Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532512
A. Watkins, K. Gnawali, H. Quinn
The use of a pulsed laser to analyze a circuit's susceptibility to radiation-induced errors has been a topic of interest to the radiation effects community. Research has shown that while lasers inject charge differently compared to radiation, the errors observed match closely. Los Alamos National Laboratories (LANL) has procured a single photon absorption pulsed laser system designed for radiation effects testing. It is currently unknown how the system correlates to other test facilities. In this paper we present a comparison between results obtained at LANL to existing published results. We also show that, for our system, there is only a small difference between topside and backside laser testing.
利用脉冲激光分析电路对辐射诱导误差的敏感性一直是辐射效应界感兴趣的话题。研究表明，虽然激光注入的电荷与辐射不同，但观察到的误差却非常接近。美国洛斯阿拉莫斯国家实验室(Los Alamos National Laboratories, LANL)研制了一种用于辐射效应测试的单光子吸收脉冲激光系统。目前尚不清楚该系统如何与其他测试设施相关联。在本文中，我们将在LANL获得的结果与现有发表的结果进行了比较。我们还表明，对于我们的系统来说，上层和后部激光测试之间只有很小的区别。
{"title":"Single Event Effects Characterization Using a Single Photon Absorption Laser","authors":"A. Watkins, K. Gnawali, H. Quinn","doi":"10.1109/AUTEST.2018.8532512","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532512","url":null,"abstract":"The use of a pulsed laser to analyze a circuit's susceptibility to radiation-induced errors has been a topic of interest to the radiation effects community. Research has shown that while lasers inject charge differently compared to radiation, the errors observed match closely. Los Alamos National Laboratories (LANL) has procured a single photon absorption pulsed laser system designed for radiation effects testing. It is currently unknown how the system correlates to other test facilities. In this paper we present a comparison between results obtained at LANL to existing published results. We also show that, for our system, there is only a small difference between topside and backside laser testing.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133532535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532555
L. Kirkland, Dave Jensen, C. Carlson, R. G. Wright
Critical weaknesses in Test Program Set (TPS) designs can be deceiving and remain unknown causing diagnostic and performance problems. These can include weak mainline test flow with intermittent pass/fails, poor diagnostics with unacceptable fault detection algorithms, and/or ReTest Okay (RTOK) and Cannot Duplicate (CND) problems. Often associated with No-Fault-Found (NFF) conditions, their causes can include test limit variations, poor test program development practices, incorrect diagnostic callouts or even Automatic Test Equipment (ATE) performance issues. Also, these performance weaknesses may be attributed to Interface Test Adapter (ITA) design, test equipment selection and settings, power supply problems, wiring discrepancies, crosstalk, timing issues, speed, noise, physical connections and the test program software itself, Full understanding of TPS performance problems is often elusive as a result of symptoms that can be extremely deceiving where alternative methods for their resolution should be considered. This paper describes some of these methods and their usefulness.
测试程序集(TPS)设计中的关键弱点可能具有欺骗性，并且仍然未知，从而导致诊断和性能问题。这些问题可能包括主线测试流程薄弱，出现间歇性通过/失败，诊断不佳，出现不可接受的故障检测算法，以及/或出现ReTest ok (RTOK)和Cannot Duplicate (CND)问题。通常与无故障发现(NFF)条件相关联，其原因可能包括测试极限变化、糟糕的测试程序开发实践、不正确的诊断标注，甚至是自动测试设备(ATE)性能问题。此外，这些性能缺陷可能归因于接口测试适配器(ITA)设计、测试设备的选择和设置、电源问题、接线差异、串扰、时序问题、速度、噪声、物理连接和测试程序软件本身。由于症状可能极具欺骗性，因此对TPS性能问题的全面理解往往难以捉摸，因此应该考虑解决这些问题的替代方法。本文介绍了其中的一些方法及其用途。
{"title":"Techniques to Solve TPS Performance Weaknesses","authors":"L. Kirkland, Dave Jensen, C. Carlson, R. G. Wright","doi":"10.1109/AUTEST.2018.8532555","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532555","url":null,"abstract":"Critical weaknesses in Test Program Set (TPS) designs can be deceiving and remain unknown causing diagnostic and performance problems. These can include weak mainline test flow with intermittent pass/fails, poor diagnostics with unacceptable fault detection algorithms, and/or ReTest Okay (RTOK) and Cannot Duplicate (CND) problems. Often associated with No-Fault-Found (NFF) conditions, their causes can include test limit variations, poor test program development practices, incorrect diagnostic callouts or even Automatic Test Equipment (ATE) performance issues. Also, these performance weaknesses may be attributed to Interface Test Adapter (ITA) design, test equipment selection and settings, power supply problems, wiring discrepancies, crosstalk, timing issues, speed, noise, physical connections and the test program software itself, Full understanding of TPS performance problems is often elusive as a result of symptoms that can be extremely deceiving where alternative methods for their resolution should be considered. This paper describes some of these methods and their usefulness.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131370662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532552
P. A. Curry, Colin C. Clark, Joseph A. Cuccaro, Scott K. Kautzmann
The most costly phase of a military platform's lifecycle historically can be its Operations and Support phase, in which the majority of maintenance occurs. It is prudent that the management of every platform consisting of Line Replaceable Units (LRU), Line Replaceable Modules, and sub-component Shop Replaceable Units includes an effective and efficient support strategy with highly accurate diagnostics at multiple levels of maintenance. Effective platform support strategies require the understanding of ever-increasing system complexities, critical temporal dependencies, and operational environmental conditions, all of which contribute to the challenge of developing diagnostics. Due to these challenges, Automatic Test Equipment (ATE), which are general purpose tools, and, when coupled with platform specific software are often utilized off-platform to verify, diagnose, and provide feedback of the LRU condition to provide accurate and repeatable diagnostics. ATE provides a much needed component of support, however, there are other factors which are also critical to the support process and can lead to misdiagnoses. These types of misdiagnoses include, but are not limited to, a frequently debated metric within the Department of Defense (DoD) commonly called “False Fails” or “No Fault Found” or “No Evidence of Failure (NEOF).” As seen for many years, making an incorrect diagnosis, for whatever the reason, can lead to numerous scenarios of unnecessary expenditures of resources due to the component's unnecessary removal, replacement, handling, shipping, processing, and transportation. The loss of these resources represent a significant cost across the Service in which they operate. As the DoD budgets are already strained and the operational tempo is ever-challenging, we must provide every advantage to the Warfighter by keeping their weapon platforms fully operational and free from misdiagnoses and unnecessary downtime, which adversely affects our nation's readiness and warfighting advantage. This paper describes some of the types and sources of component misdiagnoses at different levels of maintenance, plausible root causes, and recommendations for reduction and mitigation, including the role of ATE in a platform's support structure as a combat force multiplier and its (often misunderstood) effect on mitigation of misdiagnoses and NEOFs.
{"title":"Platform Misdiagnoses, NEOFs, and the ATE Perspective","authors":"P. A. Curry, Colin C. Clark, Joseph A. Cuccaro, Scott K. Kautzmann","doi":"10.1109/AUTEST.2018.8532552","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532552","url":null,"abstract":"The most costly phase of a military platform's lifecycle historically can be its Operations and Support phase, in which the majority of maintenance occurs. It is prudent that the management of every platform consisting of Line Replaceable Units (LRU), Line Replaceable Modules, and sub-component Shop Replaceable Units includes an effective and efficient support strategy with highly accurate diagnostics at multiple levels of maintenance. Effective platform support strategies require the understanding of ever-increasing system complexities, critical temporal dependencies, and operational environmental conditions, all of which contribute to the challenge of developing diagnostics. Due to these challenges, Automatic Test Equipment (ATE), which are general purpose tools, and, when coupled with platform specific software are often utilized off-platform to verify, diagnose, and provide feedback of the LRU condition to provide accurate and repeatable diagnostics. ATE provides a much needed component of support, however, there are other factors which are also critical to the support process and can lead to misdiagnoses. These types of misdiagnoses include, but are not limited to, a frequently debated metric within the Department of Defense (DoD) commonly called “False Fails” or “No Fault Found” or “No Evidence of Failure (NEOF).” As seen for many years, making an incorrect diagnosis, for whatever the reason, can lead to numerous scenarios of unnecessary expenditures of resources due to the component's unnecessary removal, replacement, handling, shipping, processing, and transportation. The loss of these resources represent a significant cost across the Service in which they operate. As the DoD budgets are already strained and the operational tempo is ever-challenging, we must provide every advantage to the Warfighter by keeping their weapon platforms fully operational and free from misdiagnoses and unnecessary downtime, which adversely affects our nation's readiness and warfighting advantage. This paper describes some of the types and sources of component misdiagnoses at different levels of maintenance, plausible root causes, and recommendations for reduction and mitigation, including the role of ATE in a platform's support structure as a combat force multiplier and its (often misunderstood) effect on mitigation of misdiagnoses and NEOFs.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131964239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532519
Zaiming Fu, Nan Ren, Liu Ke, Yijiu Zhao
The paper studies a new calibration method based on the framework of automatic test system. The method uses IVI (Interchangeable Virtual Instruments) as the hardware basis of the system to discuss the fast and intelligent automatic calibration of the test equipment. It intelligently analyzes the correlation of system parameters for highly complex calibrated instruments using a stepwise regression, and accurately selects high correlation factors for the calibration of each parameter. And it performs accurate multistage segmentation of the calibrated parameters using the M5 model tree algorithm to ensure calculating the linear regression equation under the least mean square and realizing the fitting and calibration of each parameter; and calibration results are then configured as a file to the folder set by the calibrated instrument to replace the original calibration file. It does not require highly experienced engineers to perform a large number of analyses, but automatically tests, autonomously analyzes, automatically calculates, generates and gives calibration files. The system is fast, intelligent, and efficient. In the paper, the self-made pulse generator is taken as an example, and the amplitude of the pulse generator is calibrated. The calibrated system error is less than 1.5%.
{"title":"Research on fast and intelligent calibration method based on automatic test system","authors":"Zaiming Fu, Nan Ren, Liu Ke, Yijiu Zhao","doi":"10.1109/AUTEST.2018.8532519","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532519","url":null,"abstract":"The paper studies a new calibration method based on the framework of automatic test system. The method uses IVI (Interchangeable Virtual Instruments) as the hardware basis of the system to discuss the fast and intelligent automatic calibration of the test equipment. It intelligently analyzes the correlation of system parameters for highly complex calibrated instruments using a stepwise regression, and accurately selects high correlation factors for the calibration of each parameter. And it performs accurate multistage segmentation of the calibrated parameters using the M5 model tree algorithm to ensure calculating the linear regression equation under the least mean square and realizing the fitting and calibration of each parameter; and calibration results are then configured as a file to the folder set by the calibrated instrument to replace the original calibration file. It does not require highly experienced engineers to perform a large number of analyses, but automatically tests, autonomously analyzes, automatically calculates, generates and gives calibration files. The system is fast, intelligent, and efficient. In the paper, the self-made pulse generator is taken as an example, and the amplitude of the pulse generator is calibrated. The calibrated system error is less than 1.5%.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"156 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115286165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532521
C. Furse, N. Jayakumar, E. Benoit, M. U. Saleh, Josiah Lacombe, M. Scarpulla, J. Harley, S. Kingston, Brent Waddoups, C. Deline
Spread spectrum time domain reflectometry (SSTDR) has previously been used for detection and location of intermittent faults on live electrical wiring. These intermittent faults can be open circuits, short circuits, or resistive changes, all of which preserve the original shape of the SSTDR correlated waveform. But things are very different when SSTDR encounters a complex impedance discontinuity such as a capacitor or inductor. In this case, the reflection is a function of frequency, changing the shape of the SSTDR signature. In this paper, we will show the SSTDR response to single capacitors and inductors. We will also explore how SSTDR responds to arrays of PV panels (which are capacitive) connected by wires. We will show both simulations and measurements. In some configurations, it is relatively easy to see faults, although algorithms are still under development. In other configurations, little change occurs, which makes it very difficult to create a system for testing for these faults.
{"title":"Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays","authors":"C. Furse, N. Jayakumar, E. Benoit, M. U. Saleh, Josiah Lacombe, M. Scarpulla, J. Harley, S. Kingston, Brent Waddoups, C. Deline","doi":"10.1109/AUTEST.2018.8532521","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532521","url":null,"abstract":"Spread spectrum time domain reflectometry (SSTDR) has previously been used for detection and location of intermittent faults on live electrical wiring. These intermittent faults can be open circuits, short circuits, or resistive changes, all of which preserve the original shape of the SSTDR correlated waveform. But things are very different when SSTDR encounters a complex impedance discontinuity such as a capacitor or inductor. In this case, the reflection is a function of frequency, changing the shape of the SSTDR signature. In this paper, we will show the SSTDR response to single capacitors and inductors. We will also explore how SSTDR responds to arrays of PV panels (which are capacitive) connected by wires. We will show both simulations and measurements. In some configurations, it is relatively easy to see faults, although algorithms are still under development. In other configurations, little change occurs, which makes it very difficult to create a system for testing for these faults.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114632846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532504
J. Sheppard, Joseph DeBruycker
The complexity and widespread use of modern day electronics in today's weapon systems necessitates a robust state-of-the-art framework for the development and operation of automatic test systems (ATS). The Department of Defense (DOD) ATS Framework Working group is developing an information standards-based framework to support interoperability in modern ATS. The expectation is that such ATS will improve overall maintenance, availability, and safety of these weapon systems while also reducing the cost of ownership of the weapon systems and their support infrastructure. A key emerging aspect of this framework is prognostics and health management (PHM). PHM is a field of work concerned with the detection, assessment, and prediction of the health of a complex system. In this paper, we summarize the current state of the DOD ATS Framework and address the functional gaps related specifically to PHM. The intent is to use this as a starting point for defining a corresponding ATS Framework for PHM. To do this, we provide a mapping between the key elements of the current framework to the functional blocks of the Open Systems Architecture Condition Based Management (OSA-CBM) standard, identifying existing standards or standards under development, and providing recommendations for areas that need improvement.
{"title":"An Investigation of Current and Emerging Standards to Support a Framework for Prognostics and Health Management in Automatic Test Systems","authors":"J. Sheppard, Joseph DeBruycker","doi":"10.1109/AUTEST.2018.8532504","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532504","url":null,"abstract":"The complexity and widespread use of modern day electronics in today's weapon systems necessitates a robust state-of-the-art framework for the development and operation of automatic test systems (ATS). The Department of Defense (DOD) ATS Framework Working group is developing an information standards-based framework to support interoperability in modern ATS. The expectation is that such ATS will improve overall maintenance, availability, and safety of these weapon systems while also reducing the cost of ownership of the weapon systems and their support infrastructure. A key emerging aspect of this framework is prognostics and health management (PHM). PHM is a field of work concerned with the detection, assessment, and prediction of the health of a complex system. In this paper, we summarize the current state of the DOD ATS Framework and address the functional gaps related specifically to PHM. The intent is to use this as a starting point for defining a corresponding ATS Framework for PHM. To do this, we provide a mapping between the key elements of the current framework to the functional blocks of the Open Systems Architecture Condition Based Management (OSA-CBM) standard, identifying existing standards or standards under development, and providing recommendations for areas that need improvement.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124358358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532565
C. Teal, C. Ferguson
This paper describes the successful application of the Department of Defense (DoD) ATS Automatic Wire Test Set (AWTS) into Phase Maintenance obtaining optimal readiness for weapon systems. The guideline for implementation is the DoD Standard Practice MIL-STD-1798C Mechanical Equipment and Subsystems Integrity Program. The goal of this integrity program is to achieve the desired level of safety and aircraft availability at the most economic cost across the life cycle of the weapon system. The Phase Maintenance process consists of inspections and the necessary repairs resulting from the inspections. These events are generally scheduled based upon a prescribed number of flight hours. This paper addresses the Electrical Wiring Interconnect Systems (EWIS) integrity requirements in the DoD Standard Practice and the current Phase Maintenance elements with and without the use of the Automatic Wire Test Set. Issues addressed are inspection methods, data collection and analysis for trend and predictive algorithm development, schedule time impacts, accuracy of inspections, human inspection errors/consistency, and cost considerations. Case studies based upon recent integration of AWTS with end users in the field to support maintenance and troubleshooting of EWIS predominantly on aircraft are presented to demonstrate efficacy as related to the issues of inspection and repair.
{"title":"Prognostics of Electrical Wiring Interconnect Systems Using Precise Automated Testing at Phase Maintenance","authors":"C. Teal, C. Ferguson","doi":"10.1109/AUTEST.2018.8532565","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532565","url":null,"abstract":"This paper describes the successful application of the Department of Defense (DoD) ATS Automatic Wire Test Set (AWTS) into Phase Maintenance obtaining optimal readiness for weapon systems. The guideline for implementation is the DoD Standard Practice MIL-STD-1798C Mechanical Equipment and Subsystems Integrity Program. The goal of this integrity program is to achieve the desired level of safety and aircraft availability at the most economic cost across the life cycle of the weapon system. The Phase Maintenance process consists of inspections and the necessary repairs resulting from the inspections. These events are generally scheduled based upon a prescribed number of flight hours. This paper addresses the Electrical Wiring Interconnect Systems (EWIS) integrity requirements in the DoD Standard Practice and the current Phase Maintenance elements with and without the use of the Automatic Wire Test Set. Issues addressed are inspection methods, data collection and analysis for trend and predictive algorithm development, schedule time impacts, accuracy of inspections, human inspection errors/consistency, and cost considerations. Case studies based upon recent integration of AWTS with end users in the field to support maintenance and troubleshooting of EWIS predominantly on aircraft are presented to demonstrate efficacy as related to the issues of inspection and repair.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"250 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123586471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532540
M. Dewey
Field Programmable Gate Arrays (FPGAs) are used extensively in today's electronic assemblies and test engineers are also choosing to incorporate FPGA-based instrumentation as part of their functional test solutions. Today there are a variety of user-programmable FPGA-based instruments available to test engineers which can be used to support a wide range of applications and interfaces. These instruments employ a range of programming tools and architectures. However, to ensure maximum flexibility and long-term / organic support for test systems and applications, both the suppliers and end-users of these instruments need to focus on employing industry standards. This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard.
{"title":"Leveraging Industry Standards for User Programmable FPGA Instrumentation","authors":"M. Dewey","doi":"10.1109/AUTEST.2018.8532540","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532540","url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) are used extensively in today's electronic assemblies and test engineers are also choosing to incorporate FPGA-based instrumentation as part of their functional test solutions. Today there are a variety of user-programmable FPGA-based instruments available to test engineers which can be used to support a wide range of applications and interfaces. These instruments employ a range of programming tools and architectures. However, to ensure maximum flexibility and long-term / organic support for test systems and applications, both the suppliers and end-users of these instruments need to focus on employing industry standards. This paper discusses the use of industry standard design tools, the proper use of intellectual property (IP), and the use/adoption of standardized FPGA interfaces such as the ANSI/VITA 57 standard.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125276230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532559
A. Tsertov, A. Jutman, K. Shibin, S. Devadze
The ongoing research in the adjoin fields of failure resilience, health monitoring, fault management has also shown a widening interest in IEEE 1687 Std. applications. In this paper we unveil IEEE 1687 compliant ecosystem that covers almost every aspect related to IJTAG compliant RSNs. With the help of ecosystem tools we present an extension to the standard network reconfiguration modules to illustrate the capabilities of asynchronous error detection schemes in IJTAG networks. In addition, in this paper as an example application of the Ecosystems' SW support we present an automatically generated tests for the suite of IEEE 1687 benchmark networks in Procedural Description Language (PDL).
{"title":"IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring","authors":"A. Tsertov, A. Jutman, K. Shibin, S. Devadze","doi":"10.1109/AUTEST.2018.8532559","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532559","url":null,"abstract":"The ongoing research in the adjoin fields of failure resilience, health monitoring, fault management has also shown a widening interest in IEEE 1687 Std. applications. In this paper we unveil IEEE 1687 compliant ecosystem that covers almost every aspect related to IJTAG compliant RSNs. With the help of ecosystem tools we present an extension to the standard network reconfiguration modules to illustrate the capabilities of asynchronous error detection schemes in IJTAG networks. In addition, in this paper as an example application of the Ecosystems' SW support we present an automatically generated tests for the suite of IEEE 1687 benchmark networks in Procedural Description Language (PDL).","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125117682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/AUTEST.2018.8532502
E. Bean
Reducing the cost of and time to develop automated test equipment (ATE) is a common goal for many organizations. This paper examines one effort to do that using a common architecture and tester executive for ATE. The history of the project and expected benefits are covered. Challenges encountered in its development are examined. This includes resistance from test engineers and architecture flexibility. These challenges also presented many opportunities for continuous improvement. In addition, this paper discusses how deviations from the architecture are handled. Finally, the actual realized benefits of this approach are described along with the path forward in gaining more from the architecture.
{"title":"Using a Common Tester Architecture","authors":"E. Bean","doi":"10.1109/AUTEST.2018.8532502","DOIUrl":"https://doi.org/10.1109/AUTEST.2018.8532502","url":null,"abstract":"Reducing the cost of and time to develop automated test equipment (ATE) is a common goal for many organizations. This paper examines one effort to do that using a common architecture and tester executive for ATE. The history of the project and expected benefits are covered. Challenges encountered in its development are examined. This includes resistance from test engineers and architecture flexibility. These challenges also presented many opportunities for continuous improvement. In addition, this paper discusses how deviations from the architecture are handled. Finally, the actual realized benefits of this approach are described along with the path forward in gaining more from the architecture.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122693223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：