A method for measuring the lambda (magnetic penetration depth) of a high T/sub c/ superconductor below T/sub c/ is proposed. The temperature-dependent lambda of niobium was measured as the changing value of the reactance of a solenoid coil over 4.2 K, and the resulting characteristics were roughly as expected.<>
{"title":"A method for simultaneously measuring resistivity and penetration depth of a cylindrical superconductor","authors":"H. Nakane","doi":"10.1109/IMTC.1990.66019","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66019","url":null,"abstract":"A method for measuring the lambda (magnetic penetration depth) of a high T/sub c/ superconductor below T/sub c/ is proposed. The temperature-dependent lambda of niobium was measured as the changing value of the reactance of a solenoid coil over 4.2 K, and the resulting characteristics were roughly as expected.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121663936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors describe the evolution of the design for a microwave instrumentation system which has been developed to measure the complex permittivity of high-loss liquids, such as water, at 9 GHz in the temperature interval from 0 degrees C to 90 degrees C with a 1 sigma precision of approximately 0.03%. Previous instrumentation had enabled a precision of approximately 1% to be attained at 9 GHz. The evolution of the design has been accomplished in a sequence of stages as various unexpected and subtle sources of errors have been identified and minimized. The statistical precision and repeatability of the measurement data have improved as these error sources have been identified and eliminated. The identification and resolution process which has enabled the improved precision to be achieved is described.<>
{"title":"Design optimization of a high precision microwave complex permittivity instrumentation system for use with high loss liquids","authors":"H. Buckmaster, C. Hansen, T.H.T. van Kalleveen","doi":"10.1109/IMTC.1990.65978","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65978","url":null,"abstract":"The authors describe the evolution of the design for a microwave instrumentation system which has been developed to measure the complex permittivity of high-loss liquids, such as water, at 9 GHz in the temperature interval from 0 degrees C to 90 degrees C with a 1 sigma precision of approximately 0.03%. Previous instrumentation had enabled a precision of approximately 1% to be attained at 9 GHz. The evolution of the design has been accomplished in a sequence of stages as various unexpected and subtle sources of errors have been identified and minimized. The statistical precision and repeatability of the measurement data have improved as these error sources have been identified and eliminated. The identification and resolution process which has enabled the improved precision to be achieved is described.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131098426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The performance of digital infinite impulse response (IIR) integrators and differentiators, calculated by means of a maximum likelihood estimator for transfer functions, is compared with that of their finite impulse response (FIR) counterparts and that of classical numerical integration and differentiation. An original design method that generates stable and reduced-order IIR filters in the complex domain (amplitude as well as phase constraints) is presented. In contrast to common opinion, it is shown that it is possible to design easy realizable IIR integrators and differentiators with an arbitrary small amplitude and phase error. Although there is no FIR alternative for IIR integrators, both FIR and IIR methods give competitive results for differentiators. It is shown that, owing to the design of pure delay filters, the (optimal) fractional delay integrators and differentiators can be used in case the original waveform and one (or more) of its (higher order) derivatives and (or) integrals are required.<>
{"title":"Real-time integration and differentiation of analog signals by means of digital filtering","authors":"R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1990.66036","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66036","url":null,"abstract":"The performance of digital infinite impulse response (IIR) integrators and differentiators, calculated by means of a maximum likelihood estimator for transfer functions, is compared with that of their finite impulse response (FIR) counterparts and that of classical numerical integration and differentiation. An original design method that generates stable and reduced-order IIR filters in the complex domain (amplitude as well as phase constraints) is presented. In contrast to common opinion, it is shown that it is possible to design easy realizable IIR integrators and differentiators with an arbitrary small amplitude and phase error. Although there is no FIR alternative for IIR integrators, both FIR and IIR methods give competitive results for differentiators. It is shown that, owing to the design of pure delay filters, the (optimal) fractional delay integrators and differentiators can be used in case the original waveform and one (or more) of its (higher order) derivatives and (or) integrals are required.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"18 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131613797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A compliant capacitive wrist sensor can be used as a versatile aid to a vision system in assembly using industrial robots. A sensor which is designed to measure the bending moments in the x and y directions, the force in the z direction, and the torsion moment around the z direction is described. The sensor consists of two opposite electrode patterns with an elastomeric material in between the electrical contacts to only the arm-side electrode pattern. Upon application of a force, the compliant intermediate will deform, causing a change in the separation and overlap between the electrodes, which results in a change in the capacitance. There are four sensitive capacitive patterns between the two electrodes. By combining the information from these four patterns it is possible to distinguish unambiguously among the three moments. An additional advantage is the cabling to only the arm side of the wrist with a minimum amount of wiring due to simple on-sensor switching. The prototype sensor shows a sensitivity better than 70 degrees /N-m with a cross sensitivity for the nonselected mode smaller than 0.1 degrees /N-m.<>
{"title":"Multiaxis compliant capacitive wrist sensor for use in automated assembly with industrial robots","authors":"R. Wolffenbuttel, K. Mahmoud, P. Regtien","doi":"10.1109/IMTC.1990.65958","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65958","url":null,"abstract":"A compliant capacitive wrist sensor can be used as a versatile aid to a vision system in assembly using industrial robots. A sensor which is designed to measure the bending moments in the x and y directions, the force in the z direction, and the torsion moment around the z direction is described. The sensor consists of two opposite electrode patterns with an elastomeric material in between the electrical contacts to only the arm-side electrode pattern. Upon application of a force, the compliant intermediate will deform, causing a change in the separation and overlap between the electrodes, which results in a change in the capacitance. There are four sensitive capacitive patterns between the two electrodes. By combining the information from these four patterns it is possible to distinguish unambiguously among the three moments. An additional advantage is the cabling to only the arm side of the wrist with a minimum amount of wiring due to simple on-sensor switching. The prototype sensor shows a sensitivity better than 70 degrees /N-m with a cross sensitivity for the nonselected mode smaller than 0.1 degrees /N-m.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130672106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The feasibility of transfer function estimation based on amplitude-only measurements is investigated, and this method is compared with the amplitude-phase (full complex spectrum) method. It is shown that the amplitude-only-based method is a feasible alternative to the full complex spectrum method when the minimum in-phase transfer function of the system is needed or when there is some a priori knowledge about the nonminimal in-phase character of the system. It appears that transfer function estimation of linear systems using amplitude information only is possible if care is taken to circumvent the degeneration problems of the information matrix. The performance of the amplitude-only estimation is compared with the performance of a full complex estimation, both analytically and through simulation. The amplitude-only estimation appears to yield a larger standard deviation on the transfer function parameters. Optimal excitation for both cases seems to be quite different. The complex estimation shows good results when only passband information is provided. In this case the amplitude-only estimation is shown to be worthless. However, extending the measurements in the transition band of the system implies a large lowering of the parameter uncertainty and allows the use of this method.<>
{"title":"Amplitude-only versus amplitude-phase estimation","authors":"Y. Rolain, R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1990.65948","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65948","url":null,"abstract":"The feasibility of transfer function estimation based on amplitude-only measurements is investigated, and this method is compared with the amplitude-phase (full complex spectrum) method. It is shown that the amplitude-only-based method is a feasible alternative to the full complex spectrum method when the minimum in-phase transfer function of the system is needed or when there is some a priori knowledge about the nonminimal in-phase character of the system. It appears that transfer function estimation of linear systems using amplitude information only is possible if care is taken to circumvent the degeneration problems of the information matrix. The performance of the amplitude-only estimation is compared with the performance of a full complex estimation, both analytically and through simulation. The amplitude-only estimation appears to yield a larger standard deviation on the transfer function parameters. Optimal excitation for both cases seems to be quite different. The complex estimation shows good results when only passband information is provided. In this case the amplitude-only estimation is shown to be worthless. However, extending the measurements in the transition band of the system implies a large lowering of the parameter uncertainty and allows the use of this method.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126457244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is noted that, as engineering, manufacturing, packaging, and quality testing processes have become faster and more complex, the need to record and analyze events that happen in milliseconds or less has become critical. Companies in electronics, aerospace, automotive, packaging, paper converting, and textiles are using high-speed motion analysis to diagnose and solve problems from basic research through final product testing. It has been found that integration of high-speed motion analysis throughout the entire design, manufacturing, and testing process can result in a significant competitive edge. The benefits are a shortened development cycle, higher manufacturing productivity, and lower operating costs.<>
{"title":"High-speed motion analysis as a measurement tool","authors":"J. Foley","doi":"10.1109/IMTC.1990.65962","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65962","url":null,"abstract":"It is noted that, as engineering, manufacturing, packaging, and quality testing processes have become faster and more complex, the need to record and analyze events that happen in milliseconds or less has become critical. Companies in electronics, aerospace, automotive, packaging, paper converting, and textiles are using high-speed motion analysis to diagnose and solve problems from basic research through final product testing. It has been found that integration of high-speed motion analysis throughout the entire design, manufacturing, and testing process can result in a significant competitive edge. The benefits are a shortened development cycle, higher manufacturing productivity, and lower operating costs.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130707944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An algorithm and the microprocessor implementation thereof for the measurement of angular velocity and acceleration of rotating machinery are presented. The speed reference signal is derived from a pulse train at a frequency of only one pulse per revolution. This fact places severe constraints on the resolution and measuring time of the instrument. To detect a rate of change of speed of 1 r.p.m./min, a measuring time of at least 1 min is required. Over a 30-s measuring period it is possible to detect a rate of only 4 r.p.m./min. The resolution, therefore, is dependent on the measuring time, and a fixed relationship exists between these two parameters. The values obtained for either velocity or acceleration/deceleration will be average values for the measuring period. The instrument has been implemented using standard microprocessor components and supporting circuitry. The results obtained so far are highly satisfactory.<>
{"title":"The digital measurement of low values of angular velocity and acceleration","authors":"G. Hancke, C. Viljoen","doi":"10.1109/IMTC.1990.65965","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65965","url":null,"abstract":"An algorithm and the microprocessor implementation thereof for the measurement of angular velocity and acceleration of rotating machinery are presented. The speed reference signal is derived from a pulse train at a frequency of only one pulse per revolution. This fact places severe constraints on the resolution and measuring time of the instrument. To detect a rate of change of speed of 1 r.p.m./min, a measuring time of at least 1 min is required. Over a 30-s measuring period it is possible to detect a rate of only 4 r.p.m./min. The resolution, therefore, is dependent on the measuring time, and a fixed relationship exists between these two parameters. The values obtained for either velocity or acceleration/deceleration will be average values for the measuring period. The instrument has been implemented using standard microprocessor components and supporting circuitry. The results obtained so far are highly satisfactory.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114778375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author discusses the need and methods for providing continuing career education and training to metrologists and technicians throughout their careers, in order for them to keep pace with changing technology, new instrumentation, and career position changes.<>
{"title":"Measurement education from the viewpoint of the senior executive","authors":"J. D. Simmons","doi":"10.1109/IMTC.1990.65968","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65968","url":null,"abstract":"The author discusses the need and methods for providing continuing career education and training to metrologists and technicians throughout their careers, in order for them to keep pace with changing technology, new instrumentation, and career position changes.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129084952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors describe a new instrument which is designed to operate as a null meter with a range of +or-1000 p.p.m. of typical test voltages used in high-accuracy AC calibrations. It is based on a commercially available dual-heater-type converter in a standard integrated circuit package. The accuracy of the instrument is better than 100 p.p.m. for frequencies of 50 Hz to 200 kHz. It can, however, be used for frequencies up to 1 MHz at reduced accuracy.<>
{"title":"An accurate RMS/DC voltage comparator","authors":"R. Arseneau, J. Zelle","doi":"10.1109/IMTC.1990.65950","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65950","url":null,"abstract":"The authors describe a new instrument which is designed to operate as a null meter with a range of +or-1000 p.p.m. of typical test voltages used in high-accuracy AC calibrations. It is based on a commercially available dual-heater-type converter in a standard integrated circuit package. The accuracy of the instrument is better than 100 p.p.m. for frequencies of 50 Hz to 200 kHz. It can, however, be used for frequencies up to 1 MHz at reduced accuracy.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"357 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115936718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The geometric average is proposed as an alternative averaging technique for frequency response function measurements. It is shown that the geometric mean produces almost unbiased measurements, even if the input and output measurements are both disturbed by (normal distributed) noise. The proposed method is compared with the classical H/sub 1/ and H/sub 2/ measuring methods. As long as the signal-to-noise ratio is higher than 3 dB, the proposed method produces almost unbiased results in comparison with the other two methods.<>
{"title":"Measurement of frequency response functions in noisy environments","authors":"J. Schoukens, R. Pintelon","doi":"10.1109/IMTC.1990.66040","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66040","url":null,"abstract":"The geometric average is proposed as an alternative averaging technique for frequency response function measurements. It is shown that the geometric mean produces almost unbiased measurements, even if the input and output measurements are both disturbed by (normal distributed) noise. The proposed method is compared with the classical H/sub 1/ and H/sub 2/ measuring methods. As long as the signal-to-noise ratio is higher than 3 dB, the proposed method produces almost unbiased results in comparison with the other two methods.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132897876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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