An approach is presented for inference from accelerated life tests. The approach is based on a dynamic linear model which arises naturally from the accelerated life testing problem and uses linear Bayesian methods for inference. The advantage of the procedure is that it does not require large numbers of items to be tested and that it can deal with both censored and uncensored data. Furthermore, the approach produces closed-form inference results. The use of the approach with some actual accelerated life test data is illustrated.<>
{"title":"Dynamic models for statistical inference from accelerated life tests","authors":"T. Mazzuchi, R. Soyer","doi":"10.1109/ARMS.1990.67932","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67932","url":null,"abstract":"An approach is presented for inference from accelerated life tests. The approach is based on a dynamic linear model which arises naturally from the accelerated life testing problem and uses linear Bayesian methods for inference. The advantage of the procedure is that it does not require large numbers of items to be tested and that it can deal with both censored and uncensored data. Furthermore, the approach produces closed-form inference results. The use of the approach with some actual accelerated life test data is illustrated.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133017611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Current and planned applications of advanced computer concepts to the onboard, in-flight fault-detection problem for reduction of cannot-duplicate-type faults are described. Also discussed is progress in computer-aided, ground-based troubleshooting for the further assistance of maintenance personnel to reduce the retest-OK problem. Demonstration of the F-16 maintenance diagnostic system has shown that a complex flight control system can be modeled to troubleshoot all the aspects of the flight-control systems including lowest replaceable units (LRUs), sub-LRUs, wiring, and connectors.<>
{"title":"Advanced maintenance diagnostics for Air Force flight control","authors":"G.M. Smith, J. B. Schroeder","doi":"10.1109/ARMS.1990.67990","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67990","url":null,"abstract":"Current and planned applications of advanced computer concepts to the onboard, in-flight fault-detection problem for reduction of cannot-duplicate-type faults are described. Also discussed is progress in computer-aided, ground-based troubleshooting for the further assistance of maintenance personnel to reduce the retest-OK problem. Demonstration of the F-16 maintenance diagnostic system has shown that a complex flight control system can be modeled to troubleshoot all the aspects of the flight-control systems including lowest replaceable units (LRUs), sub-LRUs, wiring, and connectors.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133508348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Repair data from MK12 Phalanx close-in weapon system (CIWS) depots were analyzed by component removal locations on the 13 highest-failure circuit card assemblies (CCAs). This analysis showed several clusters on the mode-system-control CCA that were believed to be caused by high temperature. With a finite-difference technique, a thermal model of these clustered areas was devised, and it verified that the resistors were operating in their upper temperature range. To assure that the analysis was reasonable, a training CIWS was wired with the thermocouples and operated. The testing verified that the analysis was reasonable and could be used to determine the effect of circuit changes on the temperature profile of this CCA. Recommendations were made to reduce the heat generated in the cluster or to increase the airflow in the region of the CCA. An estimate of potential cost savings provided the final information needed by management to decide how to proceed.<>
{"title":"An integrated analytic approach for reliability improvement (of weapons systems)","authors":"H.C. Fortna, R. Zavada, T. Warren","doi":"10.1109/ARMS.1990.67955","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67955","url":null,"abstract":"Repair data from MK12 Phalanx close-in weapon system (CIWS) depots were analyzed by component removal locations on the 13 highest-failure circuit card assemblies (CCAs). This analysis showed several clusters on the mode-system-control CCA that were believed to be caused by high temperature. With a finite-difference technique, a thermal model of these clustered areas was devised, and it verified that the resistors were operating in their upper temperature range. To assure that the analysis was reasonable, a training CIWS was wired with the thermocouples and operated. The testing verified that the analysis was reasonable and could be used to determine the effect of circuit changes on the temperature profile of this CCA. Recommendations were made to reduce the heat generated in the cluster or to increase the airflow in the region of the CCA. An estimate of potential cost savings provided the final information needed by management to decide how to proceed.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"65 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131811033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A MTBF (mean time between failures) warranty/guarantee situation is modeled for an avionics unit installed on different platforms and subjected to varying levels of operational stress. The demand for warranty repairs is approached by structuring submodels and solving these submodels using linked spreadsheets. The spares guarantee is modeled using the MTBF parameter and the expected number of units installed in the various platforms. The spreadsheets contain the essence of the mathematical models/calculations and are a form of self-documentation.<>
{"title":"MTBF warranty/guarantee for multiple user avionics","authors":"F. J. Moreno","doi":"10.1109/ARMS.1990.67942","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67942","url":null,"abstract":"A MTBF (mean time between failures) warranty/guarantee situation is modeled for an avionics unit installed on different platforms and subjected to varying levels of operational stress. The demand for warranty repairs is approached by structuring submodels and solving these submodels using linked spreadsheets. The spares guarantee is modeled using the MTBF parameter and the expected number of units installed in the various platforms. The spreadsheets contain the essence of the mathematical models/calculations and are a form of self-documentation.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132533940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A graphical interface capability of the hybrid automated reliability predictor (HARP) is described. The graphics-oriented (GO) module provides the user with a graphical language for modeling system failure modes through the selection of various fault tree gates, including sequence dependency gates, or by a Markov chain. With this graphical input language, a fault tree becomes a convenient notation for describing a system. In accounting for any sequence dependencies, HARP converts the fault-tree notation to a complex stochastic process that is reduced to a Markov chain which it can then solve for system reliability. The graphics capability is available for use on an IBM-compatible PC, a Sun and a VAX workstation. The GO module is written in the C programming language and uses the Graphical Kernel System (GKS) standard for graphics implementation. The PC, VAX, and Sun versions of the HARP GO module are currently in beta-testing.<>
{"title":"A graphical language for reliability model generation","authors":"S.V. Howell, S. Bavuso, P. Haley","doi":"10.1109/ARMS.1990.68003","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68003","url":null,"abstract":"A graphical interface capability of the hybrid automated reliability predictor (HARP) is described. The graphics-oriented (GO) module provides the user with a graphical language for modeling system failure modes through the selection of various fault tree gates, including sequence dependency gates, or by a Markov chain. With this graphical input language, a fault tree becomes a convenient notation for describing a system. In accounting for any sequence dependencies, HARP converts the fault-tree notation to a complex stochastic process that is reduced to a Markov chain which it can then solve for system reliability. The graphics capability is available for use on an IBM-compatible PC, a Sun and a VAX workstation. The GO module is written in the C programming language and uses the Graphical Kernel System (GKS) standard for graphics implementation. The PC, VAX, and Sun versions of the HARP GO module are currently in beta-testing.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114256282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Design considerations are given for fault-tree analysis (FTA) using spreadsheet software. The objective is to demonstrate, by means of examples, how microcomputer spreadsheet software can be used as an alternative to the mainframe commercial FTA package for designing the fault tree and performing tedious computations. Experiences in using this approach for fault tree analysis are described, and the sensitivity analysis of fault-tree research is addressed.<>
{"title":"Fault tree analysis-using spreadsheet","authors":"M.C. Liu","doi":"10.1109/ARMS.1990.68011","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68011","url":null,"abstract":"Design considerations are given for fault-tree analysis (FTA) using spreadsheet software. The objective is to demonstrate, by means of examples, how microcomputer spreadsheet software can be used as an alternative to the mainframe commercial FTA package for designing the fault tree and performing tedious computations. Experiences in using this approach for fault tree analysis are described, and the sensitivity analysis of fault-tree research is addressed.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127217676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An algorithm for calculating system mean time between critical failures (MTBCF) when two sections of a system with redundancy have unequal period maintenance times is discussed. The algorithm can be expanded to calculate system MTBCF for systems having more than two sections of redundancy with unequal periodic maintenance times. The algorithm can be modified to calculate system MTBCF when a portion of a system with redundancy has no periodic maintenance.<>
{"title":"MTBCF calculation for system with unequal periodic maintenance times","authors":"M. A. McGregor","doi":"10.1109/ARMS.1990.67923","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67923","url":null,"abstract":"An algorithm for calculating system mean time between critical failures (MTBCF) when two sections of a system with redundancy have unequal period maintenance times is discussed. The algorithm can be expanded to calculate system MTBCF for systems having more than two sections of redundancy with unequal periodic maintenance times. The algorithm can be modified to calculate system MTBCF when a portion of a system with redundancy has no periodic maintenance.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"242 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121331283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Reliability and maintainability are discussed as subsets of the assurance sciences. Total quality management (TQM) covers all of the assurance sciences, with significant emphasis on the human and organizational systems underlying all production processes. When the Air Force Logistics Command initiated TQM, a number of challenges had to be overcome to achieve the full potential of the program. These barriers included a lack of worker motivation, opposition of existing management, and lack of effective communication.<>
{"title":"Barriers to total quality management in the Department of Defense","authors":"H.A. Rumsey, P. Miller","doi":"10.1109/ARMS.1990.67938","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67938","url":null,"abstract":"Reliability and maintainability are discussed as subsets of the assurance sciences. Total quality management (TQM) covers all of the assurance sciences, with significant emphasis on the human and organizational systems underlying all production processes. When the Air Force Logistics Command initiated TQM, a number of challenges had to be overcome to achieve the full potential of the program. These barriers included a lack of worker motivation, opposition of existing management, and lack of effective communication.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129751763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
One of the frequency cited shortcomings of fault-tree models, their inability to model so-called sequence dependencies, is discussed. Several sources of such sequence dependencies are discussed, and new fault-tree gates to capture this behavior are defined. These complex behaviors can be included in present fault-tree models because they utilize a Markov solution. The utility of the new gates is demonstrated by presenting several models of the FTPP (fault-tolerant parallel processor), which include both hot and cold spares.<>
{"title":"Fault trees and sequence dependencies","authors":"J. Dugan, S. Bavuso, M. Boyd","doi":"10.1109/ARMS.1990.67971","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67971","url":null,"abstract":"One of the frequency cited shortcomings of fault-tree models, their inability to model so-called sequence dependencies, is discussed. Several sources of such sequence dependencies are discussed, and new fault-tree gates to capture this behavior are defined. These complex behaviors can be included in present fault-tree models because they utilize a Markov solution. The utility of the new gates is demonstrated by presenting several models of the FTPP (fault-tolerant parallel processor), which include both hot and cold spares.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"412 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132932024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A step-by-step approach to built-in test (BIT) analysis is described. A prerequisite for BIT analysis is an open dialogue between the customer and the contractor/designer. The first step in BIT analysis is having a clear understanding of BIT requirements, once these requirements are specified. When BIT requirements are being reviewed it is necessary to look at the complexity and mix of the system, i.e. the proportion of electronic, electromechanical, optical, and mechanical components and assemblies in the system.<>
{"title":"BIT analysis: how to approach it","authors":"P. Luthra","doi":"10.1109/ARMS.1990.67984","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67984","url":null,"abstract":"A step-by-step approach to built-in test (BIT) analysis is described. A prerequisite for BIT analysis is an open dialogue between the customer and the contractor/designer. The first step in BIT analysis is having a clear understanding of BIT requirements, once these requirements are specified. When BIT requirements are being reviewed it is necessary to look at the complexity and mix of the system, i.e. the proportion of electronic, electromechanical, optical, and mechanical components and assemblies in the system.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134495657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：