Two methods for determining a realistic maximum operating frequency for TTL gates are developed. Both methods involve using propagation delay times and redefining them to valid TTL levels. The first method is a rigorous treatment of the subject, while the second is an easy-to-use rule of thumb. The exponential-linear method, which is extensively discussed, is slightly conservative. No devices tested during this study would have failed due to the maximum operating frequency (f/sub MAX/) computed using this technique. The linear-linear technique is less conservative; several devices in this study would have failed to meet f/sub MAX/ requirements had this technique been used.<>
{"title":"Methods for determining a maximum operating frequency for TTL gates","authors":"R. Lewis, K.W. Awkward","doi":"10.1109/ARMS.1990.67986","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67986","url":null,"abstract":"Two methods for determining a realistic maximum operating frequency for TTL gates are developed. Both methods involve using propagation delay times and redefining them to valid TTL levels. The first method is a rigorous treatment of the subject, while the second is an easy-to-use rule of thumb. The exponential-linear method, which is extensively discussed, is slightly conservative. No devices tested during this study would have failed due to the maximum operating frequency (f/sub MAX/) computed using this technique. The linear-linear technique is less conservative; several devices in this study would have failed to meet f/sub MAX/ requirements had this technique been used.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132538820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Results of a research project recently concluded at the Danish Engineering Academy are presented. The scope of the research was to investigate the field-failure pattern of electronic systems of some complexity. The project included a close survey of 10000 to 15000 electronic systems in use in Denmark. A physically-explainable model is demonstrated where the device lifetimes are linked directly to the system failure pattern, without any restrictions on the device-lifetime distributions. This permits real-life components in the model. When the system failure data are known the model can be applied as an analysis tool, which makes it well suited for electronic systems; the reverse application is to use the model for improved reliability predictions based on realistic information about device-distributions.<>
{"title":"Field failures of electronic systems","authors":"L. Rimestad","doi":"10.1109/ARMS.1990.68014","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68014","url":null,"abstract":"Results of a research project recently concluded at the Danish Engineering Academy are presented. The scope of the research was to investigate the field-failure pattern of electronic systems of some complexity. The project included a close survey of 10000 to 15000 electronic systems in use in Denmark. A physically-explainable model is demonstrated where the device lifetimes are linked directly to the system failure pattern, without any restrictions on the device-lifetime distributions. This permits real-life components in the model. When the system failure data are known the model can be applied as an analysis tool, which makes it well suited for electronic systems; the reverse application is to use the model for improved reliability predictions based on realistic information about device-distributions.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131234727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The integration of product assurance engineering into the design process is discussed. A simple desktop approach that uses the design's indented bill of materials as its foundation is presented. The relational database structure presented supports typical reliability and maintainability analysis tasks. The author covers the indented bill of materials; reliability prediction (parts count technique); reliability prediction (stress-analysis technique conforming to MIL-HDBK-217E); failure mode, effects, and criticality analysis; maintainability prediction; and program parts selection list and generation of nonstandard part-approval requests.<>
{"title":"Desk-top computer database technique for integrated R&M analysis","authors":"M. Johnson","doi":"10.1109/ARMS.1990.68004","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68004","url":null,"abstract":"The integration of product assurance engineering into the design process is discussed. A simple desktop approach that uses the design's indented bill of materials as its foundation is presented. The relational database structure presented supports typical reliability and maintainability analysis tasks. The author covers the indented bill of materials; reliability prediction (parts count technique); reliability prediction (stress-analysis technique conforming to MIL-HDBK-217E); failure mode, effects, and criticality analysis; maintainability prediction; and program parts selection list and generation of nonstandard part-approval requests.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126402508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The system used to estimate expected cost of service coverages such as those included in the extended transmission coverage program (ETC) is described. The system simulates the life of each vehicle transmission model for a specific vocation using two components in series. The life of each is described by a two-parameter Weibull distribution. One of the components is given a wearout slope (greater than 1.0); the other is given a decreasing removal rate (a slope less than 1.0). Specific slopes and characteristic lives are determined by fitting data from a transmission analysis system (TRANS). Cost per removal, nonremoval cost, and mileage accumulation rate distributions are determined from warranty data. The required data files are online and are periodically updated. An interactive, menu-driven program has been written to aid the analyst in combining the appropriate distributions. The distribution of months between the date a unit is built and the date the end user puts it into service and the distribution of months between a repair and claim payment are also included in the system to permit a simulation of warranty and extended-coverage payout schedules. A reasonable degree of agreement has been demonstrated between these simulations and historic payout profiles.<>
{"title":"Extended service coverage cost predictions","authors":"D. E. Ellis","doi":"10.1109/ARMS.1990.67962","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67962","url":null,"abstract":"The system used to estimate expected cost of service coverages such as those included in the extended transmission coverage program (ETC) is described. The system simulates the life of each vehicle transmission model for a specific vocation using two components in series. The life of each is described by a two-parameter Weibull distribution. One of the components is given a wearout slope (greater than 1.0); the other is given a decreasing removal rate (a slope less than 1.0). Specific slopes and characteristic lives are determined by fitting data from a transmission analysis system (TRANS). Cost per removal, nonremoval cost, and mileage accumulation rate distributions are determined from warranty data. The required data files are online and are periodically updated. An interactive, menu-driven program has been written to aid the analyst in combining the appropriate distributions. The distribution of months between the date a unit is built and the date the end user puts it into service and the distribution of months between a repair and claim payment are also included in the system to permit a simulation of warranty and extended-coverage payout schedules. A reasonable degree of agreement has been demonstrated between these simulations and historic payout profiles.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"59 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126155743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The US Department of Defense's total quality management (TQM) campaign to support continuous process improvement is discussed. Reliability, maintainability, and producibility (RM&P) are discussed as key building blocks of TQM and continuous quality improvement of weapon systems. This relationship supports the strategic importance of R&M 2000 in the TQM movement and clearly supports the R&M 2000 goals. The strategic relationship of the R&M 2000 process is reviewed. To demonstrate the conceptual relationships defined by the R&M 2000 process and TQM, the R&M quality team concept is used. The R&M quality team concept is the first TQM initiative to support the R&M 2000 process. The concept has been successfully used in the design of the C-17A airlifter.<>
{"title":"R&M 2000 process: a cornerstone to the total quality movement","authors":"J. Guzzi","doi":"10.1109/ARMS.1990.67940","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67940","url":null,"abstract":"The US Department of Defense's total quality management (TQM) campaign to support continuous process improvement is discussed. Reliability, maintainability, and producibility (RM&P) are discussed as key building blocks of TQM and continuous quality improvement of weapon systems. This relationship supports the strategic importance of R&M 2000 in the TQM movement and clearly supports the R&M 2000 goals. The strategic relationship of the R&M 2000 process is reviewed. To demonstrate the conceptual relationships defined by the R&M 2000 process and TQM, the R&M quality team concept is used. The R&M quality team concept is the first TQM initiative to support the R&M 2000 process. The concept has been successfully used in the design of the C-17A airlifter.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116306361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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