The key elements of designing for testability are presented. The following issues are discussed: review of requirements, partitioning, identification of critical parameters, tolerance threshold, selection, test flow development, assessment of testability parameters, and design update and reiteration. The benefits of designing for testability are discussed.<>
{"title":"Testability equals producibility","authors":"M. V. Marth","doi":"10.1109/IMTC.1990.66044","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66044","url":null,"abstract":"The key elements of designing for testability are presented. The following issues are discussed: review of requirements, partitioning, identification of critical parameters, tolerance threshold, selection, test flow development, assessment of testability parameters, and design update and reiteration. The benefits of designing for testability are discussed.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130512949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is suggested that CAMAC (computer-automated measurement and control) provides an ideal solution for high-performance data acquisition system requirements, such as high-accuracy A/D (analog-to-digital) conversion, a large channel capacity, and physically distributed channels. A wide variety of CAMAC I/O modules provides the analog and discrete interfaces needed for high-performance systems. These include ADC modules with 16-b resolution and waveform recorders that operate to 1.3 GHz. A new CAMAC-based system, called Tachion, is also described. This system can acquire analog data and transfer these data to disk at rates up to 9.6 Mbytes per second. The performance of a CAMAC-based system is further enhanced by computer interface hardware and software that supports list processing. Also, the high level of standardization of the CAMAC command structure allows the use of a single software driver that is unaffected by the types of I/O modules in the system.<>
{"title":"CAMAC, an ideal high-performance data acquisition standard","authors":"R.T. Clearly","doi":"10.1109/IMTC.1990.66017","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66017","url":null,"abstract":"It is suggested that CAMAC (computer-automated measurement and control) provides an ideal solution for high-performance data acquisition system requirements, such as high-accuracy A/D (analog-to-digital) conversion, a large channel capacity, and physically distributed channels. A wide variety of CAMAC I/O modules provides the analog and discrete interfaces needed for high-performance systems. These include ADC modules with 16-b resolution and waveform recorders that operate to 1.3 GHz. A new CAMAC-based system, called Tachion, is also described. This system can acquire analog data and transfer these data to disk at rates up to 9.6 Mbytes per second. The performance of a CAMAC-based system is further enhanced by computer interface hardware and software that supports list processing. Also, the high level of standardization of the CAMAC command structure allows the use of a single software driver that is unaffected by the types of I/O modules in the system.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125250562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A general framework for the development of a knowledge-based spectrum analysis system is presented. The knowledge available for rating different methods is limited by the trend in literature of comparing a new spectrum analysis method with the best of the competing methods. The authors have offset this problem by comparing all the methods within a class of spectrum estimators on the same performance index. The use of the repertory grid allows the spectrum analysis knowledge to be validated and can be used to limit the search space when a spectrum analysis technique fails by utilizing the similarities among different methods. The additive clustering model, being nonhierarchical, is shown to be well suited for establishing the similarities among different spectrum analysis methods within a specific class. An extension of the method to operate directly on the ratings in the repertory grid is provided. Strategy is used as a basis of the development of the inference engine in this work. In general, the use of strategy improves the quality of the designed knowledge-based system by providing an environment in which a limitless number of methods and data validation methods can be incorporated. Considering that the designed knowledge-based system can be used to study the spectrum analysis strategy, such a system can be used to conduct spectrum analysis methodological research.<>
{"title":"A framework for knowledge based spectrum analysis","authors":"J. Kulubi, L. van Biesen","doi":"10.1109/IMTC.1990.65990","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65990","url":null,"abstract":"A general framework for the development of a knowledge-based spectrum analysis system is presented. The knowledge available for rating different methods is limited by the trend in literature of comparing a new spectrum analysis method with the best of the competing methods. The authors have offset this problem by comparing all the methods within a class of spectrum estimators on the same performance index. The use of the repertory grid allows the spectrum analysis knowledge to be validated and can be used to limit the search space when a spectrum analysis technique fails by utilizing the similarities among different methods. The additive clustering model, being nonhierarchical, is shown to be well suited for establishing the similarities among different spectrum analysis methods within a specific class. An extension of the method to operate directly on the ratings in the repertory grid is provided. Strategy is used as a basis of the development of the inference engine in this work. In general, the use of strategy improves the quality of the designed knowledge-based system by providing an environment in which a limitless number of methods and data validation methods can be incorporated. Considering that the designed knowledge-based system can be used to study the spectrum analysis strategy, such a system can be used to conduct spectrum analysis methodological research.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129162162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors present an innovative software environment for the development of libraries of DSP (digital signal processing) routines in computer-based instrumentation. The goal of this approach is to combine user-friendliness with wide portability of the results. For this purpose, an integrated architecture for a development environment has been developed; it includes a user-friendly editor, which allows the user to implement DSP algorithms for writing mathematical formulas, and a translator, which generates the corresponding source code routine in C language. In order to extend the portability to the whole development environment, a prototype was implemented in C language. Experimental results show good code portability. A simple application example (a routine that implements a finite-impulse-response filter), is considered.<>
{"title":"A user-friendly environment for the generation of highly portable software in computer-based instrumentation","authors":"F. Russo, S. Broili","doi":"10.1109/IMTC.1990.66029","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66029","url":null,"abstract":"The authors present an innovative software environment for the development of libraries of DSP (digital signal processing) routines in computer-based instrumentation. The goal of this approach is to combine user-friendliness with wide portability of the results. For this purpose, an integrated architecture for a development environment has been developed; it includes a user-friendly editor, which allows the user to implement DSP algorithms for writing mathematical formulas, and a translator, which generates the corresponding source code routine in C language. In order to extend the portability to the whole development environment, a prototype was implemented in C language. Experimental results show good code portability. A simple application example (a routine that implements a finite-impulse-response filter), is considered.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123106224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The modeling of the power spectral density of correlated noise sources in acoustic measurements in a marine environment is considered. The Belgian oceanographic vessel, the Belgica, was used for measurements of the noise generated by helixes, engines, stabilizers, the 'fish' incorporating the transducers, the waves, and the marine background noise. Classical estimators, such as the periodogram, as well as modern spectral estimators based on ARMA (autoregressive moving average) and AR (autoregressive) approaches are considered. It is shown that low-order parametric models are adequate to describe the observed and measured correlated noise sources. These models have made it possible to validate the synthetic echograms which are required for the development of algorithms solving the inverse problem.<>
{"title":"On the measurement and the modelling of the correlated noise sources corrupting the marine geological echosounding experiments","authors":"L. van Biesen, L. Peirlinckx, S. Masyn, S. Wartel","doi":"10.1109/IMTC.1990.66037","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66037","url":null,"abstract":"The modeling of the power spectral density of correlated noise sources in acoustic measurements in a marine environment is considered. The Belgian oceanographic vessel, the Belgica, was used for measurements of the noise generated by helixes, engines, stabilizers, the 'fish' incorporating the transducers, the waves, and the marine background noise. Classical estimators, such as the periodogram, as well as modern spectral estimators based on ARMA (autoregressive moving average) and AR (autoregressive) approaches are considered. It is shown that low-order parametric models are adequate to describe the observed and measured correlated noise sources. These models have made it possible to validate the synthetic echograms which are required for the development of algorithms solving the inverse problem.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128938454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is noted that tactile sensors based on piezoelectric active surfaces require complex and advanced analog and digital signal processing circuitry in order to provide the best evaluation of the information resulting from the mechanical action of the manipulated object. Following a complete analysis of the hybrid structure and functionality of two previous realizations, the authors have recognized the feasibility of designing and building a new type of analog processing stage to enhance the sensor performance. The sensing area is realized using PVF/sub 2/ piezoelectric film deposited on three facets of a truncated tetrahedron in which the mobile element is allocated. The hybrid microelectronics for the analog and digital signal processing is built near the active surface in order to reduce noise and interference created by the industrial environment in which the device is designed to work. The design of the charge amplifiers and A/D (analog-to-digital) conversion block is optimized to provide a high-precision, three-dimensional analysis of force actions. The accuracy of measurement procedures requires the development of particular circuit topologies providing a sufficient number of signals related to mechanical effects. In order to achieve this result, a differential charge amplifier circuit has been developed. A deep analysis of functionality and dynamic response of the system under normal and limit conditions has been provided.<>
{"title":"Signal evaluation and measurement techniques in a single cell hybrid tactile sensor for large object manipulation","authors":"A. Brandolini, A. Gandelli","doi":"10.1109/IMTC.1990.65981","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65981","url":null,"abstract":"It is noted that tactile sensors based on piezoelectric active surfaces require complex and advanced analog and digital signal processing circuitry in order to provide the best evaluation of the information resulting from the mechanical action of the manipulated object. Following a complete analysis of the hybrid structure and functionality of two previous realizations, the authors have recognized the feasibility of designing and building a new type of analog processing stage to enhance the sensor performance. The sensing area is realized using PVF/sub 2/ piezoelectric film deposited on three facets of a truncated tetrahedron in which the mobile element is allocated. The hybrid microelectronics for the analog and digital signal processing is built near the active surface in order to reduce noise and interference created by the industrial environment in which the device is designed to work. The design of the charge amplifiers and A/D (analog-to-digital) conversion block is optimized to provide a high-precision, three-dimensional analysis of force actions. The accuracy of measurement procedures requires the development of particular circuit topologies providing a sufficient number of signals related to mechanical effects. In order to achieve this result, a differential charge amplifier circuit has been developed. A deep analysis of functionality and dynamic response of the system under normal and limit conditions has been provided.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132144893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown that, for d>or=2b, the results are very close to those for the infinitely thick dielectric medium. The results are expected to be useful in developing suitable procedures for measuring the electrical properties of samples with small thicknesses.<>
{"title":"A study on the metal-flanged open-ended coaxial line terminating in a conductor-backed dielectric layer","authors":"S. Fan, D. Misra","doi":"10.1109/IMTC.1990.65956","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65956","url":null,"abstract":"A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown that, for d>or=2b, the results are very close to those for the infinitely thick dielectric medium. The results are expected to be useful in developing suitable procedures for measuring the electrical properties of samples with small thicknesses.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121750216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Techniques have been developed for conveniently making precision (1%) noise spectral density measurements in the 10/sup -3/-kHz to 35-Hz or higher range. Application interest is particularly in the area of amplifier l/f noise measurement. Measurements are made by overlap averaging of the fast Fourier transform (FFT) with analog preconditioning of the noise. Calibration of the measurements requires only a known sine wave signal source. The use of the FFT makes possible good statistical control of the measurement result. It was found in most cases that the longer the FFT, the better the results. It was shown that high-pass filtering of the data prior to digitization is required for accurate results. The biggest limitation to more accurate measurements, particularly at very low frequencies, is the time required to get a large sample size.<>
{"title":"Precision low frequency noise measurement","authors":"R. H. Hamstra","doi":"10.1109/IMTC.1990.65976","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65976","url":null,"abstract":"Techniques have been developed for conveniently making precision (1%) noise spectral density measurements in the 10/sup -3/-kHz to 35-Hz or higher range. Application interest is particularly in the area of amplifier l/f noise measurement. Measurements are made by overlap averaging of the fast Fourier transform (FFT) with analog preconditioning of the noise. Calibration of the measurements requires only a known sine wave signal source. The use of the FFT makes possible good statistical control of the measurement result. It was found in most cases that the longer the FFT, the better the results. It was shown that high-pass filtering of the data prior to digitization is required for accurate results. The biggest limitation to more accurate measurements, particularly at very low frequencies, is the time required to get a large sample size.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122268142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
After arguing that virtually no one calibrates oscilloscopes or waveform recorders properly and completely, the author points out that, in most cases, the tools for performing complete and proper calibrations are available when they are required by the application. After a brief introduction describing the current methods used to calibrate oscilloscopes, the problems associated with oscilloscope vertical channel bandwidth testing are discussed and illustrated. Then, a solution that involves pulse signals and an NIST-developed deconvolution algorithm is described. The proposed method for the complete and correct calibration of an oscilloscope voltage channel's speed of response is based on measuring, digitizing, and deconvolving a standard (known) pulse. It is noted that there is an added cost associated with this complete and correct calibration method, and it may not be justified for all applications. For analog oscilloscopes in particular, it may end up being cheaper to purchase a new 'smart' digitizing oscilloscope, well suited to the application of this calibration technique, than to try to apply these methods to the analog scope.<>
{"title":"Dynamic calibration of oscilloscopes and waveform recorders using pulse standards","authors":"W. Gans","doi":"10.1109/IMTC.1990.66010","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66010","url":null,"abstract":"After arguing that virtually no one calibrates oscilloscopes or waveform recorders properly and completely, the author points out that, in most cases, the tools for performing complete and proper calibrations are available when they are required by the application. After a brief introduction describing the current methods used to calibrate oscilloscopes, the problems associated with oscilloscope vertical channel bandwidth testing are discussed and illustrated. Then, a solution that involves pulse signals and an NIST-developed deconvolution algorithm is described. The proposed method for the complete and correct calibration of an oscilloscope voltage channel's speed of response is based on measuring, digitizing, and deconvolving a standard (known) pulse. It is noted that there is an added cost associated with this complete and correct calibration method, and it may not be justified for all applications. For analog oscilloscopes in particular, it may end up being cheaper to purchase a new 'smart' digitizing oscilloscope, well suited to the application of this calibration technique, than to try to apply these methods to the analog scope.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129471312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
IEEE Std 194 assumes that the polarity of a pulse being measured is known to the user who wishes to extract its parameters. It is pointed out that this is often not the case when the only information about the signal in question is contained in a waveform record. The author proposes an unambiguous depiction of the record as a train of transitions allowing the extraction of 'pulselike' parameters. The transitions are identified as to their slope polarities, that is 'rising' and 'falling'. It is noted that many of these terms have already been established for years and need to be formally made part of IEEE Std 194.<>
{"title":"Limitations of the IEEE pulse standards and suggested improvements","authors":"C. Moulton","doi":"10.1109/IMTC.1990.66023","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66023","url":null,"abstract":"IEEE Std 194 assumes that the polarity of a pulse being measured is known to the user who wishes to extract its parameters. It is pointed out that this is often not the case when the only information about the signal in question is contained in a waveform record. The author proposes an unambiguous depiction of the record as a train of transitions allowing the extraction of 'pulselike' parameters. The transitions are identified as to their slope polarities, that is 'rising' and 'falling'. It is noted that many of these terms have already been established for years and need to be formally made part of IEEE Std 194.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128678711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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