A reliability model for a repairable standby system with imperfect sensing and switching units is developed. The system has two unequal units which have energized as well as quiescent failure rates and have corresponding repair rates. The system has a sensing unit with a nonzero failure rate and a switching unit which has both cyclic and continuous failure rates, with the continuous mode including failing-open and failing-closed function modes. The system's reliability is obtained in an explicit form. Numerical examples are given, and the effects of the sensing and switching unit's failure rates on the system's reliability are discussed.<>
{"title":"Reliability of a repairable standby system with imperfect sensing and switching","authors":"D. Kececioglu, S. Jiang","doi":"10.1109/ARMS.1990.67967","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67967","url":null,"abstract":"A reliability model for a repairable standby system with imperfect sensing and switching units is developed. The system has two unequal units which have energized as well as quiescent failure rates and have corresponding repair rates. The system has a sensing unit with a nonzero failure rate and a switching unit which has both cyclic and continuous failure rates, with the continuous mode including failing-open and failing-closed function modes. The system's reliability is obtained in an explicit form. Numerical examples are given, and the effects of the sensing and switching unit's failure rates on the system's reliability are discussed.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129403599","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A technique is presented for tracking the system availability growth (AG) during development and testing so that decisions regarding proposed changes can be properly evaluated. In order to manage the AG processes, the comparative FMECA (COFMECA) technique is introduced. It is crucial that the availability be integrated into the general process of system improvement, especially when resources and ideas for the effective implementation of programs such as R&M 2000 are sought.<>
{"title":"Availability-growth aspects of reliability growth","authors":"Z. Bluvband","doi":"10.1109/ARMS.1990.68013","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68013","url":null,"abstract":"A technique is presented for tracking the system availability growth (AG) during development and testing so that decisions regarding proposed changes can be properly evaluated. In order to manage the AG processes, the comparative FMECA (COFMECA) technique is introduced. It is crucial that the availability be integrated into the general process of system improvement, especially when resources and ideas for the effective implementation of programs such as R&M 2000 are sought.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117114240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An inexpensive multiprobe vibration analysis system was designed and fabricated to test the dynamic behavior of heavy trucks. The basic unit of the system performs vibration measurements, data acquisition, and real-time FFT (fast Fourier transform) to determine quickly major frequency centers and respective acceleration amplitudes for simpler vibration patterns, e.g. for smooth or negotiable ride. Rough or unacceptable ride requires more sophisticated vibration spectrum analysis to separate vibration signatures from several different vibration sources. For this purpose a modified cepstrum analysis is run on a laptop IBM PC AT which is connected with the system through a multiplier. Several tests were performed on a variety of Freightliner heavy trucks. The results of this vibration analysis system are particularly useful for truck design and service engineers due to simplicity of data presentation.<>
设计并制作了一套廉价的多探头振动分析系统，用于测试重型卡车的动力特性。该系统的基本单元执行振动测量、数据采集和实时FFT(快速傅里叶变换)，以快速确定主要频率中心和相应的加速度幅值，用于更简单的振动模式，例如平稳或可协商的行驶。粗糙或不可接受的行驶需要更复杂的振动频谱分析，以从几个不同的振动源分离振动特征。为此，在一台通过乘法器与系统连接的便携式IBM PC AT上运行修改后的倒频谱分析。在各种Freightliner重型卡车上进行了几项测试。该振动分析系统的结果由于数据表示的简单性，对卡车设计和服务工程师特别有用。
{"title":"Multi-probe vibration analysis for reliability (assessment of vehicles)","authors":"A.H. Rawicz, Z. Xie, A. Rowley","doi":"10.1109/ARMS.1990.67978","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67978","url":null,"abstract":"An inexpensive multiprobe vibration analysis system was designed and fabricated to test the dynamic behavior of heavy trucks. The basic unit of the system performs vibration measurements, data acquisition, and real-time FFT (fast Fourier transform) to determine quickly major frequency centers and respective acceleration amplitudes for simpler vibration patterns, e.g. for smooth or negotiable ride. Rough or unacceptable ride requires more sophisticated vibration spectrum analysis to separate vibration signatures from several different vibration sources. For this purpose a modified cepstrum analysis is run on a laptop IBM PC AT which is connected with the system through a multiplier. Several tests were performed on a variety of Freightliner heavy trucks. The results of this vibration analysis system are particularly useful for truck design and service engineers due to simplicity of data presentation.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121946426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The problem of achieving optimal system size is treated for k-out-of-n systems, assuming that failure may take either one of two forms. Under the assumption that components are independent and identically-distributed and the two kinds of system failures can have different costs, the optimal system size n which maximizes the mean system profit is determined. The effect of the system parameters on the optimal system size n is studied. A numerical example is given to illustrate the results.<>
{"title":"Optimal design of systems subject to two kinds of failure","authors":"H. Pham","doi":"10.1109/ARMS.1990.67948","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67948","url":null,"abstract":"The problem of achieving optimal system size is treated for k-out-of-n systems, assuming that failure may take either one of two forms. Under the assumption that components are independent and identically-distributed and the two kinds of system failures can have different costs, the optimal system size n which maximizes the mean system profit is determined. The effect of the system parameters on the optimal system size n is studied. A numerical example is given to illustrate the results.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116452328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A formula for the expected number of corrective actions during reliability demonstration testing is derived. It is assumed that modes fail independently, each mode fails as a homogeneous Poisson process, and the distribution of modes is Pareto. Given these assumptions, the distribution of the time to corrective action is derived for a single mode. These mode results are then combined to obtain system results. An approximation is made at the system level to obtain useful results.<>
{"title":"Developing criteria for determining corrective action thresholds during reliability verification testing (RVT)","authors":"D. F. Tyler, K.J. Gyimesi, R.L. Vienneau","doi":"10.1109/ARMS.1990.67934","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67934","url":null,"abstract":"A formula for the expected number of corrective actions during reliability demonstration testing is derived. It is assumed that modes fail independently, each mode fails as a homogeneous Poisson process, and the distribution of modes is Pareto. Given these assumptions, the distribution of the time to corrective action is derived for a single mode. These mode results are then combined to obtain system results. An approximation is made at the system level to obtain useful results.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126264866","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The use of knowledge-based techniques to perform a reliability analysis of aerospace systems is discussed. Knowledge-based systems can be used by reliability engineers or design engineers to improve the accuracy of reliability analysis in a shorter amount of time than in current reliability analysis techniques. A system for performing a reliability analysis of a fault-tolerant electrical power system of an aircraft is presented. Results are compared with manually performed reliability analyses.<>
{"title":"Knowledge-based systems for reliability analysis","authors":"M. Elliott","doi":"10.1109/ARMS.1990.68005","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68005","url":null,"abstract":"The use of knowledge-based techniques to perform a reliability analysis of aerospace systems is discussed. Knowledge-based systems can be used by reliability engineers or design engineers to improve the accuracy of reliability analysis in a shorter amount of time than in current reliability analysis techniques. A system for performing a reliability analysis of a fault-tolerant electrical power system of an aircraft is presented. Results are compared with manually performed reliability analyses.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132543689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mechanical reliability models for given age parameters are adapted to provide electronic fatigue life distributions for the mission/test profile of stress amplitudes. This process also provides affordable life test plans. The mechanical renewal model is adapted to provide a replacement for mean time between failures (MTBF) as a design requirement and as a key to support analyses. The discussion of mechanical models and their adaptation to electronics include: a Markov deterioration model and adaptation; a interval reliability model and adaptation; an interval reliability example; and a Markov deterioration example.<>
{"title":"Adapting mechanical models to fit electronics","authors":"G. Benz, I. Bazovsky","doi":"10.1109/ARMS.1990.67949","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67949","url":null,"abstract":"Mechanical reliability models for given age parameters are adapted to provide electronic fatigue life distributions for the mission/test profile of stress amplitudes. This process also provides affordable life test plans. The mechanical renewal model is adapted to provide a replacement for mean time between failures (MTBF) as a design requirement and as a key to support analyses. The discussion of mechanical models and their adaptation to electronics include: a Markov deterioration model and adaptation; a interval reliability model and adaptation; an interval reliability example; and a Markov deterioration example.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115286300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Life-data analysis is the process of fitting failure distributions to reliability data. The methodology underlying a computer tool known as RAMFIT is described. It was developed to perform automated life-data analysis on missiles using interval data for missiles in storage or continuous data for missiles flown and carried in airplanes (the captive carry environment). RAMFIT is integrated into the US Air Force's reliability asset monitoring (RAM) database. This database captures data generated from a variety of sources including storage inspection tests, flightline tests, shop-level repairs, and missile firing.<>
{"title":"Automated reliability life data analysis of missiles in storage and flight","authors":"K. Mclain, R. Warren","doi":"10.1109/ARMS.1990.68006","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68006","url":null,"abstract":"Life-data analysis is the process of fitting failure distributions to reliability data. The methodology underlying a computer tool known as RAMFIT is described. It was developed to perform automated life-data analysis on missiles using interval data for missiles in storage or continuous data for missiles flown and carried in airplanes (the captive carry environment). RAMFIT is integrated into the US Air Force's reliability asset monitoring (RAM) database. This database captures data generated from a variety of sources including storage inspection tests, flightline tests, shop-level repairs, and missile firing.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116694647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Interrelationships among customer expectations, engineering requirements, and current definitions of durability in the automobile industry are examined. A durability index (DI) is developed to complement inefficient existing definitions. Inherent deficiencies of current reliability development programs (CRDPs) are discussed, and a new methodology of robust reliability/durability development methodology (RR/DDM) is proposed which blends G. Taguchi's (1988) robust design methodology into the CRDP. Under this philosophy, reliability (life) testing serves only as a final validation tool, not a debugging device for design weaknesses.<>
{"title":"Concept of durability index in product assurance planning","authors":"C.J. Wang","doi":"10.1109/ARMS.1990.67960","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67960","url":null,"abstract":"Interrelationships among customer expectations, engineering requirements, and current definitions of durability in the automobile industry are examined. A durability index (DI) is developed to complement inefficient existing definitions. Inherent deficiencies of current reliability development programs (CRDPs) are discussed, and a new methodology of robust reliability/durability development methodology (RR/DDM) is proposed which blends G. Taguchi's (1988) robust design methodology into the CRDP. Under this philosophy, reliability (life) testing serves only as a final validation tool, not a debugging device for design weaknesses.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116890471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A practical example of complex availability, the small intercontinental ballistic missile (ICBM) system, was explored. With dormant or semidormant systems, the amount of time a system appears available may differ from the real availability. The difference in real and apparent availability is often the result of a transition from an operational but dormant state to an inoperational but dormant state. A methodology to estimate the real availability of the Midgetman weapon system and the concept of complex availability, which is applicable to many types of modern manufacturing and military equipment, were developed.<>
{"title":"Complex availability: the new availability problem","authors":"G. J. Schroeder, M.M. Johnson","doi":"10.1109/ARMS.1990.67968","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67968","url":null,"abstract":"A practical example of complex availability, the small intercontinental ballistic missile (ICBM) system, was explored. With dormant or semidormant systems, the amount of time a system appears available may differ from the real availability. The difference in real and apparent availability is often the result of a transition from an operational but dormant state to an inoperational but dormant state. A methodology to estimate the real availability of the Midgetman weapon system and the concept of complex availability, which is applicable to many types of modern manufacturing and military equipment, were developed.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126541632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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