The main features of a PI (personal instrument) are discussed, and the requirements for PI software are derived. Then the performance of an original software package for PI is illustrated, showing how all requirements were satisfied. The software, coupled to a good commercial data acquisition system, features high-precision measurement and a high level of friendliness. It can be effectively employed in lab tests and for educational purposes. As far as the former are concerned, the software, associated with dedicated routines for special measurements, is a good basis for an automatic test station with extended help facilities. In this respect it was used to determine induction motor characteristics and model parameters. It has proved effective in educational applications, since it allows direct explanation of all capabilities offered by computer-based in instrumentation coupled with suitable A/D conversion hardware.<>
{"title":"Software for personal instruments","authors":"A. Ferrero","doi":"10.1109/IMTC.1990.66028","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66028","url":null,"abstract":"The main features of a PI (personal instrument) are discussed, and the requirements for PI software are derived. Then the performance of an original software package for PI is illustrated, showing how all requirements were satisfied. The software, coupled to a good commercial data acquisition system, features high-precision measurement and a high level of friendliness. It can be effectively employed in lab tests and for educational purposes. As far as the former are concerned, the software, associated with dedicated routines for special measurements, is a good basis for an automatic test station with extended help facilities. In this respect it was used to determine induction motor characteristics and model parameters. It has proved effective in educational applications, since it allows direct explanation of all capabilities offered by computer-based in instrumentation coupled with suitable A/D conversion hardware.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127106464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In 1989 a long-range program was instituted at the National Institute of Standards and Technology (NIST) specifically directed at developing improved metrology methods and standards to support microwave monolithic integrated circuit (MMIC) technology. The authors describe how the program was developed, the modes of interaction with the industrial community and the DARPA MMIC initiative, and the particular projects being undertaken which will result in a more consistent measurement base for those engaged in the design and manufacture of MMIC devices. It is concluded that, by obtaining both informational inputs and support from industry, other government research laboratories, and prospective users, the opportunities for speedy technology transfer and maximum utilization of results have been enhanced.<>
{"title":"MMIC related metrology at the National Institute of Standards and Technology","authors":"G. Reeve, R. Marks, D. Blackburn","doi":"10.1109/IMTC.1990.65997","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65997","url":null,"abstract":"In 1989 a long-range program was instituted at the National Institute of Standards and Technology (NIST) specifically directed at developing improved metrology methods and standards to support microwave monolithic integrated circuit (MMIC) technology. The authors describe how the program was developed, the modes of interaction with the industrial community and the DARPA MMIC initiative, and the particular projects being undertaken which will result in a more consistent measurement base for those engaged in the design and manufacture of MMIC devices. It is concluded that, by obtaining both informational inputs and support from industry, other government research laboratories, and prospective users, the opportunities for speedy technology transfer and maximum utilization of results have been enhanced.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115271257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of 'don't cares' at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner.<>
{"title":"An algorithm for diagnostics with signature analyzer","authors":"J. Chan, B. Womack","doi":"10.1109/IMTC.1990.65963","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65963","url":null,"abstract":"An algorithm for fault diagnosis that makes use of the information from a faulty signature is presented. The idea is to search the likely error locations before the tests are performed. The method reduces the number of tests required to diagnose the errors with the probability of aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred. Also, the case of 'don't cares' at the input sequence of signature analysis is discussed. The algorithm can be readily implemented in software with the faulty signature as the only input variable. The proposed fault diagnostic scheme has an advantage over exhaustive testing in that it leads to fault isolation in a homing-in manner.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121725588","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included.<>
{"title":"Step and frequency response testing of waveform recorders","authors":"T. Souders, D. R. Flach, J. Blair","doi":"10.1109/IMTC.1990.66001","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66001","url":null,"abstract":"Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116813489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The problem of calibrating a system for measuring the concentration of methanol in water is investigated. The inefficiency of polynomial and inverse-polynomial models used for this purpose is demonstrated. The cubic-spline interpolation is chosen and examined as a flexible means of calibration. A method for experimental validation of the results of calibration is proposed. The proposed method makes possible the utilization of a much greater amount of calibration data for improving the accuracy of calibration as compared with the polynomial and inverse-polynomial models, and requires much less a priori information on the relationships between quantities involved in the measurement process.<>
{"title":"Calibration of an electronic measuring system for ultrasonic analysis of solutions","authors":"A. Barwicz, R. Morawski, J. Dion","doi":"10.1109/IMTC.1990.65973","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65973","url":null,"abstract":"The problem of calibrating a system for measuring the concentration of methanol in water is investigated. The inefficiency of polynomial and inverse-polynomial models used for this purpose is demonstrated. The cubic-spline interpolation is chosen and examined as a flexible means of calibration. A method for experimental validation of the results of calibration is proposed. The proposed method makes possible the utilization of a much greater amount of calibration data for improving the accuracy of calibration as compared with the polynomial and inverse-polynomial models, and requires much less a priori information on the relationships between quantities involved in the measurement process.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"45 3-4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114027478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hilbert transform processors have been developed to improve flaw detection in parts by sensing the rate of total energy arrival. The processor operates in real time by using a single-sideband conversion technique. An upper sideband processor has been built with a transducer bandwidth of 0.5 to 20 MHz and can resolve echoes 90 ns apart. A lower sideband processor has a bandwidth of 2 to 42 MHz and can resolve echoes 60 ns apart.<>
{"title":"Real-time analytic signal processor for ultrasonic nondestructive testing","authors":"M. G. Duncan","doi":"10.1109/IMTC.1990.65954","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65954","url":null,"abstract":"Hilbert transform processors have been developed to improve flaw detection in parts by sensing the rate of total energy arrival. The processor operates in real time by using a single-sideband conversion technique. An upper sideband processor has been built with a transducer bandwidth of 0.5 to 20 MHz and can resolve echoes 90 ns apart. A lower sideband processor has a bandwidth of 2 to 42 MHz and can resolve echoes 60 ns apart.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114625667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An algorithm for real-time differentiation of discrete measurement data is discussed. The effectiveness of this algorithm depends on a regularization parameter whose value should be fitted to the level of disturbance to which the data are subject. A simple method for choosing this value has been proposed and it requires only scanty a priori information on the data, namely, an estimate of the signal bandwidth and an estimate of the signal-to-noise ratio. The effectiveness of this method has been demonstrated using a few sets of synthetic data and computer experimentation methodology. It has been shown that the attainable accuracy of differentiation is very close to the optimum which may be reached via empirical optimization of the regularization parameter.<>
{"title":"Regularized differentiation of measurement data using a-priori information on signal and noise spectra","authors":"A. Miekina, R. Morawski","doi":"10.1109/IMTC.1990.66043","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66043","url":null,"abstract":"An algorithm for real-time differentiation of discrete measurement data is discussed. The effectiveness of this algorithm depends on a regularization parameter whose value should be fitted to the level of disturbance to which the data are subject. A simple method for choosing this value has been proposed and it requires only scanty a priori information on the data, namely, an estimate of the signal bandwidth and an estimate of the signal-to-noise ratio. The effectiveness of this method has been demonstrated using a few sets of synthetic data and computer experimentation methodology. It has been shown that the attainable accuracy of differentiation is very close to the optimum which may be reached via empirical optimization of the regularization parameter.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132425197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is suggested that metrology education should be very diverse and serve both the person who wishes to be a generalist and the person who wishes to be a specialist in the field. In addition, it should serve the needs of people in many fields who will find the concepts of metrology useful in their work. It is emphasized that metrology needs to become an integral part of the intellectual property of every scientific professional. The study of metrology should be included as the 'laboratory side' of the science of mathematics at all levels of the educational system.<>
{"title":"Metrology education for the information age","authors":"D. Strain","doi":"10.1109/IMTC.1990.65969","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65969","url":null,"abstract":"It is suggested that metrology education should be very diverse and serve both the person who wishes to be a generalist and the person who wishes to be a specialist in the field. In addition, it should serve the needs of people in many fields who will find the concepts of metrology useful in their work. It is emphasized that metrology needs to become an integral part of the intellectual property of every scientific professional. The study of metrology should be included as the 'laboratory side' of the science of mathematics at all levels of the educational system.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"218 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122847791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is pointed out that most estimation methods, when applied to linear time-invariant systems, do not take into account the noise on the input signal. It is well known that these methods generate biased estimates when input noise is present. It is demonstrated that unbiased pole-zero estimates of the device under test (DUT) can still be obtained when an input signal with a constant signal-to-noise ratio (SNR) in the frequency domain is used. By means of a practical problem, it is experimentally demonstrated that the multisine technique gives the necessary flexibility to create optimal signals with a constant SNR, even when the noise is strongly colored.<>
{"title":"On the use of signals with a constant signal-to-noise ratio in the frequency-domain","authors":"P. Guillaume, R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1990.66038","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66038","url":null,"abstract":"It is pointed out that most estimation methods, when applied to linear time-invariant systems, do not take into account the noise on the input signal. It is well known that these methods generate biased estimates when input noise is present. It is demonstrated that unbiased pole-zero estimates of the device under test (DUT) can still be obtained when an input signal with a constant signal-to-noise ratio (SNR) in the frequency domain is used. By means of a practical problem, it is experimentally demonstrated that the multisine technique gives the necessary flexibility to create optimal signals with a constant SNR, even when the noise is strongly colored.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132514212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The implementation of a digital sine-wave oscillator using the TMS320C25 digital signal processor (DSP) is described. The system is implemented with the Dalanco Spry model 25 DSP board, and a software system is designed whereby an IBM PC host computer provides control of the waveform generator functions and parameters. Waveforms are generated using the look-up-table (LUT) method. The direct LUT method has the disadvantage of increased harmonic distortion when fractional addressing is implemented to improve frequency resolution. This type of distortion can be reduced by linear interpolation or other methods. The existing methods of direct LUT and linear interpolation are implemented and compared with the present approach. The proposed method uses a trigonometric identity to reduce the harmonic distortion of the sine wave by effectively increasing the table length of the direct LUT method. The authors present the results of an experiment performed in the digital domain, without consideration of the problem of analog reconstruction. Waveforms for the sum of two sine waves, a frequency swept sine wave, amplitude modulation, and frequency modulation are shown as applications of the waveform generator.<>
{"title":"The implementation of a digital sine-wave oscillator using the TMS320C25: distortion reduction and applications","authors":"M. Schanerberger, S. Awad","doi":"10.1109/IMTC.1990.65949","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65949","url":null,"abstract":"The implementation of a digital sine-wave oscillator using the TMS320C25 digital signal processor (DSP) is described. The system is implemented with the Dalanco Spry model 25 DSP board, and a software system is designed whereby an IBM PC host computer provides control of the waveform generator functions and parameters. Waveforms are generated using the look-up-table (LUT) method. The direct LUT method has the disadvantage of increased harmonic distortion when fractional addressing is implemented to improve frequency resolution. This type of distortion can be reduced by linear interpolation or other methods. The existing methods of direct LUT and linear interpolation are implemented and compared with the present approach. The proposed method uses a trigonometric identity to reduce the harmonic distortion of the sine wave by effectively increasing the table length of the direct LUT method. The authors present the results of an experiment performed in the digital domain, without consideration of the problem of analog reconstruction. Waveforms for the sum of two sine waves, a frequency swept sine wave, amplitude modulation, and frequency modulation are shown as applications of the waveform generator.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129247933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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