Pub Date : 2024-07-01Epub Date: 2024-06-06DOI: 10.1107/S1600577524003898
Xue Wang, Chunxia Yao, Bingbing Zhang, Dongsheng Zhang, Caijuan Shi, Ye Tao, Darui Sun
Laser-induced projectile impact testing (LIPIT) based on synchrotron imaging is proposed and validated. This emerging high-velocity, high-strain microscale dynamic loading technique offers a unique perspective on the strain and energy dissipation behavior of materials subjected to high-speed microscale single-particle impacts. When combined with synchrotron radiation imaging techniques, LIPIT allows for in situ observation of particle infiltration. Two validation experiments were carried out, demonstrating the potential of LIPIT in the roentgenoscopy of the dynamic properties of various materials. With a spatial resolution of 10 µm and a temporal resolution of 33.4 µs, the system was successfully realized at the Beijing Synchrotron Radiation Facility 3W1 beamline. This innovative approach opens up new avenues for studying the dynamic properties of materials in situ.
{"title":"Roentgenoscopy of laser-induced projectile impact testing.","authors":"Xue Wang, Chunxia Yao, Bingbing Zhang, Dongsheng Zhang, Caijuan Shi, Ye Tao, Darui Sun","doi":"10.1107/S1600577524003898","DOIUrl":"10.1107/S1600577524003898","url":null,"abstract":"<p><p>Laser-induced projectile impact testing (LIPIT) based on synchrotron imaging is proposed and validated. This emerging high-velocity, high-strain microscale dynamic loading technique offers a unique perspective on the strain and energy dissipation behavior of materials subjected to high-speed microscale single-particle impacts. When combined with synchrotron radiation imaging techniques, LIPIT allows for in situ observation of particle infiltration. Two validation experiments were carried out, demonstrating the potential of LIPIT in the roentgenoscopy of the dynamic properties of various materials. With a spatial resolution of 10 µm and a temporal resolution of 33.4 µs, the system was successfully realized at the Beijing Synchrotron Radiation Facility 3W1 beamline. This innovative approach opens up new avenues for studying the dynamic properties of materials in situ.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226167/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141285067","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-05-31DOI: 10.1107/S1600577524003163
Benedikt Roesner, Joerg Raabe, Philip R Willmott, Uwe Flechsig
In the scope of the latest upgrade of the Swiss Light Source, five hard X-ray beamlines will be constructed or rebuilt. To use synergies between these beamline projects, a concept is developed here for hard X-ray beamlines that is tailored to the new storage ring. Herein, this concept is described from the source, via the front end, to the beamline optics. The latter will be outlined in detail, including a new and modular concept for hard X-ray monochromators, focusing optics and heat-load management. With a simple, easy-to-operate and robust beamline design, the new beamlines will greatly profit from the increased brilliance of the new storage ring. The performance increase is up to four orders of magnitude, while the beamline concept allows for the broad application of experimental techniques, from propagation-based methods, such as phase-contrast tomography, to imaging techniques with nanometre resolution. At the same time, spectroscopy experiments are possible as well as high-performance serial X-ray crystallography.
在瑞士光源的最新升级范围内,将建造或重建五条硬 X 射线光束线。为了发挥这些光束线项目之间的协同作用,我们在此为硬 X 射线光束线提出了一个概念,该概念是为新的存储环量身定制的。在此,我们将从光源、前端到光束线光学系统对这一概念进行描述。后者将被详细介绍,包括硬 X 射线单色器、聚焦光学元件和热负荷管理的全新模块化概念。新的光束线设计简单、易于操作、坚固耐用,将极大地受益于新的存储环所带来的亮度提升。光束线的概念允许广泛应用各种实验技术,从基于传播的方法(如相位对比断层扫描)到纳米分辨率的成像技术。同时,还可以进行光谱学实验和高性能序列 X 射线晶体学实验。
{"title":"The concept for hard X-ray beamline optics at SLS 2.0.","authors":"Benedikt Roesner, Joerg Raabe, Philip R Willmott, Uwe Flechsig","doi":"10.1107/S1600577524003163","DOIUrl":"10.1107/S1600577524003163","url":null,"abstract":"<p><p>In the scope of the latest upgrade of the Swiss Light Source, five hard X-ray beamlines will be constructed or rebuilt. To use synergies between these beamline projects, a concept is developed here for hard X-ray beamlines that is tailored to the new storage ring. Herein, this concept is described from the source, via the front end, to the beamline optics. The latter will be outlined in detail, including a new and modular concept for hard X-ray monochromators, focusing optics and heat-load management. With a simple, easy-to-operate and robust beamline design, the new beamlines will greatly profit from the increased brilliance of the new storage ring. The performance increase is up to four orders of magnitude, while the beamline concept allows for the broad application of experimental techniques, from propagation-based methods, such as phase-contrast tomography, to imaging techniques with nanometre resolution. At the same time, spectroscopy experiments are possible as well as high-performance serial X-ray crystallography.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226164/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141181075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-25DOI: 10.1107/S1600577524004739
Andrea Martini, Janis Timoshenko, Martina Rüscher, Dorottya Hursán, Mariana C O Monteiro, Eric Liberra, Beatriz Roldan Cuenya
Transition-metal nitrogen-doped carbons (TM-N-C) are emerging as a highly promising catalyst class for several important electrocatalytic processes, including the electrocatalytic CO2 reduction reaction (CO2RR). The unique local environment around the singly dispersed metal site in TM-N-C catalysts is likely to be responsible for their catalytic properties, which differ significantly from those of bulk or nanostructured catalysts. However, the identification of the actual working structure of the main active units in TM-N-C remains a challenging task due to the fluctional, dynamic nature of these catalysts, and scarcity of experimental techniques that could probe the structure of these materials under realistic working conditions. This issue is addressed in this work and the local atomistic and electronic structure of the metal site in a Co-N-C catalyst for CO2RR is investigated by employing time-resolved operando X-ray absorption spectroscopy (XAS) combined with advanced data analysis techniques. This multi-step approach, based on principal component analysis, spectral decomposition and supervised machine learning methods, allows the contributions of several co-existing species in the working Co-N-C catalysts to be decoupled, and their XAS spectra deciphered, paving the way for understanding the CO2RR mechanisms in the Co-N-C catalysts, and further optimization of this class of electrocatalytic systems.
{"title":"Revealing the structure of the active sites for the electrocatalytic CO<sub>2</sub> reduction to CO over Co single atom catalysts using operando XANES and machine learning.","authors":"Andrea Martini, Janis Timoshenko, Martina Rüscher, Dorottya Hursán, Mariana C O Monteiro, Eric Liberra, Beatriz Roldan Cuenya","doi":"10.1107/S1600577524004739","DOIUrl":"10.1107/S1600577524004739","url":null,"abstract":"<p><p>Transition-metal nitrogen-doped carbons (TM-N-C) are emerging as a highly promising catalyst class for several important electrocatalytic processes, including the electrocatalytic CO<sub>2</sub> reduction reaction (CO<sub>2</sub>RR). The unique local environment around the singly dispersed metal site in TM-N-C catalysts is likely to be responsible for their catalytic properties, which differ significantly from those of bulk or nanostructured catalysts. However, the identification of the actual working structure of the main active units in TM-N-C remains a challenging task due to the fluctional, dynamic nature of these catalysts, and scarcity of experimental techniques that could probe the structure of these materials under realistic working conditions. This issue is addressed in this work and the local atomistic and electronic structure of the metal site in a Co-N-C catalyst for CO<sub>2</sub>RR is investigated by employing time-resolved operando X-ray absorption spectroscopy (XAS) combined with advanced data analysis techniques. This multi-step approach, based on principal component analysis, spectral decomposition and supervised machine learning methods, allows the contributions of several co-existing species in the working Co-N-C catalysts to be decoupled, and their XAS spectra deciphered, paving the way for understanding the CO<sub>2</sub>RR mechanisms in the Co-N-C catalysts, and further optimization of this class of electrocatalytic systems.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226159/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141451992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-20DOI: 10.1107/S1600577524003540
O Tkach, S Chernov, S Babenkov, Y Lytvynenko, O Fedchenko, K Medjanik, D Vasilyev, A Gloskowskii, C Schlueter, H J Elmers, G Schönhense
Imaging energy filters in photoelectron microscopes and momentum microscopes use spherical fields with deflection angles of 90°, 180° and even 2 × 180°. These instruments are optimized for high energy resolution, and exhibit image aberrations when operated in high transmission mode at medium energy resolution. Here, a new approach is presented for bandpass-filtered imaging in real or reciprocal space using an electrostatic dodecapole with an asymmetric electrode array. In addition to energy-dispersive beam deflection, this multipole allows aberration correction up to the third order. Here, its use is described as a bandpass prefilter in a time-of-flight momentum microscope at the hard X-ray beamline P22 of PETRA III. The entire instrument is housed in a straight vacuum tube because the deflection angle is only 4° and the beam displacement in the filter is only ∼8 mm. The multipole is framed by transfer lenses in the entrance and exit branches. Two sets of 16 different-sized entrance and exit apertures on piezomotor-driven mounts allow selection of the desired bandpass. For pass energies between 100 and 1400 eV and slit widths between 0.5 and 4 mm, the transmitted kinetic energy intervals are between 10 eV and a few hundred electronvolts (full width at half-maximum). The filter eliminates all higher or lower energy signals outside the selected bandpass, significantly improving the signal-to-background ratio in the time-of-flight analyzer.
光电子显微镜和动量显微镜中的成像能量滤波器使用偏转角为 90°、180° 甚至 2 × 180°的球形场。这些仪器针对高能量分辨率进行了优化,在中等能量分辨率下以高传输模式运行时会出现图像畸变。这里介绍的是一种新方法,利用带有非对称电极阵列的静电十二极在实空间或倒易空间进行带通滤波成像。除了能量色散光束偏转外,这种多极还能进行高达三阶的像差校正。这里介绍的是它在 PETRA III 硬 X 射线光束线 P22 的飞行时间动量显微镜中作为带通预滤波器的用途。由于偏转角仅为 4°,滤波器中的光束位移仅为 ∼ 8 毫米,因此整个仪器安装在一个直的真空管中。多极子由入口和出口分支的传递透镜构成。在压电电机驱动的支架上有两组 16 个不同大小的入口和出口孔径,可以选择所需的带通。当通过能量在 100 到 1400 eV 之间,狭缝宽度在 0.5 到 4 mm 之间时,传输的动能区间在 10 eV 到几百电子伏特(半最大全宽)之间。滤波器可以消除所选带通外的所有较高或较低能量信号,从而显著提高飞行时间分析仪的信噪比。
{"title":"Asymmetric electrostatic dodecapole: compact bandpass filter with low aberrations for momentum microscopy.","authors":"O Tkach, S Chernov, S Babenkov, Y Lytvynenko, O Fedchenko, K Medjanik, D Vasilyev, A Gloskowskii, C Schlueter, H J Elmers, G Schönhense","doi":"10.1107/S1600577524003540","DOIUrl":"10.1107/S1600577524003540","url":null,"abstract":"<p><p>Imaging energy filters in photoelectron microscopes and momentum microscopes use spherical fields with deflection angles of 90°, 180° and even 2 × 180°. These instruments are optimized for high energy resolution, and exhibit image aberrations when operated in high transmission mode at medium energy resolution. Here, a new approach is presented for bandpass-filtered imaging in real or reciprocal space using an electrostatic dodecapole with an asymmetric electrode array. In addition to energy-dispersive beam deflection, this multipole allows aberration correction up to the third order. Here, its use is described as a bandpass prefilter in a time-of-flight momentum microscope at the hard X-ray beamline P22 of PETRA III. The entire instrument is housed in a straight vacuum tube because the deflection angle is only 4° and the beam displacement in the filter is only ∼8 mm. The multipole is framed by transfer lenses in the entrance and exit branches. Two sets of 16 different-sized entrance and exit apertures on piezomotor-driven mounts allow selection of the desired bandpass. For pass energies between 100 and 1400 eV and slit widths between 0.5 and 4 mm, the transmitted kinetic energy intervals are between 10 eV and a few hundred electronvolts (full width at half-maximum). The filter eliminates all higher or lower energy signals outside the selected bandpass, significantly improving the signal-to-background ratio in the time-of-flight analyzer.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226149/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141428027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-25DOI: 10.1107/S1600577524005733
Andrew J Allen, Dibyendu Bhattacharyya, Kristina Kvashnina
Introducing a new Main Editor of JSR.
介绍新的 JSR 主编辑器。
{"title":"Welcoming a new Main Editor of Journal of Synchrotron Radiation.","authors":"Andrew J Allen, Dibyendu Bhattacharyya, Kristina Kvashnina","doi":"10.1107/S1600577524005733","DOIUrl":"10.1107/S1600577524005733","url":null,"abstract":"<p><p>Introducing a new Main Editor of JSR.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226145/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141451995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-21DOI: 10.1107/S1600577524003977
Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang Je Kim, Yuri Shvyd'ko
A cavity-based X-ray free-electron laser (CBXFEL) is a possible future direction in the development of fully coherent X-ray sources. CBXFELs consist of a low-emittance electron source, a magnet system with several undulators and chicanes, and an X-ray cavity. The X-ray cavity stores and circulates X-ray pulses for repeated FEL interactions with electron pulses until the FEL reaches saturation. CBXFEL cavities require low-loss wavefront-preserving optical components: near-100%-reflectivity X-ray diamond Bragg-reflecting crystals, outcoupling devices such as thin diamond membranes or X-ray gratings, and aberration-free focusing elements. In the framework of the collaborative CBXFEL research and development project of Argonne National Laboratory, SLAC National Accelerator Laboratory and SPring-8, we report here the design, manufacturing and characterization of X-ray optical components for the CBXFEL cavity, which include high-reflectivity diamond crystal mirrors, a diamond drumhead crystal with thin membranes, beryllium refractive lenses and channel-cut Si monochromators. All the designed optical components have been fully characterized at the Advanced Photon Source to demonstrate their suitability for the CBXFEL cavity application.
腔基 X 射线自由电子激光器(CBXFEL)是未来开发全相干 X 射线源的一个可能方向。CBXFEL 由一个低幅射电子源、一个带有多个起伏器和卡槽的磁铁系统以及一个 X 射线腔组成。X 射线腔存储和循环 X 射线脉冲,以便与电子脉冲反复进行 FEL 相互作用,直至 FEL 达到饱和。CBXFEL 腔需要低损耗的波前保护光学元件:反射率接近 100% 的 X 射线金刚石布拉格反射晶体、金刚石薄膜或 X 射线光栅等外耦合装置以及无像差聚焦元件。在阿贡国家实验室、SLAC 国家加速器实验室和 SPring-8 的 CBXFEL 合作研发项目框架内,我们在此报告了用于 CBXFEL 腔体的 X 射线光学元件的设计、制造和特性分析,其中包括高反射率金刚石晶体反射镜、带有薄膜的金刚石鼓头晶体、铍折射透镜和沟道切割硅单色器。所有设计的光学元件都已在先进光子源进行了全面鉴定,以证明其适用于 CBXFEL 腔体应用。
{"title":"X-ray optics for the cavity-based X-ray free-electron laser.","authors":"Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang Je Kim, Yuri Shvyd'ko","doi":"10.1107/S1600577524003977","DOIUrl":"10.1107/S1600577524003977","url":null,"abstract":"<p><p>A cavity-based X-ray free-electron laser (CBXFEL) is a possible future direction in the development of fully coherent X-ray sources. CBXFELs consist of a low-emittance electron source, a magnet system with several undulators and chicanes, and an X-ray cavity. The X-ray cavity stores and circulates X-ray pulses for repeated FEL interactions with electron pulses until the FEL reaches saturation. CBXFEL cavities require low-loss wavefront-preserving optical components: near-100%-reflectivity X-ray diamond Bragg-reflecting crystals, outcoupling devices such as thin diamond membranes or X-ray gratings, and aberration-free focusing elements. In the framework of the collaborative CBXFEL research and development project of Argonne National Laboratory, SLAC National Accelerator Laboratory and SPring-8, we report here the design, manufacturing and characterization of X-ray optical components for the CBXFEL cavity, which include high-reflectivity diamond crystal mirrors, a diamond drumhead crystal with thin membranes, beryllium refractive lenses and channel-cut Si monochromators. All the designed optical components have been fully characterized at the Advanced Photon Source to demonstrate their suitability for the CBXFEL cavity application.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226151/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141433163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-05DOI: 10.1107/S160057752400359X
Herbert J Bernstein, Jean Jakoncic
Structural biology experiments benefit significantly from state-of-the-art synchrotron data collection. One can acquire macromolecular crystallography (MX) diffraction data on large-area photon-counting pixel-array detectors at framing rates exceeding 1000 frames per second, using 200 Gbps network connectivity, or higher when available. In extreme cases this represents a raw data throughput of about 25 GB s-1, which is nearly impossible to deliver at reasonable cost without compression. Our field has used lossless compression for decades to make such data collection manageable. Many MX beamlines are now fitted with DECTRIS Eiger detectors, all of which are delivered with optimized compression algorithms by default, and they perform well with current framing rates and typical diffraction data. However, better lossless compression algorithms have been developed and are now available to the research community. Here one of the latest and most promising lossless compression algorithms is investigated on a variety of diffraction data like those routinely acquired at state-of-the-art MX beamlines.
{"title":"Investigation of fast and efficient lossless compression algorithms for macromolecular crystallography experiments.","authors":"Herbert J Bernstein, Jean Jakoncic","doi":"10.1107/S160057752400359X","DOIUrl":"10.1107/S160057752400359X","url":null,"abstract":"<p><p>Structural biology experiments benefit significantly from state-of-the-art synchrotron data collection. One can acquire macromolecular crystallography (MX) diffraction data on large-area photon-counting pixel-array detectors at framing rates exceeding 1000 frames per second, using 200 Gbps network connectivity, or higher when available. In extreme cases this represents a raw data throughput of about 25 GB s<sup>-1</sup>, which is nearly impossible to deliver at reasonable cost without compression. Our field has used lossless compression for decades to make such data collection manageable. Many MX beamlines are now fitted with DECTRIS Eiger detectors, all of which are delivered with optimized compression algorithms by default, and they perform well with current framing rates and typical diffraction data. However, better lossless compression algorithms have been developed and are now available to the research community. Here one of the latest and most promising lossless compression algorithms is investigated on a variety of diffraction data like those routinely acquired at state-of-the-art MX beamlines.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226158/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141262153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-05-31DOI: 10.1107/S1600577524003205
Beatrice E Jones, Ann Fitzpatrick, Kieran Fowell, Charlotte J C Edwards-Gayle, Nikul Khunti, Katsuaki Inoue, Steven Daniels, Eugene Williams, Camille Blayo, Rachel C Evans, Nathan Cowieson
Beamline B21 at the Diamond Light Source synchrotron in the UK is a small-angle X-ray scattering (SAXS) beamline that specializes in high-throughput measurements via automated sample delivery systems. A system has been developed whereby a sample can be illuminated by a focused beam of light coincident with the X-ray beam. The system is compatible with the highly automated sample delivery system at the beamline and allows a beamline user to select a light source from a broad range of wavelengths across the UV and visible spectrum and to control the timing and duration of the light pulse with respect to the X-ray exposure of the SAXS measurement. The intensity of the light source has been characterized across the wavelength range enabling experiments where a quantitative measure of dose is important. Finally, the utility of the system is demonstrated via measurement of several light-responsive samples.
英国钻石光源同步加速器的 B21 光束线是一条小角 X 射线散射 (SAXS) 光束线,专门通过自动样品传送系统进行高通量测量。目前已开发出一种系统,可通过与 X 射线光束重合的聚焦光束照射样品。该系统与光束线高度自动化的样品传送系统兼容,允许光束线用户从紫外和可见光谱的多种波长中选择光源,并控制光脉冲与 SAXS 测量的 X 射线曝光相关的时间和持续时间。光源的强度在整个波长范围内都有特征,因此可以进行对剂量进行定量测量非常重要的实验。最后,通过对几个光响应样品的测量,展示了该系统的实用性。
{"title":"Developing an in situ LED irradiation system for small-angle X-ray scattering at B21, Diamond Light Source.","authors":"Beatrice E Jones, Ann Fitzpatrick, Kieran Fowell, Charlotte J C Edwards-Gayle, Nikul Khunti, Katsuaki Inoue, Steven Daniels, Eugene Williams, Camille Blayo, Rachel C Evans, Nathan Cowieson","doi":"10.1107/S1600577524003205","DOIUrl":"10.1107/S1600577524003205","url":null,"abstract":"<p><p>Beamline B21 at the Diamond Light Source synchrotron in the UK is a small-angle X-ray scattering (SAXS) beamline that specializes in high-throughput measurements via automated sample delivery systems. A system has been developed whereby a sample can be illuminated by a focused beam of light coincident with the X-ray beam. The system is compatible with the highly automated sample delivery system at the beamline and allows a beamline user to select a light source from a broad range of wavelengths across the UV and visible spectrum and to control the timing and duration of the light pulse with respect to the X-ray exposure of the SAXS measurement. The intensity of the light source has been characterized across the wavelength range enabling experiments where a quantitative measure of dose is important. Finally, the utility of the system is demonstrated via measurement of several light-responsive samples.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226168/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141181069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-06-05DOI: 10.1107/S1600577524003552
Ralf D Geckeler, Andreas Just, Michael Krause, Olaf Schnabel, Ian Lacey, Damon English, Valeriy V Yashchuk
Deflectometric profilometers are used to precisely measure the form of beam shaping optics of synchrotrons and X-ray free-electron lasers. They often utilize autocollimators which measure slope by evaluating the displacement of a reticle image on a detector. Based on our privileged access to the raw image data of an autocollimator, novel strategies to reduce the systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector are discussed. It is demonstrated that imaging properties such as, for example, geometrical distortions and vignetting, can be extracted from this redundant set of images without recourse to external calibration facilities. This approach is based on the fact that the properties of the reticle itself do not change - all changes in the reticle image are due to the imaging process. Firstly, by combining interpolation and correlation, it is possible to determine the shift of a reticle image relative to a reference image with minimal error propagation. Secondly, the intensity of the reticle image is analysed as a function of its position on the CCD and a vignetting correction is calculated. Thirdly, the size of the reticle image is analysed as a function of its position and an imaging distortion correction is derived. It is demonstrated that, for different measurement ranges and aperture diameters of the autocollimator, reductions in the systematic errors of up to a factor of four to five can be achieved without recourse to external measurements.
偏转轮廓仪用于精确测量同步加速器和 X 射线自由电子激光器的光束整形光学器件的形状。它们通常使用自动准直仪,通过评估检测器上网罩图像的位移来测量斜率。我们有幸获得了自动准直仪的原始图像数据,在此基础上,我们讨论了通过使用一组在探测器上不同位置获得的网罩重叠图像来减少系统测量误差的新策略。实验证明,无需借助外部校准设备,即可从这组冗余图像中提取几何失真和渐晕等成像特性。这种方法基于这样一个事实,即视网膜本身的属性不会发生变化,视网膜图像的所有变化都是由成像过程引起的。首先,通过将插值和相关性结合起来,可以在误差传播最小的情况下确定视网膜图像相对于参考图像的偏移。其次,将视网膜图像的强度作为其在 CCD 上位置的函数进行分析,并计算光晕校正。第三,分析视网膜图像的大小与其位置的函数关系,并得出成像失真校正。结果表明,对于自动准直仪的不同测量范围和光圈直径,系统误差最多可减少四到五倍,而无需借助外部测量。
{"title":"Self-calibration strategies for reducing systematic slope measurement errors of autocollimators in deflectometric profilometry.","authors":"Ralf D Geckeler, Andreas Just, Michael Krause, Olaf Schnabel, Ian Lacey, Damon English, Valeriy V Yashchuk","doi":"10.1107/S1600577524003552","DOIUrl":"10.1107/S1600577524003552","url":null,"abstract":"<p><p>Deflectometric profilometers are used to precisely measure the form of beam shaping optics of synchrotrons and X-ray free-electron lasers. They often utilize autocollimators which measure slope by evaluating the displacement of a reticle image on a detector. Based on our privileged access to the raw image data of an autocollimator, novel strategies to reduce the systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector are discussed. It is demonstrated that imaging properties such as, for example, geometrical distortions and vignetting, can be extracted from this redundant set of images without recourse to external calibration facilities. This approach is based on the fact that the properties of the reticle itself do not change - all changes in the reticle image are due to the imaging process. Firstly, by combining interpolation and correlation, it is possible to determine the shift of a reticle image relative to a reference image with minimal error propagation. Secondly, the intensity of the reticle image is analysed as a function of its position on the CCD and a vignetting correction is calculated. Thirdly, the size of the reticle image is analysed as a function of its position and an imaging distortion correction is derived. It is demonstrated that, for different measurement ranges and aperture diameters of the autocollimator, reductions in the systematic errors of up to a factor of four to five can be achieved without recourse to external measurements.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226160/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141262181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-01Epub Date: 2024-05-21DOI: 10.1107/S1600577524003229
Anico Kulow, Javier Pérez, Redhouane Boudjehem, Eric Gautier, Sébastien Pairis, Samy Ould-Chikh, Jean Louis Hazemann, Julio César da Silva
X-ray ptychography and ptychographic computed tomography have seen a rapid rise since the advent of fourth-generation synchrotrons with a high degree of coherent radiation. In addition to quantitative multiscale structural analysis, ptychography with spectral capabilities has been developed, allowing for spatial-localized multiscale structural and spectral information of samples. The SWING beamline of Synchrotron SOLEIL has recently developed a nanoprobe setup where the endstation's first spectral and resonant ptychographic measurements have been successfully conducted. A metallic nickel wire sample was measured using 2D spectral ptychography in XANES mode and resonant ptychographic tomography. From the 2D spectral ptychography measurements, the spectra of the components of the sample's complex-valued refractive index, δ and β, were extracted, integrated along the sample thickness. By performing resonance ptychographic tomography at two photon energies, 3D maps of the refractive index decrement, δ, were obtained at the Ni K-edge energy and another energy above the edge. These maps allowed the detection of impurities in the Ni wire. The significance of accounting for the atomic scattering factor is demonstrated in the calculation of electron density near a resonance through the use of the δ values. These results indicate that at the SWING beamline it is possible to conduct state-of-the-art spectral and resonant ptychography experiments using the nanoprobe setup.
{"title":"First X-ray spectral ptychography and resonant ptychographic computed tomography experiments at the SWING beamline from Synchrotron SOLEIL.","authors":"Anico Kulow, Javier Pérez, Redhouane Boudjehem, Eric Gautier, Sébastien Pairis, Samy Ould-Chikh, Jean Louis Hazemann, Julio César da Silva","doi":"10.1107/S1600577524003229","DOIUrl":"10.1107/S1600577524003229","url":null,"abstract":"<p><p>X-ray ptychography and ptychographic computed tomography have seen a rapid rise since the advent of fourth-generation synchrotrons with a high degree of coherent radiation. In addition to quantitative multiscale structural analysis, ptychography with spectral capabilities has been developed, allowing for spatial-localized multiscale structural and spectral information of samples. The SWING beamline of Synchrotron SOLEIL has recently developed a nanoprobe setup where the endstation's first spectral and resonant ptychographic measurements have been successfully conducted. A metallic nickel wire sample was measured using 2D spectral ptychography in XANES mode and resonant ptychographic tomography. From the 2D spectral ptychography measurements, the spectra of the components of the sample's complex-valued refractive index, δ and β, were extracted, integrated along the sample thickness. By performing resonance ptychographic tomography at two photon energies, 3D maps of the refractive index decrement, δ, were obtained at the Ni K-edge energy and another energy above the edge. These maps allowed the detection of impurities in the Ni wire. The significance of accounting for the atomic scattering factor is demonstrated in the calculation of electron density near a resonance through the use of the δ values. These results indicate that at the SWING beamline it is possible to conduct state-of-the-art spectral and resonant ptychography experiments using the nanoprobe setup.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11226156/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141076695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}