Pub Date : 2025-01-01DOI: 10.1107/S160057752401155X
Lin Zhang, Jerome Hastings, Zhirong Huang, Jingyi Tang, Diling Zhu
Time-domain modeling of the thermal deformation of crystal optics can help define acceptable operational ranges across the pulse-energy repetition-rate phase space. In this paper, we have studied the transient thermal deformation of a water-cooled diamond crystal for a cavity-based X-ray free-electron laser (CBXFEL), either an X-ray free-electron laser oscillator (XFELO) or a regenerative amplifier X-ray free-electron laser (RAFEL), by numerical simulations including finite-element analysis and advanced data processing. Pulse-by-pulse transient thermal deformation of a 50 µm-thick diamond crystal has been performed with X-ray pulse repetition rates between 50 kHz and 1 MHz. Results for temperature and thermal deformation have been compared with the results of transient analysis using a continuous wave (CW) power loading. Temperature and thermal deformation results from pulse-by-pulse transient analysis vary with time about the results for the CW case for the same average power. The variation amplitude increases with pulse energy and decreases with repetition rate. When the repetition rate increases to infinity, both temperature and thermal deformation converge to the results for the CW case. Two critical time scales for the operation of crystal optics in a CBXFEL are (1) first-turn time, i.e. the time for the XFEL pulse to complete the first turn around the cavity so that the crystal sees the recirculated XFEL pulse, and (2) period-end time, i.e. the time that the next electron bunch arrives for the amplification, so that the crystal outcouples the amplified FEL power. For the same average power, simulation results show that the crystal thermal deformation seen by the XFEL beam decreases with repetition rate at the first-turn time of a 300 m-long cavity and increases with repetition rate at the period-end time. For the wavefront preservation requirement of the crystal optics, a pulse-energy versus repetition-rate phase space has been established. The upper bounds of the pulse energy at both first-turn and period-end times decreases with repetition rate, especially at the period-end time. The upper bound of the thermal deformation of the crystal at the period-end time for any repetition frequency can be estimated from the CW case. For a water-cooled diamond crystal of dimension 5 mm × 5 mm × 0.05 mm, the time to reach a quasi steady-state is about 50 ms for temperature and 50 µs for thermal deformation.
{"title":"Pulse-by-pulse transient thermal deformation in crystal optics under high-repetition-rate FEL.","authors":"Lin Zhang, Jerome Hastings, Zhirong Huang, Jingyi Tang, Diling Zhu","doi":"10.1107/S160057752401155X","DOIUrl":"10.1107/S160057752401155X","url":null,"abstract":"<p><p>Time-domain modeling of the thermal deformation of crystal optics can help define acceptable operational ranges across the pulse-energy repetition-rate phase space. In this paper, we have studied the transient thermal deformation of a water-cooled diamond crystal for a cavity-based X-ray free-electron laser (CBXFEL), either an X-ray free-electron laser oscillator (XFELO) or a regenerative amplifier X-ray free-electron laser (RAFEL), by numerical simulations including finite-element analysis and advanced data processing. Pulse-by-pulse transient thermal deformation of a 50 µm-thick diamond crystal has been performed with X-ray pulse repetition rates between 50 kHz and 1 MHz. Results for temperature and thermal deformation have been compared with the results of transient analysis using a continuous wave (CW) power loading. Temperature and thermal deformation results from pulse-by-pulse transient analysis vary with time about the results for the CW case for the same average power. The variation amplitude increases with pulse energy and decreases with repetition rate. When the repetition rate increases to infinity, both temperature and thermal deformation converge to the results for the CW case. Two critical time scales for the operation of crystal optics in a CBXFEL are (1) first-turn time, i.e. the time for the XFEL pulse to complete the first turn around the cavity so that the crystal sees the recirculated XFEL pulse, and (2) period-end time, i.e. the time that the next electron bunch arrives for the amplification, so that the crystal outcouples the amplified FEL power. For the same average power, simulation results show that the crystal thermal deformation seen by the XFEL beam decreases with repetition rate at the first-turn time of a 300 m-long cavity and increases with repetition rate at the period-end time. For the wavefront preservation requirement of the crystal optics, a pulse-energy versus repetition-rate phase space has been established. The upper bounds of the pulse energy at both first-turn and period-end times decreases with repetition rate, especially at the period-end time. The upper bound of the thermal deformation of the crystal at the period-end time for any repetition frequency can be estimated from the CW case. For a water-cooled diamond crystal of dimension 5 mm × 5 mm × 0.05 mm, the time to reach a quasi steady-state is about 50 ms for temperature and 50 µs for thermal deformation.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"57-71"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708848/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142865641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524011597
Huating Kong, Huan Zhou, Qin Xu, Ke Liu, Kunhao Zhang, Xingya Wang, Weiwei Wang, Zhijun Wang, Sisheng Wang, Yuzhu Wang, Lin Tang, Feng Yu, Jianhua He, Qisheng Wang
Shanghai Synchrotron Radiation Facility (SSRF) is a third-generation 3.5 GeV synchrotron facility located on the Chinese mainland, operational for user applications since 2009. With the completion of its Phase II project this year, SSRF now supports over 40 experimental stations across various research fields. For the structural biology community, there are three macromolecular crystallography (MX) beamlines (BL02U1, BL17UM and BL10U2) and one endstation at the white X-ray beamline (BL03HB) managed by SSRF to meet the needs of both academic and industrial users seeking to determine macromolecular crystal structures. The MX group at SSRF is dedicated to continuously upgrading these beamlines in terms of technology and scientific capabilities. This paper reports on the current status of all the MX beamlines at SSRF and discusses emerging trends.
{"title":"Status of macromolecular crystallography beamlines at SSRF.","authors":"Huating Kong, Huan Zhou, Qin Xu, Ke Liu, Kunhao Zhang, Xingya Wang, Weiwei Wang, Zhijun Wang, Sisheng Wang, Yuzhu Wang, Lin Tang, Feng Yu, Jianhua He, Qisheng Wang","doi":"10.1107/S1600577524011597","DOIUrl":"10.1107/S1600577524011597","url":null,"abstract":"<p><p>Shanghai Synchrotron Radiation Facility (SSRF) is a third-generation 3.5 GeV synchrotron facility located on the Chinese mainland, operational for user applications since 2009. With the completion of its Phase II project this year, SSRF now supports over 40 experimental stations across various research fields. For the structural biology community, there are three macromolecular crystallography (MX) beamlines (BL02U1, BL17UM and BL10U2) and one endstation at the white X-ray beamline (BL03HB) managed by SSRF to meet the needs of both academic and industrial users seeking to determine macromolecular crystal structures. The MX group at SSRF is dedicated to continuously upgrading these beamlines in terms of technology and scientific capabilities. This paper reports on the current status of all the MX beamlines at SSRF and discusses emerging trends.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"234-245"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708842/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142869429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524010646
Gabriele Trovato, Marzio De Napoli, Christian Gollwitzer, Simone Finizio, Michael Krumrey, Francesco La Via, Luca Lanzanò, Giuliana Milluzzo, Samuele Moscato, Matthias Müller, Francesco Romano, Dario Ferreira Sanchez, Massimo Camarda
For many synchrotron radiation experiments, it is critical to perform continuous, real-time monitoring of the X-ray flux for normalization and stabilization purposes. Traditional transmission-mode monitors included metal mesh foils and ionization chambers, which suffered from low signal stability and size constraints. Solid-state detectors are now considered superior alternatives for many applications, offering appealing features like compactness and signal stability. However, silicon-based detectors suffer from poor radiation resistance, and diamond detectors are limited in scalability and are expensive to produce. Silicon carbide (SiC) has recently emerged as an alternative to both materials, offering a high-quality mature semiconductor with high thermal conductivity and radiation hardness. This study focuses on a systematic exploration of the SiC `free-standing membrane' devices developed by SenSiC GmbH. In particular, we performed in-depth sensor-response analysis with photon energies ranging from tender (1.75 keV) to hard (10 keV) X-rays at the Four-Crystal Monochromator beamline in the PTB laboratory at the synchrotron radiation facility BESSY II, studying uniformity of transmission and responsivity compared with the state-of-the-art beam monitors. Furthermore, we theoretically evaluated the expected signal in different regions of the sensors, also taking into account the effect of charge diffusion from the SiC substrate in the case of the not-carved region.
{"title":"SiC free-standing membrane for X-ray intensity monitoring in synchrotron radiation beamlines.","authors":"Gabriele Trovato, Marzio De Napoli, Christian Gollwitzer, Simone Finizio, Michael Krumrey, Francesco La Via, Luca Lanzanò, Giuliana Milluzzo, Samuele Moscato, Matthias Müller, Francesco Romano, Dario Ferreira Sanchez, Massimo Camarda","doi":"10.1107/S1600577524010646","DOIUrl":"10.1107/S1600577524010646","url":null,"abstract":"<p><p>For many synchrotron radiation experiments, it is critical to perform continuous, real-time monitoring of the X-ray flux for normalization and stabilization purposes. Traditional transmission-mode monitors included metal mesh foils and ionization chambers, which suffered from low signal stability and size constraints. Solid-state detectors are now considered superior alternatives for many applications, offering appealing features like compactness and signal stability. However, silicon-based detectors suffer from poor radiation resistance, and diamond detectors are limited in scalability and are expensive to produce. Silicon carbide (SiC) has recently emerged as an alternative to both materials, offering a high-quality mature semiconductor with high thermal conductivity and radiation hardness. This study focuses on a systematic exploration of the SiC `free-standing membrane' devices developed by SenSiC GmbH. In particular, we performed in-depth sensor-response analysis with photon energies ranging from tender (1.75 keV) to hard (10 keV) X-rays at the Four-Crystal Monochromator beamline in the PTB laboratory at the synchrotron radiation facility BESSY II, studying uniformity of transmission and responsivity compared with the state-of-the-art beam monitors. Furthermore, we theoretically evaluated the expected signal in different regions of the sensors, also taking into account the effect of charge diffusion from the SiC substrate in the case of the not-carved region.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"118-124"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708857/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142789664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524009779
Sangsoo Kim, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong Jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, Jangwoo Kim
A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of 100 mm. Depending on the photon energy range, either the Si (111) or Si (110) crystal can be selected for spectral analysis. Especially in the energy range 4.5-17 keV, the spectrometer is designed to cover a spectral range wider than the full free-electron laser bandwidth and to guarantee a high resolution sufficient for resolving each spectral spike. This paper presents the design specifications, instruments and performance of this spectrometer, which has also been applied to demonstrate the spectral properties of various XFEL sources, such as self-amplified spontaneous emission, monochromatic and seeded beams.
为监测浦项加速器实验室 X 射线自由电子激光器(PAL-XFEL)硬 X 射线光束线的射击到射击光谱结构,开发了一种透射式单发光谱仪。该光谱仪由 10 微米厚的硅晶体组成,曲率半径为 100 毫米。根据光子能量范围的不同,可选择硅(111)或硅(110)晶体进行光谱分析。特别是在 4.5-17 keV 的能量范围内,光谱仪的设计可以覆盖比整个自由电子激光带宽更宽的光谱范围,并保证足够高的分辨率来分辨每个光谱尖峰。本文介绍了该光谱仪的设计规格、仪器和性能,它还被用于演示各种 XFEL 光源的光谱特性,如自放大自发辐射、单色光束和种子光束。
{"title":"Hard X-ray single-shot spectrometer of PAL-XFEL.","authors":"Sangsoo Kim, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong Jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, Jangwoo Kim","doi":"10.1107/S1600577524009779","DOIUrl":"10.1107/S1600577524009779","url":null,"abstract":"<p><p>A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of 100 mm. Depending on the photon energy range, either the Si (111) or Si (110) crystal can be selected for spectral analysis. Especially in the energy range 4.5-17 keV, the spectrometer is designed to cover a spectral range wider than the full free-electron laser bandwidth and to guarantee a high resolution sufficient for resolving each spectral spike. This paper presents the design specifications, instruments and performance of this spectrometer, which has also been applied to demonstrate the spectral properties of various XFEL sources, such as self-amplified spontaneous emission, monochromatic and seeded beams.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"246-253"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708847/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142677490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524011007
Ioana Theodora Nistea, Simon G Alcock, Andrew Foster, Vivek Badami, Riccardo Signorato, Matteo Fusco
We provide a technical description and experimental results of the practical development and offline testing of an innovative, closed-loop, adaptive mirror system capable of making rapid, precise and ultra-stable changes in the size and shape of reflected X-ray beams generated at synchrotron light and free-electron laser facilities. The optical surface of a piezoelectric bimorph deformable mirror is continuously monitored at 20 kHz by an array of interferometric sensors. This matrix of height data is autonomously converted into voltage commands that are sent at 1 Hz to the piezo actuators to modify the shape of the mirror optical surface. Hence, users can rapidly switch in closed-loop between pre-calibrated X-ray wavefronts by selecting the corresponding freeform optical profile. This closed-loop monitoring is shown to repeatably bend and stabilize the low- and mid-spatial frequency components of the mirror surface to any given profile with an error <200 pm peak-to-valley, regardless of the recent history of bending and hysteresis. Without closed-loop stabilization after bending, the mirror height profile is shown to drift by hundreds of nanometres, which will slowly distort the X-ray wavefront. The metrology frame that holds the interferometric sensors is designed to be largely insensitive to temperature changes, providing an ultra-stable reference datum to enhance repeatability. We demonstrate an unprecedented level of fast and precise optical control in the X-ray domain: the profile of a macroscopic X-ray mirror of over 0.5 m in length was freely adjusted and stabilized to atomic level height resolution. Aside from demonstrating the extreme sensitivity of the interferometer sensors, this study also highlights the voltage repeatability and stability of the programmable high-voltage power supply, the accuracy of the correction-calculation algorithms and the almost instantaneous response of the bimorph mirror to command voltage pulses. Finally, we demonstrate the robustness of the system by showing that the bimorph mirror's optical surface was not damaged by more than 1 million voltage cycles, including no occurrence of the `junction effect' or weakening of piezoelectric actuator strength. Hence, this hardware combination provides a real time, hyper-precise, temperature-insensitive, closed-loop system which could benefit many optical communities, including EUV lithography, who require sub-nanometre bending control of the mirror form.
{"title":"Picometre-level surface control of a closed-loop, adaptive X-ray mirror with integrated real-time interferometric feedback.","authors":"Ioana Theodora Nistea, Simon G Alcock, Andrew Foster, Vivek Badami, Riccardo Signorato, Matteo Fusco","doi":"10.1107/S1600577524011007","DOIUrl":"10.1107/S1600577524011007","url":null,"abstract":"<p><p>We provide a technical description and experimental results of the practical development and offline testing of an innovative, closed-loop, adaptive mirror system capable of making rapid, precise and ultra-stable changes in the size and shape of reflected X-ray beams generated at synchrotron light and free-electron laser facilities. The optical surface of a piezoelectric bimorph deformable mirror is continuously monitored at 20 kHz by an array of interferometric sensors. This matrix of height data is autonomously converted into voltage commands that are sent at 1 Hz to the piezo actuators to modify the shape of the mirror optical surface. Hence, users can rapidly switch in closed-loop between pre-calibrated X-ray wavefronts by selecting the corresponding freeform optical profile. This closed-loop monitoring is shown to repeatably bend and stabilize the low- and mid-spatial frequency components of the mirror surface to any given profile with an error <200 pm peak-to-valley, regardless of the recent history of bending and hysteresis. Without closed-loop stabilization after bending, the mirror height profile is shown to drift by hundreds of nanometres, which will slowly distort the X-ray wavefront. The metrology frame that holds the interferometric sensors is designed to be largely insensitive to temperature changes, providing an ultra-stable reference datum to enhance repeatability. We demonstrate an unprecedented level of fast and precise optical control in the X-ray domain: the profile of a macroscopic X-ray mirror of over 0.5 m in length was freely adjusted and stabilized to atomic level height resolution. Aside from demonstrating the extreme sensitivity of the interferometer sensors, this study also highlights the voltage repeatability and stability of the programmable high-voltage power supply, the accuracy of the correction-calculation algorithms and the almost instantaneous response of the bimorph mirror to command voltage pulses. Finally, we demonstrate the robustness of the system by showing that the bimorph mirror's optical surface was not damaged by more than 1 million voltage cycles, including no occurrence of the `junction effect' or weakening of piezoelectric actuator strength. Hence, this hardware combination provides a real time, hyper-precise, temperature-insensitive, closed-loop system which could benefit many optical communities, including EUV lithography, who require sub-nanometre bending control of the mirror form.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"133-144"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708852/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142848122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524010890
Justine Schlappa, Giacomo Ghiringhelli, Benjamin E Van Kuiken, Martin Teichmann, Piter S Miedema, Jan Torben Delitz, Natalia Gerasimova, Serguei Molodtsov, Luigi Adriano, Bernard Baranasic, Carsten Broers, Robert Carley, Patrick Gessler, Nahid Ghodrati, David Hickin, Le Phuong Hoang, Manuel Izquierdo, Laurent Mercadier, Giuseppe Mercurio, Sergii Parchenko, Marijan Stupar, Zhong Yin, Leonardo Martinelli, Giacomo Merzoni, Ying Ying Peng, Torben Reuss, Sreeju Sreekantan Nair Lalithambika, Simone Techert, Tim Laarmann, Simo Huotari, Christian Schroeter, Burkhard Langer, Tatjana Giessel, Jana Buchheim, Grzegorz Gwalt, Andrey Sokolov, Frank Siewert, Robby Buechner, Vinicius Vaz da Cruz, Sebastian Eckert, Chun Yu Liu, Christian Sohrt, Christian Weniger, Annette Pietzsch, Stefan Neppl, Friedmar Senf, Andreas Scherz, Alexander Föhlisch
Resonant inelastic X-ray scattering (RIXS) is an ideal X-ray spectroscopy method to push the combination of energy and time resolutions to the Fourier transform ultimate limit, because it is unaffected by the core-hole lifetime energy broadening. Also, in pump-probe experiments the interaction time is made very short by the same core-hole lifetime. RIXS is very photon hungry so it takes great advantage from high-repetition-rate pulsed X-ray sources like the European XFEL. The Heisenberg RIXS instrument is designed for RIXS experiments in the soft X-ray range with energy resolution approaching the Fourier and the Heisenberg limits. It is based on a spherical grating with variable line spacing and a position-sensitive 2D detector. Initially, two gratings were installed to adequately cover the whole photon energy range. With optimized spot size on the sample and small pixel detector the energy resolution can be better than 40 meV (90 meV) at any photon energy below 1000 eV with the high-resolution (high-transmission) grating. At the SCS instrument of the European XFEL the spectrometer can be easily positioned thanks to air pads on a high-quality floor, allowing the scattering angle to be continuously adjusted over the 65-145° range. It can be coupled to two different sample interaction chambers, one for liquid jets and one for solids, each state-of-the-art equipped and compatible for optical laser pumping in collinear geometry. The measured performances, in terms of energy resolution and count rate on the detector, closely match design expectations. The Heisenberg RIXS instrument has been open to public users since the summer of 2022.
{"title":"The Heisenberg-RIXS instrument at the European XFEL.","authors":"Justine Schlappa, Giacomo Ghiringhelli, Benjamin E Van Kuiken, Martin Teichmann, Piter S Miedema, Jan Torben Delitz, Natalia Gerasimova, Serguei Molodtsov, Luigi Adriano, Bernard Baranasic, Carsten Broers, Robert Carley, Patrick Gessler, Nahid Ghodrati, David Hickin, Le Phuong Hoang, Manuel Izquierdo, Laurent Mercadier, Giuseppe Mercurio, Sergii Parchenko, Marijan Stupar, Zhong Yin, Leonardo Martinelli, Giacomo Merzoni, Ying Ying Peng, Torben Reuss, Sreeju Sreekantan Nair Lalithambika, Simone Techert, Tim Laarmann, Simo Huotari, Christian Schroeter, Burkhard Langer, Tatjana Giessel, Jana Buchheim, Grzegorz Gwalt, Andrey Sokolov, Frank Siewert, Robby Buechner, Vinicius Vaz da Cruz, Sebastian Eckert, Chun Yu Liu, Christian Sohrt, Christian Weniger, Annette Pietzsch, Stefan Neppl, Friedmar Senf, Andreas Scherz, Alexander Föhlisch","doi":"10.1107/S1600577524010890","DOIUrl":"10.1107/S1600577524010890","url":null,"abstract":"<p><p>Resonant inelastic X-ray scattering (RIXS) is an ideal X-ray spectroscopy method to push the combination of energy and time resolutions to the Fourier transform ultimate limit, because it is unaffected by the core-hole lifetime energy broadening. Also, in pump-probe experiments the interaction time is made very short by the same core-hole lifetime. RIXS is very photon hungry so it takes great advantage from high-repetition-rate pulsed X-ray sources like the European XFEL. The Heisenberg RIXS instrument is designed for RIXS experiments in the soft X-ray range with energy resolution approaching the Fourier and the Heisenberg limits. It is based on a spherical grating with variable line spacing and a position-sensitive 2D detector. Initially, two gratings were installed to adequately cover the whole photon energy range. With optimized spot size on the sample and small pixel detector the energy resolution can be better than 40 meV (90 meV) at any photon energy below 1000 eV with the high-resolution (high-transmission) grating. At the SCS instrument of the European XFEL the spectrometer can be easily positioned thanks to air pads on a high-quality floor, allowing the scattering angle to be continuously adjusted over the 65-145° range. It can be coupled to two different sample interaction chambers, one for liquid jets and one for solids, each state-of-the-art equipped and compatible for optical laser pumping in collinear geometry. The measured performances, in terms of energy resolution and count rate on the detector, closely match design expectations. The Heisenberg RIXS instrument has been open to public users since the summer of 2022.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"29-45"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708868/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142869617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524011603
Patrick Yuheng Wang, Murilo Bazan da Silva, Matthew Hand, Hongchang Wang, Peter Chang, Victoria Beilsten-Edmands, Timur K Kim, Tien Lin Lee, Kawal Sawhney, Andrew C Walters
We present here a newly developed software tool (called PGMweb) for computing and simulating the X-ray beam path through a plane grating monochromator (PGM), a key component in soft X-ray beamlines at modern synchrotron and free-electron laser facilities. A historical overview of the development of PGMs is presented, with special attention dedicated to the collimated PGM optical scheme found at several X-ray facilities worldwide. The analytical expressions that fully describe the geometry of a PGM are derived and have been implemented as functions in a Python library (pyplanemono). PGMweb is distributed as a web-based application that can be run in any modern browser without installation, making its use very straightforward for X-ray beamline designers and beamline scientists alike.
{"title":"PGMweb: an online tool for visualizing the X-ray beam path through plane grating monochromators.","authors":"Patrick Yuheng Wang, Murilo Bazan da Silva, Matthew Hand, Hongchang Wang, Peter Chang, Victoria Beilsten-Edmands, Timur K Kim, Tien Lin Lee, Kawal Sawhney, Andrew C Walters","doi":"10.1107/S1600577524011603","DOIUrl":"10.1107/S1600577524011603","url":null,"abstract":"<p><p>We present here a newly developed software tool (called PGMweb) for computing and simulating the X-ray beam path through a plane grating monochromator (PGM), a key component in soft X-ray beamlines at modern synchrotron and free-electron laser facilities. A historical overview of the development of PGMs is presented, with special attention dedicated to the collimated PGM optical scheme found at several X-ray facilities worldwide. The analytical expressions that fully describe the geometry of a PGM are derived and have been implemented as functions in a Python library (pyplanemono). PGMweb is distributed as a web-based application that can be run in any modern browser without installation, making its use very straightforward for X-ray beamline designers and beamline scientists alike.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"261-268"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708866/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142869777","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524011585
Enrico Allaria, Paolo Cinquegrana, Miltcho B Danailov, Eugenio Ferrari, Fabian Pannek, Giuseppe Penco, Eleonore Roussel, Carlo Spezzani
The operation of modern free-electron lasers (FELs) necessitates precise knowledge of electron beam properties at the undulator to ensure the level of control required by increasingly demanding experiments. In seeded FELs, where only electrons interacting with the seed laser contribute to the process, it is crucial to determine the local values of these properties. We present a novel method, based on accurate modeling of the FEL process in high-gain harmonic generation, to accurately retrieve the electron beam slice energy spread, current and laser-induced energy modulation. Understanding these values is essential for enabling advanced FEL schemes and optimally setting advanced seeding schemes such as echo-enabled harmonic generation. We describe the method and provide an experimental application to the FERMI FEL-1, where a slice energy spread in the range 40-100 keV with a few keV accuracy is measured.
{"title":"Accurate measurements of slice electron beam parameters at the undulator in seeded free-electron lasers.","authors":"Enrico Allaria, Paolo Cinquegrana, Miltcho B Danailov, Eugenio Ferrari, Fabian Pannek, Giuseppe Penco, Eleonore Roussel, Carlo Spezzani","doi":"10.1107/S1600577524011585","DOIUrl":"10.1107/S1600577524011585","url":null,"abstract":"<p><p>The operation of modern free-electron lasers (FELs) necessitates precise knowledge of electron beam properties at the undulator to ensure the level of control required by increasingly demanding experiments. In seeded FELs, where only electrons interacting with the seed laser contribute to the process, it is crucial to determine the local values of these properties. We present a novel method, based on accurate modeling of the FEL process in high-gain harmonic generation, to accurately retrieve the electron beam slice energy spread, current and laser-induced energy modulation. Understanding these values is essential for enabling advanced FEL schemes and optimally setting advanced seeding schemes such as echo-enabled harmonic generation. We describe the method and provide an experimental application to the FERMI FEL-1, where a slice energy spread in the range 40-100 keV with a few keV accuracy is measured.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"72-81"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708859/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142865632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-01DOI: 10.1107/S1600577524010944
Palalle G Tharushi Perera, Jitraporn Vongsvivut, Denver Linklater, Zoltan Vilagosh, Dominique Appadoo, The Hong Phong Nguyen, Mark J Tobin, Rodney Croft, Elena P Ivanova
Synchrotron sourced Fourier transform infrared (SS FTIR) microspectroscopy was employed to investigate the biological effects on the neuron-like pheochromocytoma (PC 12) cells after exposure to synchrotron sourced terahertz (SS THz) radiation. Over 10 min of exposure, the PC 12 cells received a total energy of 600 J m2, with a total incident power density of ∼1.0 W m-2 (0.10 mW cm-2) at the beam extraction port (BEP) of the THz beamline at the Australian Synchrotron. To investigate the metabolic response of PC 12 cells after synchrotron THz radiation exposure, we utilized the FTIR microscope at the Infrared Microspectroscopy IRM beamline, which offers high photon flux and diffraction-limited spatial resolution enabling the detection of functional group variations in biological molecules at a single-cell level. Principal component analysis (PCA) based on the SS FTIR spectral data revealed a distinct separation of SS THz-exposed and control (non-exposed) cells. According to the PCA loadings, the key changes in the exposed cells involved lipid and protein compositions as indicated by the stretching vibrations of CH2/CH3 groups and amide I/II bands, respectively. An increase in lipids, such as cholesterol, or notable changes in their compositions and in some protein secondary structures were observed in the SS THz-exposed cells. The PCA analysis further suggests that PC 12 cells might maintain cell membrane stability after SS THz irradiation through higher volumes of cholesterol and cell morphology via regulation of the synthesis of cytoskeleton proteins such as actin-related proteins. The outcome of this study re-emphasized the exceptional SS FTIR capability to perform single-cell analysis directly, providing (i) unique biological information on cell variability within the population as well as between different groups, and (ii) evidence of molecular changes in the exposed cells that could lead to a deeper understanding of the effect of THz exposure at a single-cell level.
{"title":"Shedding light on biochemical changes in single neuron-like pheochromocytoma cells following exposure to synchrotron sourced terahertz radiation using synchrotron source Fourier transform infrared microspectroscopy.","authors":"Palalle G Tharushi Perera, Jitraporn Vongsvivut, Denver Linklater, Zoltan Vilagosh, Dominique Appadoo, The Hong Phong Nguyen, Mark J Tobin, Rodney Croft, Elena P Ivanova","doi":"10.1107/S1600577524010944","DOIUrl":"10.1107/S1600577524010944","url":null,"abstract":"<p><p>Synchrotron sourced Fourier transform infrared (SS FTIR) microspectroscopy was employed to investigate the biological effects on the neuron-like pheochromocytoma (PC 12) cells after exposure to synchrotron sourced terahertz (SS THz) radiation. Over 10 min of exposure, the PC 12 cells received a total energy of 600 J m<sup>2</sup>, with a total incident power density of ∼1.0 W m<sup>-2</sup> (0.10 mW cm<sup>-2</sup>) at the beam extraction port (BEP) of the THz beamline at the Australian Synchrotron. To investigate the metabolic response of PC 12 cells after synchrotron THz radiation exposure, we utilized the FTIR microscope at the Infrared Microspectroscopy IRM beamline, which offers high photon flux and diffraction-limited spatial resolution enabling the detection of functional group variations in biological molecules at a single-cell level. Principal component analysis (PCA) based on the SS FTIR spectral data revealed a distinct separation of SS THz-exposed and control (non-exposed) cells. According to the PCA loadings, the key changes in the exposed cells involved lipid and protein compositions as indicated by the stretching vibrations of CH<sub>2</sub>/CH<sub>3</sub> groups and amide I/II bands, respectively. An increase in lipids, such as cholesterol, or notable changes in their compositions and in some protein secondary structures were observed in the SS THz-exposed cells. The PCA analysis further suggests that PC 12 cells might maintain cell membrane stability after SS THz irradiation through higher volumes of cholesterol and cell morphology via regulation of the synthesis of cytoskeleton proteins such as actin-related proteins. The outcome of this study re-emphasized the exceptional SS FTIR capability to perform single-cell analysis directly, providing (i) unique biological information on cell variability within the population as well as between different groups, and (ii) evidence of molecular changes in the exposed cells that could lead to a deeper understanding of the effect of THz exposure at a single-cell level.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"155-161"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708867/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142848083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
X-ray spectromicroscopy is extensively utilized for nondestructive mapping of chemical states in materials. However, understanding and analyzing the geometric and topological aspects of such data pose challenges due to their representation in 4D space, encompassing (x, y, z) coordinates along with the energy (E) axis and often extending to 5D space with the inclusion of time (t) or reaction degree. In this study, we addressed this challenge by developing a new approach and introducing a device named `4D-XASView', specifically designed for visualizing X-ray absorption fine structures (XAFS) data in 4D (comprising 3D space and energy), through a multi-projection system, within the virtual reality (VR) environment. As a test case for the new system, X-ray spectromicroscopy measurements were conducted on a specimen prepared from serpentinized harzburgite sourced from the upper mantle section of the Oman ophiolite. Our 4D-XASView facilitates the visualization and analysis of the geometric and topological aspects of the data using VR goggles, enabling detailed exploration of microstructures via rotation and zooming functionalities. This capability allows us to extract XAFS spectral data by selecting specific positions and regions, thereby aiding in the identification of `trigger sites' (magnetite in serpentine), which are characteristic locations within materials that substantially influence the macroscopic propagation of reactions. Our methodology establishes a new platform for analyzing 4D or 5D XAFS data that has applicability potential in various other multidimensional datasets, including microstructures coupled with spectroscopy and diffraction data.
x射线光谱显微镜广泛用于材料化学状态的无损测绘。然而,理解和分析这些数据的几何和拓扑方面带来了挑战,因为它们在四维空间中表示,包括(x, y, z)坐标以及能量(E)轴,并且经常扩展到包含时间(t)或反应度的5D空间。在这项研究中,我们通过开发一种新方法和引入一种名为“4D- xasview”的设备来解决这一挑战,该设备专门设计用于在虚拟现实(VR)环境中通过多投影系统在4D(包括3D空间和能量)中可视化x射线吸收精细结构(XAFS)数据。作为新系统的测试用例,x射线光谱显微镜测量了来自阿曼蛇绿岩上地幔部分的蛇纹石化辉锌矿制备的样品。我们的4D-XASView便于使用VR护目镜对数据的几何和拓扑方面进行可视化和分析,通过旋转和缩放功能对微结构进行详细探索。这种能力使我们能够通过选择特定的位置和区域提取XAFS光谱数据,从而帮助识别“触发位点”(蛇纹石中的磁铁矿),这些位点是材料中的特征位置,对反应的宏观传播有很大影响。我们的方法建立了一个分析4D或5D XAFS数据的新平台,该平台具有适用于各种其他多维数据集的潜力,包括微观结构与光谱和衍射数据。
{"title":"Visualization of four-dimensional X-ray absorption fine structure data using a virtual reality system.","authors":"Haruo Igarashi, Daiki Kido, Yutaka Ishii, Yasuhiro Niwa, Atsushi Okamoto, Masao Kimura","doi":"10.1107/S1600577524011226","DOIUrl":"10.1107/S1600577524011226","url":null,"abstract":"<p><p>X-ray spectromicroscopy is extensively utilized for nondestructive mapping of chemical states in materials. However, understanding and analyzing the geometric and topological aspects of such data pose challenges due to their representation in 4D space, encompassing (x, y, z) coordinates along with the energy (E) axis and often extending to 5D space with the inclusion of time (t) or reaction degree. In this study, we addressed this challenge by developing a new approach and introducing a device named `4D-XASView', specifically designed for visualizing X-ray absorption fine structures (XAFS) data in 4D (comprising 3D space and energy), through a multi-projection system, within the virtual reality (VR) environment. As a test case for the new system, X-ray spectromicroscopy measurements were conducted on a specimen prepared from serpentinized harzburgite sourced from the upper mantle section of the Oman ophiolite. Our 4D-XASView facilitates the visualization and analysis of the geometric and topological aspects of the data using VR goggles, enabling detailed exploration of microstructures via rotation and zooming functionalities. This capability allows us to extract XAFS spectral data by selecting specific positions and regions, thereby aiding in the identification of `trigger sites' (magnetite in serpentine), which are characteristic locations within materials that substantially influence the macroscopic propagation of reactions. Our methodology establishes a new platform for analyzing 4D or 5D XAFS data that has applicability potential in various other multidimensional datasets, including microstructures coupled with spectroscopy and diffraction data.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":" ","pages":"162-170"},"PeriodicalIF":2.5,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11708858/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142869567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}