Pub Date : 2024-11-14DOI: 10.1021/acsaelm.4c0126410.1021/acsaelm.4c01264
Muhammad Wajid Zulfiqar, Sobia Nisar, Ghulam Dastgeer*, Faisal Ghafoor, Muhammad Rabeel, Vijay D. Chavan, Ali Alsalme, Muhammad Zahir Iqbal, Iqra Rabani and Deok-kee Kim*,
The unique combination of atomically thin layers and well-defined interfaces in two-dimensional (2D) semiconductors holds promise for applications in electronics and optoelectronics. As promising newcomers, p-type InSe and n-type PtS2 nanosheets present exciting possibilities, with their unique characteristics. Here, we investigate gate-controlled InSe/PtS2 van der Waals heterostructures (vdWHs), highlighting their potential as candidates for advanced electronic and optoelectronic applications. This work demonstrates the realization of a 2D p-n diode with a precisely defined atomic interface, exhibiting strong interlayer interactions. InSe/PtS2 vdWHs demonstrate impressive functionalities surpassing previously reported van der Waals counterparts with gate-dependent rectification of 1.5 × 105 at a gate voltage of Vg = −20 V and ideality factor of 1.17, close to an ideal diode. Investigating the photovoltaic response of the InSe/PtS2 heterostructure under varied light intensities revealed a significant responsivity that varies from 31.85 to 43.2 A/W upon exposure to a light wavelength of 220 nm. Additionally, a substantial external quantum efficiency (EQE) ratio of ∼2.4 × 104 % with high detectivity (D*) of 7.06 × 109 Jones values is achieved. This work demonstrates the development of advanced p-n junctions, paving the way for the realization of high-performance electronics and optoelectronic devices.
{"title":"Gate-Controlled InSe/PtS2 van der Waals Heterostructures for High-Performance Electronic and Optoelectronic Devices","authors":"Muhammad Wajid Zulfiqar, Sobia Nisar, Ghulam Dastgeer*, Faisal Ghafoor, Muhammad Rabeel, Vijay D. Chavan, Ali Alsalme, Muhammad Zahir Iqbal, Iqra Rabani and Deok-kee Kim*, ","doi":"10.1021/acsaelm.4c0126410.1021/acsaelm.4c01264","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01264https://doi.org/10.1021/acsaelm.4c01264","url":null,"abstract":"<p >The unique combination of atomically thin layers and well-defined interfaces in two-dimensional (2D) semiconductors holds promise for applications in electronics and optoelectronics. As promising newcomers, p-type InSe and n-type PtS<sub>2</sub> nanosheets present exciting possibilities, with their unique characteristics. Here, we investigate gate-controlled InSe/PtS<sub>2</sub> van der Waals heterostructures (vdWHs), highlighting their potential as candidates for advanced electronic and optoelectronic applications. This work demonstrates the realization of a 2D p-n diode with a precisely defined atomic interface, exhibiting strong interlayer interactions. InSe/PtS<sub>2</sub> vdWHs demonstrate impressive functionalities surpassing previously reported van der Waals counterparts with gate-dependent rectification of 1.5 × 10<sup>5</sup> at a gate voltage of <i>V</i><sub>g</sub> = −20 V and ideality factor of 1.17, close to an ideal diode. Investigating the photovoltaic response of the InSe/PtS<sub>2</sub> heterostructure under varied light intensities revealed a significant responsivity that varies from 31.85 to 43.2 A/W upon exposure to a light wavelength of 220 nm. Additionally, a substantial external quantum efficiency (EQE) ratio of ∼2.4 × 10<sup>4</sup> % with high detectivity (<i>D</i>*) of 7.06 × 10<sup>9</sup> Jones values is achieved. This work demonstrates the development of advanced p-n junctions, paving the way for the realization of high-performance electronics and optoelectronic devices.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"7906–7914 7906–7914"},"PeriodicalIF":4.3,"publicationDate":"2024-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142713561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The unique electronic properties of amorphous indium gallium zinc oxide (a-IGZO) thin films are closely associated with the complex charge dynamics of the materials. Conventional studies of charge transport in a-IGZO usually involve steady-state or transient measurements on field-effect transistors. Here, we employed microwave impedance microscopy to carry out position-dependent time-of-flight (TOF) experiments on a-IGZO devices, which offer spatial and temporal information on the underlying transport dynamics. The drift mobility calculated from the delay time between carrier injection and onset of TOF response is 2–3 cm2/(V s), consistent with the field-effect mobility from device measurements. The spatiotemporal conductivity data can be nicely fitted to a two-step function, corresponding to two coexisting mechanisms with a typical time scale of milliseconds. The competition between multiple-trap-and-release conduction through band-tail states and hopping conduction through deep trap states is evident from the fitting parameters. The underlying length scale and time scale of charge dynamics in a-IGZO are of fundamental importance for transparent and flexible nanoelectronics and optoelectronics, as well as emerging back-end-of-line applications.
{"title":"Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-Flight Microwave Impedance Microscopy","authors":"Jia Yu, Yuchen Zhou, Xiao Wang, Xuejian Ma, Ananth Dodabalapur* and Keji Lai*, ","doi":"10.1021/acsaelm.4c0165210.1021/acsaelm.4c01652","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01652https://doi.org/10.1021/acsaelm.4c01652","url":null,"abstract":"<p >The unique electronic properties of amorphous indium gallium zinc oxide (a-IGZO) thin films are closely associated with the complex charge dynamics of the materials. Conventional studies of charge transport in a-IGZO usually involve steady-state or transient measurements on field-effect transistors. Here, we employed microwave impedance microscopy to carry out position-dependent time-of-flight (TOF) experiments on a-IGZO devices, which offer spatial and temporal information on the underlying transport dynamics. The drift mobility calculated from the delay time between carrier injection and onset of TOF response is 2–3 cm<sup>2</sup>/(V s), consistent with the field-effect mobility from device measurements. The spatiotemporal conductivity data can be nicely fitted to a two-step function, corresponding to two coexisting mechanisms with a typical time scale of milliseconds. The competition between multiple-trap-and-release conduction through band-tail states and hopping conduction through deep trap states is evident from the fitting parameters. The underlying length scale and time scale of charge dynamics in a-IGZO are of fundamental importance for transparent and flexible nanoelectronics and optoelectronics, as well as emerging back-end-of-line applications.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8448–8454 8448–8454"},"PeriodicalIF":4.3,"publicationDate":"2024-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142713558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this work, the back-end of line (BEOL) compatible sub-6 nm Hf0.5Zr0.5O2/ZrO2/Hf0.5Zr0.5O2 (HZO/ZrO2/HZO) stack and the corresponding capacitors were fabricated. The capacitor with the sub-6 nm HZO/ZrO2/HZO stack annealed at 400 °C shows a superior remanent polarization (2Pr) of 26.3 μC/cm2 under only ±1.25 V sweeping, while the conventional HZO film presents nonferroelectricity. The enhanced ferroelectricity stems from the increased ferroelectric phase proportion with ZrO2 insertion. Moreover, the capacitor with a HZO/ZrO2/HZO stack also achieved an excellent endurance with a 2Pr of 27.1 μC/cm2 after 1011 cycles without breakdown and only ∼12% 2Pr degradation at 85 °C. The robust reliability is ascribed to the suppressed generation of defects and domain pinning under the low operating voltage. The sub-6 nm HZO/ZrO2/HZO stack presents great potential for BEOL compatible nonvolatile memories in advanced process nodes.
{"title":"Enhanced Ferroelectricity and Reliability in Sub-6 nm Ferroelectric Hf0.5Zr0.5O2/ZrO2/Hf0.5Zr0.5O2 Stack Film Compatible with BEOL Process","authors":"Yinchi Liu, Jining Yang, Hao Zhang, Dmitriy Anatolyevich Golosov, Chenjie Gu, Xiaohan Wu, Hongliang Lu, Lin Chen, Shijin Ding and Wenjun Liu*, ","doi":"10.1021/acsaelm.4c0174510.1021/acsaelm.4c01745","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01745https://doi.org/10.1021/acsaelm.4c01745","url":null,"abstract":"<p >In this work, the back-end of line (BEOL) compatible sub-6 nm Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>/ZrO<sub>2</sub>/Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> (HZO/ZrO<sub>2</sub>/HZO) stack and the corresponding capacitors were fabricated. The capacitor with the sub-6 nm HZO/ZrO<sub>2</sub>/HZO stack annealed at 400 °C shows a superior remanent polarization (2<i>P</i><sub>r</sub>) of 26.3 μC/cm<sup>2</sup> under only ±1.25 V sweeping, while the conventional HZO film presents nonferroelectricity. The enhanced ferroelectricity stems from the increased ferroelectric phase proportion with ZrO<sub>2</sub> insertion. Moreover, the capacitor with a HZO/ZrO<sub>2</sub>/HZO stack also achieved an excellent endurance with a 2<i>P</i><sub>r</sub> of 27.1 μC/cm<sup>2</sup> after 10<sup>11</sup> cycles without breakdown and only ∼12% 2<i>P</i><sub>r</sub> degradation at 85 °C. The robust reliability is ascribed to the suppressed generation of defects and domain pinning under the low operating voltage. The sub-6 nm HZO/ZrO<sub>2</sub>/HZO stack presents great potential for BEOL compatible nonvolatile memories in advanced process nodes.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8507–8512 8507–8512"},"PeriodicalIF":4.3,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142719456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-13DOI: 10.1021/acsaelm.4c0162910.1021/acsaelm.4c01629
Biao Zhang, Xiaochen Ma*, HongYan Zhu, Hongdi Xiao, Jin Ma and Caina Luan*,
Ta-doped h-ZnTiO3 (h-ZnTiO3:Ta) films with an atomic ratio of 0–5% are grown on sapphire substrates by pulsed laser deposition. The prepared films exhibit n-type semiconductor behavior with high epitaxial crystalline quality. These films have high transparency, and their optical band gaps exceed 3.72 eV. The Hall mobility and carrier concentration of the 1% Ta-doped film are 4.6 cm2/(V·s) and 4.20 × 1014 /cm3, respectively. The h-ZnTiO3:Ta film-based metal–semiconductor–metal (MSM) photodetectors are fabricated, and their characteristics are analyzed in detail. Among them, 1% Ta-doped h-ZnTiO3 film-based devices show the best detection performance, including responsivity of 4.23 mA/W and detectivity of 1.43 × 1011 Jones, under the wavelength of 308 nm ultraviolet light with an optical density of 140 μW/cm2. The detector also has an extremely fast response time (rise time: 0.16 s and fall time: 0.04 s). This work proves that h-ZnTiO3:Ta epitaxial films have great application prospects in future optoelectronic devices.
{"title":"High Crystalline Quality Ta-Doped h-ZnTiO3 Epitaxial Films: Characteristics and Application in UV Detectors","authors":"Biao Zhang, Xiaochen Ma*, HongYan Zhu, Hongdi Xiao, Jin Ma and Caina Luan*, ","doi":"10.1021/acsaelm.4c0162910.1021/acsaelm.4c01629","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01629https://doi.org/10.1021/acsaelm.4c01629","url":null,"abstract":"<p >Ta-doped <i>h</i>-ZnTiO<sub>3</sub> (<i>h</i>-ZnTiO<sub>3</sub>:Ta) films with an atomic ratio of 0–5% are grown on sapphire substrates by pulsed laser deposition. The prepared films exhibit n-type semiconductor behavior with high epitaxial crystalline quality. These films have high transparency, and their optical band gaps exceed 3.72 eV. The Hall mobility and carrier concentration of the 1% Ta-doped film are 4.6 cm<sup>2</sup>/(V·s) and 4.20 × 10<sup>14</sup> /cm<sup>3</sup>, respectively. The <i>h</i>-ZnTiO<sub>3</sub>:Ta film-based metal–semiconductor–metal (MSM) photodetectors are fabricated, and their characteristics are analyzed in detail. Among them, 1% Ta-doped <i>h</i>-ZnTiO<sub>3</sub> film-based devices show the best detection performance, including responsivity of 4.23 mA/W and detectivity of 1.43 × 10<sup>11</sup> Jones, under the wavelength of 308 nm ultraviolet light with an optical density of 140 μW/cm<sup>2</sup>. The detector also has an extremely fast response time (rise time: 0.16 s and fall time: 0.04 s). This work proves that <i>h</i>-ZnTiO<sub>3</sub>:Ta epitaxial films have great application prospects in future optoelectronic devices.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8413–8423 8413–8423"},"PeriodicalIF":4.3,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142713704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-13DOI: 10.1021/acsaelm.4c0153310.1021/acsaelm.4c01533
Pamela Machado, Pol Salles, Alexander Frebel, Gabriele De Luca, Eloi Ros, Christian Hagendorf, Ignasi Fina, Joaquim Puigdollers and Mariona Coll*,
Photoferroelectric BiFeO3 (BFO) has attracted renewed interest to be integrated into thin film photovoltaic (PV) devices as a stable, lead-free, and versatile photoabsorber with simplified architecture. While significant efforts have been dedicated toward the exploration of strategies to tailor the properties of this photoabsorber to improve the device performance, efficiencies still remain low. The modification of the BFO interface by the incorporation of transport-selective layers can offer fresh opportunities to modify the properties of the device. Identifying an optical and electrically suitable selective layer while ensuring easy device processing and controlled film properties is challenging. In this work, we determine the influence of incorporating a ZnO layer on the ferroelectric and photoresponse behavior of an epitaxial BiFe0.9Co0.1O3 (BFCO)-based heterostructure. The device is completed with Sn-doped In2O3 (ITO) and La0.7Sr0.3MnO3 (LSMO) electrodes. This all-oxide system is stable under ambient conditions and displays robust ferroelectricity. The coupled ferroelectricity–photoresponse measurements demonstrate that the short circuit current can be modulated by ferroelectric polarization in up to 68% under blue monochromatic light. Also, the responsivity of the system with the ZnO-modified interface is larger than that of the system with no ZnO. Complementary band energy alignment studies reveal that the observed increase in the short circuit current density of the device with ZnO is attributed to lower Fermi level energy at the ZnO/BFCO interface compared to the ITO/BFCO interface, which reduces charge recombination. Therefore, this study provides useful insights into the role of the ZnO interface layer in stable BFO-based devices to further explore their viability for potential optoelectronic applications.
{"title":"Interface Engineering in All-Oxide Photovoltaic Devices Based on Photoferroelectric BiFe0.9Co0.1O3 Thin Films","authors":"Pamela Machado, Pol Salles, Alexander Frebel, Gabriele De Luca, Eloi Ros, Christian Hagendorf, Ignasi Fina, Joaquim Puigdollers and Mariona Coll*, ","doi":"10.1021/acsaelm.4c0153310.1021/acsaelm.4c01533","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01533https://doi.org/10.1021/acsaelm.4c01533","url":null,"abstract":"<p >Photoferroelectric BiFeO<sub>3</sub> (BFO) has attracted renewed interest to be integrated into thin film photovoltaic (PV) devices as a stable, lead-free, and versatile photoabsorber with simplified architecture. While significant efforts have been dedicated toward the exploration of strategies to tailor the properties of this photoabsorber to improve the device performance, efficiencies still remain low. The modification of the BFO interface by the incorporation of transport-selective layers can offer fresh opportunities to modify the properties of the device. Identifying an optical and electrically suitable selective layer while ensuring easy device processing and controlled film properties is challenging. In this work, we determine the influence of incorporating a ZnO layer on the ferroelectric and photoresponse behavior of an epitaxial BiFe<sub>0.9</sub>Co<sub>0.1</sub>O<sub>3</sub> (BFCO)-based heterostructure. The device is completed with Sn-doped In<sub>2</sub>O<sub>3</sub> (ITO) and La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub> (LSMO) electrodes. This all-oxide system is stable under ambient conditions and displays robust ferroelectricity. The coupled ferroelectricity–photoresponse measurements demonstrate that the short circuit current can be modulated by ferroelectric polarization in up to 68% under blue monochromatic light. Also, the responsivity of the system with the ZnO-modified interface is larger than that of the system with no ZnO. Complementary band energy alignment studies reveal that the observed increase in the short circuit current density of the device with ZnO is attributed to lower Fermi level energy at the ZnO/BFCO interface compared to the ITO/BFCO interface, which reduces charge recombination. Therefore, this study provides useful insights into the role of the ZnO interface layer in stable BFO-based devices to further explore their viability for potential optoelectronic applications.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8251–8259 8251–8259"},"PeriodicalIF":4.3,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.acs.org/doi/epdf/10.1021/acsaelm.4c01533","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142719174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-13DOI: 10.1021/acsaelm.4c0157810.1021/acsaelm.4c01578
Wen Li, Hengzhen Cheng, Caiyu Feng, Weiyi Zhou and Bo Zhang*,
We investigated the mechanism and application of the modulation of terahertz waves using perovskite heterostructures. At the interface between PEDOT:PSS and the perovskite layers under excitation by an external light source, photogenerated carriers transferred from the perovskite layer to the PEDOT:PSS layer, which was accompanied by charge accumulation. A large number of photogenerated carriers scattered terahertz waves, thereby modulating the terahertz signal in the sample. The process of modulation and recovery of the terahertz signal by a perovskite material under external light is analogous to the principle of biological synapses, which are involved in memory and learning in animal brains. This enabled us to develop perovskite-based synaptic devices. The memory properties of perovskite heterojunction materials open up applications of terahertz technology.
{"title":"Mechanism and Application of Optical Modulation of Terahertz Waves in a Perovskite Heterojunction","authors":"Wen Li, Hengzhen Cheng, Caiyu Feng, Weiyi Zhou and Bo Zhang*, ","doi":"10.1021/acsaelm.4c0157810.1021/acsaelm.4c01578","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01578https://doi.org/10.1021/acsaelm.4c01578","url":null,"abstract":"<p >We investigated the mechanism and application of the modulation of terahertz waves using perovskite heterostructures. At the interface between PEDOT:PSS and the perovskite layers under excitation by an external light source, photogenerated carriers transferred from the perovskite layer to the PEDOT:PSS layer, which was accompanied by charge accumulation. A large number of photogenerated carriers scattered terahertz waves, thereby modulating the terahertz signal in the sample. The process of modulation and recovery of the terahertz signal by a perovskite material under external light is analogous to the principle of biological synapses, which are involved in memory and learning in animal brains. This enabled us to develop perovskite-based synaptic devices. The memory properties of perovskite heterojunction materials open up applications of terahertz technology.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8351–8359 8351–8359"},"PeriodicalIF":4.3,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142719187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-13eCollection Date: 2024-11-26DOI: 10.1021/acsaelm.4c01533
Pamela Machado, Pol Salles, Alexander Frebel, Gabriele De Luca, Eloi Ros, Christian Hagendorf, Ignasi Fina, Joaquim Puigdollers, Mariona Coll
Photoferroelectric BiFeO3 (BFO) has attracted renewed interest to be integrated into thin film photovoltaic (PV) devices as a stable, lead-free, and versatile photoabsorber with simplified architecture. While significant efforts have been dedicated toward the exploration of strategies to tailor the properties of this photoabsorber to improve the device performance, efficiencies still remain low. The modification of the BFO interface by the incorporation of transport-selective layers can offer fresh opportunities to modify the properties of the device. Identifying an optical and electrically suitable selective layer while ensuring easy device processing and controlled film properties is challenging. In this work, we determine the influence of incorporating a ZnO layer on the ferroelectric and photoresponse behavior of an epitaxial BiFe0.9Co0.1O3 (BFCO)-based heterostructure. The device is completed with Sn-doped In2O3 (ITO) and La0.7Sr0.3MnO3 (LSMO) electrodes. This all-oxide system is stable under ambient conditions and displays robust ferroelectricity. The coupled ferroelectricity-photoresponse measurements demonstrate that the short circuit current can be modulated by ferroelectric polarization in up to 68% under blue monochromatic light. Also, the responsivity of the system with the ZnO-modified interface is larger than that of the system with no ZnO. Complementary band energy alignment studies reveal that the observed increase in the short circuit current density of the device with ZnO is attributed to lower Fermi level energy at the ZnO/BFCO interface compared to the ITO/BFCO interface, which reduces charge recombination. Therefore, this study provides useful insights into the role of the ZnO interface layer in stable BFO-based devices to further explore their viability for potential optoelectronic applications.
{"title":"Interface Engineering in All-Oxide Photovoltaic Devices Based on Photoferroelectric BiFe<sub>0.9</sub>Co<sub>0.1</sub>O<sub>3</sub> Thin Films.","authors":"Pamela Machado, Pol Salles, Alexander Frebel, Gabriele De Luca, Eloi Ros, Christian Hagendorf, Ignasi Fina, Joaquim Puigdollers, Mariona Coll","doi":"10.1021/acsaelm.4c01533","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01533","url":null,"abstract":"<p><p>Photoferroelectric BiFeO<sub>3</sub> (BFO) has attracted renewed interest to be integrated into thin film photovoltaic (PV) devices as a stable, lead-free, and versatile photoabsorber with simplified architecture. While significant efforts have been dedicated toward the exploration of strategies to tailor the properties of this photoabsorber to improve the device performance, efficiencies still remain low. The modification of the BFO interface by the incorporation of transport-selective layers can offer fresh opportunities to modify the properties of the device. Identifying an optical and electrically suitable selective layer while ensuring easy device processing and controlled film properties is challenging. In this work, we determine the influence of incorporating a ZnO layer on the ferroelectric and photoresponse behavior of an epitaxial BiFe<sub>0.9</sub>Co<sub>0.1</sub>O<sub>3</sub> (BFCO)-based heterostructure. The device is completed with Sn-doped In<sub>2</sub>O<sub>3</sub> (ITO) and La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub> (LSMO) electrodes. This all-oxide system is stable under ambient conditions and displays robust ferroelectricity. The coupled ferroelectricity-photoresponse measurements demonstrate that the short circuit current can be modulated by ferroelectric polarization in up to 68% under blue monochromatic light. Also, the responsivity of the system with the ZnO-modified interface is larger than that of the system with no ZnO. Complementary band energy alignment studies reveal that the observed increase in the short circuit current density of the device with ZnO is attributed to lower Fermi level energy at the ZnO/BFCO interface compared to the ITO/BFCO interface, which reduces charge recombination. Therefore, this study provides useful insights into the role of the ZnO interface layer in stable BFO-based devices to further explore their viability for potential optoelectronic applications.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8251-8259"},"PeriodicalIF":4.3,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11603610/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142764569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-12DOI: 10.1021/acsaelm.4c0173710.1021/acsaelm.4c01737
Yunfei Bai, Wenying Qiu, Jing Xing, Ruixi Wang, Dekuan Zhu and Min Zhang*,
This study proposes a portable, paper-based tactile feedback system interaction device, engineered to serve blind users with an integrated platform for both input and output functionalities. The device comprises six functional units, each measuring 10 × 10 mm, crafted using a sandwiched structure of paper substrate, graphite, and two PLA films via the hot-pressing technique. Utilizing the corona charging method, the PLA electret films exhibit an impressive piezoelectric coefficient peaking at 3578 pC/N, making it highly sensitive for both sensing and actuating. The pressure sensor, used for writing purposes, demonstrates a sensitivity of 1.01 V/N, while the vibration actuator, used for reading, achieves an output force of 60 mN at an applied voltage of 400 V. Notably, both the surface charge density and the performance of the sensor and actuator stabilize post approximately 1000 interactions. Our psychophysical experiments indicate the device has a perceptible threshold voltage as low as 50 V. Subsequent tactile interaction communication tests offer a preliminary validation of the device’s applicability. The proposed tactile interaction device, being flexibly constructed and intrinsically biodegradable, paves the way for cost-effective tactile communication solutions.
{"title":"Paper-Based Electret Sensor/Actuator Array for Tactile Interaction","authors":"Yunfei Bai, Wenying Qiu, Jing Xing, Ruixi Wang, Dekuan Zhu and Min Zhang*, ","doi":"10.1021/acsaelm.4c0173710.1021/acsaelm.4c01737","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01737https://doi.org/10.1021/acsaelm.4c01737","url":null,"abstract":"<p >This study proposes a portable, paper-based tactile feedback system interaction device, engineered to serve blind users with an integrated platform for both input and output functionalities. The device comprises six functional units, each measuring 10 × 10 mm, crafted using a sandwiched structure of paper substrate, graphite, and two PLA films via the hot-pressing technique. Utilizing the corona charging method, the PLA electret films exhibit an impressive piezoelectric coefficient peaking at 3578 pC/N, making it highly sensitive for both sensing and actuating. The pressure sensor, used for writing purposes, demonstrates a sensitivity of 1.01 V/N, while the vibration actuator, used for reading, achieves an output force of 60 mN at an applied voltage of 400 V. Notably, both the surface charge density and the performance of the sensor and actuator stabilize post approximately 1000 interactions. Our psychophysical experiments indicate the device has a perceptible threshold voltage as low as 50 V. Subsequent tactile interaction communication tests offer a preliminary validation of the device’s applicability. The proposed tactile interaction device, being flexibly constructed and intrinsically biodegradable, paves the way for cost-effective tactile communication solutions.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8497–8506 8497–8506"},"PeriodicalIF":4.3,"publicationDate":"2024-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142719087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Compared to SrTiO3-based 3d two-dimensional electron gases (2DEGs), KTaO3-based 5d 2DEGs have much more exceptional physical properties, such as a higher Curie temperature of spin-polarized 2DEG, higher Tc for the 2DEG at superconducting state, and larger spin–orbit coupling. Herein, the CaZrO3 (CZO) films were deposited on KTaO3 (001) substrates at the deposition temperature varied from 700 °C to room temperature, and the conductive CZO/KTO interface was obtained at all deposition temperatures. The conductivity of the CZO/KTO heterointerface exhibits critical dependence on the film thickness, where the critical thickness for conduction increases from 3.2 to 6 nm when decreasing the deposition temperature from 700 °C to room temperature. Moreover, the electric properties of the heterointerface grown at room temperature can be modulated strongly by the light illumination. The strength of the spin–orbit coupling exhibits large relative variation with the carrier density. Under the light illumination, the strength of the spin–orbit coupling increases from ∼3.9 × 10–12 eV m to the maximum of ∼9 × 10–12 eV m, with the maximal change of the carrier density of only 3 × 1012 cm–2. The present work demonstrates an effective tuning of the special 5d-electron-based 2DEGs by light illumination, showing a feasible way for advanced optoelectronic device application.
与基于SrTiO3的三维二维电子气体(2DEG)相比,基于KTaO3的五维二维电子气体具有更优异的物理性质,例如自旋极化2DEG的居里温度更高、超导态2DEG的Tc更高以及自旋轨道耦合更大。本文在 KTaO3(001)基底上沉积了 CaZrO3(CZO)薄膜,沉积温度从 700 ℃ 到室温不等,在所有沉积温度下都获得了导电的 CZO/KTO 界面。CZO/KTO 异质界面的导电性与薄膜厚度呈临界关系,当沉积温度从 700 °C 降低到室温时,导电的临界厚度从 3.2 纳米增加到 6 纳米。此外,在室温下生长的异质表面的电学特性可受光照的强烈调制。自旋轨道耦合的强度随载流子密度的变化而呈现较大的相对变化。在光照下,自旋轨道耦合强度从 ∼3.9 × 10-12 eV m 增加到最大值 ∼9 × 10-12 eV m,而载流子密度的最大变化仅为 3 × 1012 cm-2。本研究成果证明了通过光照可以有效地调节基于 5d 电子的特殊二维电子元件,为先进光电器件的应用提供了一条可行的途径。
{"title":"Creation of Two-Dimensional Electron Gas at the Heterointerface of CaZrO3/KTaO3 with Tunable Rashba Spin–Orbit Coupling","authors":"Shaojin Qi, Jiexing Liang, Guimei Shi, Yulin Gan, Yuansha Chen*, Yunzhong Chen* and Jirong Sun*, ","doi":"10.1021/acsaelm.4c0161810.1021/acsaelm.4c01618","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01618https://doi.org/10.1021/acsaelm.4c01618","url":null,"abstract":"<p >Compared to SrTiO<sub>3</sub>-based 3d two-dimensional electron gases (2DEGs), KTaO<sub>3</sub>-based 5d 2DEGs have much more exceptional physical properties, such as a higher Curie temperature of spin-polarized 2DEG, higher <i>T</i><sub><i>c</i></sub> for the 2DEG at superconducting state, and larger spin–orbit coupling. Herein, the CaZrO<sub>3</sub> (CZO) films were deposited on KTaO<sub>3</sub> (001) substrates at the deposition temperature varied from 700 °C to room temperature, and the conductive CZO/KTO interface was obtained at all deposition temperatures. The conductivity of the CZO/KTO heterointerface exhibits critical dependence on the film thickness, where the critical thickness for conduction increases from 3.2 to 6 nm when decreasing the deposition temperature from 700 °C to room temperature. Moreover, the electric properties of the heterointerface grown at room temperature can be modulated strongly by the light illumination. The strength of the spin–orbit coupling exhibits large relative variation with the carrier density. Under the light illumination, the strength of the spin–orbit coupling increases from ∼3.9 × 10<sup>–12</sup> eV m to the maximum of ∼9 × 10<sup>–12</sup> eV m, with the maximal change of the carrier density of only 3 × 10<sup>12</sup> cm<sup>–2</sup>. The present work demonstrates an effective tuning of the special 5d-electron-based 2DEGs by light illumination, showing a feasible way for advanced optoelectronic device application.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"8404–8412 8404–8412"},"PeriodicalIF":4.3,"publicationDate":"2024-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142713529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-11-11DOI: 10.1021/acsaelm.4c0126110.1021/acsaelm.4c01261
Michael Pitts, Matthew Feuer, Anthony K. C. Tan, Alejandro R.-P. Montblanch, James Kerfoot, Evgeny M. Alexeev, Michael Högen, Patrick Hays, Seth A. Tongay, Andrea C. Ferrari, Mete Atatüre and Dhiren M. Kara*,
Micromechanical resonators with very low mass are highly desirable for sensing and transduction applications. Layered materials (LMs) can be used to fabricate single- to few-atom thick suspended membranes, representing the ultimate limit to low mass. Transition-metal dichalcogenides (TMDs), such as WSe2, are particularly compelling because they can host spatially confined excitons in single layer (1L), potentially enabling the creation of nonclassical mechanical states and interconnects between quantum networks and processors. However, these exciting prospects have been tempered by low device yields, invasive methods for detecting resonator motion, and high mechanical damping. Here, we report the creation of mechanical resonators by suspending 1L-WSe2 across a 90 × 90 array of 2.5-μm diameter holes with a > 75% success rate. We detect the resonator room-temperature (RT) Brownian motion and measure resonator mass to quantify contamination, using below-bandgap laser interferometry. We investigate the relation between frequency, diameter, and mechanical quality factor, which can exceed 1000 in our devices. We find the dependence agrees with the effect of dissipation dilution, highlighting the importance of reducing mechanical mode-bending. Key to this is the large-scale, high-quality arrays that make it possible to access a frequency range that surpasses previous works. Further, the ability to fabricate large numbers of 1L resonators, and the simplicity of probing their motion without electrodes or an underlying reflective substrate, facilitates previously hard-to-reach configurations, such as resonators in phononic crystals or within optical cavities.
{"title":"Evidencing Dissipation Dilution in Large-Scale Arrays of Single-Layer WSe2 Mechanical Resonators","authors":"Michael Pitts, Matthew Feuer, Anthony K. C. Tan, Alejandro R.-P. Montblanch, James Kerfoot, Evgeny M. Alexeev, Michael Högen, Patrick Hays, Seth A. Tongay, Andrea C. Ferrari, Mete Atatüre and Dhiren M. Kara*, ","doi":"10.1021/acsaelm.4c0126110.1021/acsaelm.4c01261","DOIUrl":"https://doi.org/10.1021/acsaelm.4c01261https://doi.org/10.1021/acsaelm.4c01261","url":null,"abstract":"<p >Micromechanical resonators with very low mass are highly desirable for sensing and transduction applications. Layered materials (LMs) can be used to fabricate single- to few-atom thick suspended membranes, representing the ultimate limit to low mass. Transition-metal dichalcogenides (TMDs), such as WSe<sub>2</sub>, are particularly compelling because they can host spatially confined excitons in single layer (1L), potentially enabling the creation of nonclassical mechanical states and interconnects between quantum networks and processors. However, these exciting prospects have been tempered by low device yields, invasive methods for detecting resonator motion, and high mechanical damping. Here, we report the creation of mechanical resonators by suspending 1L-WSe<sub>2</sub> across a 90 × 90 array of 2.5-μm diameter holes with <i>a</i> > 75% success rate. We detect the resonator room-temperature (RT) Brownian motion and measure resonator mass to quantify contamination, using below-bandgap laser interferometry. We investigate the relation between frequency, diameter, and mechanical quality factor, which can exceed 1000 in our devices. We find the dependence agrees with the effect of dissipation dilution, highlighting the importance of reducing mechanical mode-bending. Key to this is the large-scale, high-quality arrays that make it possible to access a frequency range that surpasses previous works. Further, the ability to fabricate large numbers of 1L resonators, and the simplicity of probing their motion without electrodes or an underlying reflective substrate, facilitates previously hard-to-reach configurations, such as resonators in phononic crystals or within optical cavities.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"6 11","pages":"7898–7905 7898–7905"},"PeriodicalIF":4.3,"publicationDate":"2024-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142719154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}