielinski","doi":"10.1109/EMCEUROPE.2012.6396852","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396852","url":null,"abstract":"The paper presents a shielding effectiveness measuring procedure for the large dimensions textile materials in an anechoic chamber. The construction of the set-up partially based on IEEE Std 299-2006 document. This construction was described as well as measuring method and analysis of collected data. Also some examples of the measurement results were presented.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133266419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396765
D. Cottet, I. Stevanovic, B. Wunsch, D. Daroui, J. Ekman, G. Antonini
This paper presents recent progress in the acceleration of PEEC based electromagnetic simulations and its impact on the design of complex bus bar structures as used in multilevel power converters. The approach presented consists of different dedicated acceleration methods for the different design tasks. The first acceleration technique applied is the so called reluctance matrix method for full 3D field results, reducing memory consumption by orders of magnitude and computing time by a factor 3 to 5. The second acceleration method applied is based on model order reduction techniques for port-to-port impedance extraction, reducing the computation time by about one order of magnitude and allowing wideband macro modeling for system level simulations. The paper focuses on the application of these methods showing the impact on practical bus bar design tasks.
{"title":"EM simulation of planar bus bars in multi-level power converters","authors":"D. Cottet, I. Stevanovic, B. Wunsch, D. Daroui, J. Ekman, G. Antonini","doi":"10.1109/EMCEUROPE.2012.6396765","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396765","url":null,"abstract":"This paper presents recent progress in the acceleration of PEEC based electromagnetic simulations and its impact on the design of complex bus bar structures as used in multilevel power converters. The approach presented consists of different dedicated acceleration methods for the different design tasks. The first acceleration technique applied is the so called reluctance matrix method for full 3D field results, reducing memory consumption by orders of magnitude and computing time by a factor 3 to 5. The second acceleration method applied is based on model order reduction techniques for port-to-port impedance extraction, reducing the computation time by about one order of magnitude and allowing wideband macro modeling for system level simulations. The paper focuses on the application of these methods showing the impact on practical bus bar design tasks.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133460000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396877
Reinhart Heinrich, R. Bechly, B. Deutschmann
Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.
{"title":"Radiated immunity testing of integrated circuits in reverberation chambers","authors":"Reinhart Heinrich, R. Bechly, B. Deutschmann","doi":"10.1109/EMCEUROPE.2012.6396877","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396877","url":null,"abstract":"Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122366099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396704
S. Bertuol, M. Ridel, J. Parmantier, L. Pisu, M. Bozzetti, A. Francavilla, M. Righero, F. Vipiana, S. Arianos, G. Vecchi
This paper presents a comprehensive application of the Field-to-TL approach implemented through a computer framework designed to facilitate data exchange among different computational tools. The framework is used also to compare results from different codes, specifically MDD (Multilevel Domain Differentiate) and CRIPTE, thus providing a validation test case for both of them. Furthermore, the comparison with measurements gives an idea of the degree of accuracy obtained with such an operating approach.
{"title":"Field to transmission line coupling: A test case within HIRF SE","authors":"S. Bertuol, M. Ridel, J. Parmantier, L. Pisu, M. Bozzetti, A. Francavilla, M. Righero, F. Vipiana, S. Arianos, G. Vecchi","doi":"10.1109/EMCEUROPE.2012.6396704","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396704","url":null,"abstract":"This paper presents a comprehensive application of the Field-to-TL approach implemented through a computer framework designed to facilitate data exchange among different computational tools. The framework is used also to compare results from different codes, specifically MDD (Multilevel Domain Differentiate) and CRIPTE, thus providing a validation test case for both of them. Furthermore, the comparison with measurements gives an idea of the degree of accuracy obtained with such an operating approach.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123893222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396675
F. Xiao, T. Takatsu, K. Murano, Y. Kami
In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which confirmed the validity of the proposed measurement system.
{"title":"Complex near electromagnetic field scanning on printed circuit board","authors":"F. Xiao, T. Takatsu, K. Murano, Y. Kami","doi":"10.1109/EMCEUROPE.2012.6396675","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396675","url":null,"abstract":"In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which confirmed the validity of the proposed measurement system.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127650526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396771
R. Smoleński, A. Kempski, J. Bojarski, P. Lezynski
Presented in this paper are the specific conducted EMI related issues accompanying the application of Power Electronic Interfaces (PEI) in Smart Grids such as the flow of EMI currents in extensive circuits and aggregation of the interferences introduced. Compensation of the voltage interference sources inside of the converters has been recommended as suitable side effects mitigating technique.
{"title":"EMI generated by Power Electronic Interfaces in Smart Grids","authors":"R. Smoleński, A. Kempski, J. Bojarski, P. Lezynski","doi":"10.1109/EMCEUROPE.2012.6396771","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396771","url":null,"abstract":"Presented in this paper are the specific conducted EMI related issues accompanying the application of Power Electronic Interfaces (PEI) in Smart Grids such as the flow of EMI currents in extensive circuits and aggregation of the interferences introduced. Compensation of the voltage interference sources inside of the converters has been recommended as suitable side effects mitigating technique.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129320224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396883
A. Di Carlofelice, E. Di Giampaolo, P. Tognolatti
A numerical investigation of the electromagnetic pollution produced inside a model of a module of the International Space Station (ISS) by a radar UWB is shown. In particular, the work investigates possible narrowband interference and the level of the background noise introduced by an UWB radar because these phenomena may decrease the QoS of existing wireless networks and apparatus. This study is part of the project “Non Invasive Monitoring by Ultra wide band Radar of Respiratory Activity of people inside a spatial environment” (NIMURRA) which refers to a feasibility study of a ultra wide band (UWB) radar applied to the breath activity monitoring of astronauts.
{"title":"A numerical investigation of UWB wave propagation inside a module of the International Space Station","authors":"A. Di Carlofelice, E. Di Giampaolo, P. Tognolatti","doi":"10.1109/EMCEUROPE.2012.6396883","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396883","url":null,"abstract":"A numerical investigation of the electromagnetic pollution produced inside a model of a module of the International Space Station (ISS) by a radar UWB is shown. In particular, the work investigates possible narrowband interference and the level of the background noise introduced by an UWB radar because these phenomena may decrease the QoS of existing wireless networks and apparatus. This study is part of the project “Non Invasive Monitoring by Ultra wide band Radar of Respiratory Activity of people inside a spatial environment” (NIMURRA) which refers to a feasibility study of a ultra wide band (UWB) radar applied to the breath activity monitoring of astronauts.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128657523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396679
J. L. Silveira, A. Raizer, F. Nyland, L. Pichon
Validating measurements of electromagnetic field in near-field zone is a general target in research within electromagnetism area. This paper aims to present the results obtained from measurements and simulations of near-fields generated by a stand-alone electronic device. Measurements were performed in an anechoic chamber using probes connected by optical fibers as well as simulations using commercial software and own codes based on TLM-TD method.
{"title":"Near-fields: Numerical modeling and experimental validation in embedded electronic systems","authors":"J. L. Silveira, A. Raizer, F. Nyland, L. Pichon","doi":"10.1109/EMCEUROPE.2012.6396679","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396679","url":null,"abstract":"Validating measurements of electromagnetic field in near-field zone is a general target in research within electromagnetism area. This paper aims to present the results obtained from measurements and simulations of near-fields generated by a stand-alone electronic device. Measurements were performed in an anechoic chamber using probes connected by optical fibers as well as simulations using commercial software and own codes based on TLM-TD method.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128684232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396856
Xiang Chen, Yong-guang Chen
In order to remedy the deficiencies of time-domain test methods of shielding effectiveness (SE) of materials in common use, a method called windowed semi-anechoic box is used for time-domain test of the SE of materials. The impact of such factors on test results as the position of test points, box size, window size, thickness and conductivity of materials, etc., is analyzed in frequency-domain. The impact of the position of test point on peak ratio SE and the ratio of electromagnetic pulse (EMP) rise time unloaded and loaded materials against different rise time of EMP is analyzed in time-domain, in order to get some recommendations for the use of the method of windowed semi-anechoic box. The results show that the method of windowed semi-anechoic box can be used to distinguish the shielding performance of different materials for each frequency component and to evaluate the overall protection performance of materials against EMP.
{"title":"Time-domain test for material electromagnetic pulse shielding effectiveness based on shielding black-box windows method","authors":"Xiang Chen, Yong-guang Chen","doi":"10.1109/EMCEUROPE.2012.6396856","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396856","url":null,"abstract":"In order to remedy the deficiencies of time-domain test methods of shielding effectiveness (SE) of materials in common use, a method called windowed semi-anechoic box is used for time-domain test of the SE of materials. The impact of such factors on test results as the position of test points, box size, window size, thickness and conductivity of materials, etc., is analyzed in frequency-domain. The impact of the position of test point on peak ratio SE and the ratio of electromagnetic pulse (EMP) rise time unloaded and loaded materials against different rise time of EMP is analyzed in time-domain, in order to get some recommendations for the use of the method of windowed semi-anechoic box. The results show that the method of windowed semi-anechoic box can be used to distinguish the shielding performance of different materials for each frequency component and to evaluate the overall protection performance of materials against EMP.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114750965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396789
S. Linder, K. Fors, K. Wiklundh, P. Stenumgaard
In this paper a method for calculating the impact of intersystem interference between frequency hopping systems is proposed. The results are given in form of the average bit error probability over all frequencies used by the system. The method includes both the transmitter spectrum with sidebands and the receiver selectivity with sidebands. Furthermore, the effects from partially overlapping frequency hopping bands are included in the model. A strength of the model is that it can be generalized to an arbitrary number of interfering frequency hopping systems. Moreover, in addition to frequency hopping systems, interference on a fix frequency from different kinds of systems can also be included. If measured interference spectra, for example from a computer or a background, are available they can be incorporated in the calculations as well. Results from using the model show that it is important to use correct models of both the transmitter spectrum and receiver sidebands. If the effects from transmitter sidebands and/or receiver selectivity is neglected the resulting bit error probability can be severely underestimated.
{"title":"Intersystem interference model for frequency hopping systems","authors":"S. Linder, K. Fors, K. Wiklundh, P. Stenumgaard","doi":"10.1109/EMCEUROPE.2012.6396789","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396789","url":null,"abstract":"In this paper a method for calculating the impact of intersystem interference between frequency hopping systems is proposed. The results are given in form of the average bit error probability over all frequencies used by the system. The method includes both the transmitter spectrum with sidebands and the receiver selectivity with sidebands. Furthermore, the effects from partially overlapping frequency hopping bands are included in the model. A strength of the model is that it can be generalized to an arbitrary number of interfering frequency hopping systems. Moreover, in addition to frequency hopping systems, interference on a fix frequency from different kinds of systems can also be included. If measured interference spectra, for example from a computer or a background, are available they can be incorporated in the calculations as well. Results from using the model show that it is important to use correct models of both the transmitter spectrum and receiver sidebands. If the effects from transmitter sidebands and/or receiver selectivity is neglected the resulting bit error probability can be severely underestimated.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114872672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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