Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.13
M. Kuster
What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the "Toward a Measurement Information Infrastructure" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.
{"title":"Vision, Progress and Discussion: A Measurement Information Infrastructure","authors":"M. Kuster","doi":"10.51843/wsproceedings.2017.13","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.13","url":null,"abstract":"What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the \"Toward a Measurement Information Infrastructure\" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128390217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.24
G. Bennett
There is a dilemma that calibration laboratories and customers go through when providing a calibration service. The customer that wants a calibration done, but the customer doesn’t understand or maybe they don’t care about the quality. What obligation does the calibration laboratory have to educate the customer, especially when they don’t care? How many customers just want calibration label. What about the customer who demands that the laboratory has to be ISO/IEC 17025 accredited, but won’t pay the additional cost of the accredited calibration?
{"title":"Balancing Cost Savings And ISO/IEC 17025","authors":"G. Bennett","doi":"10.51843/wsproceedings.2017.24","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.24","url":null,"abstract":"There is a dilemma that calibration laboratories and customers go through when providing a calibration service. The customer that wants a calibration done, but the customer doesn’t understand or maybe they don’t care about the quality. What obligation does the calibration laboratory have to educate the customer, especially when they don’t care? How many customers just want calibration label. What about the customer who demands that the laboratory has to be ISO/IEC 17025 accredited, but won’t pay the additional cost of the accredited calibration?","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114838804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.08
H. Scherer
The Ultra stable Low-noise Current Amplifier (ULCA) is a user-friendly and superior alternative to existing instruments for small direct currents in the range between about 1 fA and 5 μA. The principle of the portable laboratory table-top device, operated at room temperature, is based on a novel dual-stage transimpedance amplifier concept. The total transimpedance of 1 GO is calibrated with a cryogenic current comparator with an uncertainty < 0.1 μO/O traceable to the quantum Hall resistance. The output voltage is measured with a voltmeter calibrated traced to the Josephson voltage standard. In addition to its electrometer function, in combination with a voltage source the ULCA also can be used as a current generator. Therefore, it represents a new tool for ultra-accurate small-current measurement and generation traceable to quantum electrical standards. It outperforms commercial devices and calibration setups used in metrology institutes by up to two orders of magnitude in accuracy. The unique features of the ULCA are the excellent stability of its transimpedance (drift less than 5 μO/O per year, short-term fluctuations over one week< 0.1 μO/O), its small temperature coefficient (typically about 0.2 μO/O per Kelvin), fast settling(difference to final value < 0.1 μA/A after 3 s), and the low input current noise of 2.4 fA/vHz. This enables measuring a direct current of 100 pA with a total relative uncertainty of 0.1 μA/A in about 10 h. Besides being excellently suited for R&D in small-current metrology (e.g. for research on single-electron pumps) the ULCA is also widely applicable for calibrations, for instance for electrometers, small-current sources, or high-value resistors. Corresponding fields (and specific examples) are electronic industry (ICs), medicine and biotechnology (dosimetry, radiation protection, DNA sequencers) as well as environmental monitoring (concentration measurements of small particles in air or aerosols), and lighting industry (photo current measurement). Framed by two patent applications, the technology was transferred from the Physikalisch-Technische Bundesanstalt (PTB) to a German company (Magnicon GmbH, Hamburg), which manufactures and markets the ULCA since 2016 licensed by PTB.
{"title":"Ultrastable Low-Noise Current Amplifier: A New Tool for Small Current Metrology","authors":"H. Scherer","doi":"10.51843/wsproceedings.2017.08","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.08","url":null,"abstract":"The Ultra stable Low-noise Current Amplifier (ULCA) is a user-friendly and superior alternative to existing instruments for small direct currents in the range between about 1 fA and 5 μA. The principle of the portable laboratory table-top device, operated at room temperature, is based on a novel dual-stage transimpedance amplifier concept. The total transimpedance of 1 GO is calibrated with a cryogenic current comparator with an uncertainty < 0.1 μO/O traceable to the quantum Hall resistance. The output voltage is measured with a voltmeter calibrated traced to the Josephson voltage standard. In addition to its electrometer function, in combination with a voltage source the ULCA also can be used as a current generator. Therefore, it represents a new tool for ultra-accurate small-current measurement and generation traceable to quantum electrical standards. It outperforms commercial devices and calibration setups used in metrology institutes by up to two orders of magnitude in accuracy. The unique features of the ULCA are the excellent stability of its transimpedance (drift less than 5 μO/O per year, short-term fluctuations over one week< 0.1 μO/O), its small temperature coefficient (typically about 0.2 μO/O per Kelvin), fast settling(difference to final value < 0.1 μA/A after 3 s), and the low input current noise of 2.4 fA/vHz. This enables measuring a direct current of 100 pA with a total relative uncertainty of 0.1 μA/A in about 10 h. Besides being excellently suited for R&D in small-current metrology (e.g. for research on single-electron pumps) the ULCA is also widely applicable for calibrations, for instance for electrometers, small-current sources, or high-value resistors. Corresponding fields (and specific examples) are electronic industry (ICs), medicine and biotechnology (dosimetry, radiation protection, DNA sequencers) as well as environmental monitoring (concentration measurements of small particles in air or aerosols), and lighting industry (photo current measurement). Framed by two patent applications, the technology was transferred from the Physikalisch-Technische Bundesanstalt (PTB) to a German company (Magnicon GmbH, Hamburg), which manufactures and markets the ULCA since 2016 licensed by PTB.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115762776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.42
Walter Nowocin
Over the past five years, the U.S. Food & Drug Administration (FDA) has intensified their compliance oversight with increased Quality System Surveillance Inspections and increased Warning Letters being sent to Healthcare companies. Warning Letters are issued only for violations of regulatory significance. The good news is that the FDA publishes all Warning Letters on their web site as a public service. And they have a very easy search engine that allows you to find Warning Letters that contain topics particular to your industry or job. This paper reviews calibration related FDA Warning Letters generated over the past five years to select the best ten examples. We will analyze the best Warning Letter examples and discuss best practices that would avoid these violations. With this knowledge, we can learn from these violations and ensure that our metrology programs do not negatively impact the cost of quality of our organizations.
{"title":"Best Lessons Learned from FDA Warning Letters","authors":"Walter Nowocin","doi":"10.51843/wsproceedings.2017.42","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.42","url":null,"abstract":"Over the past five years, the U.S. Food & Drug Administration (FDA) has intensified their compliance oversight with increased Quality System Surveillance Inspections and increased Warning Letters being sent to Healthcare companies. Warning Letters are issued only for violations of regulatory significance. The good news is that the FDA publishes all Warning Letters on their web site as a public service. And they have a very easy search engine that allows you to find Warning Letters that contain topics particular to your industry or job. This paper reviews calibration related FDA Warning Letters generated over the past five years to select the best ten examples. We will analyze the best Warning Letter examples and discuss best practices that would avoid these violations. With this knowledge, we can learn from these violations and ensure that our metrology programs do not negatively impact the cost of quality of our organizations.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"275 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133917974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.01
J. Fuehne
A partnership between industry and academia has led to developing a framework for a series of training courses for various industrial employees who have different needs and requirements based on their job function. Purdue Polytechnic Columbus is working with local employer Cummins Inc. to define several training classes that would take place at the university campus in Columbus using the environmentally-controlled metrology lab at the facility. Training classes will be outlined for new employees who have no prior experience with metrology, current employees with some metrology experience who may need to update their skills or acquire new skills in a different area, degreed engineers who likely have little metrology experience but need some metrology knowledge to better function in their jobs, and managers who might need an overview of metrology and its key role in the manufacturing environment. These training sessions will necessarily vary in length and time based on the target audience and the depth of knowledge required. The objective is to do as little lecturing as possible and focus the learning on hands-on, learn-by-doing activities. This would include using hand tools, optical measurement tools and various machines that might include surface finish testers, coordinate measuring machines, roundness testers, and torque calibration instruments. A primary aspect of the classes will be measurement artifacts manufactured using 3D printers that would allow the creation of parts with flaws and imperfections that highlight the measurement process and the value in being diligent and aware when performing measurements.
{"title":"A Framework for Training Classes for Dimensional Measurement Incorporating 3D Printing Artifacts","authors":"J. Fuehne","doi":"10.51843/wsproceedings.2017.01","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.01","url":null,"abstract":"A partnership between industry and academia has led to developing a framework for a series of training courses for various industrial employees who have different needs and requirements based on their job function. Purdue Polytechnic Columbus is working with local employer Cummins Inc. to define several training classes that would take place at the university campus in Columbus using the environmentally-controlled metrology lab at the facility. Training classes will be outlined for new employees who have no prior experience with metrology, current employees with some metrology experience who may need to update their skills or acquire new skills in a different area, degreed engineers who likely have little metrology experience but need some metrology knowledge to better function in their jobs, and managers who might need an overview of metrology and its key role in the manufacturing environment. These training sessions will necessarily vary in length and time based on the target audience and the depth of knowledge required. The objective is to do as little lecturing as possible and focus the learning on hands-on, learn-by-doing activities. This would include using hand tools, optical measurement tools and various machines that might include surface finish testers, coordinate measuring machines, roundness testers, and torque calibration instruments. A primary aspect of the classes will be measurement artifacts manufactured using 3D printers that would allow the creation of parts with flaws and imperfections that highlight the measurement process and the value in being diligent and aware when performing measurements.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":" 26","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120830835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2017.10
Dean S. Williams
This paper describes a case study involving an inventory optimization pilot project that used analytics as a key to identifying and managing inventory levels for a measuring and test equipment program. This paper highlights the approach taken and the analytical tools used to execute that strategy. The approach follows the general guidelines of a LEAN improvement project using DMAIC(Define, Measure, Analyze, Implement, Control) The paper concludes with a summary of results from the pilot project, some lessons learned, anticipated next steps for full-scale implementation, and estimates of potential overall savings.
{"title":"Using Analytics to Optimize M&TE Inventory - a Case Study","authors":"Dean S. Williams","doi":"10.51843/wsproceedings.2017.10","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.10","url":null,"abstract":"This paper describes a case study involving an inventory optimization pilot project that used analytics as a key to identifying and managing inventory levels for a measuring and test equipment program. This paper highlights the approach taken and the analytical tools used to execute that strategy. The approach follows the general guidelines of a LEAN improvement project using DMAIC(Define, Measure, Analyze, Implement, Control) The paper concludes with a summary of results from the pilot project, some lessons learned, anticipated next steps for full-scale implementation, and estimates of potential overall savings.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128328619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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