Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532510
R. Marion
Defense budget decreases in recent years with increasingly complex weapon systems and component equipment has mandated innovative support solutions to control costs. Automatic Test Systems (ATS) have been standardized by service branch in an effort to control the costs of support for support equipment. Support contracts with the ATS provider for repair services leveraged repair volume to reduce cost per repair. Support contracts where the ATS provider also supplies loaner spares used centralized wholesale spares systems to reduce retail spares requirements. Commitment to aggressive turnaround times for repairs reduced wholesale spares requirements. Entrusting the ATS provider with hardware configuration management improved system availability by allowing design improvements to address bad actor concerns. Industry has shown that the next logical step in the progression is leased support equipment, where system configuration management including both hardware and software configuration is entrusted to the ATS provider. The ATS OEM has unique knowledge about the hardware and software interactions in the system that allow efficient resolution of availability detractors like false alarms. The OEM understands instrument peculiarities allowing increasingly efficient fault detection and isolation. The costs associated with the improvements will be spread across the installed base so that each customer benefits from the increased availability, whether they have one system or hundreds. The unique requirements associated with leased equipment in a military operating environment will be explored. These steps explore only the horizontal axis of test, where the vertical axis includes all layers of test, such as design verification test, factory test, acceptance test, qualification test, at-platform maintenance test and off-platform maintenance test. The potential savings by reuse along the vertical axis include ATS and Test Programs Set (TPS) components. The factory test, acceptance test and off-platform performance test requirements are often very similar, if not exactly the same. The unique requirements associated with TPS reuse in a military environment will be explored.
{"title":"Innovative Support Alternatives to Reduce Overall Weapon System Life Cycle Cost","authors":"R. Marion","doi":"10.1109/AUTEST.2018.8532510","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532510","url":null,"abstract":"Defense budget decreases in recent years with increasingly complex weapon systems and component equipment has mandated innovative support solutions to control costs. Automatic Test Systems (ATS) have been standardized by service branch in an effort to control the costs of support for support equipment. Support contracts with the ATS provider for repair services leveraged repair volume to reduce cost per repair. Support contracts where the ATS provider also supplies loaner spares used centralized wholesale spares systems to reduce retail spares requirements. Commitment to aggressive turnaround times for repairs reduced wholesale spares requirements. Entrusting the ATS provider with hardware configuration management improved system availability by allowing design improvements to address bad actor concerns. Industry has shown that the next logical step in the progression is leased support equipment, where system configuration management including both hardware and software configuration is entrusted to the ATS provider. The ATS OEM has unique knowledge about the hardware and software interactions in the system that allow efficient resolution of availability detractors like false alarms. The OEM understands instrument peculiarities allowing increasingly efficient fault detection and isolation. The costs associated with the improvements will be spread across the installed base so that each customer benefits from the increased availability, whether they have one system or hundreds. The unique requirements associated with leased equipment in a military operating environment will be explored. These steps explore only the horizontal axis of test, where the vertical axis includes all layers of test, such as design verification test, factory test, acceptance test, qualification test, at-platform maintenance test and off-platform maintenance test. The potential savings by reuse along the vertical axis include ATS and Test Programs Set (TPS) components. The factory test, acceptance test and off-platform performance test requirements are often very similar, if not exactly the same. The unique requirements associated with TPS reuse in a military environment will be explored.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130482802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532499
M. R. Johnson
As printed circuit boards have decreased in size and increased in complexity (i.e. number of layers, number of installed components, speed of busses, etc.), access to test resources (i.e. probe points) necessary for sufficient printed circuit board test has diminished. The use of intrusive test methods such as in-circuit testers, manufacturing defect analyzers, and flying probe testers entails many downsides. Each method requires access to printed circuit board probe points, the equipment necessary to facilitate each intrusive method can take up large amounts of floor space in a manufacturing facility and can be costly to operate and maintain (i.e. technician time, fixture origination and fixture revision due to printed circuit board redesign). Because of these and more downsides, non-intrusive board test has emerged as a cost-effective alternative to intrusive test or as a cost-reducing complement where intrusive test methods are still used.
{"title":"The Increasing Importance of Utilizing Non-intrusive Board Test Technologies for Printed Circuit Board Defect Coverage","authors":"M. R. Johnson","doi":"10.1109/AUTEST.2018.8532499","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532499","url":null,"abstract":"As printed circuit boards have decreased in size and increased in complexity (i.e. number of layers, number of installed components, speed of busses, etc.), access to test resources (i.e. probe points) necessary for sufficient printed circuit board test has diminished. The use of intrusive test methods such as in-circuit testers, manufacturing defect analyzers, and flying probe testers entails many downsides. Each method requires access to printed circuit board probe points, the equipment necessary to facilitate each intrusive method can take up large amounts of floor space in a manufacturing facility and can be costly to operate and maintain (i.e. technician time, fixture origination and fixture revision due to printed circuit board redesign). Because of these and more downsides, non-intrusive board test has emerged as a cost-effective alternative to intrusive test or as a cost-reducing complement where intrusive test methods are still used.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126290902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532526
F. Auzanneau
Today, the most efficient methods for wired networks diagnosis are based on reflectometry: they can detect hard (i.e. open / short circuits) and soft defects (i.e. insulation damage, hot spots or rust), either permanent or intermittent, and provide their location. This is an important information for maintenance operators who can focus repair in a shorter time. The possibility of monitoring the wires health using specifically designed reflectometry methods offers interesting opportunities for preventive maintenance. Electronic implementations of such methods are mostly based on the use of programmable logic digital systems, such as FPGA or microcontrollers, both for probe signals generation and measured signals analysis. But the cables have a pure analog behavior, therefore these systems are connected to additional costly devices such as digital to analog and analog to digital converters. These components have a direct impact on the systems performances: a higher sampling rate means a better defects location accuracy, but implies a higher cost. A higher resolution enables to detect lower signature defects but requires more memory and computing power for data processing. This paper presents a new purely binary reflectometry method using a simpler electronic architecture and quicker signal analysis, and showing better performances than standard methods (in terms of defect location accuracy, processing speed and memory requirement) at a lower cost. Equivalent detection performances are shown, and the new simplified electronic architecture enables to take advantage of all the digital resources, such as a higher clock frequency than that of most available converters, thus naturally improving the location accuracy. As the conversion components are not required anymore, the consumption and cost of the system is drastically reduced. Performance comparison is presented and an innovative process for the reflectogram computation is introduced, which enables a drastic reduction of the computing power needs and a quicker reflectogram update.
{"title":"Binary time domain reflectometry: a simpler and more efficient way of diagnosing defects in wired networks","authors":"F. Auzanneau","doi":"10.1109/AUTEST.2018.8532526","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532526","url":null,"abstract":"Today, the most efficient methods for wired networks diagnosis are based on reflectometry: they can detect hard (i.e. open / short circuits) and soft defects (i.e. insulation damage, hot spots or rust), either permanent or intermittent, and provide their location. This is an important information for maintenance operators who can focus repair in a shorter time. The possibility of monitoring the wires health using specifically designed reflectometry methods offers interesting opportunities for preventive maintenance. Electronic implementations of such methods are mostly based on the use of programmable logic digital systems, such as FPGA or microcontrollers, both for probe signals generation and measured signals analysis. But the cables have a pure analog behavior, therefore these systems are connected to additional costly devices such as digital to analog and analog to digital converters. These components have a direct impact on the systems performances: a higher sampling rate means a better defects location accuracy, but implies a higher cost. A higher resolution enables to detect lower signature defects but requires more memory and computing power for data processing. This paper presents a new purely binary reflectometry method using a simpler electronic architecture and quicker signal analysis, and showing better performances than standard methods (in terms of defect location accuracy, processing speed and memory requirement) at a lower cost. Equivalent detection performances are shown, and the new simplified electronic architecture enables to take advantage of all the digital resources, such as a higher clock frequency than that of most available converters, thus naturally improving the location accuracy. As the conversion components are not required anymore, the consumption and cost of the system is drastically reduced. Performance comparison is presented and an innovative process for the reflectogram computation is introduced, which enables a drastic reduction of the computing power needs and a quicker reflectogram update.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117005309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/autest.2018.8532556
George Isabella
This Paper defines a method of Certifying a Test Station for use by an organization's Production team, and for Validating its proper functionality. The Production team of any organization is the customer of the Test Equipment development team. The deliverable to the Production team is the Test Station, whose performance must be Validated in order to guarantee that it can adequately provide Pass/Fail discrimination upon a production unit being tested, and whose acceptance must be Certified in order to be utilized for Production deliveries.
{"title":"Test Station Validation / Certification in a Production Environment","authors":"George Isabella","doi":"10.1109/autest.2018.8532556","DOIUrl":"https://doi.org/10.1109/autest.2018.8532556","url":null,"abstract":"This Paper defines a method of Certifying a Test Station for use by an organization's Production team, and for Validating its proper functionality. The Production team of any organization is the customer of the Test Equipment development team. The deliverable to the Production team is the Test Station, whose performance must be Validated in order to guarantee that it can adequately provide Pass/Fail discrimination upon a production unit being tested, and whose acceptance must be Certified in order to be utilized for Production deliveries.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117263705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532539
Safa Şengezer, Volkan Özdemir, F. Demir
Military Slip Rings have tight test requirements to meet; such as contact noise, dielectric discharge and end-to-end resistance. Especially, the contact noise and end-to-end resistance measurements are in the order of several milliohms. Therefore, the test system must be well-calibrated in order to take precise measurements. During mass production, more than one set of test equipment can be used on different manufacturing lines. Hence, calibration should be able to be done on-line by the test software. Additionally, the test process must take as minimum time as possible in order to meet mass production schedule. Erroneous measurements due to external electromagnetic noise is a serious agent that cause the UUT (unit under test) to fail the test, prolonging the overall testing time. The testing software should detect an erroneous measurement, dispel it and prevent it from failing the test of the UUT. In this paper, we explain the methods used for a self-calibrating, automated, erroneous measurement-preventing test system for the mass production of military slip rings. When testing a slip ring, some of the measurements such as contact noise should be measured while the slip ring is rotating. Therefore, a turntable with servo motor is used for rotation. While the slip ring is rotating, it is not feasible to take measurements from the connectors on the both sides (stator & rotor) since it can cause testing cables to be tangled and eventually jam the turntable, possibly harming the slip ring. Hence, in this setup all the test equipment are connected to the slip ring from one side (stator or rotor), while at the other side all the connectors are short-circuited. These connections add to the end-to-end resistance and contact noise while measuring them. Since the precision of the measurements should be in the order of milliohm, the effect of the connections change not only with the test setup, but also with the slip ring itself. Therefore, testing software initially measures the resistances of connections, updates its' calibration values and then starts the test procedure. The details of the algorithm as well as test results with and without using this method are presented. Another phenomena while taking measurements is the electromagnetic noise that manipulates the test results. Even if the test cables are twisted and shielded, this additional noise is hard to avoid due to the test equipment itself. It causes sudden peaks in the measurements and causes the test of that channel to fail. One way of preventing this is to measure the rms or the standard deviation of the noise instead of its peak-to-peak value. However, it gives excessively optimistic results which may cause some problematic channels to go unnoticed. The method used in this setup prevents the test process to fail due to erroneous measurement, while taking objective measurements. Statistical information about the efficiency of using this method is exhibited.
{"title":"A Self-Calibrating, Erroneous Measurement-Preventing Production Test System for Military Slip Rings","authors":"Safa Şengezer, Volkan Özdemir, F. Demir","doi":"10.1109/AUTEST.2018.8532539","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532539","url":null,"abstract":"Military Slip Rings have tight test requirements to meet; such as contact noise, dielectric discharge and end-to-end resistance. Especially, the contact noise and end-to-end resistance measurements are in the order of several milliohms. Therefore, the test system must be well-calibrated in order to take precise measurements. During mass production, more than one set of test equipment can be used on different manufacturing lines. Hence, calibration should be able to be done on-line by the test software. Additionally, the test process must take as minimum time as possible in order to meet mass production schedule. Erroneous measurements due to external electromagnetic noise is a serious agent that cause the UUT (unit under test) to fail the test, prolonging the overall testing time. The testing software should detect an erroneous measurement, dispel it and prevent it from failing the test of the UUT. In this paper, we explain the methods used for a self-calibrating, automated, erroneous measurement-preventing test system for the mass production of military slip rings. When testing a slip ring, some of the measurements such as contact noise should be measured while the slip ring is rotating. Therefore, a turntable with servo motor is used for rotation. While the slip ring is rotating, it is not feasible to take measurements from the connectors on the both sides (stator & rotor) since it can cause testing cables to be tangled and eventually jam the turntable, possibly harming the slip ring. Hence, in this setup all the test equipment are connected to the slip ring from one side (stator or rotor), while at the other side all the connectors are short-circuited. These connections add to the end-to-end resistance and contact noise while measuring them. Since the precision of the measurements should be in the order of milliohm, the effect of the connections change not only with the test setup, but also with the slip ring itself. Therefore, testing software initially measures the resistances of connections, updates its' calibration values and then starts the test procedure. The details of the algorithm as well as test results with and without using this method are presented. Another phenomena while taking measurements is the electromagnetic noise that manipulates the test results. Even if the test cables are twisted and shielded, this additional noise is hard to avoid due to the test equipment itself. It causes sudden peaks in the measurements and causes the test of that channel to fail. One way of preventing this is to measure the rms or the standard deviation of the noise instead of its peak-to-peak value. However, it gives excessively optimistic results which may cause some problematic channels to go unnoticed. The method used in this setup prevents the test process to fail due to erroneous measurement, while taking objective measurements. Statistical information about the efficiency of using this method is exhibited.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115818136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532548
Henrique K. M. Ramos, M. Gonzalez, Rafael Mello de Mendonça, G. Colombo, David Rodrigo G. Ribeiro, A. Campo
This work describes the construction of a portable test system that was built by the Brazilian Air Force, capable of measuring every needed variable for a jet engine maintenance, with an emphasis on the project's programming. Its major blocks and functionalities are described and related with the selected physical equipment in a way that such endeavor could be replicated by different means. The necessity for such a project arises from a logistical dependency of several bases on a single testing facility. However, the same technology can be applied to propellants lacking an embedded health monitoring system with great benefits. Graphical language and compatible hardware were employed as tools to attain the required requisites: flexibility, scalability, robustness and determinism. Given a successful development, the new equipment measures every variable needed for a first layer of diagnosis. It brings economy, the decrease of a bottleneck and a higher degree of independency for the Brazilian Air Force as a whole.
{"title":"Portable test system for jet engines through FPGA technology","authors":"Henrique K. M. Ramos, M. Gonzalez, Rafael Mello de Mendonça, G. Colombo, David Rodrigo G. Ribeiro, A. Campo","doi":"10.1109/AUTEST.2018.8532548","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532548","url":null,"abstract":"This work describes the construction of a portable test system that was built by the Brazilian Air Force, capable of measuring every needed variable for a jet engine maintenance, with an emphasis on the project's programming. Its major blocks and functionalities are described and related with the selected physical equipment in a way that such endeavor could be replicated by different means. The necessity for such a project arises from a logistical dependency of several bases on a single testing facility. However, the same technology can be applied to propellants lacking an embedded health monitoring system with great benefits. Graphical language and compatible hardware were employed as tools to attain the required requisites: flexibility, scalability, robustness and determinism. Given a successful development, the new equipment measures every variable needed for a first layer of diagnosis. It brings economy, the decrease of a bottleneck and a higher degree of independency for the Brazilian Air Force as a whole.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130824200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532558
I. Neag, C. Gorringe
The recently published revisions of IEEE Std 1671.3 ATML UUT Description and IEEE Std 1671.1 ATML Test Description contain many new features that support the description of serial bus testing. This paper proposes a set of best practices for using these new features to describe UUT serial buses and bus test operations. The application of these best practices produces UUT and test descriptions that are simple, accurate, and maintainable for the lifetime of the UUT.
最近发布的IEEE Std 1671.3 ATML UUT Description和IEEE Std 1671.1 ATML Test Description的修订包含了许多支持串行总线测试描述的新功能。本文提出了一组使用这些新特性来描述UUT串行总线和总线测试操作的最佳实践。这些最佳实践的应用产生了简单、准确的UUT和测试描述，并且在UUT的生命周期内可维护。
{"title":"Best Practices for Describing Digital Serial Buses and Bus Test Operations Using IEEE 1671 ATML and IEEE 1641 Signal and Test Definition","authors":"I. Neag, C. Gorringe","doi":"10.1109/AUTEST.2018.8532558","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532558","url":null,"abstract":"The recently published revisions of IEEE Std 1671.3 ATML UUT Description and IEEE Std 1671.1 ATML Test Description contain many new features that support the description of serial bus testing. This paper proposes a set of best practices for using these new features to describe UUT serial buses and bus test operations. The application of these best practices produces UUT and test descriptions that are simple, accurate, and maintainable for the lifetime of the UUT.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"251 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122874894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532528
Anthony P. Erwin
Current weapon system assemblies that operate in high bandwidth optical networks are driving the need for new test methods and capabilities. In the past, the number of networked assemblies has been small with a limited number of I/O ports and data bandwidth requirements. Modern networks include many assemblies with numerous I/O and high bandwidth data intensive computing, where fiber optics is the preferred technology that meets these requirements. The sensitivity of optical networks and transceivers to maintenance and environmentally induced degradation creates challenges for Automated Test System (ATS) in assuring that any given Weapon Replaceable Assembly (WRA) can work properly and repeatably with any other WRA across multiple platforms of the same type. Meeting this challenge requires high bandwidth (10GB+) instruments capable of sending, receiving, processing and storing large amounts of data coupled with Optical Network Performance Verification. ATS must also be capable of switching these high bandwidth instruments across large number of optical IO while verifying the Unit Under Test (UUT) performance across the full range of optical operating parameters. This paper will discuss these problems, solutions and relevance to the Defense and Aerospace industry.
{"title":"Challenges and Solutions for Testing Modern Optically Networked Weapon Systems","authors":"Anthony P. Erwin","doi":"10.1109/AUTEST.2018.8532528","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532528","url":null,"abstract":"Current weapon system assemblies that operate in high bandwidth optical networks are driving the need for new test methods and capabilities. In the past, the number of networked assemblies has been small with a limited number of I/O ports and data bandwidth requirements. Modern networks include many assemblies with numerous I/O and high bandwidth data intensive computing, where fiber optics is the preferred technology that meets these requirements. The sensitivity of optical networks and transceivers to maintenance and environmentally induced degradation creates challenges for Automated Test System (ATS) in assuring that any given Weapon Replaceable Assembly (WRA) can work properly and repeatably with any other WRA across multiple platforms of the same type. Meeting this challenge requires high bandwidth (10GB+) instruments capable of sending, receiving, processing and storing large amounts of data coupled with Optical Network Performance Verification. ATS must also be capable of switching these high bandwidth instruments across large number of optical IO while verifying the Unit Under Test (UUT) performance across the full range of optical operating parameters. This paper will discuss these problems, solutions and relevance to the Defense and Aerospace industry.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114684766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532537
L. Kirkland, Dave Jensen, C. Carlson, D. Matsuura
Using digital testing hardware (actual Test Equipment) and software on a defined hardware and software platform produces a means to simulate high I/O chips and chips with no model information. This is taking digital simulation to the next level. The next level is utilizing actual test equipment (ATE) to perform digital simulations on specific devices during Unit Under Test (UUT) simulations. It is technically efficient for both functional testing and diagnostic testing to represent chip or device behavior, especially undocumented behavior and anomalies on actual ATE during simulation. Hardware modeling is the technique of using a physical device to model its own behavior during simulation. Hardware modeling systems format inputs from the simulator, apply the inputs to the physical device, evaluate device behavior, and then return the resulting outputs, plus timing information, to the simulator. By incorporating the physical device and a flexible, behavioral shell, hardware models combine functional accuracy, including unknown propagation, with complex timing information, including mode-dependent delays and timing checks. Using actual ATE during this simulation process secures chip or device functioning during stimulus and response vector sequences. This paper will discuss techniques associated with performing simulation using actual ATE. Also discussed will be the prolific capabilities of these applications.
{"title":"Sorting out Integration Snags by Using Actual Automatic Test Equipment for Simulations","authors":"L. Kirkland, Dave Jensen, C. Carlson, D. Matsuura","doi":"10.1109/AUTEST.2018.8532537","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532537","url":null,"abstract":"Using digital testing hardware (actual Test Equipment) and software on a defined hardware and software platform produces a means to simulate high I/O chips and chips with no model information. This is taking digital simulation to the next level. The next level is utilizing actual test equipment (ATE) to perform digital simulations on specific devices during Unit Under Test (UUT) simulations. It is technically efficient for both functional testing and diagnostic testing to represent chip or device behavior, especially undocumented behavior and anomalies on actual ATE during simulation. Hardware modeling is the technique of using a physical device to model its own behavior during simulation. Hardware modeling systems format inputs from the simulator, apply the inputs to the physical device, evaluate device behavior, and then return the resulting outputs, plus timing information, to the simulator. By incorporating the physical device and a flexible, behavioral shell, hardware models combine functional accuracy, including unknown propagation, with complex timing information, including mode-dependent delays and timing checks. Using actual ATE during this simulation process secures chip or device functioning during stimulus and response vector sequences. This paper will discuss techniques associated with performing simulation using actual ATE. Also discussed will be the prolific capabilities of these applications.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124880090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532515
R. Spinner, William Biagiotti, James McKenna, William Leippe
Due to the steady evolution of PXI/PXIe instrumentation and software innovation, standalone parallel ATS capability is now a cost-effective option for the rapid screening and testing of legacy avionic assemblies. By leveraging readily available PXIe stimulus and acquisition assets, a mixed-signal module may be realized for those environments where a full complement of traditional ATS assets is either not physically available or not integrated to the level required for full parallel test. In proposed configurations, packaging options exist that would allow this parallel test capability to be embedded as a supplemental modular instrument into any existing PXIe/VXI chassis. This paper will explore how the proposed modular instrument will independently implement true mixed-signal parallel functional testing (instead of static metrics) integrated with dynamic waveform analysis software for a turnkey solution on any ATS station, as innovated by Advanced Testing Technologies, Inc.
{"title":"Parallel Mixed Signal Testing as an Embedded Instrument","authors":"R. Spinner, William Biagiotti, James McKenna, William Leippe","doi":"10.1109/AUTEST.2018.8532515","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532515","url":null,"abstract":"Due to the steady evolution of PXI/PXIe instrumentation and software innovation, standalone parallel ATS capability is now a cost-effective option for the rapid screening and testing of legacy avionic assemblies. By leveraging readily available PXIe stimulus and acquisition assets, a mixed-signal module may be realized for those environments where a full complement of traditional ATS assets is either not physically available or not integrated to the level required for full parallel test. In proposed configurations, packaging options exist that would allow this parallel test capability to be embedded as a supplemental modular instrument into any existing PXIe/VXI chassis. This paper will explore how the proposed modular instrument will independently implement true mixed-signal parallel functional testing (instead of static metrics) integrated with dynamic waveform analysis software for a turnkey solution on any ATS station, as innovated by Advanced Testing Technologies, Inc.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121756198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：