The author describes a newly established precise mathematical model and CAD (computer-aided design) algorithms for a high-overload induction watthour meter (the software package is called WATTCAD). The problem of computing the dynamic induced magnetic and electric systems of the watthour meter is solved in WATTCAD with three new nonlinear equivalent circuits. The Monte Carlo method for tolerance analysis and an optimization technique have been programmed and improved for meter design. The user interface to WATTCAD was simplified and the amount of data to be entered minimized. The improved linear interpolation and secant algorithms are programmed for solving nonlinear equations of complex matrices which are used to describe the inductive electromagnetic phenomenon. As an example, the use of WATTCAD to design a new model watthour meter DD285 is discussed.<>
{"title":"Computer-aided design of induction watthour meter","authors":"Keren Ban","doi":"10.1109/IMTC.1990.65957","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65957","url":null,"abstract":"The author describes a newly established precise mathematical model and CAD (computer-aided design) algorithms for a high-overload induction watthour meter (the software package is called WATTCAD). The problem of computing the dynamic induced magnetic and electric systems of the watthour meter is solved in WATTCAD with three new nonlinear equivalent circuits. The Monte Carlo method for tolerance analysis and an optimization technique have been programmed and improved for meter design. The user interface to WATTCAD was simplified and the amount of data to be entered minimized. The improved linear interpolation and secant algorithms are programmed for solving nonlinear equations of complex matrices which are used to describe the inductive electromagnetic phenomenon. As an example, the use of WATTCAD to design a new model watthour meter DD285 is discussed.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122195697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The performance characteristics of semiconductor laser diodes for wideband analog transmission have been investigated. The distortion characteristics of such devices were determined by measurement of the laser's light-current transfer characteristic and also by means of multicarrier harmonic distortion measurements. The noise characteristics were determined by measurement of the laser's relative intensity noise. The performance of these devices at the system level was demonstrated by measuring the noise and distortion characteristics after transmission through optical fiber. The measurements indicate that distributed-feedback semiconductor lasers are viable candidates for deployment as sources for broadband analog transmission in fiber-optic transmission systems.<>
{"title":"Broadband analog performance of laser diodes","authors":"Y. Trisno, H. Achor","doi":"10.1109/IMTC.1990.66034","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66034","url":null,"abstract":"The performance characteristics of semiconductor laser diodes for wideband analog transmission have been investigated. The distortion characteristics of such devices were determined by measurement of the laser's light-current transfer characteristic and also by means of multicarrier harmonic distortion measurements. The noise characteristics were determined by measurement of the laser's relative intensity noise. The performance of these devices at the system level was demonstrated by measuring the noise and distortion characteristics after transmission through optical fiber. The measurements indicate that distributed-feedback semiconductor lasers are viable candidates for deployment as sources for broadband analog transmission in fiber-optic transmission systems.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116077296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A novel method for the design of digital finite impulse response (FIR) and infinite impulse response (IIR) Hilbert transformers using the least squares (LS) and the minimax criteria is presented. The LS approximation is performed in the complex domain. Also presented is an iterative extension of the algorithm, which results in a minimax (Chebyshev) approximation, also in the complex domain. For FIR filters the results are the same as those of the optimal methods known from the literature. For the same task, stable IIR filters have also been successfully designed. The procedures proposed are usable for the design of digital filters other than Hilbert transformers, since the desired frequency response can be given point by point.<>
{"title":"Optimal FIR and IIR Hilbert transformer design via LS and minimax fitting","authors":"I. Kollár, R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1990.66007","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66007","url":null,"abstract":"A novel method for the design of digital finite impulse response (FIR) and infinite impulse response (IIR) Hilbert transformers using the least squares (LS) and the minimax criteria is presented. The LS approximation is performed in the complex domain. Also presented is an iterative extension of the algorithm, which results in a minimax (Chebyshev) approximation, also in the complex domain. For FIR filters the results are the same as those of the optimal methods known from the literature. For the same task, stable IIR filters have also been successfully designed. The procedures proposed are usable for the design of digital filters other than Hilbert transformers, since the desired frequency response can be given point by point.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132580285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A method, based on asynchronous spectral averaging, to measure the standard deviation of a clock/aperture jitter of an A/D (analog-to-digital) system is proposed. A sine wave with frequency f/sub 0/ is used as an input test signal to a B-bit A/D system. Spectral averaging is then performed on many asynchronously acquired data records with length N. The jitter standard deviation can then be calculated from the measured signal-to-noise floor ratio. An expression which relates the signal-to-noise floor ratio to the standard deviation of the jitter is derived in a closed form. Simulation results are also presented and are shown to be in very good agreement with the theoretical results.<>
{"title":"Digital spectra of non-uniformly sampled signals: theories and applications. IV. Measuring clock/aperture jitter of an A/D system","authors":"Y. Jenq","doi":"10.1109/IMTC.1990.65986","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65986","url":null,"abstract":"A method, based on asynchronous spectral averaging, to measure the standard deviation of a clock/aperture jitter of an A/D (analog-to-digital) system is proposed. A sine wave with frequency f/sub 0/ is used as an input test signal to a B-bit A/D system. Spectral averaging is then performed on many asynchronously acquired data records with length N. The jitter standard deviation can then be calculated from the measured signal-to-noise floor ratio. An expression which relates the signal-to-noise floor ratio to the standard deviation of the jitter is derived in a closed form. Simulation results are also presented and are shown to be in very good agreement with the theoretical results.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"289 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133598602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The development of a specialized circuit for measurement and recording (essentially a microcontroller with a masked ROM containing a specialized program) is described. The software calibration method is based on the assumption of a linear deviation from the nominal law. The purpose of this approach is to offer for loggers an architecture as universal as possible and also to simplify the task of the designer in charge of a new development. The example of a temperature and humidity recorder illustrates the features and limitations of the method, as well as some precautions to be taken. The work considered was carried out in the framework of a large project devoted to the design optimization of portable, autonomous micro-data-loggers recording various physical parameters.<>
{"title":"Software calibration: a view on a linear deviation concept","authors":"F. Gueuning, P. Bernard, C. Eugène","doi":"10.1109/IMTC.1990.65971","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65971","url":null,"abstract":"The development of a specialized circuit for measurement and recording (essentially a microcontroller with a masked ROM containing a specialized program) is described. The software calibration method is based on the assumption of a linear deviation from the nominal law. The purpose of this approach is to offer for loggers an architecture as universal as possible and also to simplify the task of the designer in charge of a new development. The example of a temperature and humidity recorder illustrates the features and limitations of the method, as well as some precautions to be taken. The work considered was carried out in the framework of a large project devoted to the design optimization of portable, autonomous micro-data-loggers recording various physical parameters.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134138172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The need to enhance the performance of process instrumentation systems by applying modern signal processing techniques has been identified as one of the priority areas for research and development in process instrumentation and process control. It is pointed out that this performance enhancement can be in the form of extracting additional information from flow sensors beyond the customary requirements of the basic process measurement, that is, flow rate. In conjunction with, and within the expert systems approach, an enhanced flowmeter can be utilized for condition monitoring purposes, and for diagnostic engineering management and optimization of process plant operations. The authors demonstrate the new importance of flow measurement signals from the point of view of extracting additional information, which is used to characterize the operational status of a turbine flow meter installed in a plant. The signal processing method is based on the system identification and parametric modelling approach. Qualitative signatures which have been identified for the turbine flow measurement system have also been related to the condition of the process plant.<>
{"title":"Additional information from flowmeters via signal analysis","authors":"J. Amadi-Echendu, E. Higham","doi":"10.1109/IMTC.1990.65994","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65994","url":null,"abstract":"The need to enhance the performance of process instrumentation systems by applying modern signal processing techniques has been identified as one of the priority areas for research and development in process instrumentation and process control. It is pointed out that this performance enhancement can be in the form of extracting additional information from flow sensors beyond the customary requirements of the basic process measurement, that is, flow rate. In conjunction with, and within the expert systems approach, an enhanced flowmeter can be utilized for condition monitoring purposes, and for diagnostic engineering management and optimization of process plant operations. The authors demonstrate the new importance of flow measurement signals from the point of view of extracting additional information, which is used to characterize the operational status of a turbine flow meter installed in a plant. The signal processing method is based on the system identification and parametric modelling approach. Qualitative signatures which have been identified for the turbine flow measurement system have also been related to the condition of the process plant.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131493181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20- mu V r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices.<>
{"title":"Application and operation of a superconducting sampler based instrumentation system","authors":"E. Hanson, Z. Shen","doi":"10.1109/IMTC.1990.66012","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66012","url":null,"abstract":"A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20- mu V r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126856350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors introduce a simple method by which the robust calibration technique developed by S.K. Judah (1985) may be unified with the thru-reflect-line technique, yielding initial estimates of the six-port instrumental parameters that are insensitive to noise and random errors. This calibration technique has been employed in a single six-port reflectometer operating at 2 GHz. Experimental experience has shown the technique to be robust; problems encountered using the method recommended by G.F. Engen (1979) have not arisen. Investigation by computer simulation has also shown the technique to be reliable. This methodology requires a substantial increase in software effort owing to the effective operational requirement of two full calibration techniques.<>
{"title":"A robust six-to-four port reduction technique for the calibration of six-port microwave network analysers","authors":"A. Wright, S. Judah","doi":"10.1109/IMTC.1990.65977","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65977","url":null,"abstract":"The authors introduce a simple method by which the robust calibration technique developed by S.K. Judah (1985) may be unified with the thru-reflect-line technique, yielding initial estimates of the six-port instrumental parameters that are insensitive to noise and random errors. This calibration technique has been employed in a single six-port reflectometer operating at 2 GHz. Experimental experience has shown the technique to be robust; problems encountered using the method recommended by G.F. Engen (1979) have not arisen. Investigation by computer simulation has also shown the technique to be reliable. This methodology requires a substantial increase in software effort owing to the effective operational requirement of two full calibration techniques.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"147 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125820982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author describes a waveform-recorder evaluation system which is controlled by a Microvax II with instrumentation control through the IEEE-488 bus. Evaluation procedures are described with attention to the 'pathological cases' that can lead to significant misestimates of a digitizer's performance. The aim of these evaluation procedures is consistency with the new Trial Waveform Digitizer Standard generated by the Waveform Measurements and Analysis Committee appointed by the Instrumentation and Measurement Society of the IEEE. Methods are discussed for measuring the effective-bits performance of a waveform digitizer and determining differential nonlinearity.<>
{"title":"Effective waveform recorder evaluation procedures","authors":"P. J. Green","doi":"10.1109/IMTC.1990.66000","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66000","url":null,"abstract":"The author describes a waveform-recorder evaluation system which is controlled by a Microvax II with instrumentation control through the IEEE-488 bus. Evaluation procedures are described with attention to the 'pathological cases' that can lead to significant misestimates of a digitizer's performance. The aim of these evaluation procedures is consistency with the new Trial Waveform Digitizer Standard generated by the Waveform Measurements and Analysis Committee appointed by the Instrumentation and Measurement Society of the IEEE. Methods are discussed for measuring the effective-bits performance of a waveform digitizer and determining differential nonlinearity.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129022308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A multistage half-band FIR (finite impulse response) decimator has been implemented on a 40000-gate, 1.5- mu m CMOS gate array, which dissipates 1.5 W at a clock rate of 25.6 MHz (a sampling rate of 2.56 MHz). The filter handles 20-b, 2.56-M sample/s input data. It has been tested for frequency shifting and zooming in a prototype FFT (fast Fourier transform) spectrum analyzer and has increased the frequency resolution by up to 2/sup 17/ times without aliasing, resulting in frequency resolution on the order of 20 mHz; it has a 96-dB dynamic range.<>
{"title":"A programmable multistage half-band FIR decimator for input data rates up to 2.56 MSPS","authors":"T. Yoshida, H. Kobayashi","doi":"10.1109/IMTC.1990.66006","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66006","url":null,"abstract":"A multistage half-band FIR (finite impulse response) decimator has been implemented on a 40000-gate, 1.5- mu m CMOS gate array, which dissipates 1.5 W at a clock rate of 25.6 MHz (a sampling rate of 2.56 MHz). The filter handles 20-b, 2.56-M sample/s input data. It has been tested for frequency shifting and zooming in a prototype FFT (fast Fourier transform) spectrum analyzer and has increased the frequency resolution by up to 2/sup 17/ times without aliasing, resulting in frequency resolution on the order of 20 mHz; it has a 96-dB dynamic range.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128609947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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