A methodology is described for evaluating the logistical supportability of complex systems. Specifically, the supportability of the US Army's mobile subscriber equipment (MSE) is described. MSE is a good example of a complex military system which employs many continuity-of-operations (CONOPS) features, i.e. system networking, component redundancy, and functional bypass capabilities. The MSE supportability analysis determined that the additional procurement of specific spare parts could greatly increase MSE performance. The MSE analysis provided a means to increase the expected call-completion rate of the Army's primary corps and division common-user voice-communication system significantly. The increased cost associated with acquiring the additional spares was virtually negligible when compared to the MSE procurement cost.<>
{"title":"Analysis of logistic supportability for complex systems (military communications)","authors":"D. Mortin","doi":"10.1109/ARMS.1990.67965","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67965","url":null,"abstract":"A methodology is described for evaluating the logistical supportability of complex systems. Specifically, the supportability of the US Army's mobile subscriber equipment (MSE) is described. MSE is a good example of a complex military system which employs many continuity-of-operations (CONOPS) features, i.e. system networking, component redundancy, and functional bypass capabilities. The MSE supportability analysis determined that the additional procurement of specific spare parts could greatly increase MSE performance. The MSE analysis provided a means to increase the expected call-completion rate of the Army's primary corps and division common-user voice-communication system significantly. The increased cost associated with acquiring the additional spares was virtually negligible when compared to the MSE procurement cost.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130074398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In developing new failure rate models in MIL-HDBK-217E for microcircuits, the need for updated values of three failure-rate adjustment factors (pi-factors) became evident. These pi-factors are the quality factor, the environmental factor, and the learning factor. The logic, methodology, and results of the approach taken in developing these factors are addressed, and a discussion on how to use each pi-factor is provided. The pi-factors discussed are different from those presented in past revisions of MIL-HDBK-217 in that they have been derived from different sets of data from those used to develop the microcircuit models. They are generic to all microcircuits, are flexible and easy to use, and relate to physical attributes (such as device screening) or applicable military specifications.<>
{"title":"Pi factors revisited","authors":"R. Seidl, W. Garry","doi":"10.1109/ARMS.1990.67924","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67924","url":null,"abstract":"In developing new failure rate models in MIL-HDBK-217E for microcircuits, the need for updated values of three failure-rate adjustment factors (pi-factors) became evident. These pi-factors are the quality factor, the environmental factor, and the learning factor. The logic, methodology, and results of the approach taken in developing these factors are addressed, and a discussion on how to use each pi-factor is provided. The pi-factors discussed are different from those presented in past revisions of MIL-HDBK-217 in that they have been derived from different sets of data from those used to develop the microcircuit models. They are generic to all microcircuits, are flexible and easy to use, and relate to physical attributes (such as device screening) or applicable military specifications.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130163818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Several different alternatives are under consideration by the ANSI X3T9.5 committee for the implementation of a concentrator in a fiber distributed data interface (FDDI) ring. The alternatives differ in the number of MAC (medium access control) chips present in the concentrator. The three alternatives are compared by evaluating the availability of simple networks constructed with concentrators of each type. The analysis considers the variations in the failure rates introduced by the different alternatives as well as variations in other parameters such as repair times and coverage factors.<>
{"title":"An availability comparison of three concentrator alternatives in a fiber distributed data interface ring network","authors":"E. Cortes","doi":"10.1109/ARMS.1990.67953","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67953","url":null,"abstract":"Several different alternatives are under consideration by the ANSI X3T9.5 committee for the implementation of a concentrator in a fiber distributed data interface (FDDI) ring. The alternatives differ in the number of MAC (medium access control) chips present in the concentrator. The three alternatives are compared by evaluating the availability of simple networks constructed with concentrators of each type. The analysis considers the variations in the failure rates introduced by the different alternatives as well as variations in other parameters such as repair times and coverage factors.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121975642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Soft failure is defined in terms of event, and a definition of its repair is provided to clarify the nature of its recovery to a successful system performance are given. An analysis of some 30 failure modes with their taxonomy, classification, and causality is presented. A general reliability-modeling technique is proposed which permits the analyst to characterize the reliability solution based on the definition of soft failure. An example based on recent findings in the area of recovery-block schemes is presented.<>
{"title":"Soft failures and reliability","authors":"H. Chenoweth","doi":"10.1109/ARMS.1990.67995","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67995","url":null,"abstract":"Soft failure is defined in terms of event, and a definition of its repair is provided to clarify the nature of its recovery to a successful system performance are given. An analysis of some 30 failure modes with their taxonomy, classification, and causality is presented. A general reliability-modeling technique is proposed which permits the analyst to characterize the reliability solution based on the definition of soft failure. An example based on recent findings in the area of recovery-block schemes is presented.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125650982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A method for measuring the break rate (BR) of an individual avionics system is described. The method is convenient early in the design process and accounts for item criticality, redundancy, task deferrability, and when deferred tasks are repaired. Also introduced is a new criterion of effectiveness, sortie loss rate, as an alternative to BR. Sortie loss rate has the benefit of measuring the total number of potential military sorties missed due to unscheduled maintenance. BR is calculated as the number of sorties missed divided by the number of sorties attempted. An alternative way to compute BR is one minus the ratio of actual sorties launched to attempted sorties.<>
{"title":"Break rate: a reliability parameter for surge operations","authors":"J. K. Seger","doi":"10.1109/ARMS.1990.67991","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67991","url":null,"abstract":"A method for measuring the break rate (BR) of an individual avionics system is described. The method is convenient early in the design process and accounts for item criticality, redundancy, task deferrability, and when deferred tasks are repaired. Also introduced is a new criterion of effectiveness, sortie loss rate, as an alternative to BR. Sortie loss rate has the benefit of measuring the total number of potential military sorties missed due to unscheduled maintenance. BR is calculated as the number of sorties missed divided by the number of sorties attempted. An alternative way to compute BR is one minus the ratio of actual sorties launched to attempted sorties.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125685673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The design of fault-tolerant systems to tolerate a larger number of faults without a significant increase in the amount of redundancy is discussed. The technique is to partition a module into submodules and provide local redundancy. The results are illustrated for a duplex system and then generalized to other fault-tolerant systems. The issue of optimal partitioning is also addressed.<>
{"title":"Reliability enhancement by submodule redundancy","authors":"S. Upadhyaya, H. Pham, K. Saluja","doi":"10.1109/ARMS.1990.67944","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67944","url":null,"abstract":"The design of fault-tolerant systems to tolerate a larger number of faults without a significant increase in the amount of redundancy is discussed. The technique is to partition a module into submodules and provide local redundancy. The results are illustrated for a duplex system and then generalized to other fault-tolerant systems. The issue of optimal partitioning is also addressed.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132986026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The concept, implementation, and long-range goals of a supportability-trend analysis and reporting system (STARS) for the National Space Transportation System (NSTS) are discussed. The requirement was established as a direct result of the recommendations of the Rogers Commission investigation of the circumstances of the Space Shuttle Challenger accident. STARS outlines the requirements for the supportability-trend data collection, analysis, and reporting requirements that each of the project offices supporting the Space Shuttle are required to provide to the NSTS program office. STARS data give the historic and predictive logistics information necessary for all levels of NSTS management to make safe and cost-effective decisions concerning the smooth flow of Space Shuttle turnaround.<>
{"title":"STARS-supportability trend analysis and reporting system for the National Space Transportation System","authors":"L. J. Graham, G.T. Doempke","doi":"10.1109/ARMS.1990.67928","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67928","url":null,"abstract":"The concept, implementation, and long-range goals of a supportability-trend analysis and reporting system (STARS) for the National Space Transportation System (NSTS) are discussed. The requirement was established as a direct result of the recommendations of the Rogers Commission investigation of the circumstances of the Space Shuttle Challenger accident. STARS outlines the requirements for the supportability-trend data collection, analysis, and reporting requirements that each of the project offices supporting the Space Shuttle are required to provide to the NSTS program office. STARS data give the historic and predictive logistics information necessary for all levels of NSTS management to make safe and cost-effective decisions concerning the smooth flow of Space Shuttle turnaround.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127924300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Test data from burn-in of complex electromechanical systems were analyzed using hazard plots in order to determine whether the systems were being tested for the optimum length of time. The problems encountered were how to determine the failure distribution and its parameters for multiply censored data and how to put it in a form easily understood by those outside the reliability field. A BASIC computer code generated plots of multiply censored data, consisting of test results for nine systems, for five common distributions to determine the best fit. It was found that the effects of burn-in at the module level could best be seen as the system level using the three-parameter Weibull distribution. From a so-called bathtub curve plot showing the change in instantaneous failure rate as a function of run-in time (wafers), intuitive conclusions can be drawn regarding the adequacy of run-in. Alternatively, the asymptotic instantaneous failure rate can be used as the useful life failure rate in cost equations, which should provide an objective measure of the adequacy of run-in.<>
{"title":"Analysis of multiply censored run-in data","authors":"J. Elerath","doi":"10.1109/ARMS.1990.68009","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68009","url":null,"abstract":"Test data from burn-in of complex electromechanical systems were analyzed using hazard plots in order to determine whether the systems were being tested for the optimum length of time. The problems encountered were how to determine the failure distribution and its parameters for multiply censored data and how to put it in a form easily understood by those outside the reliability field. A BASIC computer code generated plots of multiply censored data, consisting of test results for nine systems, for five common distributions to determine the best fit. It was found that the effects of burn-in at the module level could best be seen as the system level using the three-parameter Weibull distribution. From a so-called bathtub curve plot showing the change in instantaneous failure rate as a function of run-in time (wafers), intuitive conclusions can be drawn regarding the adequacy of run-in. Alternatively, the asymptotic instantaneous failure rate can be used as the useful life failure rate in cost equations, which should provide an objective measure of the adequacy of run-in.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124810717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This work reviews possible hardware-redundancy techniques for long-haul fiberoptic communications systems designed to operate undersea. Approaches are analyzed from a complexity viewpoint, taking into account overall system supervisory techniques, fiber-routing considerations and repair strategies and reducing the options to a short list of four on this basis. These four options are compared via a detailed reliability analysis employing the matrix method, a recently developed algorithm based on Markov theory.<>
{"title":"Long-haul undersea communications systems: hardware redundancy techniques for ultra-reliability","authors":"R. Murphy","doi":"10.1109/ARMS.1990.67952","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67952","url":null,"abstract":"This work reviews possible hardware-redundancy techniques for long-haul fiberoptic communications systems designed to operate undersea. Approaches are analyzed from a complexity viewpoint, taking into account overall system supervisory techniques, fiber-routing considerations and repair strategies and reducing the options to a short list of four on this basis. These four options are compared via a detailed reliability analysis employing the matrix method, a recently developed algorithm based on Markov theory.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121592422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Published data on avionic fatigue life and high-temperature endurance were used to develop straight-line relationships between stress amplitudes and life at given amplitudes for four part types: a chassis, a plated-through hole, an integrated circuit (IC), and a non-IC piece part. Design-life-distributions for four accelerated reliability test programs were derived for the same item categories using the same straight-line relationships between stress and life. The tests involved 15 specimens and approximately 40000 accelerated test hours. A test-life observation was multiplied by the ratio between predicted usage life mean for the design configuration and predicted test-life mean for the test configuration being observed. A product limit technique was used to treat censorship (observations of test end without relevant failure). The resulting test data distribution was used to predict the failure-free operation period and the mean time between failures for the new design.<>
{"title":"Using test data to predict avionics integrity","authors":"G. Benz","doi":"10.1109/ARMS.1990.67920","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67920","url":null,"abstract":"Published data on avionic fatigue life and high-temperature endurance were used to develop straight-line relationships between stress amplitudes and life at given amplitudes for four part types: a chassis, a plated-through hole, an integrated circuit (IC), and a non-IC piece part. Design-life-distributions for four accelerated reliability test programs were derived for the same item categories using the same straight-line relationships between stress and life. The tests involved 15 specimens and approximately 40000 accelerated test hours. A test-life observation was multiplied by the ratio between predicted usage life mean for the design configuration and predicted test-life mean for the test configuration being observed. A product limit technique was used to treat censorship (observations of test end without relevant failure). The resulting test data distribution was used to predict the failure-free operation period and the mean time between failures for the new design.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130477861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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