Pub Date : 2022-05-04DOI: 10.1080/08940886.2022.2078158
H. Bluhm
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Pub Date : 2022-05-04DOI: 10.1080/08940886.2022.2082166
A. Shavorskiy, E. Kokkonen, E. Redekop, Giulio D’Acunto, J. Schnadt, J. Knudsen
Vol. 35, No. 3, 2022, Synchrotron radiation newS Technical RepoRT Time-Resolved APXPS with Chemical Potential Perturbations: Recent Developments at the MAX IV Laboratory Andrey ShAvorSkiy,1 eSko kokkonen,1 evgeniy redekop,2 giulio d’Acunto,3,4 JoAchim SchnAdt,1,3,4 And JAn knudSen1,3,4 1MAX IV Laboratory, Lund University, Lund, Sweden 2Department of Chemistry, Centre for Materials Science and Nanotechnology (SMN), University of Oslo, Oslo, Norway 3Division of Synchrotron Radiation Research, Department of Physics, Lund University, Lund, Sweden 4NanoLund, Lund University, Lund, Sweden Introduction Heterogeneous systems made up of gas-solid interfaces are common in nature and in industrial processes. They play a critical role in heterogeneous catalysis, formation of weather patterns, atmospheric phenomena, and corrosion. For many of these systems, the activity and structure of the interface are intimately related and rapidly responding to changes in the gas phase composition. To understand such activity-structure relationships, correlated measurements of activity and interfacial structure and composition are required. Often, studies of heterogeneous systems focus on experiments under steady-state conditions. Under such conditions, however, the acquisition of correlated data is often complicated by the dynamic nature of the heterogeneous processes and their complexity [1]. For example, under steady-state conditions only the slowest reaction steps and most abundant intermediates are characterized. It is only when the system is driven away from its steady state and allowed to relax that the true time evolution of its key features becomes observable. The literature often discusses that such transient methods result in a better mechanistic understanding of surface reactions than steady-state experiments [2]. The general scheme for a time-resolved experiment thus should follow the classical pump-probe scheme: the transient conditions are created on demand by driving the system away from the steady state via an external perturbation (the pump). Among the multitude of methods to excite/perturb the system, chemical potential perturbations are desirable for investigating activity-structure relationship and can be implemented via changes in gas composition above the solid surface. The structural/compositional response is then measured (the probe) during subsequent relaxation of the system into the previous (for reversible processes) or new (for nonreversible processes) resting state (Figure 1) [3]. The simplest way to perform a time-resolved measurement is to decrease the acquisition time for a measurement. However, the signal-tonoise ratio required for extraction of meaningful information sets the lower limit achievable in this approach. The analysis of a consequent series of such measurements allows extraction of the time evolution of the signal. During such an experiment, the measurements of the sample response occur in real time, which gives the advantage
同步辐射新闻技术报告:带化学势扰动的时间分辨APXPSMAX IV实验室的最新进展Andrey ShAvorSkiy,1 eSko kokkonen,1 evgeniy redekop,2 giulio d 'Acunto,3,4 JoAchim SchnAdt,1,3,4 And JAn knudsen1,3,4 1瑞典隆德大学MAX IV实验室2挪威奥斯陆大学材料科学与纳米技术中心化学系3瑞典隆德大学物理系同步辐射研究部4隆德大学nanolund，隆德，隆德由气固界面组成的非均相系统在自然界和工业过程中都很常见。它们在多相催化、天气模式的形成、大气现象和腐蚀中起着关键作用。对于许多这样的系统，界面的活性和结构是密切相关的，并迅速响应气相组成的变化。为了理解这种活性-结构关系，需要对活性和界面结构及组成进行相关测量。通常，异质系统的研究集中在稳态条件下的实验。然而，在这种情况下，由于异构过程的动态性及其复杂性[1]，相关数据的获取往往变得复杂。例如，在稳态条件下，只有最慢的反应步骤和最丰富的中间产物被表征。只有当系统远离稳态并允许其放松时，其关键特征的真实时间演变才能被观察到。文献经常讨论，这种瞬态方法比稳态实验能更好地理解表面反应的机理。因此，时间分辨实验的一般方案应该遵循经典的泵-探测方案:瞬态条件是根据需要通过外部扰动(泵)将系统从稳态驱动而产生的。在众多激发/扰动系统的方法中，化学势扰动对于研究活性-结构关系是理想的，并且可以通过改变固体表面以上的气体组成来实现。随后，在系统松弛到前一个(可逆过程)或新的(不可逆过程)静息状态(图1)[3]时，测量结构/组成响应(探针)。执行时间分辨测量的最简单方法是减少测量的采集时间。然而，提取有意义信息所需的信噪比设置了该方法可实现的下限。对一系列这样的测量结果的分析可以提取信号的时间演化。在这种实验中，样品响应的测量是实时发生的，这使得研究不可逆过程和自发振荡反应具有优势。因此，可以精确地将成分数据与活动特征相匹配。为了提供有意义的数据，摄动和测量都必须发生在比随后的弛豫短得多的时间尺度上。在过去的二十年中，环境压力x射线光电子能谱(APXPS)已经发展成为在现实条件下研究气固界面的最流行和最强大的实验技术之一。目前，在现代同步加速器设施中进行的化学扰动XPS实验的时间分辨率仅限于几百毫秒;由于光电子的收集效率相对较低，并且在几毫巴时存在气相，因此达到比这更好的时间分辨率目前是一个挑战。为了克服这一问题，实现APXPS实验时间分辨率的突破，必须结合平均方法，多次重复相同的过程，对数据进行求和/平均，以提高信噪比。在下面的例子中，我们展示了在SPE-上进行的当前最先进的时间分辨原位APXPS测量
{"title":"Time-Resolved APXPS with Chemical Potential Perturbations: Recent Developments at the MAX IV Laboratory","authors":"A. Shavorskiy, E. Kokkonen, E. Redekop, Giulio D’Acunto, J. Schnadt, J. Knudsen","doi":"10.1080/08940886.2022.2082166","DOIUrl":"https://doi.org/10.1080/08940886.2022.2082166","url":null,"abstract":"Vol. 35, No. 3, 2022, Synchrotron radiation newS Technical RepoRT Time-Resolved APXPS with Chemical Potential Perturbations: Recent Developments at the MAX IV Laboratory Andrey ShAvorSkiy,1 eSko kokkonen,1 evgeniy redekop,2 giulio d’Acunto,3,4 JoAchim SchnAdt,1,3,4 And JAn knudSen1,3,4 1MAX IV Laboratory, Lund University, Lund, Sweden 2Department of Chemistry, Centre for Materials Science and Nanotechnology (SMN), University of Oslo, Oslo, Norway 3Division of Synchrotron Radiation Research, Department of Physics, Lund University, Lund, Sweden 4NanoLund, Lund University, Lund, Sweden Introduction Heterogeneous systems made up of gas-solid interfaces are common in nature and in industrial processes. They play a critical role in heterogeneous catalysis, formation of weather patterns, atmospheric phenomena, and corrosion. For many of these systems, the activity and structure of the interface are intimately related and rapidly responding to changes in the gas phase composition. To understand such activity-structure relationships, correlated measurements of activity and interfacial structure and composition are required. Often, studies of heterogeneous systems focus on experiments under steady-state conditions. Under such conditions, however, the acquisition of correlated data is often complicated by the dynamic nature of the heterogeneous processes and their complexity [1]. For example, under steady-state conditions only the slowest reaction steps and most abundant intermediates are characterized. It is only when the system is driven away from its steady state and allowed to relax that the true time evolution of its key features becomes observable. The literature often discusses that such transient methods result in a better mechanistic understanding of surface reactions than steady-state experiments [2]. The general scheme for a time-resolved experiment thus should follow the classical pump-probe scheme: the transient conditions are created on demand by driving the system away from the steady state via an external perturbation (the pump). Among the multitude of methods to excite/perturb the system, chemical potential perturbations are desirable for investigating activity-structure relationship and can be implemented via changes in gas composition above the solid surface. The structural/compositional response is then measured (the probe) during subsequent relaxation of the system into the previous (for reversible processes) or new (for nonreversible processes) resting state (Figure 1) [3]. The simplest way to perform a time-resolved measurement is to decrease the acquisition time for a measurement. However, the signal-tonoise ratio required for extraction of meaningful information sets the lower limit achievable in this approach. The analysis of a consequent series of such measurements allows extraction of the time evolution of the signal. During such an experiment, the measurements of the sample response occur in real time, which gives the advantage ","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"4 - 10"},"PeriodicalIF":0.0,"publicationDate":"2022-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48868290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-04DOI: 10.1080/08940886.2022.2082182
Chia‐Hsin Wang, Bo-Hong Liu, Yaw-Wen Yang
Ambient pressure X-ray photoelectron spectroscopy is considered one of the most exciting photoelectron spectroscopy techniques developed during the past two decades to address the electronic structure properties of the materials under in-situ and in-operando environments [1, 2]. Through the ingenious design of sample cells, the technique has been applied to investigate the heterogeneous reactions covering gassolid, liquid-solid, and gas-liquid interfaces routinely in a few mbar pressure range. This capability allows researchers to explore new research frontiers in areas such as catalysis, renewable energy, environmental chemistry, etc. [3–5]. The past decade has seen a greater proliferation of both lab-based and synchrotron-based APXPS instruments, propelled by the availability of commercial APXPS analyzers [6, 7].
{"title":"Ambient Pressure X-ray Photoelectron Spectroscopy (APXPS): Present Status and Future Development at NSRRC","authors":"Chia‐Hsin Wang, Bo-Hong Liu, Yaw-Wen Yang","doi":"10.1080/08940886.2022.2082182","DOIUrl":"https://doi.org/10.1080/08940886.2022.2082182","url":null,"abstract":"Ambient pressure X-ray photoelectron spectroscopy is considered one of the most exciting photoelectron spectroscopy techniques developed during the past two decades to address the electronic structure properties of the materials under in-situ and in-operando environments [1, 2]. Through the ingenious design of sample cells, the technique has been applied to investigate the heterogeneous reactions covering gassolid, liquid-solid, and gas-liquid interfaces routinely in a few mbar pressure range. This capability allows researchers to explore new research frontiers in areas such as catalysis, renewable energy, environmental chemistry, etc. [3–5]. The past decade has seen a greater proliferation of both lab-based and synchrotron-based APXPS instruments, propelled by the availability of commercial APXPS analyzers [6, 7].","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"48 - 53"},"PeriodicalIF":0.0,"publicationDate":"2022-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43883209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2066442
F. Seiboth
The short wavelength of X-rays allows in principle the creation of focal spot sizes down to a few nanometers and below. At the same time, this short wavelength and the resulting interaction with matter puts stringent requirements on X-ray optics manufacturing and metrol-ogy. With the transition from third-generation synchrotron sources to diffraction-limited storage rings of the fourth generation, more beamlines will operate at higher spatial coherence. Thus, more instruments will work with smaller focal spot sizes that are increasingly dominated by diffraction effects instead of a demagnification of the X-ray source. Consequently, the requirements of X-ray optics will increase to ensure best beam characteristics via diffraction-limited optics. Simultaneously, X-ray optics manufacturing strives to achieve higher numerical aper-tures to provide ever decreasing beam sizes. On the forefront of this development are highly specialized nanofocusing beamlines with X-ray optics that push focusing toward 10 nm [1–4] and have the ambi-tious goal to reach 1 nm spot sizes [5]. The fabrication of X-ray optics requires the most advanced technologies, such as lithographic nano-fabrication for diffractive [6] and refractive optics [7], surface figuring with atomic precision for total reflection and multilayer mirrors [8], and thin-film technologies for multilayer optics [9]. All of these technologies have been developed over decades and further advances are expected in the future. Minuscule fluctuations or process anisotropies can cause shape deviations of the X-ray optic with a significant impact on focusing performance. Refractive phase plates in combination with a focusing optic are one solution to overcome these technological limitations. While the weak interaction of hard X-rays with matter and the resulting refractive index decrement δ on the order of 10 6 − pose a challenge for the
{"title":"Refractive Phase Plates for Aberration Correction and Wavefront Engineering","authors":"F. Seiboth","doi":"10.1080/08940886.2022.2066442","DOIUrl":"https://doi.org/10.1080/08940886.2022.2066442","url":null,"abstract":"The short wavelength of X-rays allows in principle the creation of focal spot sizes down to a few nanometers and below. At the same time, this short wavelength and the resulting interaction with matter puts stringent requirements on X-ray optics manufacturing and metrol-ogy. With the transition from third-generation synchrotron sources to diffraction-limited storage rings of the fourth generation, more beamlines will operate at higher spatial coherence. Thus, more instruments will work with smaller focal spot sizes that are increasingly dominated by diffraction effects instead of a demagnification of the X-ray source. Consequently, the requirements of X-ray optics will increase to ensure best beam characteristics via diffraction-limited optics. Simultaneously, X-ray optics manufacturing strives to achieve higher numerical aper-tures to provide ever decreasing beam sizes. On the forefront of this development are highly specialized nanofocusing beamlines with X-ray optics that push focusing toward 10 nm [1–4] and have the ambi-tious goal to reach 1 nm spot sizes [5]. The fabrication of X-ray optics requires the most advanced technologies, such as lithographic nano-fabrication for diffractive [6] and refractive optics [7], surface figuring with atomic precision for total reflection and multilayer mirrors [8], and thin-film technologies for multilayer optics [9]. All of these technologies have been developed over decades and further advances are expected in the future. Minuscule fluctuations or process anisotropies can cause shape deviations of the X-ray optic with a significant impact on focusing performance. Refractive phase plates in combination with a focusing optic are one solution to overcome these technological limitations. While the weak interaction of hard X-rays with matter and the resulting refractive index decrement δ on the order of 10 6 − pose a challenge for the","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"43 - 48"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46265740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2066432
M. Manfredda, C. Fava, S. Gerusina, R. Gobessi, N. Mahne, L. Raimondi, A. Simoncig, M. Zangrando
Introduction KAOS, the Kirkpatrick-Baez Active Optical System, is the flagship optical system of FERMI, the first—and presently only—fully seeded Free Electron Laser facility in the world. KAOS has been entirely developed in-house and, after progressive revisions and upgrades, it presently empowers three out of six beamlines at FERMI (DiProI, LDM, MagneDyn). It also serves two beamlines at FLASH, Hamburg (FL23 and FL24). Although it is grounded on the well-established concept of Kirkpatrick-Baez (KB) mirrors, the challenges it addressed and the needs it was built for ultimately produced a unique system with unique features. Its success over time is the result of a simple and clean mechanical design coupled with the consolidated use of in-series Hartmann wavefront sensors, mounted downstream of the experimental end-stations. Wavefront sensing proved itself a valuable tool to assess the focusing capabilities of KAOS at the early stage of development. It has now overcome this initial duty, becoming used for the optimization of the curvature to face a plethora of needs, such as minimizing aberrations, shaping the beam, accommodating a varying source position, and providing extra diagnostics to the users. Ultimately, KAOS has grown up around, and thanks to, wavefront sensing; if KAOS were a sports car, wavefront sensing would be the pilot. This article aims to tell how KAOS was born and grew up, and will show how wavefront sensing made it work for the best.
{"title":"The Evolution of KAOS, a Multipurpose Active Optics System for EUV/Soft X-rays","authors":"M. Manfredda, C. Fava, S. Gerusina, R. Gobessi, N. Mahne, L. Raimondi, A. Simoncig, M. Zangrando","doi":"10.1080/08940886.2022.2066432","DOIUrl":"https://doi.org/10.1080/08940886.2022.2066432","url":null,"abstract":"Introduction KAOS, the Kirkpatrick-Baez Active Optical System, is the flagship optical system of FERMI, the first—and presently only—fully seeded Free Electron Laser facility in the world. KAOS has been entirely developed in-house and, after progressive revisions and upgrades, it presently empowers three out of six beamlines at FERMI (DiProI, LDM, MagneDyn). It also serves two beamlines at FLASH, Hamburg (FL23 and FL24). Although it is grounded on the well-established concept of Kirkpatrick-Baez (KB) mirrors, the challenges it addressed and the needs it was built for ultimately produced a unique system with unique features. Its success over time is the result of a simple and clean mechanical design coupled with the consolidated use of in-series Hartmann wavefront sensors, mounted downstream of the experimental end-stations. Wavefront sensing proved itself a valuable tool to assess the focusing capabilities of KAOS at the early stage of development. It has now overcome this initial duty, becoming used for the optimization of the curvature to face a plethora of needs, such as minimizing aberrations, shaping the beam, accommodating a varying source position, and providing extra diagnostics to the users. Ultimately, KAOS has grown up around, and thanks to, wavefront sensing; if KAOS were a sports car, wavefront sensing would be the pilot. This article aims to tell how KAOS was born and grew up, and will show how wavefront sensing made it work for the best.","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"29 - 36"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44236213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2066440
Xianbo Shi, Z. Qiao, L. Rebuffi, M. Wojcik, M. Highland, Matthew G. Frith, R. Harder, D. Shu, S. Mashrafi, J. Anton, S. Kearney, Max Wyman,, L. Assoufid
Introduction The planning and construction of new and upgraded high-brightness X-ray synchrotron and free electron laser sources, such as the Advanced Photon Source upgrade project (APS-U) [1], are driving numerous opportunities to advance X-ray science and technologies. At the same time, an increasing number of highly diverse beamline experiments demand wavefront-preserving adaptive X-ray optics with both high precision and flexibility. At the APS, significant effort has been devoted to developing next-generation adaptive and corrective optics combined with state-of-the-art at-wavelength wavefront sensing techniques and an intelligent feedback control system for the automation and self-alignment of beamline optical systems. This article reviews recent achievements in these areas at the APS [2–11]. These include the development of in-situ wavefront sensing [2, 3], the application in active feedback control of ultra-precision deformable mirrors [4, 5], and the exploration of non-invasive wavefront sensing techniques for adaptive optics and beamline diagnostics [6–8].
{"title":"Development of X-ray Wavefront Sensing Techniques for Adaptive Optics Control at the Advanced Photon Source","authors":"Xianbo Shi, Z. Qiao, L. Rebuffi, M. Wojcik, M. Highland, Matthew G. Frith, R. Harder, D. Shu, S. Mashrafi, J. Anton, S. Kearney, Max Wyman,, L. Assoufid","doi":"10.1080/08940886.2022.2066440","DOIUrl":"https://doi.org/10.1080/08940886.2022.2066440","url":null,"abstract":"Introduction The planning and construction of new and upgraded high-brightness X-ray synchrotron and free electron laser sources, such as the Advanced Photon Source upgrade project (APS-U) [1], are driving numerous opportunities to advance X-ray science and technologies. At the same time, an increasing number of highly diverse beamline experiments demand wavefront-preserving adaptive X-ray optics with both high precision and flexibility. At the APS, significant effort has been devoted to developing next-generation adaptive and corrective optics combined with state-of-the-art at-wavelength wavefront sensing techniques and an intelligent feedback control system for the automation and self-alignment of beamline optical systems. This article reviews recent achievements in these areas at the APS [2–11]. These include the development of in-situ wavefront sensing [2, 3], the application in active feedback control of ultra-precision deformable mirrors [4, 5], and the exploration of non-invasive wavefront sensing techniques for adaptive optics and beamline diagnostics [6–8].","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"37 - 42"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44434059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2066400
J. Nicolas, I. Šics, C. Colldelram, N. Gonzalez, A. Crisol, C. Ruget, Joaquín Benchomo González
Introduction The development of X-ray photon science has been characterized in the last few years by the development of free electron lasers and the so-called diffraction limited storage rings. These new sources are characterized by very high brilliance and increased transversal coherence. These features open new scientific opportunities, as they allow for higher spatial resolution, increased flux, and extended coherence length for diffraction and imaging techniques. Profiting from these features requires building or upgrading the optical systems of the beamlines employing optical elements, mostly mirrors, of very high quality. Mirrors with exceedingly large surface errors are either limiting the achievable smallest spot size or the highest reachable photon flux density, or causing intensity striations of the beam out of focus [1–3]. Despite the great improvement in the surface accuracy of commercially available mirrors experienced in the last decade, fruit of the development of deterministic polishing [4, 5], obtaining the ideal optical mirror surfaces at a beamline in operation is still challenging. In addition to residual polishing and figuring errors, there are errors that appear only after integration of the mirror at the beamline, or during operation, caused for instance by the heat load or by residual strain induced by the clamps or by the cooling system. More importantly, often beamlines require being able to change or manipulate the wavefront. Examples of this are beamlines where the position of the focused spot is shifted from one station to another, or when it depends on the photon energy. Other examples are beamlines that match the spot size to the sample in order to maintain the total incident flux while minimizing the flux density (to minimize radiation damage or space charge). The simplest example of adaptive optics is given by mechanical mirror benders, existing in many facilities for many years. These devices introduce a mechanical constraint at the ends of the mirror substrate, which results in a change of the mirror curvature profile, thus providing control of the lowest aberration terms of the wavefront. To have better control of the wavefront, one can add more actuators along the mirror (see Figure 1), thus introducing additional degrees of freedom. Of course, for the system to work, the actuators must provide enough resolution to modify the mirror surface with sub-nanometer resolution. Some systems obtain such resolution by taking advantage of the bimorph effect [6, 7] or using piezoelectric actuators [8, 9]. Alternatively, other systems, like the system developed by ALBA, achieve the required resolution by using elastic elements in the actuators [10–12]. These introduce and maintain a force rather than a geometrical constraint. In their case, the ratio between the stiffness of the mirror and of the spring is large enough to allow obtaining sub-nanometer resolution at the surface of the mirror using only conventional UHV mec
{"title":"A Versatile Adaptive Optics System for Alba Beamlines","authors":"J. Nicolas, I. Šics, C. Colldelram, N. Gonzalez, A. Crisol, C. Ruget, Joaquín Benchomo González","doi":"10.1080/08940886.2022.2066400","DOIUrl":"https://doi.org/10.1080/08940886.2022.2066400","url":null,"abstract":"Introduction The development of X-ray photon science has been characterized in the last few years by the development of free electron lasers and the so-called diffraction limited storage rings. These new sources are characterized by very high brilliance and increased transversal coherence. These features open new scientific opportunities, as they allow for higher spatial resolution, increased flux, and extended coherence length for diffraction and imaging techniques. Profiting from these features requires building or upgrading the optical systems of the beamlines employing optical elements, mostly mirrors, of very high quality. Mirrors with exceedingly large surface errors are either limiting the achievable smallest spot size or the highest reachable photon flux density, or causing intensity striations of the beam out of focus [1–3]. Despite the great improvement in the surface accuracy of commercially available mirrors experienced in the last decade, fruit of the development of deterministic polishing [4, 5], obtaining the ideal optical mirror surfaces at a beamline in operation is still challenging. In addition to residual polishing and figuring errors, there are errors that appear only after integration of the mirror at the beamline, or during operation, caused for instance by the heat load or by residual strain induced by the clamps or by the cooling system. More importantly, often beamlines require being able to change or manipulate the wavefront. Examples of this are beamlines where the position of the focused spot is shifted from one station to another, or when it depends on the photon energy. Other examples are beamlines that match the spot size to the sample in order to maintain the total incident flux while minimizing the flux density (to minimize radiation damage or space charge). The simplest example of adaptive optics is given by mechanical mirror benders, existing in many facilities for many years. These devices introduce a mechanical constraint at the ends of the mirror substrate, which results in a change of the mirror curvature profile, thus providing control of the lowest aberration terms of the wavefront. To have better control of the wavefront, one can add more actuators along the mirror (see Figure 1), thus introducing additional degrees of freedom. Of course, for the system to work, the actuators must provide enough resolution to modify the mirror surface with sub-nanometer resolution. Some systems obtain such resolution by taking advantage of the bimorph effect [6, 7] or using piezoelectric actuators [8, 9]. Alternatively, other systems, like the system developed by ALBA, achieve the required resolution by using elastic elements in the actuators [10–12]. These introduce and maintain a force rather than a geometrical constraint. In their case, the ratio between the stiffness of the mirror and of the spring is large enough to allow obtaining sub-nanometer resolution at the surface of the mirror using only conventional UHV mec","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":" ","pages":"14 - 19"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45089947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2066450
Introduction The Japanese Society for Synchrotron Radiation Research (JSSRR) is an academic society for promoting development in synchrotron radiation (SR) science and technology in Japan, composed of 1200 members from universities, research institutes, industrial companies, and SR facilities. Due to the recent COVID pandemic situation, deployment of automation and remote tools in SR experiments has accelerated, while the rapid transition to the new style has evoked some concerns among users and SR facilities. To build a broad consensus in the Japanese SR community, the JSSRR organized an “Ad-hoc Committee on Remote Experiments” in 2021. This report is a brief summary of discussion at the Committee.
{"title":"Report on Remote Experiments from the JSSRR Ad-Hoc Committee","authors":" ","doi":"10.1080/08940886.2022.2066450","DOIUrl":"https://doi.org/10.1080/08940886.2022.2066450","url":null,"abstract":"Introduction The Japanese Society for Synchrotron Radiation Research (JSSRR) is an academic society for promoting development in synchrotron radiation (SR) science and technology in Japan, composed of 1200 members from universities, research institutes, industrial companies, and SR facilities. Due to the recent COVID pandemic situation, deployment of automation and remote tools in SR experiments has accelerated, while the rapid transition to the new style has evoked some concerns among users and SR facilities. To build a broad consensus in the Japanese SR community, the JSSRR organized an “Ad-hoc Committee on Remote Experiments” in 2021. This report is a brief summary of discussion at the Committee.","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"49 - 51"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47114085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-03-04DOI: 10.1080/08940886.2022.2058856
J. Sutter, S. Alcock, I. Nistea, Hongchang Wang, K. Sawhney
Introduction Reflective mirrors are used on most synchrotron and free electron laser (XFEL) beamlines to transport X-rays from the source to the sample. They are achromatic and provide larger acceptance and less absorption compared to compound refractive lenses. Mirrors whose surface profile can be controllably changed are called “active optics.” This enables users to vary the beam profile or focal position. X-ray beamlines use two categories of active optics: mechanically actuated mirrors, which typically use one or two independent bending motors for cylindrical or elliptical bending [1]; and piezoelectric bimorph deformable mirrors. Bimorph deformable X-ray mirrors have been used to focus X-rays at synchrotron and XFEL beamlines since early research in the 1990s by Susini et al. [2] and Signorato et al. [3] at the European Synchrotron Radiation Facility (France). Soon afterwards, bimorph mirrors were commercialized by Thales-SESO (France) and deployed at several labs, including the Advanced Photon Source (USA) and Diamond Light Source (UK), called “Diamond” from here on. Research by Diamond’s Optics & Metrology (O&M) group shows that the widely held bad impression of bimorph mirrors as unreliable and excessively complex is outdated and unfounded. With fast, precise metrology techniques developed at Diamond, the difficulties encountered by the early users of bimorph mirrors have been overcome, and Diamond has combined bimorph actuators with specialized substrates for several novel applications. Finally, Diamond’s improvements can help realize the true potential of bimorph mirrors to act as closed-loop, adaptive X-ray optics with real-time correction. Such dynamic optics could match the profile of an X-ray beam to a series of rapidly changing samples of different shapes and sizes, or provide fast, stable wavefront correction.
{"title":"Active and Adaptive X-Ray Optics at Diamond Light Source","authors":"J. Sutter, S. Alcock, I. Nistea, Hongchang Wang, K. Sawhney","doi":"10.1080/08940886.2022.2058856","DOIUrl":"https://doi.org/10.1080/08940886.2022.2058856","url":null,"abstract":"Introduction Reflective mirrors are used on most synchrotron and free electron laser (XFEL) beamlines to transport X-rays from the source to the sample. They are achromatic and provide larger acceptance and less absorption compared to compound refractive lenses. Mirrors whose surface profile can be controllably changed are called “active optics.” This enables users to vary the beam profile or focal position. X-ray beamlines use two categories of active optics: mechanically actuated mirrors, which typically use one or two independent bending motors for cylindrical or elliptical bending [1]; and piezoelectric bimorph deformable mirrors. Bimorph deformable X-ray mirrors have been used to focus X-rays at synchrotron and XFEL beamlines since early research in the 1990s by Susini et al. [2] and Signorato et al. [3] at the European Synchrotron Radiation Facility (France). Soon afterwards, bimorph mirrors were commercialized by Thales-SESO (France) and deployed at several labs, including the Advanced Photon Source (USA) and Diamond Light Source (UK), called “Diamond” from here on. Research by Diamond’s Optics & Metrology (O&M) group shows that the widely held bad impression of bimorph mirrors as unreliable and excessively complex is outdated and unfounded. With fast, precise metrology techniques developed at Diamond, the difficulties encountered by the early users of bimorph mirrors have been overcome, and Diamond has combined bimorph actuators with specialized substrates for several novel applications. Finally, Diamond’s improvements can help realize the true potential of bimorph mirrors to act as closed-loop, adaptive X-ray optics with real-time correction. Such dynamic optics could match the profile of an X-ray beam to a series of rapidly changing samples of different shapes and sizes, or provide fast, stable wavefront correction.","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"35 1","pages":"8 - 13"},"PeriodicalIF":0.0,"publicationDate":"2022-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45453105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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