Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368651
Hong Lei, S. Bowen, Zhou Zhongyuan, Zhou Xiang
Differences in the insertion loss of a reverberation chamber as measured in frequency & time domain are shown. And an alternative approach for measuring the insertion loss which is named as time domain energy-decay method is proposed, and compared with conventional time domain time-decay method & frequency domain continuous wave based method. Insertion loss measured by time domain energy-decay method is identical to that which would be obtained in frequency domain. The insertion loss determined by time-decay method is 1~2dB greater than those obtained with frequency domain measurement, the main reason for the discrepancy is the influence of antenna (antenna impedance mismatch and non-unit antenna efficiency). The effectiveness of the time domain method for measuring the insertion loss of a reverberation chamber is of particular interest in this paper.
{"title":"Differences in reverberation chamber insertion loss measurement in time & frequency domian","authors":"Hong Lei, S. Bowen, Zhou Zhongyuan, Zhou Xiang","doi":"10.1109/CEEM.2015.7368651","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368651","url":null,"abstract":"Differences in the insertion loss of a reverberation chamber as measured in frequency & time domain are shown. And an alternative approach for measuring the insertion loss which is named as time domain energy-decay method is proposed, and compared with conventional time domain time-decay method & frequency domain continuous wave based method. Insertion loss measured by time domain energy-decay method is identical to that which would be obtained in frequency domain. The insertion loss determined by time-decay method is 1~2dB greater than those obtained with frequency domain measurement, the main reason for the discrepancy is the influence of antenna (antenna impedance mismatch and non-unit antenna efficiency). The effectiveness of the time domain method for measuring the insertion loss of a reverberation chamber is of particular interest in this paper.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120981889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368619
L. Jike, Z. Xinghai, He Jinliang, Qi Zheng
When a cloud data center is constructed in the same location as a high voltage substation, the power frequency magnetic field when the substation works normally and the short-time power frequency magnetic field at the time of short circuit may cause hazards to the information storage equipment of the cloud data center constructed on the same site. Through measurements and analyses, this article summarizes characteristics of power frequency magnetic field environment generated by the substation. It proposes to improve the power frequency magnetic field immunity of information storage equipment so as to cancel measures for shielding power frequency magnetic fields in the data cloud center and save a huge amount of shielding expenses for protection strategies against power frequency magnetic fields in the data center. The power frequency magnetic field immunity is tested on the server for information storage in the cloud data center developed according to harsh requirements of power frequency magnetic field immunity. The test results indicate that the server developed for the data center can tolerate the harshest power frequency magnetic field environment.
{"title":"Research and test on immunity of a data center server against power frequency magnetic fields in a high voltage substation","authors":"L. Jike, Z. Xinghai, He Jinliang, Qi Zheng","doi":"10.1109/CEEM.2015.7368619","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368619","url":null,"abstract":"When a cloud data center is constructed in the same location as a high voltage substation, the power frequency magnetic field when the substation works normally and the short-time power frequency magnetic field at the time of short circuit may cause hazards to the information storage equipment of the cloud data center constructed on the same site. Through measurements and analyses, this article summarizes characteristics of power frequency magnetic field environment generated by the substation. It proposes to improve the power frequency magnetic field immunity of information storage equipment so as to cancel measures for shielding power frequency magnetic fields in the data cloud center and save a huge amount of shielding expenses for protection strategies against power frequency magnetic fields in the data center. The power frequency magnetic field immunity is tested on the server for information storage in the cloud data center developed according to harsh requirements of power frequency magnetic field immunity. The test results indicate that the server developed for the data center can tolerate the harshest power frequency magnetic field environment.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"33 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121013567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368678
Zhenhe Liang, Changlin Zhou, Shouguo Zhao, Tong Liu, Zhenyi Wang
This paper presents a study about temperature effect on the conducted susceptibility level of a microcontroller. Based on direct power injection, the electromagnetic susceptibility of microcontroller is measured under different temperatures. Measurement results show that different temperature conditions could result in fluctuations of conducted susceptibility level. To analyze the temperature effect on susceptibility level, several potential threats in passive part, microcontroller input/output buffer and clock signal are presented in this paper.
{"title":"Analysis of temperature effect on electromagnetic susceptibility of microcontroller","authors":"Zhenhe Liang, Changlin Zhou, Shouguo Zhao, Tong Liu, Zhenyi Wang","doi":"10.1109/CEEM.2015.7368678","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368678","url":null,"abstract":"This paper presents a study about temperature effect on the conducted susceptibility level of a microcontroller. Based on direct power injection, the electromagnetic susceptibility of microcontroller is measured under different temperatures. Measurement results show that different temperature conditions could result in fluctuations of conducted susceptibility level. To analyze the temperature effect on susceptibility level, several potential threats in passive part, microcontroller input/output buffer and clock signal are presented in this paper.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127362073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368659
Wei Ming, C. Ming
Electromagnetic pulse can damage electronic equipment through conduction coupling and radiation coupling two ways. The shielding effectiveness is an important parameter describing the shielding performance of the material. At present, most standards and specifications specify the shielding effectiveness of materials in the frequency-domain. A time domain experimental system of materials shielding effectiveness was presented. The time domain transfer function model of materials was achieved based on system identification theory. The transfer function model accurately forecasted the waveforms when the square wave or electromagnetic penetrates through the metal fabric material. The results show that this time domain test system can be used to evaluate materials shielding effectiveness against electromagnetic pulse. The transfer function model of the material can be used to forecast the waveform of electromagnetic pulse penetrating through the material.
{"title":"Modeling for electromagnetic pulse shielding effectiveness in time domain","authors":"Wei Ming, C. Ming","doi":"10.1109/CEEM.2015.7368659","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368659","url":null,"abstract":"Electromagnetic pulse can damage electronic equipment through conduction coupling and radiation coupling two ways. The shielding effectiveness is an important parameter describing the shielding performance of the material. At present, most standards and specifications specify the shielding effectiveness of materials in the frequency-domain. A time domain experimental system of materials shielding effectiveness was presented. The time domain transfer function model of materials was achieved based on system identification theory. The transfer function model accurately forecasted the waveforms when the square wave or electromagnetic penetrates through the metal fabric material. The results show that this time domain test system can be used to evaluate materials shielding effectiveness against electromagnetic pulse. The transfer function model of the material can be used to forecast the waveform of electromagnetic pulse penetrating through the material.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130736955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368690
Y. Du, Ming-li Chen
Magnetic shielding is an effective means to reduce low-frequency magnetic fields emitted from power cables and busbars. However, shielding against unbalanced currents has not been addressed well. This paper introduces equivalent magnetic dipoles for discussing magnetic shielding under a monopole current source. It is found that shielding is achieved by the cancellation of magnetic fields from both equivalent dipoles and the source monopole. However, the performance is not satisfactory because of a fast decaying rate of distance in the equivalent dipoles. To improve shielding performance under an unbalanced current source, it is recommended using either highly-permeable plates or multiple highly-conductive and electrically-connected plates.
{"title":"Low-frequency magnetic shielding against unbalanced currents","authors":"Y. Du, Ming-li Chen","doi":"10.1109/CEEM.2015.7368690","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368690","url":null,"abstract":"Magnetic shielding is an effective means to reduce low-frequency magnetic fields emitted from power cables and busbars. However, shielding against unbalanced currents has not been addressed well. This paper introduces equivalent magnetic dipoles for discussing magnetic shielding under a monopole current source. It is found that shielding is achieved by the cancellation of magnetic fields from both equivalent dipoles and the source monopole. However, the performance is not satisfactory because of a fast decaying rate of distance in the equivalent dipoles. To improve shielding performance under an unbalanced current source, it is recommended using either highly-permeable plates or multiple highly-conductive and electrically-connected plates.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129031439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368695
Yigang Wang, Bin Chen, Hai-Lin Chen, Y. Yi, Qiang Chen
This work develops a hybrid finite-difference time-domain (FDTD) method to calculate the electromagnetic field and temperature distribution of the high power microwave feed output window. First, the electromagnetic field of the microwave feed is computed, by which the electromagnetic heating source of the output window can be obtained. Then the partial differential equation of heat conduction is solved numerically. The influence of the temperature on electromagnetic parameters is considered in the model. The calculation is performed in the two-dimensional (2-D) cylindrical coordinate system, in which conformal FDTD techniques are used to handle the oblique PEC wall of the feed and cylindrical CPML is used to truncate the computational domain. The model is validated by the calculation results. The proposed method can be used in the analysis of unsteady temperature field of the output window.
{"title":"Electromagnetic-thermal coupling computation of the high power microwave feed output window","authors":"Yigang Wang, Bin Chen, Hai-Lin Chen, Y. Yi, Qiang Chen","doi":"10.1109/CEEM.2015.7368695","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368695","url":null,"abstract":"This work develops a hybrid finite-difference time-domain (FDTD) method to calculate the electromagnetic field and temperature distribution of the high power microwave feed output window. First, the electromagnetic field of the microwave feed is computed, by which the electromagnetic heating source of the output window can be obtained. Then the partial differential equation of heat conduction is solved numerically. The influence of the temperature on electromagnetic parameters is considered in the model. The calculation is performed in the two-dimensional (2-D) cylindrical coordinate system, in which conformal FDTD techniques are used to handle the oblique PEC wall of the feed and cylindrical CPML is used to truncate the computational domain. The model is validated by the calculation results. The proposed method can be used in the analysis of unsteady temperature field of the output window.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129042809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368633
Qi Zheng, W. Zhigang
Electromagnetic radiation has been recognized by more and more people and has made them feel frightened. Even in some cities, such phenomena have taken place that residents urge to remove established base stations, cut off feeder lines or prevent new base stations from being set up. Due to lack of in-depth research on electromagnetic radiation around base stations, communication operators in China fail to master detailed data so that they cannot be persuasive and usually lose the initiative when having disputes with the public. In this paper, all-round measurements have been conducted in hundreds of base stations in different types in several cities in China and some rules have been discovered about the electromagnetic radiation intensity of base station antennas and their influence scope.
{"title":"Study on electromagnetic radiation tests of base stations and its influence scope","authors":"Qi Zheng, W. Zhigang","doi":"10.1109/CEEM.2015.7368633","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368633","url":null,"abstract":"Electromagnetic radiation has been recognized by more and more people and has made them feel frightened. Even in some cities, such phenomena have taken place that residents urge to remove established base stations, cut off feeder lines or prevent new base stations from being set up. Due to lack of in-depth research on electromagnetic radiation around base stations, communication operators in China fail to master detailed data so that they cannot be persuasive and usually lose the initiative when having disputes with the public. In this paper, all-round measurements have been conducted in hundreds of base stations in different types in several cities in China and some rules have been discovered about the electromagnetic radiation intensity of base station antennas and their influence scope.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127622449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368638
W. Zhuang, Wanchun Tang, Fenfei Hou
In this paper, an efficient algorithm for computing the planar layered finite frequency selective surface using parallel multilevel UV method is described. The method of moments is utilized with RWG basis functions and the parallel multilevel UV method is used for accelerating the matrix vector multiplication. Simulated results are given to demonstrate the accuracy and efficiency of the proposed method.
{"title":"Parallelized multilevel UV method for analysis of planar layered finite frequency selective surface","authors":"W. Zhuang, Wanchun Tang, Fenfei Hou","doi":"10.1109/CEEM.2015.7368638","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368638","url":null,"abstract":"In this paper, an efficient algorithm for computing the planar layered finite frequency selective surface using parallel multilevel UV method is described. The method of moments is utilized with RWG basis functions and the parallel multilevel UV method is used for accelerating the matrix vector multiplication. Simulated results are given to demonstrate the accuracy and efficiency of the proposed method.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130895560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368642
Yao Meili, Gao Cheng, Yang Bo, L. Yanxin, Xue Yulong
To improve the measurement accuracy of self-integral Rogowski coil, the ahead phenomenon of its wave peak is analyzed. To find the authentic reason of this phenomenon, the equivalent parameter model of the sampling resistor is established. Both the analysis of the equivalent parameter model and experiment results show that distributed inductance in the sampling resistor is the critical factor for this phenomenon. Moreover, small resistance value leads to large ratio of inductance and impedance, which is the real reason for such phenomenon. The smaller the sampling resistance value is, the more probability of this phenomenon is. Versus, sampling resistor with larger value seldom causes this phenomenon. Therefore, to design the self-integral Rogowski coil, both the measurement dynamic range and the accuracy of measurement should be considered, and appropriate sampling resistors should be selected as well.
{"title":"Analysis on wave peak ahead phenomenon of self-integral Rogowski coil","authors":"Yao Meili, Gao Cheng, Yang Bo, L. Yanxin, Xue Yulong","doi":"10.1109/CEEM.2015.7368642","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368642","url":null,"abstract":"To improve the measurement accuracy of self-integral Rogowski coil, the ahead phenomenon of its wave peak is analyzed. To find the authentic reason of this phenomenon, the equivalent parameter model of the sampling resistor is established. Both the analysis of the equivalent parameter model and experiment results show that distributed inductance in the sampling resistor is the critical factor for this phenomenon. Moreover, small resistance value leads to large ratio of inductance and impedance, which is the real reason for such phenomenon. The smaller the sampling resistance value is, the more probability of this phenomenon is. Versus, sampling resistor with larger value seldom causes this phenomenon. Therefore, to design the self-integral Rogowski coil, both the measurement dynamic range and the accuracy of measurement should be considered, and appropriate sampling resistors should be selected as well.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130208010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.1109/CEEM.2015.7368648
Shuo Zhang, Liang Zhou
This study investigated a thermal breakdown model for semiconductor devices under the injection of microwave pulses. A general equation was derived to calculate power to failure, which depended on the pulse width and its duty cycle. The equation was able to calculate the threshold power given the parameters of a certain semiconductor device. This analysis is useful for further discussion on semiconductor protection under microwave pulses.
{"title":"Investigating a thermal breakdown model and experiments on a silicon-based low-noise amplifier under microwave pulses","authors":"Shuo Zhang, Liang Zhou","doi":"10.1109/CEEM.2015.7368648","DOIUrl":"https://doi.org/10.1109/CEEM.2015.7368648","url":null,"abstract":"This study investigated a thermal breakdown model for semiconductor devices under the injection of microwave pulses. A general equation was derived to calculate power to failure, which depended on the pulse width and its duty cycle. The equation was able to calculate the threshold power given the parameters of a certain semiconductor device. This analysis is useful for further discussion on semiconductor protection under microwave pulses.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130418243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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